Journal of IKEEE (전기전자학회논문지)

Institute of Korean Electrical and Electronics Engineers (한국전기전자학회)
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Impedance design of tap changing auto transformer based LVRT/HVRT test device

탭 변환 단권변압기 기반 LVRT/HVRT 시험장비의 임피던스 설계

  • Baek, Seung-Hyuk (Dept. of Electronics Engineering, Hanyang University, ERICA Campus) ;
  • Kim, Dong-Uk (Dept. of Electronics Engineering, Hanyang University, ERICA Campus) ;
  • Yoon, Young-Doo (Dept. of Automotive Engineering, Hanyang University) ;
  • Kim, Sungmin (Dept. of Electronics Engineering, Hanyang University, ERICA Campus)
  • Received : 2020.03.06
  • Accepted : 2020.03.23
  • Published : 2020.03.31
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Abstract

This paper proposes an impedance design method of the test device for evaluating Low Voltage Ride Through(LVRT) and High Voltage Ride Through(HVRT) functions. The LVRT/HVRT test device should have ability to generate the fault voltage specified in the grid code for a certain period and to limit the magnitude of the fault current with the design specification. In this paper, the impedance design method for auto transformer is proposed based on a equivalent model of a tap-change auto-transformer during LVRT/HVRT operation. In addition, to generate various fault voltages required the LVRT/HVRT test, tap impedance design in the auto transformer is considered. To verify the validity of the proposed design method, the design process of the 10MVA LVRT/HVRT test device was conducted and the design results was verified through simulation models.

본 논문은 계통 연계 기준인 Low Voltage Ride Through(LVRT) 및 High Voltage Ride Through(HVRT) 기능을 평가하기 위한 시험 장비의 임피던스 설계 방법을 제안한다. LVRT/HVRT 시험 장비는 계통 연계 규정에 명시되어 있는 계통 사고 전압을 일정시간 동안 발생시킬 수 있어야 하며 설계 사양에 맞게 사고전류의 크기를 제한해야 한다. 본 논문에서는 LVRT/HVRT 동작 시 탭 변환 단권변압기 시험 장비의 등가 모델을 기반으로 계통 연계 규정을 만족하기 위한 단권변압기의 임피던스를 설계한다. 제안하는 설계 방법을 이용하여 LVRT/HVRT 시험 시 요구되는 다양한 사고전압을 출력할 수 있는 시험장비의 설계를 위한 탭 간의 임피던스 설계 과정을 설명한다. 제안하는 설계 방법의 타당성을 검증하기 위하여, 10MVA급 LVRT/HVRT 시험 장비의 설계 과정을 설명하고 시뮬레이션을 통하여 확인하였다.

Keywords

References

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