• 한국정보디스플레이학회:학술대회논문집
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• 2009.10a
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• pp.637-640
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• 2009

The LCD based on Kerr effect is highly interesting because it uses an optically isotropic state with no need of alignment layer and it shows sub-millisecond response time. The problem of the device is that it requires very high operating voltage and the transmittance is relatively low compared with other LCDs that use nematic LC. In this work, we study on various electrode structures and driving method which can lower operating voltage.

• 한국정보디스플레이학회:학술대회논문집
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• 2007.08a
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• pp.733-736
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• 2007

We have proposed novel bonding technique of substrates for developing the flexible LCD with high quality. The gel type mixture of agarose and UV curable epoxy developed to obtain tight bonding ability and enhanced electro-optical characteristic simultaneously. This technique can be used to roll-to-roll process for fabricating the flexible LCDs.

• 한국정보디스플레이학회:학술대회논문집
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• 2007.08a
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• pp.997-1000
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• 2007

Achieving white balance is one of the key issues for LCD image quality enhancement. A well-known color correction algorithm is Accurate Color Capture (ACC). Determination of ACC correction values has been time consuming as past methods have required trial-and-error analysis of differences between predicted and measured values. We propose a new ACC value determination method that uses spatially emulated patterns and measured values on patterns.

• 한국정보디스플레이학회:학술대회논문집
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• 2007.08a
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• pp.829-832
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• 2007

A high-speed and accurate analog buffer is proposed for mobile display using LTPS TFTs. The proposed analog buffer is common source type with sampling and negative feedback mode. Therefore, driving speed of the proposed buffer is faster than previously reported one. In addition, the accuracy is very high because of high negative feedback gain. The simulation results show that maximum mischarging voltage of the proposed buffer is 8mV and previously reported one is 37mV. And Power consumption of the proposed buffer is $43.1{\mu}W$, which is 73% of previously reported one.

• 한국정보디스플레이학회:학술대회논문집
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• 2007.08a
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• pp.352-355
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• 2007

We have developed tight bonding of plastic LCD with new rigid spacer. For tight bonding of two plastic substrates, we designed structures to collect UV or thermal epoxy placed on the top of rigid spacer spontaneously by capillary effect. We confirmed that tight bonded plastic LCD has a good adhesion without induced defects and a high mechanical stability against the various external deformations. This method can be applicable to the fabrication of large plastic LCDs using stamping process.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 1999.05a
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• pp.613-616
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• 1999

An active-matrix LCD using thin film transistors (TFTs)has been widely recognized as having potential for high-quality color flat-panel displays. Pixel-Design Array Simulation Tool (PDAST) was used to profoundly understand the gate signal distortion and pixel charging capability, which are the most critical limiting factors for high-quality TFT-LCDs. Since PDAST can simulate the gate data and pixel voltages of a certain pixel on TFT array at any time and at any location on an array, the effect of the new set of capacitance models on the pixel operations can be effectively analyzed, The set of models which is adopted from VLSI interconnections calculate more precise capacitance. The information obtained from this study could be utilized to design the larger area and finer image quality panel.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 1998.06a
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• pp.321-324
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• 1998

Pixel-Design Array Simulation Tool(PDAST) was used to profoundly the gate signal distortion and pixel changing capability, which are the most critical limiting factors for high-quality TFT-LCDs. Since PDAST can simulate the gate, data and pixel voltages of a certain pixel on TFT array at any time and at any location on an array, the effect of the resistivity of gate line material on the pixel operations can be effectively analyzed. The gate signal delay, pixel charging ratio, level-shift of the pixel voltage were simulated with varying the resis5tivity of the gate line material. The information obtained from this study could be utilized to design the larger area and finer image quality panel.

• Proceedings of the KIEE Conference
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• 2000.07c
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• pp.1745-1747
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• 2000

TFT-LCD simulator, PDAST(Pixel Design Array Simulation Tool) could simulate the effect of the variation on the pixel characteristics. Since feed-through voltage in TFT-LCD can be a serious problem to pixel voltage characteristics, it should be compensated. It is applicable to various kinds of TFT-LCDs and can be used to calculate the spontaneous part of common electrode voltage accurately. Also, PDAST can estimate pixel voltage according to various inversion methods. It allows high-speed calculation and the information obtained from this study could be utilized to design the larger area and finer image quality panel.

• Proceedings of the KIEE Conference
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• 2000.07c
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• pp.1581-1583
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• 2000

In this paper, we proposed a surface discharge FFL with the new electrode structure like the needle shaped electrode as the variation of cell structure to high luminance and low power consumption. In comparison with different electrode structure it has low discharge voltage and current and good optical characteristics. So it has better discharge characteristics than different surface discharge FFL and can be fungible of backlight as a lighting source in LCDs.

• Journal of the Optical Society of Korea
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• v.17 no.5
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• pp.392-398
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• 2013

As the essential techniques for the CD (Critical Dimension) measurement of the LCD pattern, there are various modules such as an optics design, auto-focus [1-4], and precise edge detection. Since the operation of image enhancement to improve the CD measurement repeatability, a ring type of the reflected lighting optics is devised. It has a simpler structure than the transmission light optics, but it delivers the same output. The edge detection is the most essential function of the CD measurements. The CD measurement is a vital inspection for LCDs [5-6] and semiconductors [7-8] to improve the production yield rate, there are numbers of techniques to measure the CD. So in this study, a new subpixel algorithm is developed through facet modeling, which complements the previous sub-pixel edge detection algorithm. Currently this CD measurement system is being used in LCD manufacturing systems for repeatability of less than 30 nm.