• Title/Summary/Keyword: Ion beam mixing

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The electronic structure of the ion-beam-mixed Pt-Cu alloys by XPS and XANES

  • Lim, K.Y.;Lee, Y.S.;Chung, Y.D.;Lee, K.M.;Jeon, Y.;Whang, C.N.
    • Proceedings of the Korean Vacuum Society Conference
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    • 1998.02a
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    • pp.133-133
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    • 1998
  • In the thin film alloy formation of the transition metals ion-beam-mixing technique forms a metastable structure which cannot be found in the arc-melted metal alloys. Sppecifically it is well known that the studies about the electronic structure of ion-beam-mixed alloys pprovide the useful information in understanding the metastable structures in the metal alloy. We studied the electronic change in the ion-beam-mixed ppt-Ct alloys by XppS and XANES. These analysis tools pprovide us information about the charge transfer in the valence band of intermetallic bonding. The multi-layered films were depposited on the SiO2 substrate by the sequential electron beam evapporation at a ppressure of less than 5$\times$10-7 Torr. These compprise of 4 ppairs of ppt and Cu layers where thicknesses of each layer were varied in order to change the alloy compposition. Ion-beam-mixing pprocess was carried out with 80 keV Ae+ ions with a dose of $1.5\times$ 1016 Ar+/cm2 at room tempperature. The core and valence level energy shift in these system were investigated by x-ray pphotoelectron sppectroscoppy(XppS) pphotoelectrons were excited by monochromatized Al K a(1486.6 eV) The ppass energy of the hemisppherical analyzer was 23.5 eV. Core-level binding energies were calibrated with the Fermi level edge. ppt L3-edge and Cu K-edge XANES sppectra were measured with the flourescence mode detector at the 3C1 beam line of the ppLS (ppohang light source). By using the change of White line(WL) area of the each metal sites and the core level shift we can obtain the information about the electrons pparticippating in the intermetallic bonding of the ion-beam-mixed alloys.

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Enhanced Corrosion Resistance of WC-Co with an Ion Beam Mixed Silicon Carbide Coating

  • Yeo, Sun-Mok;Park, Jae-Won
    • Proceedings of the Korean Vacuum Society Conference
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    • 2011.08a
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    • pp.193-193
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    • 2011
  • Strong adhesion of a silicon carbide (SiC) coating to a WC-Co substrate was achieved through an ion beam mixing technique and the corrosion resistance of the SiC coated WC-Co was investigated by means of a potentiodynamic electrochemical test. In a 1 M NaOH solution, the corrosion current density of SiC-coated WC-Co after heat treatment at 500$^{\circ}C$ was about 50 times lower than that for the as-received WC-Co. In addition, the corrosion resistance systematically increases with increasing the SiC coating thickness. On the other hand, for a 0.5 M H2SO4 solution, the corrosion current density for SiC-coated WC-Co was about 3 times lower than that for the as-received WC-Co. We discuss the physical reasons for the changes in the corrosion current density with the different electrolytes.

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ENHANCED ADHESION STRENGTH OF Cu/polyimide AND Cu/Al/polyimide BY ION BEAM MIXING

  • Chang, G.S.;Kim, T.G.;Chae, K.H.;Whang, C.N.;Zatsepin, D.S.;Kurmaev, E.Z.;Choe, H.S.;Lee, Y.P.
    • Journal of the Korean Vacuum Society
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    • v.6 no.S1
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    • pp.122-126
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    • 1997
  • the Cu/polyimide system is known to be the best candidate for a multilevel interconnection system due to the low resistance of Cu and to the low dielectric constant of polyimide respectively. Ion beam mixing of Cu(40nm)/polyimide was carried out at room temperature with 80 keV Ar+ and N2+ form $1.5\times$1015 to 15$\times$1015 ions/cm2. The quantitative adhesion strength was measured by a standard scratch test. X-ray photoelectron spectroscopy and x-ray emission spectrocopy are employed to investigate the chemical bonds and the interlayer compound formation of the films Cu/Al/polyimide showed more adhesion strength than Cu/polyimide after ion beam mixing and N2+ ions are more effective in the adhesion enhancement than Ar+ with the same sample geometry. The XES results shows the formation of interlayer compound of CuAl2O4 which can reflect more adhesive Cu/Al/polyimide which has not been reported previously. The latter results is understood by the fact that N2+ ions produce more pyridinelike moiety, amide group and tertiary amine moiety whcih are known as adhesion promotors.

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MICROSTRUCTURAL STUDY OF $Fe_{1-x}Ti_x$ ALLOYS FORMED BY ION BEAM MIXING

  • Jeon, Y.;Lee, Y.S.;Choi, B.S.;Woo, J.J.;Whang, C.N.
    • Journal of the Korean Vacuum Society
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    • v.6 no.S1
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    • pp.127-132
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    • 1997
  • Microstructure of the Fe-Ti system by ion beam mixing of multilayers at 300 K and 77 K has been studied in a wide composition range. The ion bombardment was carried out using $Ar^+$ ions at 80 keV. Using grazing angle x-ray diffraction we find that the lattice parameters of these bcc solid solutions are very close to that of $\alpha$-Fe. Extended x-ray absorption fine-structure spectroscopy have been performed to investgate the short-range order in the ion-beam-mixed state. The structure parameters, such as the interatomic distance and the coordination number are estmated from the Fe K-edge Fourier filtered EXAFS spectra. The interatomic distance is independent of the alloy concentration and it is almost constant. The study of x-ray absorption near-edge structure gives information on the individual $\rho$components of the partial densityof states of the conduction band of the Fe and Ti We also find that a charge transfer from Ti to Fe atoms takes place.

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Temperature cycling test of Cu films on anodized aluminum substrate of metal-PC application

  • Kim, Hyeong-Jin;Park, Jae-Won
    • Proceedings of the Korean Vacuum Society Conference
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    • 2011.02a
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    • pp.334-334
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    • 2011
  • We applied N-ion bombardment and heat treatment to the Cu thin films deposited on aluminum oxide layer for the enhancement of adhesion. With e-beam evaporation method. $1,000{\AA}$ thick Cu pre-bombardment layer was deposited on the aluminum oxide surface and then N-ion beam was bombared in order to mix the atoms at the film/substrate interface. Additional $4,000{\AA}$-thick Cu film was the coated. Subsequently, the ion mixide Cu on aluminum oxide was annealed at $200^{\circ}C$ and $300^{\circ}C$ in vacuum.

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A Study on the Phase Formation and Sequence in Co/Si System during Ion Beam Mixing (Ion Beam Mixing에 의한 Co/Si 계의 상 형성 및 전이에 관한 연구)

  • 최정동;곽준섭;백홍구;황정남
    • Journal of the Korean Vacuum Society
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    • v.4 no.1
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    • pp.26-31
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    • 1995
  • 본 연구에서는 Co/Si 계에 대한 이온선 혼합실험을 온도와 이온선량을 변수로 하여 실시하였고, Co/Si 계에 대한 상형성 과정을 금속/Si 계에 대한 이온선 혼합시의 비정질상 및 결정상 형성예측 모델(ADF Model)과 초기 결정상 예측 모델(PDF Model)을 이용하여 해석하였다. 이온선 혼합은 80KeV 가속기를 이용하여 상온$-400^{\circ}C$의 온도 범위에서 1.0X1015Ar+/$\extrm{cm}^2$-2.0X1016Ar+/$\textrm{cm}^2$의 이온선량을 변화시키면서 실험하였으며 상분석은 투과전자현미경(TEM)과 X선 회절 분석을 이용하였다. Co/Si 계에서 이온선 혼합시 형성되는 초기 결정상은 Co2Si이며 이온선량의 증가에 따라 CoSi로 상전이하였다. 이러한 실험 결과는 비정질상 및 결정상 형성 예측 모델(ADF model)과 초기 결정상 예측모델(PDF model)의 예측결과와 매우 잘 일치하고 있다. 이상의 연구 결과로부터 ADF 모델과 PDF모델을 이용하여 박막에서 형성되는 상을 보다 정확히 예측할 수 있음을 알 수 있었다.

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