• Title/Summary/Keyword: In situ TEM

Search Result 119, Processing Time 0.028 seconds

Practical Issues on In Situ Heating Experiments in Transmission Electron Microscope (투과전자현미경 내 직접 가열 실험에서의 실험적 문제들)

  • Kim, Young-Min;Kim, Jin-Gyu;Kim, Yang-Soo;Oh, Sang Ho;Kim, Youn-Joong
    • Applied Microscopy
    • /
    • v.38 no.4
    • /
    • pp.383-386
    • /
    • 2008
  • In performing in situ heating transmission electron microscopy (TEM) for materials characterizations, arising concerns such as specimen drifts and unintentional Cu contamination are discussed. In particular, we analysed the thermal and mechanical characteristics of in situ heating holders to estimate thermal drift phenomena. From the experimental results, we suggest an empirical model to describe the thermal drift behavior so that we can design an effective plan for in situ heating experiment. Practical approaches to minimize several hindrances arisen from the experiment are proposed. We believe that our experimental recommendations will be useful for a microscopist fascinated with the powerful potential of in situ heating TEM.

TEM sample preparation using micro-manipulator for in-situ MEMS experiment

  • Hyunjong Lee;Odongo Francis Ngome Okello;Gi-Yeop Kim;Kyung Song;Si-Young Choi
    • Applied Microscopy
    • /
    • v.51
    • /
    • pp.8.1-8.7
    • /
    • 2021
  • Growing demands for comprehending complicated nano-scale phenomena in atomic resolution has attracted in-situ transmission electron microscopy (TEM) techniques for understanding their dynamics. However, simple to safe TEM sample preparation for in-situ observation has been limited. Here, we suggested the optical microscopy based micro-manipulating system for transferring TEM samples. By adopting our manipulator system, several types of samples from nano-wires to plate-like thin samples were transferred on micro-electro mechanical systems (MEMS) chip in a single step. Furthermore, the control of electrostatic force between the sample and the probe tip is found to be a key role in transferring process.

In-situ TEM of Carbon Nanotube Field Emitters and Improvement of Electron Emission from Nanotube Films by Laser Treatment

  • Saito, Yahachi;Seko, Kazuyuki;Kinoshita, Jun-ichi;Ishida, Toshiyuki;Yotani, Junko;Kurachi, Hiroyuki;Uemura, Sashiro
    • 한국정보디스플레이학회:학술대회논문집
    • /
    • 2005.07b
    • /
    • pp.1081-1086
    • /
    • 2005
  • Dynamic behavior of carbon nanotubes (CNTs) in an electric field is directly observed by in-situ transmission electron microscopy (TEM). The CNT field emitters examined by in-situ TEM are multiwalled, double-walled and single walled CNTs. Threshold fields for electron emission and sustainable emission currents depending on the structure of CNTs are presented, and degradation mechanism of the CNT field emitters is discussed. In addition to the microscopy studies on individual CNTs, our recent development in surface treatment of CNT layers grown by chemical vapor deposition, which brings about high density of emission current and high uniformity, is also presented.

  • PDF

Dedicated preparation for in situ transmission electron microscope tensile testing of exfoliated graphene

  • Kim, Kangsik;Yoon, Jong Chan;Kim, Jaemin;Kim, Jung Hwa;Lee, Suk Woo;Yoon, Aram;Lee, Zonghoon
    • Applied Microscopy
    • /
    • v.49
    • /
    • pp.3.1-3.7
    • /
    • 2019
  • Graphene, which is one of the most promising materials for its state-of-the-art applications, has received extensive attention because of its superior mechanical properties. However, there is little experimental evidence related to the mechanical properties of graphene at the atomic level because of the challenges associated with transferring atomically-thin two-dimensional (2D) materials onto microelectromechanical systems (MEMS) devices. In this study, we show successful dry transfer with a gel material of a stable, clean, and free-standing exfoliated graphene film onto a push-to-pull (PTP) device, which is a MEMS device used for uniaxial tensile testing in in situ transmission electron microscopy (TEM). Through the results of optical microscopy, Raman spectroscopy, and TEM, we demonstrate high quality exfoliated graphene on the PTP device. Finally, the stress-strain results corresponding to propagating cracks in folded graphene were simultaneously obtained during the tensile tests in TEM. The zigzag and armchair edges of graphene confirmed that the fracture occurred in association with the hexagonal lattice structure of graphene while the tensile testing. In the wake of the results, we envision the dedicated preparation and in situ TEM tensile experiments advance the understanding of the relationship between the mechanical properties and structural characteristics of 2D materials.

Annealing Experiments of Albite Using Optical Microscope Heating Stage (광학현미경 가열실험대를 이용한 알바이트의 등온가열 실험 연구)

  • Park Byung-Kyu;Kim Yong-Jun;Kim Youn-Joong
    • Journal of the Mineralogical Society of Korea
    • /
    • v.18 no.4 s.46
    • /
    • pp.289-299
    • /
    • 2005
  • Annealing experiments on albite powders, thin sections, and TEM specimens have been performed utilizing an optical microscope heating stage. Sample orientations were determined by optical microscope and XRD, and then confirmed by TEM diffraction patterns. Partial melting of samples occurred at $1030^{\circ}C$-l2 hr for powder, but at $1060^{\circ}C$-12 hr for TEM specimen. It is difficult to get TEM images of albite microstructures above this temperature due to thickening and the amorphous phase of the melted part. Correlative studies between optical microscopy and TEM indicated that the $1050^{\circ}C$-12 hr annealing in ambient condition was most adequate to observe tweed microstructures in albite through TEM. In situ TEM heating experiments for direct observation of tweed microstructures in albite may require annealing at slightly higher temperatures than $1050^{\circ}C$ considering the high vacuum condition inside TEM.

An Investigation of In Situ TEM Heating Experiments of Powder Samples (분말 시료의 투과전자현미경 직접 가열 실험법 연구)

  • Kim, Youn-Joong;Jeung, Jong-Man;Lee, Young-Boo;Lee, Su-Jeong;Song, Ji-Ho
    • Applied Microscopy
    • /
    • v.31 no.4
    • /
    • pp.315-323
    • /
    • 2001
  • In situ TEM heating experiments utilizing kaolinite powder samples result in the following facts. (1) The water recirculation system adopted in the Gatan's heating holder is required to prevent specimen drift above $500^{\circ}C$. (2) Since the degree of phase changes depends on the thickness of powders below $600^{\circ}C$, examinations of both thin and thick specimens are required. (3) Sample preparation using Mo-grids is required for TEM heating experiments above $900^{\circ}C$. At these temperature ranges the effect of heating rate and holding time on the phase transition process increases drastically, so that a programmed temperature control is required. (4) TEM heating experiments of the embedded powders by epoxy for the cross-sectional view was limited due to the severe epoxy movement during heating above $300^{\circ}C$. Better methods of sample preparation are required to overcome this problem.

  • PDF

Synthesis and Characterization of Silica/Polystyrene Composite Nanoparticles by in situ Miniemulsion Polymerization (In situ 미니에멀젼중합에 의한 실리카/폴리스타이렌 복합체 나노입자의 합성과 특성)

  • Patole, Archana S.;Patole, S.P.;Song, Mi-Hyang;Yoon, Joo-Young;Kim, Jin-Hwan;Kim, Tae-Ho
    • Elastomers and Composites
    • /
    • v.44 no.1
    • /
    • pp.34-40
    • /
    • 2009
  • New coupling agent or surface modified agent (9-decenoic acid) was used to enhance the compatibility between silica and polystyrene in silica/polystyrene hybrid nanocomposite, synthesized by in situ miniemulsion polymerization. Composites contain well dispersed nanosize silica particles. Related tests and analyses confirmed the success of synthesis. Functionalization of silica by 9-decenoic acid and silica on the polystyrene was confirmed by FTIR. TGA showed presence and amount of silica in final latex. The glass transition temperature of the hybrid nanocomposite was increased with the silica amount. SEM and TEM analysis showed the spherical morphology of PS and composite with an average diameter of 55 nm. The presence of silica within composite was confirmed by EDS attached to the existing TEM.

In-situ TEM investigation of zirconium alloy under Kr+ single-beam and Kr+-He+ dual-beam synergetic irradiation

  • Zhen Wang;Qing-Xue Yan;Zhong-Qiang Fang;Chen-Yang Lu
    • Nuclear Engineering and Technology
    • /
    • v.56 no.8
    • /
    • pp.3129-3138
    • /
    • 2024
  • The in-situ TEM irradiation experiments of zirconium alloy were conducted at 573 K, 673 K, and 773 K utilizing a 400 keV Kr + single beam and a 400 keV Kr+ and 30 keV He + dual beam. The results show that a large number of dislocation loops have been characterized in the matrix of the zirconium alloy under irradiation. With increasing the irradiation damage dose, some dislocation loops have reacted with one another to form a larger dislocation loop, which has finally formed dislocation lines or other defect structures. In zirconium alloys irradiated with Kr + single beam and Kr+ and He + dual-beam radiation, the proportion of <a> type dislocation loops with different Burgers vectors is essentially the same at low damage doses, but the proportion of interstitial type dislocation loops with the same Burgers vectors is obviously different. The amorphization of the second phase and the dissolution of the small-sized second phase were also pointed out. With the increase in temperature, the density of the dislocation loop in zirconium alloy gradually decreases, and the size of dislocation loop first increases and then decreases. Kr+ and He + dual beam irradiation increases the size of dislocation loops but decreases their density as compared with Kr + single beam irradiation.

Investigation of Al Back Contact and BSF Formation by In-situ TEM for Silicon Solar Cells

  • Park, Sungeun;Song, Jooyoung;Tark, Sung Ju;Kim, Young Do;Choi, Chel-Jong;Kwon, Soonwoo;Yoon, Sewang;Kim, Donghwan
    • 한국신재생에너지학회:학술대회논문집
    • /
    • 2010.11a
    • /
    • pp.38.1-38.1
    • /
    • 2010
  • The trend to thinner crystalline silicon solar wafers in production of solar cells investigates re-evolution of back surface field (BSF) formation. We have studied mechanisms of back contact formation in Al evaporation and screen printed Al paste for Si solar cells by TEM analysis. We observed that Si diffuse into Al during heat up. The Si diffusion process made vacancies in Si wafer. The Al began to seep into the Si wafer (Al spike). During heat down, the Al spike were shrink which causes the doped region (BSF).

  • PDF