• Title/Summary/Keyword: Interfacial Layer

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Deformation and Fracture Analysis of Honeycomb Sandwich Composites under Bending Loading (굽힘 하중을 받는 하니컴 샌드위치 복합재료의 변형 및 파괴 해석)

  • Kim Hyoung-Gu;Choi Nak-Sam
    • Composites Research
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    • v.18 no.1
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    • pp.30-37
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    • 2005
  • The bending strength characteristics and local deformation behaviors of honeycomb sandwich composites were investigated using three-point bending experiment and finite element simulation with a real model of honeycomb core. Two kinds of cell sizes of honeycomb core, two kinds of skin layer thicknesses, perfect bonding specimen as well as initial delamination specimen were used for analysis of stress and deformation behaviors of honeycomb sandwich beams. Various failure modes such as skin layer yielding, interfacial delamination, core shear deformation and local buckling were considered. Its simulation results were very comparable to the experimental ones. Consequently, cell size of honeycomb core and skin layer thickness had dominant effects on the bending strength and deformation behaviors of honeycomb sandwich composites. Specimens of large core cell size and thin skin layer showed that bending strength decreased by $30\~68\%$.

Structural and electrical characterizations of $HfO_{2}/HfSi_{x}O_{y}$ as alternative gate dielectrics in MOS devices (MOS 소자의 대체 게이트 산화막으로써 $HfO_{2}/HfSi_{x}O_{y}$ 의 구조 및 전기적 특성 분석)

  • 강혁수;노용한
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2001.07a
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    • pp.45-49
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    • 2001
  • We have investigated physical and electrical properties of the Hf $O_2$/HfS $i_{x}$/ $O_{y}$ thin film for alternative gate dielectrics in the metal-oxide-semiconductor device. The oxidation of Hf deposited directly on the Si substrate results in the H $f_{x}$/ $O_{y}$ interfacial layer and the high-k Hf $O_2$film simultaneously. Interestingly, the post-oxidation N2 annealing of the H102/H1Si70y thin films reduces(increases) the thickness of an amorphous HfS $i_{x}$/ $O_{y}$ layer(Hf $O_2$ layer). This phenomenon causes the increase of the effective dielectric constant, while maintaining the excellent interfacial properties. The hysteresis window in C-V curves and the midgap interface state density( $D_{itm}$) of Hf $O_2$/HfS $i_{x}$/ $O_{y}$ thin films less than 10 mV and ~3$\times$10$^{11}$ c $m^{-2}$ -eV without post-metallization annealing, respectively. The leakage current was also low (1$\times$10-s A/c $m^2$ at $V_{g}$ = +2 V). It is believed that these excellent results were obtained due to existence of the amorphous HfS $i_{x}$/ $O_{y}$ buffer layer. We also investigated the charge trapping characteristics using Fowler-Nordheim electron injection: We found that the degradation of Hf $O_2$/HfS $i_{x}$/ $O_{y}$ gate oxides is more severe when electrons were injected from the gate electrode.e electrode.e.e electrode.e.

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Interfacial Reactions of Sn-Ag-Cu solder on Ni-xCu alloy UBMs (Ni-xCu 합금 UBM과 Sn-Ag계 솔더 간의 계면 반응 연구)

  • Han Hun;Yu Jin;Lee Taek Yeong
    • Proceedings of the International Microelectronics And Packaging Society Conference
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    • 2003.11a
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    • pp.84-87
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    • 2003
  • Since Pb-free solder alloys have been used extensively in microelectronic packaging industry, the interaction between UBM (Under Bump Metallurgy) and solder is a critical issue because IMC (Intermetallic Compound) at the interface is critical for the adhesion of mechanical and the electrical contact for flip chip bonding. IMC growth must be fast during the reflow process to form stable IMC. Too fast IMC growth, however, is undesirable because it causes the dewetting of UBM and the unstable mechanical stability of thick IMC. UP to now. Ni and Cu are the most popular UBMs because electroplating is lower cost process than thin film deposition in vacuum for Al/Ni(V)/Cu or phased Cr-Cu. The consumption rate and the growth rate of IMC on Ni are lower than those of Cu. In contrast, the wetting of solder bumps on Cu is better than Ni. In addition, the residual stress of Cu is lower than that of Ni. Therefore, the alloy of Cu and Ni could be used as optimum UBM with both advantages of Ni and Cu. In this paper, the interfacial reactions of Sn-3.5Ag-0.7Cu solder on Ni-xCu alloy UBMs were investigated. The UBMs of Ni-Cu alloy were made on Si wafer. Thin Cr film and Cu film were used as adhesion layer and electroplating seed layer, respectively. And then, the solderable layer, Ni-Cu alloy, was deposited on the seed layer by electroplating. The UBM consumption rate and intermetallic growth on Ni-Cu alloy were studied as a function of time and Cu contents. And the IMCs between solder and UBM were analyzed with SEM, EDS, and TEM.

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Effect of Brake Timing on Joint Interface Efficiency of Aluminum Composites During Friction Welding (알루미늄 복합재료의 마찰용접시 브레이크 타이밍이 접합계면 효율에 미치는 영향)

  • Kim Hyun-Soo;Park In-Duck;Shinoda Takeshi;Kim Tae-Gyu
    • Journal of Powder Materials
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    • v.13 no.1 s.54
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    • pp.62-67
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    • 2006
  • Friction welding of $Al_2O_3$ particulate reinforced aluminum composites was performed and the following conclusions were drawn from the study of interfacial bonding characteristics and the relationship between experimental parameters of friction welding and interfacial bond strength. Highest bonded joint efficiency (HBJE) approaching $100\%$ was obtained from the post-brake timing, indicating that the bonding strength of the joint is close to that of the base material. For the pre-brake timing, HBJE was $65\%$. Most region of the bonded interface obtained from post-brake timing exhibited similar microstructure with the matrix or with very thin, fine-grained $Al_2O_3$ layer. This was attributed to the fact that the fine-grained $Al_2O_3$ layer forming at the bonding interface was drawn out circumferentially in this process. Joint efficiency of post-brake timing was always higher than that of pre-brake timing regardless of rotation speed employed. In order to guarantee the performance of friction welded joint similar to the efficiency of matrix, it is necessary to push out the fine-grained $Al_2O_3$ layer forming at the bonding interface circumferentially. As a result, microstructure of the bonded joint similar to that of the matrix with very thin, fine-grained $Al_2O_3$ layer can be obtained.

Research trend in the development of charge transport materials to improve the efficiency and stability of QLEDs (QLEDs 효율 및 안정성 향상을 위한 전하 수송 소재 개발 동향)

  • Gim, Yejin;Park, Sujin;Lee, Donggu;Lee, Wonho
    • Journal of Adhesion and Interface
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    • v.23 no.2
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    • pp.17-24
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    • 2022
  • Colloidal quantum dots (QDs) have gained attention for applications in quantum dot light emitting diodes (QLEDs) due to their high photoluminescence quantum yield, narrow emission spectra, and tunable bandgap. Nevertheless, non-radiative recombination induced by electron and hole imbalance deteriorates the device efficiency and stability. To overcome the problem, researchers have been trying to enhance hole transport properties of hole transporting layers (HTL) and/or slow down the electron injection in electron transport layer (ETL). Here, we summarize two approaches: i) development of interfacial materials between QD and ETL (or HTL); ii) engineering of HTL by blending or multi-layer approaches.

Interfacial properties of composite shotcrete containing sprayed waterproofing membrane

  • Park, Byungkwan;Lee, Chulho;Choi, Soon-Wook;Kang, Tae-Ho;Kim, Jintae;Choi, Myung-Sik;Jeon, Seokwon;Chang, Soo-Ho
    • Geomechanics and Engineering
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    • v.16 no.4
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    • pp.385-397
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    • 2018
  • This study evaluates the interfacial properties of composite specimens consisting of shotcrete and sprayed waterproofing membrane. Two different membrane prototypes were first produced and tested for their waterproofing ability. Then composite specimens were prepared and their interfacial properties assessed in direct shear and uniaxial compression tests. The direct shear test showed the peak shear strength and shear stiffness of the composites' interface decreased as the membrane layer became thicker. The shear stiffness, a key input parameter for numerical analysis, was estimated to be 0.32-1.74 GPa/m. Shear stress transfer at the interface between the shotcrete and membrane clearly emerged when measuring peak shear strengths (1-3 MPa) under given normal stress conditions of 0.3-1.5 MPa. The failure mechanism was predominantly shear failure at the interface in most composite specimens, and shear failure in the membranes. The uniaxial compression test yielded normal stiffness values for the composite specimens of 5-24 GPa/m. The composite specimens appeared to fail by the compressive force forming transverse tension cracks, mainly around the shotcrete surface perpendicular to the membrane layer. Even though the composite specimens had strength and stiffness values sufficient for shear stress transfer at the interfaces of the two shotcrete layers and the membrane, the sprayed waterproofing membrane should be as thin as possible whilst ensuring waterproofing so as to obtain higher strength and stiffness at the interface.

A study on interfacial characteristics of Ni-Cr alloy by Nb content for Porcelain Fused to Metal Crown (금속소부도재관용 Ni-Cr 합금에 첨가된 Nb이 계면특성에 미치는 영향)

  • Kim, Chi-Young;Choi, Sung-Min
    • Journal of Technologic Dentistry
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    • v.27 no.1
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    • pp.97-104
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    • 2005
  • The effect of Nb on interfacial bonding characteristics of Ni-Cr alloy for porcelain fused to metal crown (PFM) has been studied in order to investigate oxide layer. A specimens, which is 0.8mm in thickness, were fired at 1,000$^{\circ}C$ with four tests such as air, vacuum, air for 5 minutes and vacuum for 5 minutes in order to examine an oxide behavior of alloy surface generated by the adding of Nb to be controlled at a rate of 0, 1, 3 and 5. It observed oxide film form of the fired specimens with optical microscope and scanning electron microscope (SEM), and chemical formation of them with energy disperse X-ray spectroscopy (EDX). The other specimens, which is 2mm in thickness, were fired at 1,000$^{\circ}C$ with air and vacuum in order to analyze the diffusion behaviors of alloy-porcelain interface by X-ray dot mapping. The results of this study were as follows: 1. The observation of microstructure of specimens by SEM showed that the more Nb content is high, the more much intermediate compound of rich Nb is observed. 2. The surface morphology of oxide film is most dense in 3% Nb. The heat treatment in air constitutes denser oxide film than heat treatment under vacuum. 3. The diffusion behavior of oxide layer by X-ray dot mapping showed that Si, Al of porcelain diffuse toward metal.

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A Study on Interfacial Phenomena of Tungsten Fiber Reinforced Aluminium Matrix Composite under Thermal Cycles (W 섬유강화(纖維强化) Al 합금기지(合金基地) 복합재(複合材)의 열(熱)cycle에 따른 계면거동(界面擧動)에 관(關)한 연구(硏究))

  • Huh, J.G.;Kim, J.T.;Hyun, Ch.Y.;Kim, Y.S.;Kim, S.Y.
    • Journal of the Korean Society for Heat Treatment
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    • v.7 no.3
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    • pp.169-174
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    • 1994
  • The reaction layer formed at interface between matrix and fiber has significant effects on the mechanical properties and behaviors of deformation m FRM. In this study, the mechanical properties and interfacial behaviors according to surface finishing on the fibers and according to heat treatment in FRM were investigated. FRM was fibricated by diffusion bonding method. In W/Al alloy composite and W/Al composite, W of which was coated with $WO_3$, the heat treatment was carried out thermal cycling method from 373K to 673K. In W/Al composite, W of which was coated with $WO_3$, growth of interface layer was hardly occured in spite of the increasing various thermal cycles. It was exhibited that oxidized W/Al composite were higher strength than non-oxidezed W/Al composite with the increasing thermal cycles. The compounds of fiber/matrix interface were analyzed into $WAl_{12}$, $WAl_7$, and $AlWO_3$, respectivly. Therefore the interfacial compounds of fiber/matrix seriously affected the mechanical properties and behaviors of deformation in FRM.

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Fabrication and Cell Properties of Flattened Tube Segmented-in-Series Solid Oxide Fuel Cell-Stack Using Decalcomania Paper (전사지를 이용한 다전지식 평관형 고체산화물 연료전지 제작 및 셀 특성)

  • An, Yong-Tae;Ji, Mi-Jung;Park, Sun-Min;Shin, Sang-Ho;Hwang, Hae-Jin;Choi, Byung-Hyun
    • Korean Journal of Materials Research
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    • v.23 no.3
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    • pp.206-210
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    • 2013
  • In the segmented-in-series solid-oxide fuel cells (SIS-SOFCs), fabrication techniques which use decalcomania paper have many advantages, i.e., an increased active area of the electrode; better interfacial adhesion property between the anode, electrolyte and cathode; and improved layer thickness uniformity. In this work, a cell-stack was fabricated on porous ceramic flattened tube supports using decalcomania paper, which consists of an anode, electrolyte, and a cathode. The anode layer was $40{\mu}m$ thick, and was porous. The electrolyte layers exhibited a uniform thickness of about $20{\mu}m$ with a dense structure. Interfacial adhesion was improved due to the dense structure. The cathode layers was $30{\mu}m$ thick with porous structure, good adhesion to the electrolyte. The ohmic resistance levels at 800, 750 and $700^{\circ}C$ were measured, showing values of 1.49, 1.58 and $1.65{\Omega}{\cdot}cm^2$, respectively. The polarization resistances at 800, 750 and $700^{\circ}C$ were measured to be 1.63, 2.61 and $4.17cm^2$, respectively. These lower resistance values originated from the excellent interfacial adhesion between the anode, electrolyte and cathode. In a two-cell-stack SOFC, open-circuit voltages(OCVs) of 1.915, 1.942 and 1.957 V and maximum power densities(MPD) of 289.9, 276.1 and $220.4mW/cm^2$ were measured at 800, 750 and $700^{\circ}C$, respectively. The proposed fabrication technique using decalcomania paper was shown to be feasible for the easy fabrication of segmented-in-series flattened tube SOFCs.

Effect of Low Temperature Annealing on the Magnetoresistance in Co/Cu Artificial Superlattice (Co/Cu인공초격자에서 저온 열처리가 자기저항에 미치는 영향)

  • 민경익;송용진;이후산;주승기
    • Journal of the Korean Magnetics Society
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    • v.3 no.4
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    • pp.305-309
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    • 1993
  • Thermal stability of Co/Cu artificial superlattice (AS) prepared by RF-magnetron sputtering and the effect of low temperature annealing on the magnetoresistance of the AS have been investigated in this work. Dependence of annealing behavior on the Cu spacer thickness, Fe underlayer thickness, and kind of the underlayer was examined and the relationship between the interfacial reaction and magnetoresistance was studied. It turned out that when Co/Cu AS was annealed at low temperature ($<450^{\circ}C$), the magnetoresistance could increase in the case of AS with thick spacer Cu ($20~25\AA$) layer, whereas it decreased in the case of AS with thin spacer Cu ($7\AA$) layer, which of the former is in contrast with previous reports and the latter in consistent with them. The increase of magnetoresistance is due to increase of interfacial atomic sharpness, which is supported by low angle X-ray diffraction analysis. The thermal stability of Co/Cu AS was better in the case of thick Fe underlayered AS. Interfacial reaction (separation of intermixed Co and Cu) could be observed at lower temperature for (200)-textured samples than for (111)-textured samples, which can be interpreted in terms of interdiffusion kinetics depending on the crystallographic orientation.

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