• Title/Summary/Keyword: Large display panel

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Development of integrated test facility for human factors experiments in nuclear power plant (원자력발전소에서의 인간공학적 실험평가를 위한 종합 실험설비 개발)

  • 오인석;이현철;천세우;박근옥;심봉식
    • Journal of the Ergonomics Society of Korea
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    • v.16 no.1
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    • pp.107-117
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    • 1997
  • It is necessary to evaluate HMI inaspects of human factors in the design stage of MMIS(man machine interface system) and feedback the result of evaluation because operators performance is mainly influenced by the HMI. Therefore, the MMIS design should be reflected the operators psychological, behavioral and physiological characteristics in the interaction with human machine interface(HMI) in order to improve the safety and availability of the MMIS of a nuclear power plant(NPP) by reduction of human error. The development of human factors experimental evaluation techniques and integrated test facility(ITF) for the human factors evaluation become an important research field to resolve hi,am factors issues on the design of an advanced control room(ACR). We developed am ITF, which is aimed to experiment with the design of the ACR and the human machine interaction as it relates to the control of NPP. This paper presents the development of an ITF that consists of three rooms such as main test room(MTR), supporting test room(STR) and experiment control room(ECR). And, the ITF has a various facilities such as a human machine simulator(HMS), experimental measurement systems and data analysis and experiment evaluation supporting system(DAEXESS). The HMS consists of full-scope simulation model of Korean standard NPP and advanced HMI based on visual display nits (VDUS) such as touch color CRT, large scale display panel(LSDP), flat panel display unit and so on.

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Aspherical prism lens design and manufacture of a small size and light wight EGD (비구면 프리즘 렌즈를 이용한 소형 경량의 EGD용 광학계 설계 및 제작)

  • Kim, Tae-Ha;Park, Kwang-Bum;Kim, Mi-Jung;Park, Young-Su;Kim, Hwi-Woon;Moon, Hyun-Chan
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2007.11a
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    • pp.454-454
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    • 2007
  • Eye Glass Display (EGD) with microdisplay to realize the virtual display can make the large screen, so virtual image has been developed by using microdisplay panel. This paper shows study of spherical prism lens design and manufacture of a small size and light weigh EGD with 0.59" OLED panel. Code V is used and it designed an aspherical prism lens about eye relief 25mm and 42 degree of filed of view (FOV). With the application this aspheric prism lens to OLED type's microdisplay, virtual image showed 60 inch at 2m. It had less than 2% of distortion value and modulation transfer function in axial had 30% of resolution with 32 lp/mm spatial frequency. We made an injection molding bases to lens designed.

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Microstructure and Strength of the Microjoined Electrode for the Lamp of the LCD Backlight Unit (TFT-LCD 백라이트 유닛(BLU) 램프용 전극 미세 접합부의 강도 및 미세조직)

  • Kim, Gwang-Soo;Kim, Sang-Duck
    • Korean Journal of Materials Research
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    • v.19 no.1
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    • pp.7-12
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    • 2009
  • TFT-LCD is the most popular type of flat display panel in the information technology field. The back light unit is a main part of the structure of a TFT-LCD panel. Occasionally, studies have shown that failures of the CCFL of the BLU occur due to the poor weld characteristics of these materials. The aim of this study was to prepare some technical data and to characterize a microjoined electrode for the CCFL. Microstructure examinations, microhardness measurements, resistance measurements and microtensile tests of the microjoined electrode were carried out. The result indicates that a large amount of grain coarsening exists in the heat-affected zone (HAZ) of the weld between the cup and the pin. This grain coarsening of the HAZ between the cup and pin is caused by the welding cycle, which may have an influence on the lowest microhardness values. Fracturing of the microjoined electrode also occurred at the HAZ close to the cup between the weld holding the cup and the pin. Additionally, no specific changes of the electrical resistance among the cup, pin, and lead wire themselves or in the microjoined electrode were observed.

An Analysis of Particle-clumping Phenomena of a Charged Particle-type Reflective Electronic Display

  • Kim, Young-Cho
    • Transactions on Electrical and Electronic Materials
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    • v.13 no.4
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    • pp.212-214
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    • 2012
  • Both the electrically positive and negative particles in a cell of quick response-liquid powder display (QR-LPD) are surrounded by conductive electrodes on the upper and lower substrate and the dielectric materials of the barrier ribs. Particles in a cell are attached to or detached from the other materials by image force, electric field, Coulomb's force, and Van der Waals' force. Through these forces, the moving particles form an image but induce clumping phenomena. Particles having a large kinetic energy by a large q/m value crash into the opposite electrode with high speed at a large driving voltage and quickly lose electrically charged material. As a result, these particles are clumped and degrade panel performance. The clumped particles in a cell are observed by microscopic photographs and ascertained by a response time. When the bias voltage is increased to 0.68-0.76 $V/{\mu}m$, particle clumping occurs abruptly and the response time increases sharply. This particle clumping is similarly observed after the number of driving times at the driving voltage (0.42-0.64 $V/{\mu}m$).

A Study on the Discharge AND Gate of Plasma Display Panels (플라즈마 디스플레이 패널의 방선 AND gate에 간한 연구)

  • 손현성;채승엽;염정덕
    • Proceedings of the Korean Institute of IIIuminating and Electrical Installation Engineers Conference
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    • 2001.11a
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    • pp.39-46
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    • 2001
  • The plasma display panel with the electrode structure of new discharge AND gate was developed and the driving system for experiment was developed. And discharge AND gate operation was verified. Discharge AND gate operated by the operation speed of 8$mutextrm{s}$ and the operation margin of 20V. It was known to be able to control the discharge of the adjoining scan electrode accurately. Because this method uses the DC discharge, the control of the discharge can be facilitated compared with conventional discharge AND gate. Moreover, because the imput discharge and the output discharge of AND gate are separate, the display discharge can be prevented from passing AND gate. Therefore, it is possible to apply to the large screen plasma display. And the decrease of contrast ratio does not occur because the scanning electrical discharge does not influence the picture quality.

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The Optimum Phosphor Thickness to Obtain the Highest Luminance and Luminous Efficiency in ac PDP

  • Heo, Jeong-Eun;Kim, Young-Kee;Park, Hun-Gun;Park, Chung-Hoo
    • Journal of Information Display
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    • v.2 no.1
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    • pp.14-19
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    • 2001
  • Plasma display panel(PDP) have gained great attention due to their potential application to large-area display including HDTV. The luminance and luminous efficiency of PDP, however, should be improved to realize this goal. In this study, we examined experimentally the effects of phosphor thickness and discharge gap on the luminance and luminous efficiency of ac PDP. For the rib height of 110 ${\mu}m$, whereas the optimum phosphor thickness was about 30 ${\mu}m$. The optimum thickness of green phosphor was about 50 ${\mu}m$ for the rib height of $120{\sim}160\;{\mu}m$.

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Bandgap Voltage Reference Circuit Design Technology Suitable for Driving Large OLED Display Panel (대형 OLED 디스플레이 패널 구동에 적합한 밴드갭 레퍼런스 회로 설계 및 결과)

  • Moon, Jong Il;Cho, Sang Jun;Cho, Eou Sik;Nam, Chul;Kwon, Sang Jik
    • Journal of the Semiconductor & Display Technology
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    • v.17 no.2
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    • pp.53-56
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    • 2018
  • In this paper, a CMOS bandgap voltage reference that is not sensitive to changes in the external environment is presented. Large OLED display panels need high supply voltage. MOSFET devices with high voltage are sensitive to the output voltage due to the channel length modulation effect. The self-cascode circuit was applied to the bandgap reference circuit. Simulation results show that the maximum output voltage change of the basic circuit is 77mV when the supply voltage is changed from 10.5V to 13.5V, but the proposed circuit change is improved to 0.0422mV. The improved circuit has a low temperature coefficient of $9.1ppm/^{\circ}C$ when changing the temperature from $-40^{\circ}C$ to $140^{\circ}C$. Therefore, the proposed circuit can be used as a reference voltage source for circuits that require a high supply voltage.

Inspection for Process Improvement during High-Resolution Large-Size LTPS TFT Manufacturing

  • Chang, Jiun-Jye;Chen, Chih-Chiang;Chuang, Ching-Sang;Wu, Yung-Fu;Sheu, Chai-Yuan
    • 한국정보디스플레이학회:학술대회논문집
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    • 2003.07a
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    • pp.626-629
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    • 2003
  • In order to achieve high-resolution and large-size displays, inspection technology is necessary and important. It is a powerful utility for process and yield improvement for the high valued panel realization. We indicated the challenge of advanced panel manufacturing on inspection ability and throughput. We also investigated the method to judge laser-crystallizing energy by inspection technology. Finally, the total defect number and critical killer defects were classified and discussed in this work.

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Implementation of Logic Gates Using Organic Thin Film Transistor for Gate Driver of Flexible Organic Light-Emitting Diode Displays (유기 박막 트랜지스터를 이용한 유연한 디스플레이의 게이트 드라이버용 로직 게이트 구현)

  • Cho, Seung-Il;Mizukami, Makoto
    • The Journal of the Korea institute of electronic communication sciences
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    • v.14 no.1
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    • pp.87-96
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    • 2019
  • Flexible organic light-emitting diode (OLED) displays with organic thin-film transistors (OTFTs) backplanes have been studied. A gate driver is required to drive the OLED display. The gate driver is integrated into the panel to reduce the manufacturing cost of the display panel and to simplify the module structure using fabrication methods based on low-temperature, low-cost, and large-area printing processes. In this paper, pseudo complementary metal oxide semiconductor (CMOS) logic gates are implemented using OTFTs for the gate driver integrated in the flexible OLED display. The pseudo CMOS inverter and NAND gates are designed and fabricated on a flexible plastic substrate using inkjet-printed OTFTs and the same process as the display. Moreover, the operation of the logic gates is confirmed by measurement. The measurement results show that the pseudo CMOS inverter can operate at input signal frequencies up to 1 kHz, indicating the possibility of the gate driver being integrated in the flexible OLED display.

TW(True Wide)-IPS for Improvement of Display Performance in large size TV application

  • Kim, J.H.;Ko, T.W.;Lee, J.H.;Choi, H.C.;Oh, C.H.
    • 한국정보디스플레이학회:학술대회논문집
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    • 2003.07a
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    • pp.664-667
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    • 2003
  • Super In Plane Switching (S-IPS) technology is applied for large TFT-LCD panels used in TV applications. It has a lot of advantages in comparison to the alternative, VA technology. S-IPS shows excellent viewing angle properties and fast response time between intermediate gray levels. If the performance parameters which describe the actual visual performance are considered, S-IPS is much more advantageous.$^{1)}$ However, it shows relatively low contrast ratio in diagonal direction compared to viewing angle characteristic in upper/down direction in S-IPS. In order to compensate the relatively low diagonal contrast ratio, a newly designed optical film was applied and the truly wide view angle of a S-IPS TW(True Wide)-IPS) was achieved. Our newly developed 30-inch TFT-LCD panel reveals TW-IPS that is optimized for TV application

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