• Korean Journal of Materials Research
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• v.29 no.1
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• pp.59-64
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• 2019

This study investigates the optical characteristics of InGaN multiple quantum wells(MQWs) light emitting diodes(LEDs) on planar sapphire substrates(PSSs), nano-sized PSS(NPSS) and micro-sized PSS(MPSS). We obtain the results as the patterning size of the sapphire substrates approach the nanometer scale: The light from the back side of the device increases and the total light extraction becomes larger than the MPSS- and planar-LEDs. The experiment is conducted by Monte Carlo ray-tracing, which is regarded as one of the most suitable ways to simulate light propagation in LEDs. The results show fine consistency between simulation and measurement of the samples with different sized patterned substrates. Notably, light from the back side becomes larger in the NPSS LEDs. We strongly propose that the increase in the light intensity of NPSS LEDs is due to an abnormal optical distribution, which indicates an increase of extraction probability through NPSS.

• Particle and aerosol research
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• v.16 no.2
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• pp.49-59
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• 2020

Various devices have been developed to the measurement of particulate matter pollutants, and Optical Particle Counter (OPC) that can be easily and quickly measured is widely used lately. The measured value by OPC is converted to weight concentration using the correction factor (CF). The calculation of CF is very important to improve the reliability and accuracy of OPC. In this study, the CF calculation study of light scattering laser photometer (model 8533, TSI) was carried out to measure in the atmospheric environment using 2 gravimetric devices and 3 light scattering laser photometer devices. Regression analysis and Tukey tests were used to significance the test of measurement devices. Measurements were carried out twice. There was a comparative analysis of measurement data between light scattering laser photometer and gravimetric devices in 1st measurement, and then the Evaluation of PM2.5 concentration corrected by CF performed in 2nd measurement. As a result of the significance analysis between light scattering laser photometer and gravimetric devices, the correlation between the same method was high, but the correlation between different methods was low. CF was calculated as 0.4258 based on the measurement results, and it is a similar level to previous studies at home and abroad. It is expected that these results can be used as basic data in the future study for air quality measurement research using light scattering laser photometer. Also, in order to improve the accuracy of the measurement techniques and the development of technology in the atmospheric environment, CF calculation research should be conducted continuously.

• ETRI Journal
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• v.38 no.5
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• pp.1019-1029
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• 2016

The probability hypothesis density (PHD) filter is an effective means to track multiple targets in that it avoids explicit data associations between the measurements and targets. However, the target birth intensity as a prior is assumed to be known before tracking in a traditional target-tracking algorithm; otherwise, the performance of a conventional PHD filter will decline sharply. Aiming at this problem, a novel target birth intensity scheme and an improved measurement-driven scheme are incorporated into the PHD filter. The target birth intensity estimation scheme, composed of both PHD pre-filter technology and a target velocity extent method, is introduced to recursively estimate the target birth intensity by using the latest measurements at each time step. Second, based on the improved measurement-driven scheme, the measurement set at each time step is divided into the survival target measurement set, birth target measurement set, and clutter set, and meanwhile, the survival and birth target measurement sets are used to update the survival and birth targets, respectively. Lastly, a Gaussian mixture implementation of the PHD filter is presented under a linear Gaussian model assumption. The results of numerical experiments demonstrate that the proposed approach can achieve a better performance in tracking systems with an unknown newborn target intensity.

• Proceedings of the Korean Society of Medical Physics Conference
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• 2002.09a
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• pp.244-247
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• 2002

We examined a possibility to use inorganic plastic scintillator, which has the effective atomic number close to that of human soft tissue, for the measurement of dose distributions in a shorter time period. The method was to irradiate a block of plastic scintillator as a phantom, and to measure the distribution of the scintillation light by a wave length analyzer through a thread of plastic optical fiber. By irradiating the diagnostic x-ray, we observed the emission spectrum of the scintillation light from the scintillator. It showed a peak at around 420nm with a full width of 140 nm. The emission spectrum was integrated to determine the total number of photons. The dependences of the amount of photons on the irradiated dose were measured. The results of the experiment show that the amount of emission light is in proportional to the irradiated dose. From this fact, we conclude that the present method can be used for the measurement of the depth dose distribution of the diagnostic x-rays.

• 한국가시화정보학회:학술대회논문집
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• 2004.12a
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• pp.1-13
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• 2004

A scanning stereo-PIV system was developed to measure the three-dimensional distribution of three-component velocity in a turbulent round jet. A laser light beam produced by a high repetition rate YLF pulse laser was expanded vertically by a cylindrical lens to form a laser light sheet. The light sheet is scanned in a direction normal to the sheet by a flat mirror mounted on an optical scanner, which is controlled by a programmable scanner controller. Two high-speed mega-pixel resolution C-MOS cameras captured the particle images illuminated by the light sheet, and stereoscopic PIV method was adopted to acquire the 3D-3C-velocity distribution of turbulent round jet in an octagonal tank filled with water. The jet Reynolds number was set at Re=1000 and the streamwise location of the measurement was fixed at approximately x = 40D. Time evolution of three-dimensional vortical structure, which is identified by vorticity, is visualized. It revealed that the existence of a group of hairpin-like vortex structures was quite evident around the rim of the shear layer of the jet. Turbulence statistics shows good agreement with the previous data, and divergence of a filtered (unfiltered) velocity vector field was $7\%\;(22\%)$ of root-me an-squared vorticity value.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2000.11a
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• pp.36-39
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• 2000

A small electrical potential difference which appears on any solid body when subjected to illumination by a modulated light beam generated by laser is called photocharge voltage(PCV)[1,2]. This voltage is proportional to the induced change in the surface electrical charge and is capacitatively measured on various materials such as conductors, semiconductors, ceramics, dielectrics and biological objects. The amplitude of the detected signal depends on the type of material under investigation, and on the surface properties of the sample. In photocharge voltage spectroscopy measurements[3], the sample is illuminated by both a steady state monochromatic bias light and the pulsed laser. The monochromatic light is used to created a variation in the steady state population of trap levels in the surface and space charge region of semiconductor samples which does result in a change in the measured voltage. Using this technique the spatial variation of PCV can be utilized to evaluate the surface conditions of the sample and the variation of the PCV due to the monochromatic bias light are utilized to characterize the surface states. A qualitative analysis of the proposed measurement is present along with experimental results performed on amorphous silicon samples. The deposition temperature was varied in order to obtain samples with different structural, optical and electronic properties and measurements are related to the defect density in amorphous thin film.

• Journal of the Korean Society for Precision Engineering
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• v.18 no.11
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• pp.51-57
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• 2001

A light beam reflected from a machined surface generally containes information concerning about its surface roughness. This study examines and proposes a surface roughness measurement technique for on-machine measurement of machined surfaces. The technique is based on the measurement of a reflected laser beam pattern and the statistical analysis of its light intensity distribution. The surface roughness was found to be closely related to the standard deviation of the light intensity on the primary axis of the reflected pattern. An image acquisition device is made up of a laser diode, a half mirror, a screen, and a CCD camera. The exact image with the primary and secondary axes of a reflected laser beam pattern is calculated through such image processing algorithm as thresholding, edge detection, image rotation, segmentation, etc. A median filter and a surrounding light correction algorithm are improve the image quality and reduce the measuring error. Using the developed measuring device the effect of screen materials and workpiece and workpiece materials was investigated. Experimental results regarding to relatively high-quality surfaces machined by grinding, polishing, lapping processes have shown the measurement error is within 10% in the range of $0.1{mu}m~0.8{\mu}m R_q.$Therefore, the proposed method is thought to be effectively used when quick measurements is needed with workpieces fixed on the machine.

• Journal of the Optical Society of Korea
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• v.18 no.3
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• pp.236-243
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• 2014

Surface profiling and film thickness measurement play an important role for inspection. White light interferometry is widely used for engineering surfaces profiling, but its applications are limited primarily to opaque surfaces with relatively simple optical reflection behavior. The conventional bucket algorithm had given inaccurate surface profiles because of the phase error that occurs when a thin-film exists on the top of the surface. Recently, reflectometry and white light scanning interferometry were combined to measure the film thickness and surface profile. These techniques, however, have found that many local minima exist, so it is necessary to make proper initial guesses to reach the global minimum quickly. In this paper we propose combing reflectometry and white light scanning interferometry to measure the thin-film thickness and surface profile. The key idea is to divide the measurement into two states; reflectometry mode and interferometry mode to obtain the thickness and profile separately. Interferogram modeling, which considers transparent thin-film, was proposed to determine parameters such as height and thickness. With the proposed method, the ambiguity in determining the thickness and the surface has been eliminated. Standard thickness specimens were measured using the proposed method. Multi-layered film measurement results were compared with AFM measurement results. The comparison showed that surface profile and thin-film thickness can be measured successfully through the proposed method.

• Journal of the Korean Chemical Society
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• v.21 no.4
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• pp.270-275
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• 1977

A rate constant is deduced for the reaction of tert-butoxy radicals and trimethylsilane from the measurement of the phase shift between the modulated light source and the ESR signal of trimethylsilyl radical. The rate constant was found to $3{\times}10^{-2}M^{-1}{\cdot}sec^{-1}$ at $-50^{\circ}C$.

• Proceedings of the KSME Conference
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• 2000.04a
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• pp.411-414
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• 2000

Optical Triangulation Probes (OTPs) are widely used for their simple structure. high resolution, and long operating range. However, errors originating from speckle, inclination of the object, source power fluctuation, ambient light, and noise of the detector limit their usability. In this paper, we propose new design criteria for an error-reduced OTP. The light source module for the system consists of an incoherent light source and a multimode optical fiber for eliminating speckle and shaping a Gaussian beam Intensity profile. A diffuse-reflective white copy paper, which is attached to the object, makes the light intensity distribution on the change-coupled device(CCD). Since the peak positions of the intensity distribution are not related to the various error sources, a sub-pixel resolution signal processing algorithm that can detect the peak position makes it possible to construct an error-reduced OTP system