• Title/Summary/Keyword: ICP 플라즈마

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Fabrication of Low Temperature Poly-Silicon by Inductively Coupled Plasma Assisted Magnetron Sputtering (유도결합 플라즈마-마그네트론 스퍼터링 방법을 이용한 저온 폴리실리콘 제조)

  • 유근철;박보환;주정훈;이정중
    • Journal of the Korean institute of surface engineering
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    • v.37 no.3
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    • pp.164-168
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    • 2004
  • Polycrystalline silicon thin films were deposited by inductively coupled plasma (ICP) assisted magnetron sputtering using a gas mixture of Ar and $H_2$ on a glass substrate at $250^{\circ}C$. At constant Ar mass flow rate of 10 sccm, the working pressure was changed between 10mTorr and 70mTorr with changing $H_2$ flow rate. The effects of RF power applied to ICP coil and $Ar/H_2$ gas mixing ratio on the properties of the deposited Si films were investigated. The crystallinity was evaluated by both X-ray diffraction and Raman spectroscopy. From the results of Raman spectroscopy, the crystallinity was improved as hydrogen mixing ratio was increased up to$ Ar/H_2$=10/16 sccm; the maximum crystalline fraction was 74% at this condition. When RF power applied to ICP coil was increased, the crystallinity was also increased around 78%. In order to investigate the surface roughness of the deposited films, Atomic Force Microscopy was used.

Characterization and deposition of ZnO thin films by Reactive Magnetron Sputtering using Inductively-Coupled Plasma (ICP) (유도결합형 플라즈마를 사용한 반응성 마그네트론 스퍼터링에 의한 ZnO 박막 증착 및 특성분석)

  • Kim, Dong-Sun
    • Journal of the Semiconductor & Display Technology
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    • v.10 no.2
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    • pp.83-89
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    • 2011
  • In this study, we investigated the effects of shutter control by Reactive Magnetron Sputtering using Inductively-Coupled Plasma(ICP) for obtaining ZnO thin films with high purity. The surface morphologies and structure of deposited ZnO thin films were characterized using Scanning Electron Microscopy (SEM), Atomic Force Microscopy (AFM) and X-ray Diffractometer (XRD). Also, optical and chemical properties of ZnO thin films were analyzed by Spectroscopic Ellipsometer (SE) and X-ray Photoelectron spectroscopy (XPS). As a result, it observed that ZnO thin films grown at reactive sputtering using shutter control and ICP were higher density, lower surface roughness, better crystallinity than other conventional sputtering deposition methods. For obtaining better quality deposition ZnO thin films, we will investigate the effects of substrate temperature and RF power on shutter control by a reactive magnetron sputtering using inductively-coupled plasma.

Study on the ultra thin film of silicon oxyinitride deposited by plasma - assisted $N_2O$ oxidation in ICP-CVD reactor (ICP-CVD 반응기 내에서 $N_2O$ 플라즈마 산화법을 이용하여 증착된 ultra thin silicon oxynitride films 에 관한 연구)

  • Hwang, Sung-Hyun;Jung, Sung-Wook;Yi, J.
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2006.06a
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    • pp.161-162
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    • 2006
  • Scaling rules for TFT application devices have led to the necessity of ultra thin dielectric films and high-k dielectric layers. In this paper, The advantages of high concentration of nitrogen in silicon oxide layer deposited by using $N_2O$ in Inductively Coupled Plasma Chemical Vapor Deposition (ICP-CVD) reported about Ellipsometric measurement, Capacitance-Voltage characterization and processing conditions.

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The effect of ferrite cores on the inductively coupled plasma driven at 13.56MHz (13.56MHz 유도 결합 플라즈마에서의 강자성체 페라이트 코어의 효과)

  • Lee, Won-Ki;Lee, Kyeong-Hyo;Chung, Chin-Wook
    • Proceedings of the Korean Society Of Semiconductor Equipment Technology
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    • 2005.09a
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    • pp.197-202
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    • 2005
  • Due to high permeability of the ferrite core, the characteristics of the ICP are expected to be greatly improved. We investigated the effect of the ferrite cores on conventional inductively coupled plasma. It was observed that the current and voltage in ike ICP antenna are slightly decreased and the power transfer efficiency is increased. However, due to eddy current and hysterisis loss, plasma density in the ICP with the ferrite cores is not increased. It seems that the ICP with the ferrite cores at low frequency (${\~}$100kHz) will be greatly improved since the losses at the low frequency can be negligible.

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Fabrication of Si substrate for photovoltaic using anti-reflection patterns with nano-protrusion (나노 돌기를 가진 저반사 패턴을 이용한 태양전지용 실리콘 기판 제작)

  • Shin, Ju-Hyeon;Han, Kang-Soo;Lee, Heon
    • 한국신재생에너지학회:학술대회논문집
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    • 2011.05a
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    • pp.104.2-104.2
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    • 2011
  • 세계적으로 환경오염이 심각해짐에 따라 친환경적으로 에너지를 생산하는 기술이 주목받고 있다. 그 중에서도 태양광을 이용하여 전력을 생산하는 태양광 태양전지의 경우 원리가 간단하고 에너지원의 수급이 용이하다는 장점으로 인하여 많은 연구가 진행되고 있다. 그러나 태양광 태양전지의 경우, 태양전지 기판에서의 반사로 인하여 발전 효율이 낮아는 문제점이 있다. 이를 해결하기 위해 텍스처링 공정을 통해 태양전지 기판에서의 반사를 줄이고 태양전지의 효율을 증가시키는 방법이 이용되고 있다. 본 연구에서는 나노 돌기를 가진 저반사 패턴을 이용하여 태양전지용 실리콘 기판을 제작함으로써, 태양전지 기판에서의 반사를 줄이고자 하였다. 나노 돌기를 가진 저반사 패턴이 형성 된 태양전지용 실리콘 기판을 제작하기 위해 ICP 장비를 이용한 $Cl_2$ 플라즈마 식각공정을 진행하였다. 먼저 Au agglomeration 기술을 이용하여 Au nano particle을 실리콘 기판 위에 형성 후, 이를 식각 마스크로 이용하여 ICP 식각을 진행하였다. 이어서 나노 돌기가 형성 된 실리콘 기판 위에 $Cl_2$ 플라즈마에 내식각성이 우수한 레지스트를 이용하여, 나노 임프린트 리소그래피 기술을 통해 저반사 패턴을 형성하였다. 이 방법으로 형성 된 저반사 패턴을 식각 마스크로 사용하여 앞의 공정과 동일한 조건으로 실리콘 기판을 식각하였다. 최종적으로 agglomerated Au particle과 $Cl_2$ 플라즈마에 내식각성이 우수한 레지스트를 이용하여 나노 돌기를 가진 저반사 패턴이 형성된 실리콘 기판을 제작하였다.

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