• Proceedings of the KIEE Conference
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• 2006.10a
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• pp.55-56
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• 2006

We investigated the diffraction grating efficiency by the DPSS laser beam wavelength to improve the diffraction efficiency on AsGeSeS & Ag/ AsGeSeS thin film. Diffraction efficiency was obtained from DPSS(532nm)(P:P)polarized laser beam on AsGeSeS, Ag/ AsGeSeS and AsGeSeS/Ag/AsGeSeS thin films. As a result, for the laser beam intensity, 0.24 mW, single AsGeSeS thin film shows the highest value of 0.161% diffraction efficiency at 300 s and for 2.4 mW, it was recorded with the fastest speed of 50 s, which the diffraction grating forming speed is faster than that of 0.24 mW beam. Ag/ AsGeSeS and AsGeSeS/ Ag/ AsGeSeS multi-layered thin film also show the faster grating forming speed at 2.4 mW and higher value of diffraction efficiency at 0.24 mW.

• Korean Journal of Environmental Agriculture
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• v.38 no.2
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• pp.96-103
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• 2019

BACKGROUND: This study was conducted to develop selenium (Se)- and germanium (Ge)-enriched rice by foliar spray application of organic or inorganic Se and Ge. METHODS AND RESULTS: The time and frequency of organic or inorganic Se and Ge treatment were performed at the five main growth stages as followings: effective tillering stage (E), maximum tillering stage (M), booting stage (B), heading stage (H), grain filling stage (G). The main treatment plots were consisted of (1) 'once' treatment (at each E, M, B, H, G stage, Se/Ge single apply), (2) 'twice I' (at H + G stages, organic or inorganic Se/Ge apply), (3) 'twice II' (at H + G stages, mixture apply of Se + Ge + pesticide). The organic or inorganic Se treatment concentration was 20 and 40 ppm, and the Ge was 50 and 100 ppm. The Se and Ge contents in rice grain (brown rice and polished rice) were analyzed by inductively coupled plasma (ICP). The highest Se content was noted in brown rice 'twice I' with Se 40 ppm (1394.06) at H + G stages, but the lowest was in 'once' with Se 40 ppm ($367.79{\mu}g{\cdot}kg^{-1}$) at B stage. The highest of Se content in polished rice was found in 'twice I' of Se 40 ppm (1090.25) at H + G stages, but the lowest was in 'once' with Se 40 ppm ($403.53{\mu}g{\cdot}kg^{-1}$) at E stage. On the other hand, The highest of Ge content in brown rice was found in 'twice I' with Ge 100 ppm (398.66) at H + G stages, but the lowest was in 'once' with Ge 100 ppm ($139.64{\mu}g{\cdot}kg^{-1}$) at B stage. The highest of Ge content in polished rice was found in 'twice I' of Ge 100 ppm (300.29) at H + G stages, but the lowest was in 'once' with Ge 100 ppm ($142.24{\mu}g{\cdot}kg^{-1}$) at B stage. CONCLUSION: Se and Ge contents both in brown rice and polished rice treated with organic Se and Ge forms were higher than those of inorganic Se and Ge. Overall results concluded that the supplementation of organic Se and Ge contents in brown and polished rice contents were comparatively higher than the inorganic Se and Ge. This is results also proved that the foliar spray application of organic Se and Ge has positive nutritive effect on the rice for regular consumption.

• Electrical & Electronic Materials
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• v.9 no.2
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• pp.152-158
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• 1996

Optical absorption and photoconductivity spectra of undoped and Co-doped Cd$_{4}$GeSe$_{6}$ single crystals, grown by the chemical transport reaction using iodine as a transporting agent, were investigated. At 20K, the optical energy gaps of the single crystals are 1.934eV for Cd$_{4}$GeSe$_{6}$ and 1.815eV for Cd$_{4}$GeSe$_{6}$ :Co$^{2+}$. The photoconductivity spectra of these single crystals were closely investigated over the temperature range 20-290K. At 20K, the photoconductivity peaks were located at 1.797eV, 1.347eV for Cd$_{4}$GeSe$_{6}$ and 1.815eV, I,.57eV, 1.46eV and 1.38eV for Cd$_{4}$GeSe$_{6}$ :Co$^{2+}$, respectively.ely.

• Journal of the Korean Vacuum Society
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• v.3 no.2
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• pp.227-233
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• 1994

CuAlGeSe4 및 CuAlGeSe4 ; Co2+ 결정을 고순도의 성분원소로부터 합성하고 서냉법으로 결정을 성장시켰다. 이들결정은 chalcopyrite 결정구조를 갖고 있으며 직접전이형 energy gap 구조를 갖고 286K에서 energy gap은 CuAlGeSe4 결정의 경우는 2.394eV이며 CuAlGeSe4 ; Co2+ 결정의 경우는 2.302 eV로 주어졌다. CuAlGeSe4 : Co2+ 결정에서 cobalt에 의한 불순물 광흡수 peak들은 12243, 7002, 3890 cm-1에서 나타났으며 이 peak들은 CuAlGeSe4 : Co2+ 결정의 Td symmetry site에 위치한 Co2+ ion의 energy 준위사이의 전자전이에 의한 optical absorption임을 규명했다.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.20 no.3
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• pp.240-244
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• 2007

We investigated the diffraction grating efficiency by the Diode Pumped Solid State(DPSS 532 nm) laser beam wavelength to improve the diffraction efficiency on $As_{40}Ge_{10}Se_{15}S_{35},\;Ag/As_{40}Ge_{10}Se_{15}S_{35}$ and $As_{40}Ge_{10}Se_{15}S_{35}/Ag/As_{40}Ge_{10}Se_{15}S_{35}$ thin film. Diffraction efficiency was obtained from DPSS laser, used (P:P)polarized laser beam on each thin films. As a result, for the laser beam intensity in $0.24mW/cm^2$, single $As_{40}Ge_{10}Se_{15}S_{35}$ thin film shows the highest value of 0.161% diffraction efficiency at 300 s and for laser beam intensity in $2.4mW/cm^2$, it was recorded with the fastest speed of 50 s(0.013%), which the diffraction grating forming speed is faster than that of $0.24mW/cm^2$ beam. $Ag/As_{40}Ge_{10}Se_{15}S_{35}$ double layer and $As_{40}Ge_{10}Se_{15}S_{35}/Ag/As_{40}Ge_{10}Se_{15}S_{35}$ multi-layered thin film also show the faster grating forming speed at $2.4mW/cm^2$ and higher value of diffraction efficiency at $0.24mW/cm^2$.

• Proceedings of the Korean Vacuum Society Conference
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• 2011.02a
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• pp.62-62
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• 2011

현재 TFT의 주요 재료로 사용되는 비정질 실리콘은 전하 이동도가 매우 작아 고속 스위칭과 같은 고성능을 구현하기 어려우며 이동도 향상을 위해 고온 공정이 적용되야 하는 단점을 가지고 있다. 이러한 문제를 해결하기 위해 전하 이동도가 큰 박막재료를 바탕으로 박막 트랜지스터의 연구개발이 필요하며 이를 위한 해결책 중 새로운 스위칭 동작원리를 제공하며 고 이동도를 갖는 비정질 칼코지나이드 재료가 각광 받고 있다. 본 연구에서는 박막 스위칭 소자 응용을 위해 GeTe 재료를 기반으로 Se을 치환하여 GeSexTe1-x 박막을 제작한 후 소자의 전기적 특성을 평가하였다. GeTe 박막의 결정화 온도는 $187^{\circ}C$였으며 Se을 점진적으로 첨가한 GeSexTe1-x (X=0.2, 0.4, 0.6) 박막의 경우 각각 $213^{\circ}C$, $240^{\circ}C$, $287^{\circ}C$로 측정되었다. 이는 상대적으로 Ge과 Se의 결합에너지가 Ge과 Te의 결합에너지 보다 크기 때문에 Se 함량의 증가에 따라 비정질상의 안정성이 증가된 것으로 판단된다. 비교적 열적 안정성이 높은 3가지의 각각 다른 Se함량을 가진 Ge1.07 Se0.50 Te0.43, Ge1.07 Se0.68 Te0.26, Ge0.95 Se0.90 Te0.15의 소자를 제작하여 스위칭 특성을 분석하였다. GeTe의 경우 전형적인 메모리 스위칭 특성이 나타난 반면 위의 조성을 갖는 박막의 경우 반복적인 문턱 스위칭 특성을 보였다. 이는 Se이 첨가되면서 열적 안정성의 증가로 인해 스위칭이 일어난 후에도 비정질 상을 유지하기 때문이라 판단된다. 각각 제작된 소자에서 인가 전압의 증가와 펄스의 rising time 감소에 따라 더 빠른 스위칭 시간을 보였으며 Se함량이 감소함에 따라 스위칭 전압 또한 감소하는 것을 확인하였다. On 상태의 저항은 Se 함량에 따라 크게 차이가 없었지만 Off 상태의 저항은 Se 함량이 증가됨에 따라 증가되는 것을 확인하였다. 결과적으로 Se 함량에 따른 스위칭 특성의 최적화를 통해 고성능 스위칭 소자에 적용될 수 있을 것이라 판단된다.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2006.11a
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• pp.112-113
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• 2006

In this paper. we investigated a characteristic of holographic grating data erasure with non-polarized beam at amorphous chalcogenide As-Ge-Se-S thin film. A sample of holographic grating data was formed with DPSS laser for setup. Then, the erasure process was performed with He-Ne laser vertically at sample. As-Ge-Se-S(single layer). Ag/As-Ge-Se-S(double layer) and As-Ge-Se-S/Ag/As-Ge-Se-S(multi-layer) are manufactured to compare their characteristic of erasure.

• Journal of the Korean Vacuum Society
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• v.18 no.6
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• pp.459-467
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• 2009

$Cd_2GeSe_4$ and $Cd_2GeSe_4:Co^{2+}$ films were prepared on indium-tin-oxide(ITO)-coated glass substrates by using thermal evaporation. The crystallization was achieved by annealing the as-deposited films in flowing nitrogen. X-ray diffraction spectra showed that the $Cd_2GeSe_4$ and the $Cd_2GeSe_4:Co^{2+}$ films were preferentially grown along the (113) orientation. The crystal structure was rhomohedral(hexagonal) with lattice constants of $a=7.405\;{\AA}$ and $c=36.240\;{\AA}$ for $Cd_2GeSe_4$ and $a=7.43\;{\AA}$ and $c=36.81\;{\AA}$ for $Cd_2GeSe_4:Co^{2+}$ films. From the scanning electron microscope images, the $Cd_2GeSe_4$ and $Cd_2GeSe_4:Co^{2+}$ films were plated, and the grain size increased with increasing annealing temperature. The optical energy band gap, measured at room temperature, of the as-deposited $Cd_2GeSe_4$ films was 1.70 eV and increased to about 1.74 eV and of the as-deposited $Cd_2GeSe_4:Co^{2+}$ films was 1.79 eV and decreased to about 1.74 eV upon annealing in flowing nitrogen at temperatures from $200^{\circ}C$ to $500^{\circ}C$. The dynamical behavior of the charge carriers in the $Cd_2GeSe_4$ and $Cd_2GeSe_4:Co^{2+}$ films were investigated by using the photoinduced discharge characteristics technique.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2009.06a
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• pp.71-72
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• 2009

칼코게나이드(chalcogenide)계 비정질 반도체는 그들의 독특한 광학적, 전기적 특성 때문에 활발한 연구가 진행되고 있다. 비정질 Se는 유연한 원자구조로 인해 가장 먼저 광학적으로 상용화되었으며, 응용성이 매우 큰 반도체 재료중 하나로 Ge-Se와 같이 Se를 기본으로 한 칼코게나이드 유리 반도체가 주목받고 있다. 따라서 본 연구에서는 비정질 칼코게나이드 $Ge_xSe_{100-x}$(x=25,95) 조성에 대한 광학적 특성을 연구 하였다. 시료는 5N의 순도를 갖는 Ge, Se 물질을 준비하고 조성비에 맞추어서 석영관에 진공 봉입한 후 용융 혼합하여 $Ge_{25}Se_{75}$와 $Ge_{95}Se_5$조성의 두 가지 비정질 벌크를 제작하였다. 열증착 방법으로 유리 기판위에 박막을 제작하였고 UV-vis-NIR spectrophotometer를 사용하여 투과도를 측정하였다. 측정한 스펙트럼을 이용하여 Swanpoel method로 굴절률을 계산하고 특성을 분석하였다.

• Proceedings of the KIEE Conference
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• 2006.07c
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• pp.1428-1429
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• 2006

We investigated the diffraction efficiency, erasing property and rewriting property of diffraction grating with each wavelength of recording beam. A (P:P) polarized light was exposed on AsGeSeS and Ag/AsGeSeS thin film to form a diffraction grating by HeNe(635nm) laser and DPSS(532nm) laser. At the maximum efficiency condition, unpolarized HeNe laser beam was irradiated to erase 1ha generated diffraction grating. The HeNe laser showed more higher diffraction efficiency and the DPSS laser showed more faster diffraction grating time. At erasing and rewriting process, AsGeSeS(61%-85%)thin film showed better property than Ag doped Ag/AsGeSeS(53%-63%) double layer structured thin film.