• 접착 및 계면
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• 제5권3호
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• pp.18-22
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• 2004

본 실험에서는 Johnson-Kendall-Roberts (JKR) 기법을 이용하여 고체물질의 표면에너지 및 두 물질 사이의 고유접착에너지를 측정하였다. JKR 기법의 원리는 기본적으로 접촉역학(contact mechanics)에 기본을 두고 있으며 이를 통하여 기존의 접촉각 측정 방식을 통한 고체 표면에너지 측정 및 peel test와 같은 고전적인 방법을 통한 접착에너지의 측정에서의 한계점을 극복할 수 있는 새로운 방법으로 받아들여지고 있다. 본 연구에서는 polydimethylsiloxane (PDMS)를 이용하여 표면에너지를 측정함으로써 JKR 기법을 통한 측정 결과와 이의 응용가능성에 대해 알아보고자 하였다.

• 대한기계학회:학술대회논문집
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• 대한기계학회 2007년도 춘계학술대회A
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• pp.1744-1748
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• 2007

In this study, the Johnson-Kendall-Roberts (JKR) theory was combined with the instrumented indentation technique (IIT) to evaluate work of adhesion and modulus of elastomeric polymer. Indentation test was used to obtain the load-displacement data for contacts between Tungsten Carbide indenter and elastomeric polymer. And the JKR contact model, contrived to take viscoelastic effects of polymer into account, was applied to compensate the contact area and the elastic modulus which Hertzian contact model would underestimate and overestimate, respectively. Besides, we could obtain the thermodynamic work of adhesion by considering the surface energy in this contact model. In order to define the relation between JKR contact area and applied load without optical measuring of contact area, we used the relation between applied load and contact stiffness by examining the correlation between JKR contact area and stiffness through dimensional analysis with 14 kinds of elastomeric polymer. From this work, it could be demonstrated that the interfacial work of adhesion and elastic modulus of compliant polymer can be obtained from a simple instrumented indentation testing without area measurement, and provided as the main algorithm of compliant polymer characterization.

• 대한기계학회논문집A
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• 제31권9호
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• pp.951-959
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• 2007

In this study, the Johnson-Kendall-Roberts(JKR) theory was combined with the instrumented indentation technique (IIT) to evaluate work of adhesion and modulus of elastomeric polymer. Indentation test was used to obtain the load-displacement data for contacts between Tungsten Carbide indenter and elastomeric polymer. And the JKR contact model, contrived to take viscoelastic effects of polymer into account, was applied to compensate the contact area and the elastic modulus which Hertzian contact model would underestimate and overestimate, respectively. Besides, we could obtain the thermodynamic work of adhesion by considering the surface energy in this contact model. In order to define the relation between JKR contact area and applied load without optical measuring of contact area, we used the relation between applied load and contact stiffness by examining the correlation between JKR contact area and stiffness through dimensional analysis with 14 kinds of elastomeric polymer. From this work, it could be demonstrated that the interfacial work of adhesion and elastic modulus of compliant polymer can be obtained from a simple instrumented indentation testing without area measurement, and provided as the main algorithm of compliant polymer characterization.

• 한국소음진동공학회:학술대회논문집
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• 한국소음진동공학회 2004년도 춘계학술대회논문집
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• pp.73-76
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• 2004

Tapping mode atomic force microscopy (TM-AFM) utilizes the dynamic response of a resonating probe tip as it approaches and retracts from a sample to measure the topography and material properties of a nanostructure. We present recent results based on numerical techniques that yield new perspectives and insight into AFM. It is compared that the dynamic models including van der Waals and Derjaguin-Muller-Toporov(DMT) or Johnson-Kendall-Roberts(JKR) contact forces demonstrates that periodic solutions can be represented with respect to the approach distance and excitation frequency.

• 한국신재생에너지학회:학술대회논문집
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• 한국신재생에너지학회 2005년도 춘계학술대회
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• pp.538-541
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• 2005

In tapping mode atomic force microscopy(TM-AFM). the vibro-contact response of a resonating tip is used to measure the nanoscale topology and other properties of a sample surface. However, the nonlinear tip-surface interact ions can affect the tip response and destabilize the tapping mode control. Especially it is difficult to obtain a good scanned image of high adhesion surfaces such as polymers and biomoleculars using conventional tapping mode control. In this study, theoretical and experimental investigations are made on the nonlinear dynamics and control of TM-AFM. To analyze the complex dynamics and control of the tapping tip, the classical contact models are adopted due to the surface adhesion. Also we report the surface adhesion is an additional important parameter to determine the control stability of TM-AFM. In addition, we prove that it is more adequate to use Johnson-Kendall-Roberts (JKR) contact model to obtain a reasonable tapping response in AFM for the soft and high adhesion samples.

• 대한기계학회논문집A
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• 제30권2호
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• pp.135-140
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• 2006

In tapping mode atomic force microscopy (TM-AFM), the vibro-contact response of a resonating tip is used to measure the nanoscale topology and other properties of a sample surface. However, the nonlinear tipsurface interactions can affect the tip response and destabilize the tapping mode control. Especially it is difficult to obtain a good scanned image of high adhesion surfaces such as polymers and biomolecules using conventional tapping mode control. In this study, theoretical and experimental investigations are made on the nonlinear dynamics and control of TM-AFM. Also we report the surface adhesion is an additional important parameter to determine the control stability of TM-AFM. In addition, we proved that it was adequate to use Johnson-Kendall-Roberts (JKR) contact model to obtain a reasonable tapping response in AFM for the soft and high adhesion samples.

• 한국기계가공학회지
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• 제18권3호
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• pp.59-65
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• 2019

In many industries, particle packing is adopted quite frequently. In the particle packing process, the Discrete Element Method (DEM) can analyze the multi-collision of particles efficiently. Two types of contact models are frequently used for the DEM. One is the linear spring model, which has the fastest calculation time, and the other is the Hertz-Mindlin model, which is the most frequently used contact model employing the DEM. Meanwhile, very tiny particles in the micrometer order are used in modern industries. In the micro length order, surface force is important to decreased particle size. To consider the effect of surface force in this study, we performed a simulation with the Hertz-Mindlin model and added the Johnson-Kendall-Roberts (JKR) theory depicting surface force with surface energy. In addition, three contact models were compared with several parameters. As a result, it was found that the JKR model has larger residual stress than the general contact models because of the pull-off force. We also validated that surface force can influence particle behavior if the particles are small.

• 한국정밀공학회지
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• 제21권12호
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• pp.167-173
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• 2004

Recently, it has been reported that frictional behavior at nanometer scale can be different from that at macro scale. In this article, friction and wear tests were conducted using an AFM to investigate the effect of real contact area on the coefficient of friction and wear property. SiO$_2$, Hica, and SiGe were used in friction test and the AFM tip was Si$_3$N$_4$. The real contact area between an AFM tip and flat surface was calculated by the Johnson-Kendall-Roberts (JKR) theory. Wear specimen was Mica, and the diamond tip was used. We found that the coefficient of friction is constant below a critical area, but it is degraded over the area. Moreover, it is found that wear depth increased rapidly from a certain load and was degraded as a function of the number of the scanning cycles. Also, the range of scanning velocity used in this study had little effect on the wear depth.

• 반도체디스플레이기술학회지
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• 제9권1호
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• pp.5-10
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• 2010

Among a variety of cleaning processes, the cryogenic carbon dioxide ($CO_2$) cleaning has merits because it is highly efficient in removing very fine particles, innoxious to humans and does not produce residuals after the cleaning, which enables us to extend its area of coverage in the semi-conductor fabrication society. However, the cryogenic carbon dioxide cleaning method has some technical research issues in aspect to particles' adhesion and removal. To resolve these issues, performing an analysis for the identification of particle adhesion mechanism is needed. In this study, a research was performed by a theoretical approach. To this end, we extended the G-T (Greenwood-Tripp) model by applying the JKR (Johnson-Kendall-Roberts) and Lennard-Jones potential theories and the statistical characteristics of rough surface to investigate and identify the contact, adhesion and deformation mechanisms of soft or hard particles on the rough substrate. The statistical characteristics of the rough surface were taken into account through the employment of the normal probability distribution function of the asperity peaks on the substrate surface. The effects of surface roughness on the pull-off force for these particles were examined and discussed.

• 반도체디스플레이기술학회지
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• 제7권4호
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• pp.29-33
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• 2008

Rapid increase of integrity for recent semiconductor industry highly demands the development of removal technology of contaminated particles in the scale of a few microns or even smaller. It is known that the surface cleaning technology using $CO_2$ snow has its own merits of high efficiency. However, the detailed removal mechanism of particles using this technology is not yet fully understood due to the lack of sophisticated research endeavors. The detachment mechanism of particles from the substrates is known to be belonged in four types; rebounding, sliding, rolling and lifting. In this study, a modeling effort is performed to explain the detachment mechanism of a contaminant particle due to the rebounding caused by the vertical collision of the $CO_2$ snow. The Hertz and Johnson-Kendall-Roberts(JKR) theories are employed to describe the contact, adhesion and deformation mechanisms of the particles on a substrate. Numerical simulations are followed for several representative cases, which provide the perspective views on the dynamic characteristics of the particles as functions of the material properties and the initial inter-particle collision velocity.