• The Journal of Korea Institute of Information, Electronics, and Communication Technology
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• v.2 no.1
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• pp.3-9
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• 2009

Although Active matrix organic light emitting diode (AMOLED) display has a better image quality in terms of viewing angle, contrast ratio, and response time than liquid crystal displays (LCDs), it still has some critical issues such as lifetime, residual images, and brightness non-uniformity due to non-uniformity in electrical characteristics of driving TFTs and IR drops on supplied power line. Among them, we improved irrecoverable residual images of AMOLED displays which is mainly related to the hysteresis characteristics of driving TFTs. We consider four kinds of surface treatment conditions before gate oxide deposition for improving hysteresis characteristics. We can reduce the hysteresis level of p-channel TFT to 0.23 V, interface trap states between the poly-Si layer and gate insulator to $3.11{\times}10^{11}cm^{-2}$, and output current variation of p-channel TFT to 3.65 % through the surface treatment using ultraviolet light and H2 plasma. Therefore, the recoverable residual image problem of AMOLED displays can be improved by surface treatment using ultraviolet light and $H_2$ plasma.

• Proceedings of the Materials Research Society of Korea Conference
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• 2011.05a
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• pp.65-65
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• 2011

Single-well carbon nanotubes (SWNT) have been proposed as a promising candidate for various applications owing to their excellent properties. In particular, their fascinating electrical and mechanical properties could provide a new area for the development of advanced engineering materials. A transparent conductive thin film (TCF) has increased for applications such as liquid crystal displays, touch panels, and flexible displays. Indium tin oxide (ITO) thin films, which have been traditionally used as the TCFs, have a serious obstacle in TCFs applications. SWNTs are the most appropriate materials for conductive films for displays due to their excellent high mechanical strength and electrical conductivity. But, a bundle of CNTs has different electrical properties than their individual counterparts. In this work, the fabrication by the spraying process of transparent SWNT films and reduction of its sheet resistance on PET substrates is researched. Arc-discharge SWNTs were dispersed in deionized water by adding sodum dodecyl sulfate (SDS) as surfactant and sonicated, followed by the centrifugation. The dispersed SWNT was spray-coated on PET substrate and dried on a hotplate at $100^{\circ}C$. When the spray process was terminated, the TCF was immersed into deionized water to remove the surfactant and then it was dried on hotplate. The TCF film was then treated with ionic doping treatment, rinsed with deionized water and dried. The surface morphology of TCF was characterized by field emission scanning electron microscopy. The sheet resistance and optical transmission properties of the TCF were measured with a four-point probe method and a UV-visible spectrometry, respectively. Results, we show that 97 ${\Omega}$/> sheet resistance can be achieved with 81% transmittance at the wavelength of 550 nm. The changes in electrical and optical conductivity of SWNT film before and after ionic doping treatments were discussed.

• International Journal of Precision Engineering and Manufacturing
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• v.7 no.1
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• pp.51-56
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• 2006

A computer code was developed to simulate both the thermal stresses introduced during the post-filling stage and the in-plane deformation after ejection process by finite element method based on the plane stress theory. The computer simulation was applied to the mold design of a 2 inch light guide plate (LGP) for thin film transistor (TFT)-liquid crystal displays (LCD). With injection molding experiments based on the design of experiments (DOE) technique, the influences of the processing conditions in injection molding on brightness and uniformity of the LGP were investigated, and the optimal processing parameters were selected to increase the brightness and uniformity. The verification experiment showed that the brightness and uniformity of the LGP were increased dramatically under the selected optimal processing conditions.

• Proceedings of the KIEE Conference
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• 2001.11a
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• pp.41-42
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• 2001

본 연구에서는 빠른 응답특성과 넓은 시야 각 특성을 갖는 Optically Compensated Bend Mode Liquid Crystal Displays(OCB LCDs)의 전기광학 특성을 계산하였다. 액정의 운동방정식을 시뮬레이션하여 얻은 분자배열 분포로부터 광학적 투과 특성을 계산하였으며, 누설광 차단과 수평 및 수직 방향의 넓은 시야각을 확보하기 위하여 보상필름으로써 Wide View Film을 적용하였다. 이러한 결과를 이축성 필름을 사용한 기존의 OCB LCDs와 비교함으로써 Wide View Film을 적용한 OCB LCDs의 시야의존 특성이 향상됨을 확인하였다.

• Proceedings of the KIEE Conference
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• 2001.11a
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• pp.32-34
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• 2001

본 연구에서는 액정디스플레이의 전기광학특성 분석에 사용되고 있는 두 가지 모델링 방법인 벡터접근법과 텐서접근법에서, 각각의 지배방정식을 시뮬레이션 함으로써 두 접근법의 결과를 비교 및 분석하였다. 이를 위하여 1차원적 시뮬레이션과 함께 측면전장효과 및 disclination line등의 영향을 모두 고려하기 위해 3차원적 액정분자배열 분포를 동일한 조건에 대하여 시뮬레이션 하였다. 두 접근방법에 대한 동적 특성은 단위화소 내의 국부 점에서 많은 차이를 보임을 확인하였으며, 이에 따라 네마틱액정의 방향자에 대한 네마틱 대칭성이 고려된 텐서접근법이 물리적으로 의미가 있으며 실제 현상도 명확하게 설명할 수 있음을 확인하였다.

• Proceedings of the Korean Society of Precision Engineering Conference
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• 2005.06a
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• pp.565-568
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• 2005

We describe a new scheme of dispersive white-light interferometer that is capable of measuring the thickness profile of thin-film layers, for which not only the top surface height profile but also the film thickness of the target surface should be measured at the same time. The interferometer is found useful particularly for in-situ inspection of micro-engineered surfaces such as liquid crystal displays, which requires for high-speed implementation of 3-D surface metrology.

• Proceedings of the Materials Research Society of Korea Conference
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• 2003.03a
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• pp.190-190
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• 2003

여러원소 (Sb, F 등)를 도핑한 SnO$_2$ 투명전도막은 여러 가지 훌륭한 특성으로 Solar cell, heat mirrors, gas sensors, liquid crystal displays, thick film resistor 등과 같이 넓은 범위에서 응용되고 있다. 본 연구에서는 Sb 도핑된 Tin Oxide films이 Sol-gel dip coating법에 의해 준비되었다. SnO$_2$:Sb 용액은 SnC1$_2$ 와 SbC1$_3$ Power를 알코올에 용해하여 Ethylene glycol 와 Citric acid를 첨가하여 합성하였다. 막의 상형성은 XRD와 SEM(Scanning electron microscope)에 의해서 분석되었으며, 특성분석은 투과율(UV/VIS Spectrophotometer)과 표면전기저항(four point probe)으로 분석되었다. SiO$_2$ barrier이 SnO$_2$:Sb 막의 특성에 미치는 영향을 확인하기 위하여 XPS(X-ray photoelectron spectroscopy) 분석이 적용되었다.

• Proceedings of the KIEE Conference
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• 2000.11c
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• pp.449-451
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• 2000

Crosstalk is the primary cause of image distortion in active matrix liquid crystal displays (AMLCD). Crosstalk produces voltage errors that limit gray scale fidelity and consequently, degrades display resolution, contrast ratio, color fidelity, and image quality. In this study, crosstalk phenomena of some methods to compensate level shift voltages has been simulated. This will be contributed to find the way to design the excellent image quality of the TFT-LCDs.

• Industrial Engineering and Management Systems
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• v.8 no.3
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• pp.148-154
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• 2009

In recent days, large-sized flat-panel display (FPD) has been increasingly applied to computer monitors and TVs. Mura defects, appearing as low contrast or non-uniform brightness region, sometimes occur in manufacturing of the Thin-Film Transistor Liquid-Crystal Displays (TFT-LCD). Implementation of automatic Mura inspection methods is necessary for TFT-LCD production. Various existing Mura detection methods based on regression diagnostics, surface fitting and data transformation have been presented with good performance. This paper proposes an efficient Mura detection method that is based on a regression diagnostics using studentized residuals for automatic Mura inspection of FPD. The input image is estimated by a linear model and then the studentized residuals are calculated for filtering Mura regions. After image dilation, the proposed threshold is determined for detecting the non-uniform brightness region in TFT-LCD by means of monitoring the every pixel in the image. The experimental results obtained from several test images are used to illustrate the effectiveness and efficiency of the proposed method for Mura detection.

• International Journal of Precision Engineering and Manufacturing
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• v.1 no.1
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• pp.56-61
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• 2000

We present a fast inspection method of machine vision for in-line quality assurance of liquid crystal displays(LCD) and plasma display panels(PDP). The method incorporates an optical spatial filter in the Fourier plane of the imaging optics to block the normal periodic pattern, extracting only defects real time without relying on intensive software image process. Special emphasis is on designing a collimated white light source to provide high degree of spatial coherence for effective real time Fourier transform. At the same time, a low level of temporal coherence is attained to improve defect detection capabilities by avoiding undesirable coherent noises. Experimental results show that the proposed inspection method offers a detection accuracy of 15% tolerance, which is sufficient for industrial applications.