• Proceedings of the Korea Concrete Institute Conference
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• 2001.11a
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• pp.1041-1044
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• 2001

This study was performed to evaluate the effect of non-uniform corrosion distribution on the analysis of concrete cover failure. A series of experiments have been undertaken to measure the corrosion rate of reinforcement according to the concentration of chloride ion so as to suggest a relationship between the reinforcement corrosion rate and chloride ion density. The corrosion induced pressure depending on the density of chloride ion has been derived. And nonlinear analysis assuming nonlinear corrosion distribution for cover cracking was achieved and compared with other experimental results to verify the accuracy of the model. Analysis was also performed for various parameters to compare their effects.

• Journal of Magnetics
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• v.20 no.4
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• pp.366-370
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• 2015

New ion beam etcher (IBE) using a magnetized inductively coupled plasma (M-ICP) has been developed. The magnetic flux density distributions inside the upper chamber, where the plasma is generated by inductive coupling, were successfully optimized by arranging a pair of circular coils very carefully. More importantly, the proposed M-ICP IBE exhibits higher etch rate than ICP.

• Korean Journal of Air-Conditioning and Refrigeration Engineering
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• v.4 no.2
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• pp.72-81
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• 1992

Experimental study on air ionization phenomena has been conducted to analyze the propagation behavior and dischargeability of polarity air ions under the super clean room environments with the operation of prototype of Air Ionization System. Varying humidity and air velocity, the distribution of air ion density and the discharge time are measured and analyzed.

• Proceedings of the Korean Vacuum Society Conference
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• 2011.08a
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• pp.310-311
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• 2011

Dual-frequency (DF) capacitively coupled plasmas (CCP) are used to separately control the mean ion energy and flux at the electrodes [1]. This separate control in capacitively coupled radio frequency discharges is one of the most important issues for various applications of plasma processing. For instance, in the Plasma Enhanced Chemical Vapor Deposition processes such as used for solar cell manufacturing, this separate control is most relevant. It principally allows to increase the ion flux for high deposition rates, while the mean ion energy is kept constant at low values to prevent highly energetic ion bombardment of the substrate to avoid unwanted damage of the surface structure. DF CCP can be analyzed in a fashion similar to single-frequency (SF) driven with effective parameters [2]. It means that DF CCP can be converted into SF CCP with effective parameters such as effective frequency and effective current density. In this study, comparison of DF CCP and its converted effective SF CCP is carried out through particle-in-cell/Monte Carlo (PIC-MCC) simulations. The PIC-MCC simulation shows that DF CCP and its converted effective SF CCP have almost the same plasma characteristics. In DF CCP, the negative resistance arises from the competition of the effective current and the effective frequency [2]. As the high-frequency current increases, the square of the effective frequency increases more than the effective current does. As a result, the effective voltage decreases with the effective current and it leads to an increase of the ion flux and a decrease of the mean ion energy. Because of that, the negative resistance regime can be called the preferable regime for solar cell manufacturing. In this preferable regime, comparison of DF (13.56+100 or 200 MHz) CCP and SF (60 MHz) CCP with the same effective current density is carried out. At the lower effective current density (or at the lower plasma density), the mean ion energy of SF CCP is lower than that of DF CCP. At the higher effective current density (or at the higher plasma density), however, the mean ion energy is lower than that of SF CCP. In this case, using DF CCP is better than SF CCP for solar cell manufacturing processes.

• Journal of the Semiconductor & Display Technology
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• v.2 no.3
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• pp.19-23
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• 2003

Extended unbalanced magnetron sputtering system based on the cylindrical magnetron with a rotating cathode was developed. The unbalanced configuration of magnetic field was realized by means of additional lines of permanent magnets, placed along both sides of a 89 mm outer diameter and 600 mm long cylindrical cathode. The performance of the unbalanced magnetron was assessed in terms of the ion current density and the ion-to-atom ratio incident at the substrate. Furthermore, the paper presents the comparison of the internal plasma parameters, such as the electron temperature, electron density, plasma and floating potentials, measured by a Langmuir probe in various positions from the cathode, for conventional and unbalanced constructions of the cylindrical magnetron. The plasma density and ion current density are about 3-5 times higher than those of conventional one, in the unbalanced magnetron in a 0.24 Pa Ar atmosphere with a DC cathode power of 3 kW.

• Membrane and Water Treatment
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• v.1 no.1
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• pp.13-37
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• 2010

The performance of an electrodialyzer for concentrating seawater is predicted by means of a computer simulation, which includes the following five steps; Step 1 mass transport; Step 2 current density distribution; Step 3 cell voltage; Step 4 NaCl concentration in a concentrated solution and energy consumption; Step 5 limiting current density. The program is developed on the basis of the following assumption; (1) Solution leakage and electric current leakage in an electrodialyzer are negligible. (2) Direct current electric resistance of a membrane includes the electric resistance of a boundary layer formed on the desalting surface of the membrane due to concentration polarization. (3) Frequency distribution of solution velocity ratio in desalting cells is equated by the normal distribution. (4) Current density i at x distant from the inlets of desalting cells is approximated by the quadratic equation. (5) Voltage difference between the electrodes at the entrance of desalting cells is equal to the value at the exits. (6) Limiting current density of an electrodialyzer is defined as average current density applied to an electrodialyzer when current density reaches the limit of an ion exchange membrane at the outlet of a desalting cell in which linear velocity and electrolyte concentration are the least. (7) Concentrated solutions are extracted from concentrating cells to the outside of the process. The validity of the computer simulation model is demonstrated by comparing the computed results with the performance of electrodialyzers operating in salt-manufacturing plants. The model makes it possible to discuss optimum specifications and operating conditions of a practical-scale electrodialyzer.

• Proceedings of the KIEE Conference
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• 1999.11d
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• pp.879-881
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• 1999

Radical and ion densities in a CF4 plasma have been calculated as a function of input power density. 9as pressure and feed gas flow rate using simple 0 dimensional global model. Fluorine atom is found to be the most abundant neutral particle. Highly fragmented species such as CF and CF+ become dominant neutral and ionic radical at the high power condition. As the pressure increases. ion density increases but ionization rate decreases due to the decrease in electron temperature. The fractional dissociation of CF4 feed gas decreases with pressure after increasing at the low pressure range. Electron density and temperature are almost independent of flow rate within calculation conditions studied. The fractional dissociation of CF4 monotonically decreases with flow rate. which results in increase in CF3 and decrease in CF density. The calculation results show that the SiO2 etch selectivity improvement correlates to the increase in the relative density of fluorocarbon ion and neutral radicals which has high C/F ratio.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2002.07a
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• pp.232-235
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• 2002

An 150 kV gas cluster ion accelerator was fabricated and assessed. The change of surface morphology and surface roughness were examined by an atom force microscope (AFM) after irradiation of $CO_2$ gas clusters on Si (100) surfaces at the acceleration voltages of 50 kV. The density of hillocks induced by cluster ion impact was gradually increased with the dosage up to 5$\times$10$^{11}$ ions/$\textrm{cm}^2$. At the boundary of the ion dosage of 10$^{12}$ ions/$\textrm{cm}^2$, the density of the induced hillocks was decreased and RMS (root mean square) surface roughness was not deteriorated further. At the dosage of 5x10$^{13}$ ions/$\textrm{cm}^2$, the induced hillocks completely disappeared and the surface became very flat. In addition, the irradiated region was sputtered. $CO_2$ cluster ions are irradiated at the acceleration voltage of 25 kV to remove hillocks on indium tin oxide (ITO) surface and thus to attain highly smooth surfaces. $CO_2$ monomer ions are also bombarded on the ITO surface at the same acceleration voltage to compare sputtering phenomena. From the AFM results, the irradiation of monomer ions make the hillocks sharper and the surfaces rougher On the other hand, the irradiation of $CO_2$ cluster ions reduces the hight of hillocks and planarize the ITO surfaces. From the experiment of isolated cluster ion impact on the Si surfaces, the induced hillocks m high had the surfaces embossed at the lower ion dosages. The surface roughness was slightly increased with the hillock density and the ion dosage. At higher than a critical ion dosage, the induced hillocks were sputtered and the sputtered particles migrated in order to fill valleys among the hillocks. After prolonged irradiation of cluster ions, the irradiated region was very flat and etched.

• Proceedings of the Korean Society of Precision Engineering Conference
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• 2010.11a
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• pp.539-540
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• 2010

• Journal of the Korean Vacuum Society
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• v.7 no.4
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• pp.381-389
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• 1998

The time variation of an ion current density has been analyzed based on the plasma particle dynamic model for the plasma immersion ion implantation. The implanted ion current density has its maximum value at a particular time after sheath formation, and decays. The influence of the particle collisions, the capacitive time of the substrate, and the pulse formula has been represented on the implanted ion current.