• Journal of IKEEE
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• v.24 no.1
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• pp.216-224
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• 2020

This paper proposes an impedance design method of the test device for evaluating Low Voltage Ride Through(LVRT) and High Voltage Ride Through(HVRT) functions. The LVRT/HVRT test device should have ability to generate the fault voltage specified in the grid code for a certain period and to limit the magnitude of the fault current with the design specification. In this paper, the impedance design method for auto transformer is proposed based on a equivalent model of a tap-change auto-transformer during LVRT/HVRT operation. In addition, to generate various fault voltages required the LVRT/HVRT test, tap impedance design in the auto transformer is considered. To verify the validity of the proposed design method, the design process of the 10MVA LVRT/HVRT test device was conducted and the design results was verified through simulation models.