• Title/Summary/Keyword: InGaAs/GaAs

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A Study on Electrical and Optical Characteristics of InAs/GaAs Self-organized Quantum Dots (InAs/GaAs Self-organized Quantum Dots의 전기.광학적 특성 연구)

  • 김기홍;박종도;배인호;손정식;문병연;이주인
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.14 no.2
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    • pp.99-103
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    • 2001
  • We present a detailed of the interband transitions of InAs/GaAs self-organized quantum dots(QDs) based on surface photovoltage(SPV), photoreflactance(PR) and photoluminescence(PL) spectroscopies. At room temperature, interband absorption transitions of QDs have been observed by using SPV spectrum, which clearly exhibits three well-resolved absorption transitions of QDs have been observed by using SPV spectrum, which clearly exhibits three well-resolved absorption peaks. The absorption line shape is Gaussian-like. Furthermore, the corresponding interband transitions are also observed in PR and PL experiments at 77K.

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Growth Temperature Effects of In0.5Al0.5As Buffer Layer on the Optical Properties of In0.5Ga0.5As/In0.5Al0.5As Multiple Quantum Wells Grown on GaAs (GaAs 기판 위에 성장한 In0.5Ga0.5As/In0.5Al0.5As 다중양자우물의 광학적 특성에 대한 In0.5Al0.5As 버퍼층 성장온도의 영향)

  • Kim, Hee-Yeon;Oh, H.J.;Ahn, S.W.;Ryu, Mee-Yi;Lim, J.Y.;Shin, S.H.;Kim, S.Y.;Song, J.D.
    • Journal of the Korean Vacuum Society
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    • v.19 no.3
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    • pp.211-216
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    • 2010
  • The luminescence properties of $In_{0.5}Ga_{0.5}As/In_{0.5}Al_{0.5}As$ multiple quantum wells (MQWs) grown on $In_{0.5}Al_{0.5}As$ buffer layers have been studied by using photoluminescence (PL) and time-resolved PL measurements. A$1-{\mu}m$ thick $In_{0.5}Al_{0.5}As$ buffer layers were deposited on a 500 nm thick GaAs layer, followed by the deposition of the InGaAs/InAlAs MQWs. In order to investigate the effects of InAlAs buffer layer on the optical properties of the MQWs, four different temperature sequences are used for the growth of InAlAs buffer layer. The growth temperature for InAlAs buffer layer was varied from 320^{\circ}C to $580^{\circ}C$. The MQWs consist of three $In_{0.5}Ga_{0.5}$As wells with different well thicknesses (2.5 nm, 4.0 nm, and 6.0 nm thick) and 10 nm thick $In_{0.5}Al_{0.5}$As barriers. The PL spectra from the MQWs with InAlAs layer grown at lower temperature range ($320-580^{\circ}C$) showed strong peaks from 4 nm QW and 6 nm QW. However, for the MQWs with InAlAs buffer grown at higher temperature range ($320-480^{\circ}C$), the PL spectra only showed a strong peak from 6 nm QW. The strongest PL intensity was obtained from the MQWs with InAlAs layer grown at the fixed temperature of $480^{\circ}C$, while the MQWs with buffer layer grown at higher temperature from $530^{\circ}C$ to $580^{\circ}C$ showed the weakest PL intensity. From the emission wavelength dependence of PL decay times, the fast and slow decay times may be related to the recombination of carriers in the 4 nm QW and 6 nm QW, respectively. These results indicated that the growth temperatures of InAlAs layer affect the structural and optical properties of the MQWs.

Fatigue Life Evaluation of Spot Weldment Using DCPDM (직류전위차법을 이용한 점용접부의 피로수명 평가)

  • 유효선;이송인;권일현;안병국
    • Journal of Welding and Joining
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    • v.19 no.1
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    • pp.58-64
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    • 2001
  • The initiation and propagation lives of fatigue crack were studied for spot weldments composed of cold rolled steel plates(SPC$\times$SPC) and galvanized steel plates(GA$\times$GA) using DC potential drop method(DCPDM). Through the various test results, it was known that the fatigue crack initiation and propagation behaviors in all specimens could be definitely detected by DCPDM. The fatigue crack initiation life( $N_{i}$) detected by DCPDM in SPC$\times$SPC and GA$\times$GA spot weldments increased as the welding current and the nugget diameter( $N_{d}$) increased. The fatigue crack propagation life($\Delta$ $N_{f-i}$) declined as the difference of $N_{i}$ and the fatigue fracture life( $N_{f}$) also increased according to the decrease of fatigue load, $\Delta$P and the increase of nugget diameter. In the same spot weldments, the increase of nugget diameter came to increase fatigue crack propagation life owing to a decrease of stress concentration in front of nugget, especially the increasing extent for GA$\times$GA spot weldment was very high. In the welding current 6kA, $N_{f}$ for GA$\times$GA spot weldment decreased more than that of SPC$\times$SPC specimen due to zinc layer coated in steel plate and undersized nugget diameter. On the other hand, in 8kA and 10kA, the GA$\times$GA spot weldment showed higher $N_{f}$ in spite of lower $N_{i}$, than that of SPC$\times$SPC specimen except 3,000N fatigue load.ue load. load.d.

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The Influence of the Mg-doped p-GaN Layer Activated in the O2 Ambient on the Current-Voltage Characteristics of the GaN-Based Green LEDs (O2 분위기에서 p-GaN 층의 Mg 활성화가 GaN계 녹색 발광소자에 미치는 전류-전압특성)

  • 윤창주;배성준
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.15 no.5
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    • pp.441-448
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    • 2002
  • The electrical properties of the GaN-based green light emitting diodes(LEDs) with the Mg-doped p-GaN layer activated in $N_2$ or $O_2$ ambient have been compared. For the $N_2$ -ambient activation the current-voltage behavior of LEDs has been found to be improved when the Mg dopants activation was performed in the higher temperature. However, for the $O_2$-ambient activation the current-voltage characteristic has been observed to be enhanced when the Mg dopants activation was carried out in the lower temperature. The minimum forward voltage at 20mA was obtained to be 4.8 V for LEDs with the p-GaN layer activated at $900^{\circ}C$ in the $N_2$ ambient and 4.5V for LEDs with the p-GaN layer treated at $700^{\circ}C$ in the $O_2$ambient, repectively. The forward voltage reduction of the LEDs treated in the $O_2$-ambient may be related to the oxygen co-doping of the p-GaN layer during the activation process. The $O_2$ -ambient activation process is useful for the enhancement of the LED performance as well as the fabrication process since this process can activate the Mg dopants in the low temperature.

The Study of a Population and Generation Parameter's Characteristics on PID Gain Tuning with GA in Wide Solution Area (넓은 해영역에서의 GA를 이용한 PID 제어기 게인 조정에 따른 개체수와 세대수 파라미터의 특징에 관한 연구)

  • Jeong, Hwang Hun
    • Journal of Power System Engineering
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    • v.21 no.3
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    • pp.60-65
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    • 2017
  • A GA is one of the best method to find optimal value in searching area. A GA is driven by probabilistic selection that based on the survival of the fittest. So this algorithm need a huge solving time even if it can be used lots of optimizing problem such as structural design, machine learning, system's identification and so on. This GA's characteristic constrain the program to drive offline. Some studies try to use this algorithm on online or reduce the GA's running time with parallel GA or micro GA. Unfortunately these studies still didn't reduce amount of fitness solving. If the chromosome was imported to the system, it affected system's stability. And when the control system uses online GA, it also doesn't have enough learning time. In this study, try to find stability criterion to reduce the chromosome's affection and find the characteristic of the number of population and generation when GA was driven into the wide searching area.

InAlAs/InGaAs schottky barrier enhanced metal semiconductor metal photodiode with very low dark current (매우 낮은 암전류를 가지는 schottky barrier enhanced InAlAs/InGaAs metal semiconductor metal 광다이오드)

  • 김정배;김문정;김성준
    • Journal of the Korean Institute of Telematics and Electronics D
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    • v.34D no.5
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    • pp.61-66
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    • 1997
  • In this paper we report the fabrication of an InGaAs metal-semiconductor-metal (MSM) photodiode(PD) which an InAlAs barrier enhancement layer that has very low dark current and high speed chracteristics. The detector using Cr/Au schottky metal fingers with 4um spacing on a large active area of 300*300um$^{2}$ offers a low dark current of 38nA at 10V, a low capacitance of 0.8pF, and a high 3-dB bandwidth of 2.4 GHz. To our knowledge, these characteristics are better than any previously published results obtained from large area InGaAs MSM PD's. The RC equivalent model and frequency domain current response model considering transit time were also used to analyze the frequency characteristic of the fabricated device.

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Structural Analysis of Low Temperature Processed Schottky Contacts to n-InGaAs (저온공정 n-InGaAs Schottky 접합의 구조적 특성)

  • 이홍주
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.14 no.7
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    • pp.533-538
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    • 2001
  • The barrier height is found to increase from 0.25 to 0.690 eV for Schottky contacts on n-InGaAs using deposition of Ag on a substrate cooled to 77K(LT). Surface analysis leads to an interface model for the LT diode in which there are oxide compounds of In:O and As:O between the metal and semiconductor, leading to behavior as a metal-insulator-semiconductor diode. The metal film deposited t LT has a finer and more uniform structure, as revealed by scanning electron microscopy and in situ metal layer resistance measurement. This increased uniformity is an additional reason for the barrier height improvement. In contrast, the diodes formed at room temperature exhibit poorer performance due to an unpassivated surface and non-uniform metal coverage on a microscopic level.

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Design and Fabrication of 40 ㎓ MMIC Double Balanced Star Mixer using Novel Balun (새로운 발룬 회로를 이용한 40 ㎓ 대역 MMIC 이중 평형 Star 혼합기의 설계 및 제작)

  • 김선숙;이종환;염경환
    • The Journal of Korean Institute of Electromagnetic Engineering and Science
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    • v.15 no.3
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    • pp.258-264
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    • 2004
  • In this paper, MMIC double balanced star mixer for 40 ㎓ was implemented on GaAs substrate with backside vias. In the design of the MMIC mixer, the design of balun and diode was required. A novel balun structure using microstrip to CPS was presented. The 40 ㎓ balun was designed based on the design experience of the scale-down balun by 2 ㎓. The balun may be suitable for fabrication in MMIC process with backside via and can easily be applied for DBM(Double Balanced Mixer). A Schottky diode was designed and implemented using p-HEMT process considering the compatability with other high frequency MMIC's fabricated on p-HEMT base process. Finally, the double balanced star mixer was fabricated using the balun and the p=HEMP Schottky diode. The measured performance of mixer shows 30 ㏈ conversion loss at 18 ㏈m LO power. This insufficient performance is caused by the unwanted diode at AlGaAs junction in vertical structure of p-HEMT. If the p-HEMT's gate is recessed to AlGaAs layer, and so the diode is eliminated, the mixer's performances will be improved.

Improvement in LED structure for enhanced light-emission

  • Park, Seong-Ju
    • Proceedings of the Materials Research Society of Korea Conference
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    • 2003.11a
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    • pp.21-21
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    • 2003
  • To increase the light-emission efficiency of LED, we increased the internal and external quantum efficiency by suppressing the defect formation in the quantum well and by increasing the light extraction efficiency in LED, respectively. First, the internal quantum efficiency was improved by investigating the effect of a low temperature (LT) grown p-GaN layer on the In$\sub$0.25/GaN/GaN MQW in green LED. The properties of p-GaN was optimized at a low growth temperature of 900oC. A green LED using the optimized LT p-type GaN clearly showed the elimination of blue-shift which is originated by the MQW damage due to the high temperature growth process. This result was attributed to the suppression of indium inter-diffusion in MQW layer as evidenced by XRD and HR-TEM analysis. Secondly, we improved the light-extraction efficiency of LED. In spite of high internal quantum efficiency of GaN-based LED, the external quantum efficiency is still low due to the total internal reflection of the light at the semiconductor-air interface. To improve the probability of escaping the photons outside from the LED structure, we fabricated nano-sized cavities on a p-GaN surface utilizing Pt self-assembled metal clusters as an etch mask. Electroluminescence measurement showed that the relative optical output power was increased up to 80% compared to that of LED without nano-sized cavities. I-V measurement also showed that the electrical performance was improved. The enhanced LED performance was attributed to the enhancement of light escaping probability and the decrease of resistance due to the increase in contact area.

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Optical properties of a-plane InGaN/GaN multi-quantum wells with green emission

  • Song, Hoo-Young;Kim, Eun-Kyu;Lee, Sung-Ho;Hwang, Sung-Min
    • Proceedings of the Korean Vacuum Society Conference
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    • 2010.02a
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    • pp.172-172
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    • 2010
  • In the area of optoelectronic devices based on GaN and related ternary compounds, the two-dimensional system like as quantum wells (QWs) has been investigated as an effective structure for improving the light-emitting efficiency. Generally, the quantum well active regions in III-nitride light-emitting diodes grown on conventional c-plane sapphire substrates have critical problems given by the quantum confined Stark effect (QCSE) due to the effects of strong piezoelectric and spontaneous polarizations. However, the QWs grown on nonpolar templates are free from the QCSE since the polar-axis lies within the growth plane of the template. Also the unique characteristic of linear polarized light emission from nonpolar QW structures is attracting attentions because it is proper to the application of back-light units of liquid crystal display. In this study, we characterized optical properties of the a-plane InGaN/GaN QW structures by temperature-dependent photoluminescence (TDPL) measurements. From the photoluminescence (PL) spectrum measured at 300 K, green emission centered at 520 nm was observed for the QW region. Since indium incorporation on nonpolar QWs is lower than that on c-plane, this high indium-doping on a-plane InGaN QWs is not common. Therefore, the effect of high indium composition on optical properties in a-plane InGaN QWs will be extensively studied.

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