• 제목/요약/키워드: Inspection of Defects

검색결과 642건 처리시간 0.032초

공동주택 사용검사 전 하자 특성 분석 (Analysis on Characteristics of Defects before Inspection for Apartment Use)

  • 이상효;한만천;김재준;이정석
    • 한국산학기술학회논문지
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    • 제21권5호
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    • pp.167-178
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    • 2020
  • 본 논문에서는 사용검사 전 하자로 분류되는 미시공과 변경시공을 대상으로 하자분류체계를 설정하여 세부적인 사용검사 전 하자발생 패턴과 특징을 도출하는 것을 목적으로 한다. 이를 위하여 본 논문에서는 실제로 하자 분쟁이 발생한 공동주택 사례 133건, 약 3,110건의 사용검사 전 하자항목을 활용하여 분석을 실시하였다. 주요 분석결과를 살펴보면, 첫째, 하자중요도 관점에서 마감공사에서 발생하는 사용검사 전 하자들이 상대적으로 높은 순위를 차지하였다. 둘째, 일반적으로 외벽 균열 등과 같은 하자도 매우 중요한 하자로 인식되고 있으나, 사용검사 전 하자들의 경우, 외벽에는 상대적으로 나타나지 않는 것으로 확인되었다. 셋째, 방수공사의 경우, 기전실이나 주차장 등에서 사용검사 전 하자가 주로 발생하는 것으로 확인되었다. 또한 하자중요도 상위 20위 내에 포함되는 하자에 대한 세부 내역을 확인한 결과, 분쟁 소송 과정에서 다양한 쟁점이 발생할 수 있음에 따라 이해관계자 간 이견을 합리적으로 해결할 수 있는 기준이나 대응책 마련이 필요하다.

TFT-LCD의 품질검사기준 설정을 위한 픽셀결점 탐지도 평가 (A study on the detection probabilities of pixel defects with respect to their locations on the TFT-LCD)

  • 김상호;양승준
    • 대한안전경영과학회:학술대회논문집
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    • 대한안전경영과학회 2004년도 춘계학술대회
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    • pp.283-289
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    • 2004
  • The number of pixel defects including bright and black dots on a panel is one of the critical factors determining the quality of TFT-LCD. Since pixel defects on the TFT-LCD panels are sometimes unavoidable, manufacturers have to inspect the panels so that any panel with an unacceptable number of defects will not be delivered to the buyers. However, the buyers demand for the manufacturers to meet different pixel defects tolerances (acceptable number of pixel defects on a TFT-LCD panel) around central(tight) and peripheral(loose) inspection zones. The disagreement in quality standard among different buyers also cause confusions in screening non-confirmative products and unstable yield of production. Few research has focused on the effects of defect locations on a TFT-LCD panel on their detection probabilities and the rational division of defect inspection zones. In this research, experiments were conducted to find the detection probabilities of black dot defects with respect to their varying locations on a TFT-LCD. It is proposed a rational division of inspection zone on a TFT-LCD panel on the basis of detection probabilities of the defects. With these division of inspection zones and the mean defect detection probability within each zone, it is expected to establish a more reasonable pixel defects tolerances.

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주택 재건축 예비평가 자료분석을 통한 분야별 주요결함의 예방·조치방안 (The Management Method for Preventing Frequent Defect about Each Inspection Part from The Data Analysis of Pre-qualification of Residential Building Reconstruction)

  • 김천학;배철학
    • 한국건축시공학회:학술대회논문집
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    • 한국건축시공학회 2008년도 추계 학술논문 발표대회
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    • pp.181-186
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    • 2008
  • The purpose of this study is analyzing the frequent defect about each inspection part of Pre-qualification of residential building reconstruction and finding the cause of occurrence so that can supply a solution of the problem during the plalnning and constructure. The frequent defects are naturally following the deterioration and more occur in the structure body than a skin. The meaning that supply the cause and the managing method for preventing frequent defects about each inspection part is as follows. To prevent the defects, it is needed that the choice of the appropriate materials, giving a sufficient space for facilities, reliable constructure for the part of expecting the defects. The quality of life will go up due to making a good dwelling environment and extending the life cycle of structures from the inspection and managing the part of expecting defects.

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신경회로망을 이용한 원공 결함 패턴 인식에 관한 연구 (A Study on the Pattern Recognition of Hole Defect using Neural Networks)

  • 이동우;홍순혁;조석수;주원식
    • 한국정밀공학회지
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    • 제20권2호
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    • pp.146-153
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    • 2003
  • Ultrasonic inspection of defects has been focused on the existence of defect in structural material and need has much time and expenses in inspecting all the coordinates (x, y) on material surface. Neural networks can have an application to coordinates (x, y) of defects by multi-point inspection method. Ultrasonic inspection modeling is optimized by neural networks Neural networks has trained training example of absolute and relative coordinate of defects, and defect pattern. This method can predict coordinates (x, y) of defects within engineering estimated mean error $\psi$.

LCD 결함 검출을 위한 머신 비전 알고리즘 연구 (Study on Machine Vision Algorithms for LCD Defects Detection)

  • 정민철
    • 반도체디스플레이기술학회지
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    • 제9권3호
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    • pp.59-63
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    • 2010
  • This paper proposes computer visual inspection algorithms for various LCD defects which are found in a manufacturing process. Modular vision processing steps are required in order to detect different types of LCD defects. Those key modules include RGB filtering for pixel defects, gray-scale morphological processing and Hough transform for line defects, and adaptive threshold for spot defects. The proposed algorithms can give users detailed information on the type of defects in the LCD panel, the size of defect, and its location. The machine vision inspection system is implemented using C language in an embedded Linux system for a high-speed real-time image processing. Experiment results show that the proposed algorithms are quite successful.

태양광 웨이퍼의 결함검출을 위한 자동 정밀검사 시스템 개발 (Development of Automatic Precision Inspection System for Defect Detection of Photovoltaic Wafer)

  • 백승엽
    • 한국생산제조학회지
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    • 제20권5호
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    • pp.666-672
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    • 2011
  • In this paper, we describes the development of automatic inspection system for detecting the defects on photovoltaic wafer by using machine vision. Until now, The defect inspection process was manually performed by operators. So these processes caused the produce of poorly-made articles and inaccuracy results. To improve the inspection accuracy, the inspection system is not only configured, but the image processing algorithm is also developed. The inspection system includes dimensional verification and pattern matching which compares a 2-D image of an object to a pattern image the method proves to be computationally efficient and accurate for real time application and we confirmed the applicability of the proposed method though the experience in a complex environment.

병영시설 하자관리를 위한 체크리스트 제안 (Proposal of Checklist for the Management of Defects in Barracks Facilities)

  • 김정섭;방홍순;김옥규
    • 한국건축시공학회:학술대회논문집
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    • 한국건축시공학회 2022년도 봄 학술논문 발표대회
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    • pp.41-42
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    • 2022
  • The management of defects in barracks facilities is carried out in such a way that defects found by the facility's manager are listed and requested to be repaired by the contractor. However, the standards and methods for the inspection of defects in the management of these defects are not specified in detail, so it is difficult to check the defects in detail. In response, the study first analyzed the current status of the number of defects that occurred in 2021 at official residences and barracks of certain units. As a result of the analysis, the number of defects that were not taken care of and that were not taken until the previous month was more than 10 cases on average per month. In order to reduce the number of such defects, major improvements in the field, timing, and safety inspection were found after the inspection of the military's facilities and safety, and the analysis of the manual of maintenance management. In addition, items for improvement of the checklist were derived through an analysis of the repair of defects caused by the unit's official residence and a total of 10 barracks facilities. Based on this, a checklist was proposed to manage defects in barracks facilities through interviews with military facility managers.

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컬러영상을 이용한 실시간 COF 필름 복합 검사시스템 개발 (Development of Real-Time COF Film Complex Inspection System using Color Image)

  • 김용관;이인환
    • 한국기계가공학회지
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    • 제20권10호
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    • pp.112-118
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    • 2021
  • In this study, an inspection method using a color image is proposed to conduct a real-time inspection of covalent organic framework (COF) films to detect defects, if any. The COF film consists of an upper pattern SR and a lower PI. The proposed system detects the defects of more than 20 ㎛ on the SR surface owing to the characteristics of the pattern, whereas on the PI surface, it detects defects of more than 4 ㎛ by utilizing a micro-optical system. In the existing system, it is difficult for the operator to conduct a full inspection through a high-performance microscope. The proposed inspection algorithm performs the inspection by separating each color component using the color contrast of the pattern on the SR side, and on the PI surface it inspects the bonding state of the mounted chip. As a result, it is possible to confirm the exact location of the defects through the SR and PI surface inspections in the implemented inspection.

수중용 선체외판 길함 검사용 장치 개발 (An Underwater Inspection System to Detect Hull Defects of a Ship)

  • 김영진;조영준;이강원;손웅희
    • 한국해양공학회:학술대회논문집
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    • 한국해양공학회 2006년 창립20주년기념 정기학술대회 및 국제워크샵
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    • pp.281-284
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    • 2006
  • After building a ship in a shipyard, there are so many repeated inspection of welding seam defects and painting status before delivering to the ship's owner. An inspection on the bottom part of a ship in commercial service should be done in every two years for the purpose of safety and for the prevention of ship speed deterioration. conventional welding seam inspection systems are rely on the visual inspection by human or the ultrasonic inspection for the selective part of a ship. This paper suggests a remote controlled inspection system for the examination of large ships or steel structures. The proposed system moves in contact with the ship under inspection and have a CCD camera to provide visual-guidance information to a remotely located human worker. Additionally this system utilizes a weld line tracking algorithm for an optimal position control. We verified the effectiveness of the inspection system by experimental data.

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광학스캐닝 메커니즘 및 근적외선 카메라 광학계를 이용한 태양전지 웨이퍼 검사장치 개발 (Development of Inspection System With Optical Scanning Mechanism and Near-Infrared Camera Optics for Solar Cell Wafer)

  • 김경범
    • 반도체디스플레이기술학회지
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    • 제11권3호
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    • pp.1-6
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    • 2012
  • In this paper, inspection system based on optical scanning mechanism is designed and developed for solar cell wafer. It consists of optical scanning mechanism, NIR camera optics, machinery and control system, algorithm of defect detection and software. Optical scanning mechanism is composed of geometrical camera optics and structured hybrid illumination system. It is used to inspection of surface defects. NIR camera optics is used for inspection of defects inside solar cell wafer. It is shown that surface and internal micro defects can be detected in developed inspection system for solar cell wafer.