• Title/Summary/Keyword: Grain v1

Search Result 540, Processing Time 0.022 seconds

Basic Studies for the Breeding of High Protein Rice -V. Effect of planting and harvesting date on the amylose and protein content in rice grain- (수도 고단백계통 육성을 위한 기초적 연구 -V. 파종 및 수확시기가 쌀의 Amylose 및 단백질함량에 미치는 영향-)

  • Huhn-Pal Moon;Mun-Hue Heu
    • KOREAN JOURNAL OF CROP SCIENCE
    • /
    • v.19
    • /
    • pp.14-20
    • /
    • 1975
  • In order to obtain the fundamental informations on the variation of protein and amylose content in rice grain, 4 varieties were subjected to the 5 different harvesting with 5 different plantings. Amylose content in the rice grain were increased by later planting. Protein content of thermo-sensitive rice varieties were decreased while those of photo-sensitive varieties were increased by delayed planting. Interactions among planting date, variety and harvesting date were highly significant for amylose content, but not significant for protein content.

  • PDF

Dielectrical Properties of ZnO Varistor Fabricated by the Method of 3-Composition Seed Grain (3-성분 종입자법으로 제조된 ZnO 바리스터의 유전특성)

  • Kim, D.Y.;Jeong, I.H.;Cho, A.H.;Jang, K.W.;Lee, J.W.
    • Proceedings of the KIEE Conference
    • /
    • 1991.11a
    • /
    • pp.316-320
    • /
    • 1991
  • The dielectric properties of the ZnO varistor fabricated by the method of 3-composition seed grain was studied. In this paper, we present the C-V charateristic for the specimen. The dielectric constant and disppation which changed with additives may be explained on the basis of the deplation layer; the presence of deplation layer has been inferred by donor and state density obtained from the $1/C^2$ vs. V.

  • PDF

Electrical Properties of ZnO-Bi2O3-Sb2O3 Ceramics (ZnO-Bi2O3-Sb2O3 세라믹스의 전기적 특성)

  • Hong, Youn-Woo;Shin, Hyo-Soon;Yeo, Dong-Hun;Kim, Jong-Hee;Kim, Jin-Ho
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
    • /
    • v.21 no.8
    • /
    • pp.738-748
    • /
    • 2008
  • In this study, it has been investigated on the changing behavior of electrical properties in $ZnO-Bi_2O_3-Sb_2O_3$ (Sb/Bi=2.0, 1.0 and 0.5) ceramics. The samples were prepared by conventional ceramic process, and then characterized by I-V, C-V curve plots, impedance and modulus spectroscopy (IS & MS) measurement. The electrical properties of ZBS systems were strongly dependent on Sb/Bi. In ZBS systems, the varistor characteristics were deteriorated noticeably with increasing Sb/Bi and the donor density and interface state density were increased with increasing Sb/Bi. On the other hand, we observed that the grain boundary reacted actively with the ambient oxygen according to Sb/Bi ratio. Especially the grain boundaries of Sb/Bi=0.5 systems were divided into two types, i.e. sensitive to oxygen and thus electrically active one and electrically inactive intergranular one with temperature. Besides, the increased pyrochlore and $\beta$-spinel phase with Sb/Bi ratio caused the distributional inhomogeneity in the grain boundary barrier height and the temperature instability. To the contrary, the grain boundary layer was relatively homogeneous and more stable to temperature change and kept the system highly nonlinear at high Bi-rich phase contents.

Thermal Process Effects on Grain Size and Orientation in (Bi1La1)4Ti3O12 Thin Film Deposited by Spin-on Method (스핀 코팅법으로 증착한 (Bi1La1)4Ti3O12 박막의 후속 열공정에 따른 입자 크기 및 결정 방향성 변화)

  • Kim, Young-Min;Kim, Nam-Kyeong;Yeom, Seung-Jin;Jang, Gun-Eik;Ryu, Sung-Lim;Sun, Ho-Jung;Kweon, Soon-Yong
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
    • /
    • v.20 no.7
    • /
    • pp.575-580
    • /
    • 2007
  • A 16 Mb 1T1C FeRAM device was integrated with BLT capacitors. But a lot of cells were failed randomly during the measuring the bit-line signal distribution of each cell. The reason was revealed that the grain size and orientation of the BLT thin film were severely non-uniform. And the grain size and orientation were severely affected by the process conditions of post heat treatment, especially nucleation step. The optimized annealing temperature at the nucleation step was $560^{\circ}C$. The microstructure of the BLT thin film was also varied by the annealing time at the step. The longer process time showed the finer grain size. Therefore, the uniformity of the grain size and orientation could be improved by changing the process conditions of the nucleation step. The FeRAM device without random bit-fail cell was successfully fabricated with the optimized BLT capacitor and the sensing margin in bit-line signal distribution of it was about 340 mV.

Effect of Sb/Bi Ratio on Sintering and Grain Boundary Properties of ZnO-Bi2O3-Sb2O3-NiO-Cr2O3 Varistor (Sb/Bi비가 ZnO-Bi2O3-Sb2O3-NiO-Cr2O3 바리스터의 소결과 입계 특성에 미치는 영향)

  • Hong, Youn-Woo;Lee, Young-Jin;Kim, Sei-Ki;Kim, Jin-Ho
    • Korean Journal of Materials Research
    • /
    • v.22 no.12
    • /
    • pp.689-695
    • /
    • 2012
  • We have examined the co-doping effects of 1/2 mol% NiO and 1/4 mol% $Cr_2O_3$ (Ni:Cr = 1:1) on the reaction, microstructure, and electrical properties, such as the bulk defects and the grain boundary properties, of ZnO-$Bi_2O_3-Sb_2O_3$ (ZBS; Sb/Bi = 0.5, 1.0, and 2.0) varistors. The sintering and electrical properties of Ni,Cr-doped ZBS, ZBS(NiCr) varistors were controlled using the Sb/Bi ratio. Pyrochlore ($Zn_2Bi_3Sb_3O_{14}$), ${\alpha}$-spinel ($Zn_7Sb_2O_{12}$), and ${\delta}-Bi_2O_3$ were detected for all of compositions. For the sample with Sb/Bi = 1.0, the Pyrochlore was decomposed and promoted densification at lower temperature by Ni rather than by Cr. A homogeneous microstructure was obtained for all of the samples affected by ${\alpha}$-spinel. The varistor characteristics were not dramatically improved (non-linear coefficient, ${\alpha}$ = 5~24), and seemed to form ${Zn_i}^{{\cdot}{\cdot}}$(0.17 eV) and ${V_o}^{\cdot}$(0.33 eV) as dominant defects. From impedance and modulus spectroscopy, the grain boundaries were found to have been divided into two types, i.e., one is tentatively assigned to ZnO/$Bi_2O_3$ (Ni,Cr)/ZnO (0.98 eV) and the other is assigned to a ZnO/ZnO (~1.5 eV) homojunction.

Voltage Enhancement of ZnO Oxide Varistors for Various Y2O3 Doping Compositions

  • Yoon, Jung-Rag;Lee, Chang-Bae;Lee, Kyung-Min;Lee, Heun-Young;Lee, Serk-Won
    • Transactions on Electrical and Electronic Materials
    • /
    • v.10 no.5
    • /
    • pp.152-155
    • /
    • 2009
  • The microstructure and the electrical properties of a ZnO varistor, which was composed of a ZnO-$Bi_2O_3$-$Sb_2O_3$-CoO- $MnO_2$ -NiO-$Nd_2O_3$ system, were investigated at various $Y_2O_3$ addition concentrations. $Y_2O_3$ played a role in the inhibition of the grain growth. As the $Y_2O_3$ content increased, the average grain size decreased from $6.8{\mu}m$ to $4{\mu}m$, and the varistor voltage($V_{1mA}$) greatly increased from 275 to 400 V/mm. The nonlinearity coefficient ($\alpha$) decreased from 72 to 65 with increasing $Y_2O_3$ amount. On the other hand, the leakage current ($I_L$) increased from 0.2 to 0.9 ${\mu}A$. These results confirmed that doping the varistors with $Y_2O_3$ is a promising production route for production of a higher fine-grained varistor voltage ($V_{1mA}$) which can dramatically reduce the size of the varistors.

Structural, optical, and electrical properties on Cu(In,Ga)$Se_2$ thin-films with Cu-defects and In/(In+Ga) ratio (Cu(In,Ga)$Se_2$ 박막의 Cu 결함 및 In, Ga 비율의 변화에 따른 구조적, 광학적, 전기적 특성 연구)

  • Jeong, A.R.;Kim, G.Y.;Jo, W.;Jo, H.J.;Kim, D.H.;Sung, S.J.;Kang, J.K.;Lee, D.H.;Nam, D.H.;Cheong, H.
    • 한국신재생에너지학회:학술대회논문집
    • /
    • 2011.11a
    • /
    • pp.47.1-47.1
    • /
    • 2011
  • We report on a direct measurement of two-dimensional chemical and electrical distribution on the surface of photovoltaic Cu(In,Ga)$Se_2$ thin-films using a nano-scale spectroscopic and electrical characterization, respectively. The Raman measurement reveals non-uniformed surface phonon vibration which comes from different compositional distribution and defects in the nature of polycrystalline thin-films. On the other hand, potential analysis by scanning Kelvin probe force microscopy shows a higher surface potential or a small work function on grain boundaries of the thin-films than on the grain surfaces. This demonstrates the grain boundary is positively charged and local built-in potential exist on grain boundary, which improve electron-hole separation on grain boundary. Local electrical transport measurements with scanning probe microscopy on the thin-films indicates that as external bias is increases, local current is started to flow from grain boundary and saturated over 0.3 V external bias. This accounts for carrier behavior in the vicinity of grain boundary with regard to defect states. We suggest that electron-hole separation at the grain boundary as well as chemical and electrical distribution of polycrystalline Cu(In,Ga)$Se_2$ thin-films.

  • PDF

The Structure and Electrical Characteristics of ZnO Varistors Surface using-Fractal (프랙탈을 이용한 ZnO 바리스터 표면 구조 및 전기적 특성)

  • Oh, Soo-Hong;Hong, Kyung-Jin;Lee, Jin;Lee, Joon-Ung;Kim, Tae-Sung
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
    • /
    • v.13 no.10
    • /
    • pp.834-839
    • /
    • 2000
  • The structural properties that SEM photograph of ZnO varistors surface studied by fractal mathematics program were investigated to verify the relations of electrical characteristics. The SEM photograph of ZnO varistors surface were changed by binary code and the grain shape of that were analyzed by fractal dimension. The void of ZnO varistors surface was found by fractal program. The relation between grain density and electrical properties depend on fractal dimension. The grain size in ZnO varistors surface was decreased by increasing of Sb$_2$O$_3$ addition. The spinel structure was formed by Sb$_2$O$_3$addition and it was depressed the ZnO grain formation. The grain size of ZnO by Sb$_2$O$_3$addition were from 5 to 10[${\mu}{\textrm}{m}$]. Among of ZnO varistors, fractal dimension of ZnO4 was very high as a 1.764. The density of grain boundary in ZnO2 and ZnO3 varistors surface was 15[%] by formed spinal structure. The breakdown electric field of ZnO2 that fractal dimension has 1.752 was very high to be 8.5[kV/cm]. When the fractal dimensin was high, the grain shape of ZnO varistors was complex and the serial layers of ZnO grain was increased.

  • PDF

Effect of Drift Pin Arrangement for Strength Property of Glulam Connections (드리프트 핀의 배열 형태가 집성재 접합부의 회전 거동 및 강도 성능에 미치는 영향)

  • Lee, In-Chan;Park, Chun-Young;Lee, Jun-Jae
    • Journal of the Korean Wood Science and Technology
    • /
    • v.35 no.3
    • /
    • pp.10-21
    • /
    • 2007
  • It is necessary to study about moment performance of glulam-dowel connections which had been applied rotation. To analyze and predict the moment performance, angled to grain load was replaced with parallel to grain load and perpendicular to grain load. The dowel bending strength and dowel bearing strength were tested. And tensile strength test for connections of two different end distances was performed. Specimens of rotation test were composed with different drift pin numbers and drift pin arrangement. Connection deformation was occurred by plastic behavior of drift pin after yield when tensile load applied at connection. And the absorbing drift pin deflection by end distance continued the connection deformation. When rotation applied at connection that 2 drift pins were arranged parallel to grain (b2h), it showed similar performance with tensile perpendicular to grain. And connection that 2 drift pins were arranged perpendicular to grain (b2v) showed similar performance with tensile parallel to grain. Connection capacity that 4 drift pins were arranged rectangular (b4) showed 1.7 times as strong as connection that 2 drift pins were arranged parallel to grain (b2h). These results agreed predicted values and it is available that rotation replaced with tensile load.

Doping Effect of Yb2O3 on Varistor Properties of ZnO-V2O5-MnO2-Nb2O5 Ceramic Semiconductors

  • Nahm, Choon-Woo
    • Korean Journal of Materials Research
    • /
    • v.29 no.10
    • /
    • pp.586-591
    • /
    • 2019
  • This study describes the doping effect of $Yb_2O_3$ on microstructure, electrical and dielectric properties of $ZnO-V_2O_5-MnO_2-Nb_2O_5$ (ZVMN) ceramic semiconductors sintered at a temperature as low as $900^{\circ}C$. As the doping content of $Yb_2O_3$ increases, the ceramic density slightly increases from 5.50 to $5.54g/cm^3$; also, the average ZnO grain size is in the range of $5.3-5.6{\mu}m$. The switching voltage increases from 4,874 to 5,494 V/cm when the doping content of $Yb_2O_3$ is less than 0.1 mol%, whereas further doping decreases this value. The ZVMN ceramic semiconductors doped with 0.1 mol% $Yb_2O_3$ reveal an excellent nonohmic coefficient as high as 70. The donor density of ZnO gain increases in the range of $2.46-7.41{\times}10^{17}cm^{-3}$ with increasing doping content of $Yb_2O_3$ and the potential barrier height and surface state density at the grain boundaries exhibits a maximum value (1.25 eV) at 0.1 mol%. The dielectric constant (at 1 kHz) decreases from 592.7 to 501.4 until the doping content of $Yb_2O_3$ reaches 0.1 mol%, whereas further doping increases it. The value of $tan{\delta}$ increases from 0.209 to 0.268 with the doping content of $Yb_2O_3$.