• Journal of the Korean Society for Nondestructive Testing
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• v.14 no.2
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• pp.101-111
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• 1994

Electronic speckle pattern interferometry(ESPI) using a CW laser, a video system and an image processor were applied to the in-plane displacement measurements. Unlike traditional strain gauges or Moire method, ESPI method requires no special surface preparation or attachments and it can be measured in-plane displacement without any contact and real time. In this experiment, specimen was loaded in paralled with a loa cell. The specimen was plance to which strain gauges was attached. The study provides an example of how ESPI have been used to measure displacement and strain distribution in this specimen. The results measured by ESPI were compared with the data which were measured by strain gauge method in tensile testing.

• Journal of the Korean Society for Precision Engineering
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• v.21 no.11
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• pp.69-74
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• 2004

This paper presents ESPI system for the measurement of thermal expansion coefficient of STS430 up to 1,00$0^{\circ}C$ . Existing methods, strain gauge and moire have the limitation of contact to object and do not supply the coefficient up to 80$0^{\circ}C$ . There needs to measure the data up to 80$0^{\circ}C$, because heat resistant materials have high melting temperature up to 1,000'E In previous studies related to thermal strain analysis, the quantitative results have not reported by ESPI at high temperature, yet. In-plane ESPI and vacuum chamber for the reduction of air turbulence and oxidation are designed for the measurement of the coefficient up to 1,00$0^{\circ}C$ and speckle correlation fringe pattern images are processed by commercial image filtering tool-smoothing, thinning and enhancement- to obtain quantitative results, which is compared with references data. The comparison shows two data are agreed within 4.1% blow $600^{\circ}C$ however, there is some difference up to $600^{\circ}C$. Also, the incremental ratio of the coefficient is changed up to 80$0^{\circ}C$ . The reason is the phase transformation of STS430 probably begins at 80$0^{\circ}C$

• Journal of the Korean Society for Precision Engineering
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• v.26 no.7
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• pp.65-72
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• 2009

Laser interferometry is widely used as a measuring system in many fields because of its high resolution and its ability to measure a broad area in real-time all at once. In conventional laser interferometry, for example out-of-plane ESPI (Electronic Speckle Pattern Interferometry), in plane ESPI, shearography and holography, it uses PZT or other components as a phase shift instrumentation to extract 3-D deformation data, vibration mode and others. However, in most cases PZT has some disadvantages, which include nonlinear errors and limited time of use. In the present study, a new type of laser interferometry using a laser diode is proposed. Using Laser Diode Sinusoidal Phase Modulating (LD-SPM) interferometry, the phase modulation can be directly modulated by controlling the laser diode injection current thereby eliminating the need for PZT and its components. This makes the interferometry more compact. This paper reports on a new approach to the LD (Laser Diode) Modulating interferometry that involves four-frame phase shift method. This study proposes a four-frame phase mapping algorithm, which was developed to have a guaranteed application, to stabilize the system in the field and to be a user-friendly GUI. In this paper, the theory for LD wavelength modulation and sinusoidal phase modulation of LD modulating interferometry is shown. Using modulating laser and research of measurement algorithm does comparison with existent ESPI measurement algorithm. Algorithm measures using GPIB communication through most LabVIEW 8.2. GPIB communication does alteration through PC. Transformation of measurement object measures through modulating laser algorithm that develops. Comparison of algorithm of modulating laser developed newly with existent PZT algorithm compares transformation price through 3-D. Comparison of 4-frame phase mapping, unwrapping, 3-D is then introduced.

• Proceedings of the KSME Conference
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• 2004.11a
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• pp.772-776
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• 2004

The paper describes the quantitative determination of out-of-plane displacement from result of Shearogrpahy, which can measure the first-order partial derivative of out-of-plane displacement directly. However, the differential sensitivity of Shearography is related to the amount of shearing, which is manually adjustable in optical interferometer and affects the quantitative determination. The relationship between those is inspected by comparing ESPI with Shearography. From the result, the amount of shearing plays a modulation factor of out-of-plane displacement and small amount of shearing gives good agreement with out-of-plane displacement.

• Journal of the Korean Society for Precision Engineering
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• v.21 no.8
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• pp.89-96
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• 2004

Micro-tensile testing system, consisting of a micro tensile loading system and micro-ESPI(Electronic Speckle Pattern Interferometry) system, has been developed for measurement of micro-tensile properties of thin micro-materials. Micro-tensile loading system had a load cell with the maximum capacity of 50N and micro actuator with resolution of 4.5nm in stroke. The system was used to apply a tensile load to the micro-sized specimen. During tensile loading, the micro-ESPI system acquired interferornetric speckle patterns in the deformed specimen and measured the in-plane tensile strain. The ESPI system consisted of a CCD-camera with a lens and the window-based program developed for this experiment. Using this system, stress-strain curves for 4 kinds of electrolytic copper foil 18$\square$m thick were obtained. From these curves, tensile properties, including the elastic modulus. yielding strength and tensile strength, were determined and also values of the plastic exponent and coefficient based on Ramberg-Osgood relationship were evaluated.

• Journal of the Korean Society of Manufacturing Technology Engineers
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• v.6 no.3
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• pp.52-57
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• 1997

Electronic Speckle Pattern Interferometry(ESPI) using the Model 95 Ar. laser, a video system and an image processor was applied to the in-plane displacement measurements. Unlike traditional strain gauges or Moire method, ESPI method requires no special surface preparation or attachments and can be measured in-plane displacement with no special surface preparation or attachments and can be measured in-plane displacement with no contact and real time. In this experiment specimen was loaded in parallel with a loadcell. The specimen was the cold rolled steel sheet of 2mm thickness, which was attached strain gauges. The study provides an example of how ESPI have been used to measure strain displacement in this specimen. The results measured by ESPI compare with the data which was measured by strain gauge method in tensile testing.

• Journal of the Korean Society for Precision Engineering
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• v.24 no.12
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• pp.104-110
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• 2007

Internal defects are mainly caused by a corrosive action and degradation in the pipe used in a nuclear power plant or factory. The ESPI method have the many advantages when compared with conventional method. The advantage are the area measurement ability at one time and non-contact measurement ability in the real-time. In this paper, we studied on the measurement of a internal defect by using out of plane ESPI technique. Here, we compared the experimental results using out of plane ESPI with the FEM results.

• Proceedings of the Korean Society of Precision Engineering Conference
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• 1997.10a
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• pp.241-244
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• 1997

This paper proposes Electronic Speckle Pattern Interferometry(ESPI) for the quantitative buckling analysis of square tube, which is unable to be measured with previous methods. The quantitative buckling analysis in elasticity is important part to study strain-stress analysis of thick-plated tube and fatigue analysis. However, it is unsolved problem with theory and previous experimental method. The merits of ESPI, Whole-filed measurement and high accurate 3D-displacement measurement make it possible to determinate the buckling analysis in elasticity quantitatively.

• Proceedings of the Korean Society of Precision Engineering Conference
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• 2001.04a
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• pp.239-242
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• 2001

Electronic Speckle Pattern Interferometry(ESPI) was proposed in the 1970's as a method of producing the interferogram without using traditional holographic technique. ESPI is more faster than Holography method, because the interferometric image is recorded and updated by the video camera every 1/30 second and whold-field inspection possibly. In this study using a non-contact optical technique that is suited for in-plane and out-of-plane deformation measurement. Thin plate with crack was analyzed by ESPI to determine the characteristics of vibration mode shape and natural frequency. Also, results of the experiment were compared with Finite Element Method(FEM).

• Journal of the Korean Society for Precision Engineering
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• v.18 no.5
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• pp.90-97
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• 2001

An electronic speckle pattern interferometry (ESPI) system for measuring tensile properties under micro-tensile testing has been developed. The system consists of an optical system and an image processing system. In the optical system, optical components for measurement of in-plane deformation are arranged on the path of He-Ne laser. In the image processing system, the window-based program for acquiring speckle pattern interferometric image was developed and deformation in a small specimen is continuously evaluated during the test. Using this system, tensile strain of copper foil was measured during tensile testing. Tensile specimen had the thickness and width of 22 and 500 ${\mu}{\textrm}{m}$, respectively. Tensile properties, including the elastic modulus, yielding strength and tensile strength, of the copper were evaluated and also plastic exponent and coefficient in the Ramberg-Osgood relationship were evaluated from the stress-strain curve.