• Journal of the Korean Society for Heat Treatment
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• v.7 no.4
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• pp.288-297
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• 1994

In this study, lattice parameter, binding energy and microstructures of TiC layer according to the addition of Fe, Cr were investigated in the reactive deposition coating. From the results, the lattice parameters of the TiC layers by using ferro-titanium as a precursor were 4.329~4.339A but the lattice parameters of the TiC layers formed by ferro-titanium and ferro-chromium decreased to 4.316~4.330A. The hardness of the former's was HV(100g) 3,000~3,400kg/mm and the hardness of the latter's was HV (100g) 3,800~3,900. But, regardless of Cr and Fe, the binding energy of TiC layers were 454.75 eV for $Ti2p_{3/2}$ and were 281.85 eV for Cls. Meanwhile, the TiC layers were densified by addition of Fe, Cr and internal defects were reduced Therefore. it can be concluded that the remarkable hardness increment was obtained by the improvement of microstructures of TiC rather than the increase of bond strength or Peierls stress.

• Applied Microscopy
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• v.36 no.spc1
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• pp.57-61
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• 2006

High-resolution microscopy was applied for surveying hydride stability in Vanadium alloys, which are candidate for hydrogen storage materials of advanced hydrogen energy systems. $V_2H$ hydride in V alloys was stable at room temperature under the vacuum condition, but it was decomposed during heating up to $100^{\circ}C$. It was confirmed from HRTEM image and FFT that $V_2H$ has a BCT structure, where hydrogen atoms locate at octahedral sites. Crystal orientation was <110> beta// <110> mat., and lattice strain is about 10%. After the decomposition of the hydride, relatively large lattice expansion was observed in the matrix, which suggests that hydrogen atoms should be trapped by lattice defects and included in the matrix. Intensive electron beam also enhanced the decomposition.

• Journal of the Optical Society of Korea
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• v.6 no.4
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• pp.172-179
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• 2002

Like the conventional digital storage systems, volume holographic memory can be deteriorated by burst errors due to its high-density storage characteristics. These burst errors are used byoptical defects such as scratches, dust particles, etc. and are two-dimensional in a data page. To deal with these errors, we introduce some concepts for describing them and propose efficient two- dimensional interleaving schemes. The schemes are two-dimensional lattices of an error-correction code word and have equilateral triangular and square structures. Using these structures, we can minimize the number of code words that are interleaved and improve the efficiency of the system. For large size burst errors, the efficient interleaving structure is an equilateral triangular lattice. However, for some small size burst errors, it is reduced to a square lattice.

• Journal of the Korean Crystal Growth and Crystal Technology
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• v.13 no.1
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• pp.31-35
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• 2003

The PL data bases reveal the fact that a part of lattice of HPHT treated diamond is reconfigured by the reduction, elimination, generation, and movement of vacancies and interstitials as well as of impurity elements. In particular, this very sensitive method clearly illustrated that minute amount of nitrogen impurities is present in all of these type IIa diamonds, and reveal the presence of a considerable number of point defects dispersed throughout the crystal lattice.

• Applied Microscopy
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• v.46 no.3
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• pp.164-166
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• 2016

Electron channeling contrast imaging (ECCI) is a powerful analyzing tool for identifying lattice defects like dislocations and twin boundaries. By using diffraction-based scanning electron microscopy technique, it enables microstructure analysis, which is comparable to that obtained by transmission electron microscopy that is mostly used in defect analysis. In this report, the optimal conditions for investigating crystal defects are suggested. We could obtain the best ECCI images when both acceleration voltage and probe current are high (30 kV and 20 nA). Also, shortening the working distance (6 mm) enhances the quality of defect imaging.

• Proceedings of the KIEE Conference
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• 2007.07a
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• pp.1864-1865
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• 2007

In this paper, we proposed pre-filter algorithms which using frequency domain analysis method, for the detections of defects in large-sized Thin Film Transistor-Liquid Crystal Display(TFT-LCD) panel surfaces. We performed frequency analysis with 1-D, 2-D FFT methods for extract periodic patterns of lattice structures in TFT-LCDs. To remove this patterns, band-stop filters were used for eliminating specific frequency components. In order to acquire only defected images, we used 2-D inverse FFT methods which can be reverts images that remains defects.

• Journal of the Semiconductor & Display Technology
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• v.22 no.2
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• pp.81-86
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• 2023

Recently, there has been an increased demand for light-emitting diode (LED) due to the growing emphasis on environmental protection. However, the use of GaN-based sapphire in LED manufacturing leads to the generation of defects, such as dislocations caused by lattice mismatch, which ultimately reduces the luminous efficiency of LEDs. Moreover, most inspections for LED semiconductors focus on evaluating the luminous efficiency after packaging. To address these challenges, this paper aims to detect defects at the wafer stage, which could potentially improve the manufacturing process and reduce costs. To achieve this, image processing and deep learning-based defect detection techniques for Sapphire Epi-Wafer used in Green LED manufacturing were developed and compared. Through performance evaluation of each algorithm, it was found that the deep learning approach outperformed the image processing approach in terms of detection accuracy and efficiency.

• Nuclear Engineering and Technology
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• v.52 no.10
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• pp.2285-2289
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• 2020

Protactinium contamination is a mayor issue in the thorium fuel cycle. We investigate, in this work, the consequences of Pa incorporation in vacancy defects and interstitials in Th, ThC and ThN. We calculate charge transfers and lattice distortions due to these incorporations as well as migration paths and energies involved in the diffusion of Pa.

• Journal of the Korean Crystal Growth and Crystal Technology
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• v.12 no.6
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• pp.299-303
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• 2002

The relationship of crystallinity between defects distribution with (100) ZnTe/GaAs using HWE growth was investigated by four crystal rocking curve (FCRC) and transmission electron microscopy (TEM). The thickness dependence of crystal quality in ZnTe epilayer was evaluated. The FWHM value shows a strong dependence on ZnTe epilayer thickness. For the films thinner than 6 ${\mu}{\textrm}{m}$, the FWHM value decreases very steeply as the thickness increases. For the films thicker than 6 ${\mu}{\textrm}{m}$, it becomes an almost constant value. At the thickness of 12 $\mu\textrm{m}$ with the smallest value of 66 arcsec. which is the best value so far reported on ZnTe epilayers was obtained. Investigation into the nature and behavior of dislocations with film thickness in (100) ZnTe/(100)GaAs heterostructures grown by Hot Wall Epitaxy (HWE). This film defects range from interface to 0.7 ${\mu}{\textrm}{m}$ thickness was high density, due to the large lattice mismatch and thermal expansion coefficients. The thickness of 0.7~1.8 ${\mu}{\textrm}{m}$ was exists low defect density. In the thicker range than 1.8 ${\mu}{\textrm}{m}$ thickness was measured hardly defects.

• Composites Research
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• v.30 no.6
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• pp.356-364
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• 2017

Composite lattice structures are tried to be used in various fields because of its benefit in physical properties. With increase of demand of the composite lattice structure, nondestructive testing technology is also required to certificate the quality of the manufactured structures. Recently, research on the development of the composite lattice structure in Republic of Korea was started and accordingly, fast and accurate non-destructive evaluation technology was needed to finalize the manufacturing process. This paper studied non-destructive testing methods for composite lattice structure using laser ultrasonic propagation imaging systems. Pulse-echo ultrasonic propagation imaging system was able to inspect a rib structure wrapped with a skin structure. To reduce the time of inspection, a band divider, which can get signal in different frequency bands at once, was developed. Its performance was proved in an aluminum sandwich panel. In addition, to increase a quality of results, curvature compensating algorithm was developed. On the other hand, guided wave ultrasonic propagation imaging system was applied to inspect delamination in a rib structure. To increase an area of inspection, multi-source ultrasonic wave propagation image was applied, and defects were successfully highlighted with variable time window amplitude mapping algorithm. These imply that ultrasonic propagation imaging systems provides fast and accurate non-destructive testing results for composite lattice structure in a stage of the manufacturing process.