• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.17 no.10
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• pp.1034-1040
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• 2004

The latch-up current and switching characteristics of MOS-Controlled Thyristor(MCT) are studied with variation of the channel length and impurity concentration. The proposed MCT power device has the lateral structure and P-epitaxial layer in substrate. Two dimensional MEDICI simulator is used to study the latch-up current and forward voltage-drop from the characteristics of I-V and the switching characteristics with variation of impurity concentration. The channel length and impurity concentration of the proposed MCT power device show the strong affect on the anode current and turn-off time. The increase of impurity concentration in P and N channels is found to give the increase of latch-up current and forward voltage-drop.

• Nuclear Engineering and Technology
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• v.55 no.7
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• pp.2489-2497
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• 2023

Co and Eu impurities in the SSCs are nuclides that dominantly influence the neutron-induced radioactive inventory in metal and concrete radwastes (radioactive wastes) during NPP decommission. The impurity concentrations provided by NUREG/CR-3474 were used for the practical range of Co and Eu impurity concentrations to be applied to the code calculations. Metal structures near the core were evaluated to be ILW (intermediate-level waste) for the whole range of Co impurity concentration, so the boundary line between ILW and LLW (low-level waste) has no change for the whole concentration range provided by NUREG/CR-3474. Also, the boundary line between VLLW (very low-level waste) and CW (clearance waste) in the concrete shield could alter a little depending on the Eu impurity concentration within the range provided by NUREG/CR-3474. From this work, it is found that the concentration of material impurities of SSCs gives no critical impact on determining radwaste levels.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.18 no.1
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• pp.17-23
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• 2005

The switching characteristics of MOS-Controlled Thyristor(MCT) is studied with variation of the channel length and impurity concentration in ON and OFF FET channel. The proposed MCT power device has the lateral structure and P-epitaxial layer in substrate. Two dimensional MEDICI simulator and PSPICE simulator are used to study the latch-up current and forward voltage-drop from the characteristics of I-V and the switching characteristics with variation of channel length and impurity concentration in P and N channel. The channel length and N impurity concentration of the proposed MCT power device show the strong affect on the transient characteristics of current and power. The N channel length affects only on the OFF characteristics of power and anode current, while the N doping concentration in P channel affects on the ON and OFF characteristics.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.15 no.8
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• pp.658-663
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• 2002

Hall factor of electrons in $\Gamma$-valley is calculated as functions of temperature, impurity concentration, and nonparabolicity of conduction valleys by taking into account the current density obtained from the Boltzmann transport equation. The dependence of the Hall factor on the temperature is clearly shown in the case of the optical phonon scattering and that on the impurity concentration is obvious in the case of the ionized impurity scattering. As the nonparabolicity of the conduction band increases, the Hall factor due to the acoustic or optic phonon scattering increases, whereas that due to the ionized impurity scattering decreases. The change of the Hall factor can be analysed in terms of the dispersion of relaxation time.

• Journal of the Korean Applied Science and Technology
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• v.16 no.1
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• pp.75-81
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• 1999

HF purification performance of an ion exchange membrane(IEM) was evaluated with 0.5% HF spiked with 10ppb of Fe, Ni and Cu nitrates. The result show that after less than five turnovers through an IEM, the metallic impurity concentration drops below 1ppb. The decrease rate can be fitted to a model assuming the experimental tanks to be continuously stirred tank reaction and that the metallic impurity concentration after the IEM is a function of the single-pass purification efficiency of the membrane, the concentration before purification and the metals desorbed form the IEM. The Concentration after purification was investigated up to a cumulative Fe loading of 300ppb in the 23 liter recirculated loop. It increases linearly vs. cumulative loading and can be explained by the Langmuir theory resulting in a purification efficiency at the equilibrium of close to 99.5% in this loading regime.

• Mass Spectrometry Letters
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• v.12 no.1
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• pp.26-30
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• 2021

The impurity concentration is a crucial parameter for semiconductor thin films. Evaluating the impurity distribution in silicon thin film is another challenge. In this study, we have investigated the doping concentration of boron in silicon thin film using time of flight secondary ion mass spectrometry in dynamic mode of operation. Boron doped silicon film was grown on i) p-type silicon wafer and ii) borosilicate glass using hot wire chemical vapor deposition technique for possible applications in optoelectronic devices. Using well-tuned SIMS measurement recipe, we have detected the boron counts 101~104 along with the silicon matrix element. The secondary ion beam sputtering area, sputtering duration and mass analyser analysing duration were used as key variables for the tuning of the recipe. The quantitative analysis of counts to concentration conversion was done following standard relative sensitivity factor. The concentration of boron in silicon was determined 1017~1021 atoms/㎤. The technique will be useful for evaluating distributions of various dopants (arsenic, phosphorous, bismuth etc.) in silicon thin film efficiently.

• Journal of Nuclear Fuel Cycle and Waste Technology(JNFCWT)
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• v.14 no.2
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• pp.91-100
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• 2016

The neutron activation inventories in reactor vessel and its internals, and bio-shield of a PWR nuclear power plant were calculated to evaluate the effect of impurity elements contained in the structural materials on the activation inventory. Carbon steel is, in this work, used as the reactor vessel material, stainless steel as the reactor vessel internals, and ordinary concrete as the bio-shield. For stainless steel and carbon steel, one kind of impurity concentration was employed, and for ordinary concrete five kinds were employed in this study using MCNP5 and FISPACT for the calculation of neutron flux and activation inventory, respectively. As the results, specific activities for the cases with impurity elements were calculated to be more than twice than those for the cases without impurity elements in stainless and carbon steel. Especially, the specific activity for the concrete material with impurity elements was calculated to be 30 times higher than that without impurity. Neutron induced reactions and activation inventories in each material were also investigated, and it is noted that major radioactive nuclide in steel material is Co-60 from cobalt impurity element, and, in concrete material, Co-60 and Eu-152 from cobalt and europium impurity elements, respectively. The results of this study can be used for nuclear decommissioning plan during activation inventory assessment and regulation, and it is expected to be used as a reference in the design phase of nuclear power plant, considering the decommissioning of nuclear power plants or nuclear facilities.

• Journal of Nuclear Fuel Cycle and Waste Technology(JNFCWT)
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• v.21 no.2
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• pp.193-204
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• 2023

To ensure radiological safety margin in the transport and storage of spent nuclear fuel, it is crucial to perform source term and shielding analyses in advance from the perspective of conservation. When performing source term analysis on UO₂ fuel, which is mostly used in commercial nuclear power plants, uranium and oxygen are basically considered to be the initial materials of the new fuel. However, the presence of impurities in the fuel and structural materials of the fuel assembly may influence the source term and shielding analyses. The impurities could be radioactive materials or the stable materials that are activated by irradiation during reactor power operation. As measuring the impurity concentration levels in the fuel and structural materials can be challenging, publicly available information on impurity concentration levels is used as a reference in this evaluation. To assess the effect of impurities, the results of the source term and shielding analyses were compared depending on whether the assumed impurity concentration is considered. For the shielding analysis, generic cask design data developed by KEPCO-E&C was utilized.

• Journal of the Korean Vacuum Society
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• v.13 no.1
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• pp.22-28
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• 2004

Ta films were deposited on Si (100) substrates at zero substrate bias voltage and a substrate bias voltage of -125 V ($V_{s}$ = -125 V) using a non-mass separated ion beam deposition system. To investigate the effect of the negative substrate bias voltage on the impurity concentration in the Ta films, secondary ion mass spectrometry (SIMS) was used to determine impurities in the Ta films. By the SIMS depth profiles with $Cs^{+}$ cluster ion beam, high intensities of O, C and Si were clearly found in the Ta film at $V_{s}$ = 0 V, whereas these impurities remarkably decreased in the Ta film at $V_{s}$ = -125 V. Furthermore, from the SIMS result with $Cs^{+}$ and $O_2^{+}$ ion beams, it was found that applying the negative substrate bias voltage could affect individual impurity contents in the Ta films during the deposition. Discussions concerning the effect of the negative substrate bias voltage on the impurity concentration of Ta films will be described in details.

• Proceedings of the Korean Vacuum Society Conference
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• 2004.02a
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• pp.35-35
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• 2004