• Proceedings of the KIEE Conference
• /
• 2004.07c
• /
• pp.1567-1569
• /
• 2004

유기발광 소자의 전공 수송층 재료로 많이 쓰이고 있는 N,N'-diphenyl-N,N'-(3-methylphenyl)-1,1'-biphenyl-4-4'-diamine(TPD)는 OLED소자가 연속적으로 작동하게 되면 TPD박막이 결정화되는데, 이러한 결정화는 디스플래이 소자에 dark spot(흑점)의 문제점을 가져왔다. 이러한 원인을 제거하기 위해서 ITO위에 PolyThiophene을 완충층으로 제작함으로써, OLED 소자의 효율에 미치는 영향은 크다고 할수 있다. 자체 제작한 플라즈마 중합장치의 중합조건과 중합체 PolyThiophene의 분자구조를 알아보았다.

• Proceedings of the Korean Vacuum Society Conference
• /
• 2012.08a
• /
• pp.378-379
• /
• 2012

ITO 만큼 높은 전도성과 광학적 투과성을 갖는 Al-doped ZnO (AZO) 박막을 DC-Pulse magnetron sputtering을 이용하여 40 nm 두께로 증착 후 리소그라피 공정을 통해 $30{\mu}m$ 간격으로 패터닝 하였다. 간격 30 ${\mu}m$로 배열된 AZO를 촉매층으로 하는 수열합성법을 리사이클 공정을 반복하여 수행하여 ZnO 나노선을 성장시켰다. 이와 같이 AZO 전극 사이에 길이 $30{\mu}m$의 ZnO 나노선이 래터럴 구조로 연결된 소자의 $NH_3$ 가스감지 특성을 조사하였다. 합성된 나노선의 전기적, 광학적, 구조적인 특성을 분석하여 높은 가스 감지도를 예상할 수 있는 특성을 확인하였다. 제작된 가스센서를 진공 챔버에 설치 후 양 전극간에 동작전압(Operating voltage)을 1 V로 인가하여 고정한 후에 $NH_3$를 주입(Injection)과 퍼지(Purge)를 반복하며 그 주입량(10 ppm, 20 ppm, 40 ppm, 60 ppm)에 변화를 주었고, 그에 따른 전류변화를 관찰하여 $NH_3$ 가스감지특성을 평가하였다.

• Proceedings of the Korean Vacuum Society Conference
• /
• 2012.08a
• /
• pp.414-414
• /
• 2012

차세대 플렉시블 디스플레이 소재로서, 탄소나노뷰브(CNT) 기반의 투명전도막은 기존의 ITO 박막보다 우수한 유연성을 갖기 때문에 많은 관심을 모으고 있다. 특히 낮은 저항과 투과도를 유지하면서 투명 전도막의 내구성을 향상시키는 연구는 상업화에 가장 필요한 연구 분야이다. 본 연구에서는 다층벽 탄소나노튜브(MWCNT)를 이용하여 제작된 투명 전도막의 내구성을 개선하기 위하여 오버 코팅을 통한 물성 개선을 연구하였다. 투명전도막은 PET기판 위에 스프레이 방식을 이용하여 균일하게 코팅하였다. 오버 코팅 물질로는 실리콘계 유무기하이브리드 투명하드 코팅을 적용하였다. 연구결과 오버 코팅층과 CNT 코팅층과의 젖음성이 물성 향상에 가장 많은 영향을 끼치는 것을 관찰하였고, 특히 젖음성이 증가할수록 투과도와 전기전도도가 향상되는 것을 확인하였다. 또한 고온 고습 환경에서 240시간 이상 내구성 테스트 결과, 저항률 변화가 1.1 이하인 것을 확인하였다.

• Korean Journal of Materials Research
• /
• v.26 no.6
• /
• pp.342-346
• /
• 2016

To observe the bonding structure and electrical characteristics of a GZO oxide semiconductor, GZO was deposited on ITO glasses and annealed at various temperatures. GZO was found to change from crystal to amorphous with increasing of the annealing temperatures; GZO annealed at $200^{\circ}C$ came to have an amorphous structure that depended on the decrement of the oxygen vacancies; increase the mobility due to the induction of diffusion currents occurred because of an increment of the depletion layer. The increasing of the annealing temperature caused a reduction of the carrier concentration and an increase of the bonding energy and the depletion layer; therefore, the large potential barrier increased the diffusion current dna the Hall mobility. However, annealing temperatures over $200^{\circ}C$ promoted crystallinity by the defects without oxygen vacancies, and then degraded the depletion layer, which became an Ohmic contact without a potential barrier. So the current increased because of the absence of a potential barrier.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
• /
• v.28 no.7
• /
• pp.433-438
• /
• 2015

Zinc tin oxide transparent thin film transistors (ZTO TTFTs) were fabricated by using $n^+$ Si wafers as gate electrodes. Indium (In), aluminum (Al), indium tin oxide (ITO), silver (Ag), and gold (Au) were employed for source and drain electrodes, and the mobility and the threshold voltage of ZTO TTFTs were observed as a function of electrode. The ZTO TTFTs adopting In as electrodes showed the highest mobility and the lowest threshold voltage. It was shown that Ag and Au are not suitable for the electrodes of ZTO TTFTs. As the results of this study, it is considered that the interface properties of electrode/ZTO are more influential in the properties of ZTO TTFTs than the conductivity of electrode.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
• /
• 2009.06a
• /
• pp.10-10
• /
• 2009

We have fabricated transparent and flexible thin film transistor(TFT) on polyethylene terephthalate(PET) substrate using Zinc Oxide (ZnO) and Indium Tin Oxide (ITO) film as active layer and electrode. The transfer printing method was used for printing the device layer on target plastic substrate at room temperature. This approach have an advantage to separate the high temperature annealing process to improve the electrical properties of ZnO TFT from the device process on plastic substrate. The resulting devices on plastic substrate presented mechanical and electrical properties similar with those on rigid substrate.

• Journal of the Korean Applied Science and Technology
• /
• v.15 no.3
• /
• pp.85-90
• /
• 1998

In this study, organic electroluminescent devices(OELD) with a structure of a glass $substrate/ITO/TPD/Tb(ACAC)_3(Phen-Cl)/Alq_3/Al$ was fabricated by vacuum evaporation method, where Tb complex was known to have green light emitting property. Electroluminescent(EL) and I-V characteristics of this structure were investigated. This triple-layer structure shows the green EL spectrum at the wavelwngth of 546nm, which is almost the same as the PL spectrum of $Pb(ACAC)_3(Phen_Cl)$. It was found in current-voltage(I-V) characteristics of the devices that the operating voltage was about 12V.

• Journal of the Korean Crystal Growth and Crystal Technology
• /
• v.10 no.2
• /
• pp.140-144
• /
• 2000

($Pb_{0.91}$$La_{0.09}$)($Zr_{0.65}$$Ti_{0.35}$)$O_3$ thin films were prepared on ITO-coated glass by spin-coating. As $Pb_{0.9}$$La_{0.1}$)$TiO_3$ thin films were used as seeding layers, formation temperature of perovskite was reduced and theUrosette" structure was disappeared. PLZT thin films with a seeding layer of 40 nm thick showed a (100) preferred orientation and better dielectric and ferroelectric properties.ties.

• Journal of the Korean Vacuum Society
• /
• v.8 no.2
• /
• pp.136-140
• /
• 1999

The stability and response time of $WO_3$ thin films for EC device are critical problems being solved. Those are affected by the species of electrolyte, preparation conditions and fabricating methods of specimen. In this paper, we compared the stabilities of three kinds of tungsten oxide film in electrolyte. Each of three films was prepared by different manufacturing conditions, that is, one is a thermal oxidation film of tungsten metal deposited on pure glass substrate, another is a $WO_3$ film made on ITO glass directly, the other is a thermally oxidized film on tungsten plate. It was observed that thermally oxidized $WO_3$ films has a remarkable stability (the lifetime was above $10^6$ cycle). From these results, we found that the stability was closely related to the stoichiometric bonding between tungsten and oxygen atoms in addition to crystallinity and density of film.

• 한국신재생에너지학회:학술대회논문집
• /
• 2011.05a
• /
• pp.129.2-129.2
• /
• 2011

본 연구에서는 a-Si:H/c-si 구조의 이종접합 태양전지의 p a-Si:H 에미터 층의 박막 조건에 따라 태양전지 특성을 연구하였다. p, n-layer는 PECVD (Plasma-enhanced chemical vapor deposition) i-layer는 HWCVD(Hot wire chemical vapor deposition), ITO는 RF 마그네트론 스퍼터링법으로 제작하였다. p-layer의 도핑 농도, 기판 증착 온도, 증착 높낮이에 따라 특성을 비교 분석 하였다. QSSPC로 minority carrier life time, 자외 가시선 분광분석 장치로 투과 반사도를, Ellipsometer로 흡수 계수, 두께, FTIR로 막의 구성요소 등의 변화를 조사하여 개선된 p a-Si:H의 특성이 이종접합 태양전지에서 효율향상에 영향을 주는지 Photo IV와 EQE를 통하여 조사하였다.