• Title/Summary/Keyword: Gate Length

Search Result 567, Processing Time 0.022 seconds

Relation of Threshold Voltage and Scaling Theory for Double Gate MOSFET (DGMOSFET의 문턱전압과 스켈링 이론의 관계)

  • Jung, Hak-Kee
    • Journal of the Korea Institute of Information and Communication Engineering
    • /
    • v.16 no.5
    • /
    • pp.982-988
    • /
    • 2012
  • This paper has presented the relation of scaling theory and threshold voltage of double gate(DG) MOSFET. In the case of conventional MOSFET, current and switching frequency have been analyzed based on scaling theory. To observe the possibility of application of scaling theory for threshold voltage of DGMOSFET, the change of threshold voltage has been observed and analyzed according to scaling theory. The analytical potential distribution of Poisson equation has been used, and this model has been already verified. To solve Poisson equation, charge distribution such as Gaussian function has been used. As a result, it has been observed that threshold voltage is grealty changed according to scaling factor and change rate of threshold voltages is traced for scaling of doping concentration in channel. This paper has explained for the best modified scaling theory reflected the influence of two gates as using weighting factor when scaling theory has been applied for channel length and channel thickness.

Tunneling Current of Sub-10 nm Asymmetric Double Gate MOSFET for Channel Doping Concentration (10 nm 이하 비대칭 DGMOSFET의 채널도핑농도에 따른 터널링 전류)

  • Jung, Hakkee
    • Journal of the Korea Institute of Information and Communication Engineering
    • /
    • v.19 no.7
    • /
    • pp.1617-1622
    • /
    • 2015
  • This paper analyzes the ratio of tunneling current for channel doping concentration of sub-10 nm asymmetric double gate(DG) MOSFET. The ratio of tunneling current for off current in subthreshold region increases in the region of channel length of 10 nm below. Even though asymmetric DGMOSFET is developed to reduce short channel effects, the increase of tunneling current in sub-10 nm is inevitable. As the ratio of tunneling current in off current according to channel doping concentration is calculated in this study, the influence of tunneling current to occur in short channel is investigated. To obtain off current to consist of thermionic emission and tunneling current, the analytical potential distribution is obtained using Poisson equation and tunneling current using WKB(Wentzel-Kramers-Brillouin). As a result, tunneling current is greatly changed for channel doping concentration in sub-10 nm asymmetric DGMOSFET, specially with parameters of channel length, channel thickness, and top/bottom gate oxide thickness and voltage.

Drain Induced Barrier Lowering(DIBL) SPICE Model for Sub-10 nm Low Doped Double Gate MOSFET (10 nm 이하 저도핑 DGMOSFET의 SPICE용 DIBL 모델)

  • Jung, Hakkee
    • Journal of the Korea Institute of Information and Communication Engineering
    • /
    • v.21 no.8
    • /
    • pp.1465-1470
    • /
    • 2017
  • In conventional MOSFETs, the silicon thickness is always larger than inversion layer, so that the drain induced barrier lowering (DIBL) is expressed as a function of oxide thickness and channel length regardless of silicon thickness. However, since the silicon thickness is fully depleted in the sub-10 nm low doped double gate (DG) MOSFET, the conventional SPICE model for DIBL is no longer available. Therefore, we propose a novel DIBL SPICE model for DGMOSFETs. In order to analyze this, a thermionic emission and the tunneling current was obtained by the potential and WKB approximation. As a result, it was found that the DIBL was proportional to the sum of the top and bottom oxide thicknesses and the square of the silicon thickness, and inversely proportional to the third power of the channel length. Particularly, static feedback coefficient of SPICE parameter can be used between 1 and 2 as a reasonable parameter.

Development of Gate Choice Model of Subway Station (지하철 역사에서의 출구선택 모형 개발)

  • Park, Ji-Hun;Lee, Seung-Jae;Kim, Ju-Yeong
    • Journal of Korean Society of Transportation
    • /
    • v.28 no.1
    • /
    • pp.15-24
    • /
    • 2010
  • Until now, the location and the size of gate are designed by only experience and intuitive use judgement. However there are no studies that investigated how many people will be using each subway gate depending on the location of gates. Therefore, the purpose of this study is to develop a gate choice model of subway station. The most critical element of a gate choice in subway station is the location of pedestrian's destinations. In this study, the development of the regression model is constructed from data of land use characteristic of station vicinity and the number of bus route and the space structure of station vicinity(Depth concept by Space Syntax analysis and total road length of station vicinity) by using the real data of 30 subway station in Seoul. This study found that subway pedestrian flow are mainly determined by three factors; the total floor space of commercial buildings, Total Depth(space structure index of station vicinity), and the number of bus route. The verification of a proposed model is done by using the real gate pedestrian data of two subway station in Seoul; Gang-nam and Yang-jae. The additional study of how to define the gate impact area is analysed. Therefore, this study will provide the theoretical bases in decision of gate location and size when a new subway station is opened in future.

An analysis on satisfaction level of clinicians on implant surgical guidance system based on computed tomography (컴퓨터 단층 촬영을 기반으로 한 임플란트 가이드 시스템에 대한 임상가의 만족도 분석)

  • Hong, Min-ho;Jin, Ming-Xu;Lee, Du-Hyeong;Lee, Kyu-Bok
    • Journal of Dental Rehabilitation and Applied Science
    • /
    • v.31 no.3
    • /
    • pp.178-185
    • /
    • 2015
  • Purpose: The purpose of this study was to conduct a comparative assessment on the satisfaction level for the two interfaces of surgical guide system (SimPlant and R2GATE), the design and convenience of manufactured surgical guides and the importance of using the surgical guides thereof by means of survey. Materials and Methods: Hereupon, they simulated the implant surgical process by mounting the two manufactured systems of surgical guide on a dental mold, respectively. The study subjects were instructed to complete the questionnaire as to the satisfaction level upon completion of the simulated surgery. This study summarized the data of each question after collecting the completed questionnaires. Then, this study analyzed the summarized data by utilizing statistical program SPSS 20.0 (IBM). Results: R2GATE had a higher value of the satisfaction level on the design and convenience of manufactures surgical guides. R2GATE group ($7.33{\pm}1.26$) was found to have a higher value in terms of the overall satisfaction level compared to SimPlant group ($6.67{\pm}1.26$) (${\alpha}$ = 0.05). Conclusion: The user satisfaction level on the surgical guide manufactured for R2GATE system was to such an extent as it can be widely used in clinical environment. Moreover, the surgical guide manufactured as R2GATE system can guide both the length and direction of a drill simultaneously. As a result, it is highly recommended for those beginners who do not have a lot of experience in implant placement.

Dependence of Subthreshold Current for Channel Structure and Doping Distribution of Double Gate MOSFET (DGMOSFET의 채널구조 및 도핑분포에 따른 문턱전압이하 전류의존성)

  • Jung, Hak-Kee
    • Journal of the Korea Institute of Information and Communication Engineering
    • /
    • v.16 no.4
    • /
    • pp.793-798
    • /
    • 2012
  • In this paper, dependence of subthreshold current has been analyzed for doping distribution and channel structure of double gate(DG) MOSFET. The charge distribution of Gaussian function validated in previous researches has been used to obtain potential distribution in Poisson equation. Since DGMOSFETs have reduced short channel effects with improvement of current controllability by gate voltages, subthreshold characteristics have been enhanced. The control of current in subthreshold region is very important factor related with power consumption for ultra large scaled integration. The deviation of threshold voltage has been qualitatively analyzed using the changes of subthreshold current for gate voltages. Subthreshold current has been influenced by doping distribution and channel dimension. In this study, the influence of channel length and thickness on current has been analyzed according to intensity and distribution of doping.

Quantum-Mechanical Modeling and Simulation of Center-Channel Double-Gate MOSFET (중앙-채널 이중게이트 MOSFET의 양자역학적 모델링 및 시뮬레이션 연구)

  • Kim, Ki-Dong;Won, Tae-Young
    • Journal of the Institute of Electronics Engineers of Korea SD
    • /
    • v.42 no.7 s.337
    • /
    • pp.5-12
    • /
    • 2005
  • The device performance of nano-scale center-channel (CC) double-gate (DG) MOSFET structure was investigated by numerically solving coupled Schr$\"{o}$dinger-Poisson and current continuity equations in a self-consistent manner. The CC operation and corresponding enhancement of current drive and transconductance of CC-NMOS are confirmed by comparing with the results of DG-NMOS which are performed under the condition of 10-80 nm gate length. Device optimization was theoretically performed in order to minimize the short-channel effects in terms of subthreshold swing, threshold voltage roll-off, and drain-induced barrier lowering. The simulation results indicate that DG-MOSFET structure including CC-NMOS is a promising candidates and quantum-mechanical modeling and simulation calculating the coupled Schr$\"{o}$dinger-Poisson and current continuity equations self-consistently are necessary for the application to sub-40 nm MOSFET technology.

Study of charge trap flash memory device having Er2O3/SiO2 tunnel barrier (Er2O3/SiO2 터널베리어를 갖는 전하트랩 플래시 메모리 소자에 관한 연구)

  • An, Ho-Myung
    • Proceedings of the Korean Institute of Information and Commucation Sciences Conference
    • /
    • 2013.05a
    • /
    • pp.789-790
    • /
    • 2013
  • $Er_2O_3/SiO_2$ double-layer gate dielectric shows low gate leakage current and high capacitance. In this paper, we apply $Er_2O_3/SiO_2$ double-layer gate dielectric as a charge trap layer for the first time. $Er_2O_3/SiO_2$ double-layer thickness is optimized by EDISON Nanophysics simulation tools. Using the simulation results, we fabricated Schottky-barrier silicide source/drain transistor, which has10 um/10um gate length and width, respectively. The nonvolatile device demonstrated very promising characterstics with P/E voltage of 11 V/-11 V, P/E speed of 50 ms/500 ms, data retention of ten years, and endurance of $10^4$ P/E cycles.

  • PDF

A study on Current-Voltage Relation for Double Gate MOSFET (DGMOSFET의 전류-전압 특성에 관한 연구)

  • Jung, Hak-Kee;Ko, Suk-Woong;Na, Young-Il;Jung, Dong-Su
    • Proceedings of the Korean Institute of Information and Commucation Sciences Conference
    • /
    • v.9 no.2
    • /
    • pp.881-883
    • /
    • 2005
  • In case is below length 100nm of gate, various kinds problem can be happened with by threshold voltage change of device, occurrence of leakage current by tunneling because thickness of oxide by 1.5nm low scaling is done and doping concentration is increased. SiO$_2$ dielectric substance can not be used for gate insulator because is expected that tunneling current become 1A/cm$^2$ in 1.5nm thickness low. In this paper, devised double gate MOSFET(DGMOSFET) to decrease effect of leakage current by this tunneling. Therefore, could decrease effect of these leakage current in thickness 1nm low of SiO$_2$ dielectric substance. But, very big gate insulator of permittivity should be developed for develop device of nano scale.

  • PDF

a-Si:H TFT Using Ferroelectrics as a Gate Insulator

  • Hur, Chang-Wu;Kung Sung;Jung-Soo, Youk;Sangook Moon;Kim, Jung-Tae
    • Proceedings of the Korean Institute of Information and Commucation Sciences Conference
    • /
    • 2004.05a
    • /
    • pp.53-56
    • /
    • 2004
  • The a-Si:H TFT using ferroelectric of SrTi $O_3$as a gate insulator is fabricated on glass. Dielectric characteristics of ferroelectric are superior to $SiO_2$and S $i_3$ $N_4$. Ferroelctric increases on-current, decreases thresh old voltage of TFT and also improves breakdown characteristics. The a-SiN:H has optical band gap of 2.61 eV, refractive index of 1.8~2.0 and resistivity of 10$^{13}$ - 10$^{15}$ $\Omega$cm, respectively. Insulating characteristics of ferroelectrics are excellent because dielectric constant of ferroelectric is about 60~100 and breakdown strength is over 1MV/cm. TFT using ferroelectric has channel length of 8~20${\mu}{\textrm}{m}$ and channel width of 80~200${\mu}{\textrm}{m}$. And it shows that drain current is 3.4$mutextrm{A}$ at 20 gate voltage, $I_{on}$ / $I_{off}$ is a ratio of 10$^{5}$ - 10$^{8}$ and $V_{th}$ is 4~5 volts, respectively. In the case of TFT without ferroelectric, it indicates that the drain current is 1.5 $mutextrm{A}$ at 20 gate voltage and $V_{th}$ is 5~6 volts. With the improvement of the ferroelectric thin film properties, the performance of TFT using this ferroelectric has advanced as a gate insulator fabrication technology is realized.zed.d.

  • PDF