• Journal of Korea Society of Industrial Information Systems
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• v.18 no.5
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• pp.1-8
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• 2013

This paper presents a variable gain amplifier(VGA) without passive devices. This VGA employes the architecture of current feedback amplifier and variable gain can be achieved by using the GM ratios of two trans-conductance(gm) circuits. To obtain linearity and high gain, it uses current division technique and source degeneration in feedback GM circuits. Input trans-conductance(GM) circuit was biased by using a tunable voltage controller to obtain variable gain. The prototype of the VGA is designed in $0.35{\mu}m$ CMOS technology and it is operating in sub-threshold region for low power consumption. The the gain of proposed VGA is varied from 23dB to 43dB, and current consumption is $2.82{\mu}A{\sim}3{\mu}A$ at 3.3V. The area of VGA is 1$120{\mu}m{\times}100{\mu}m$.

• Proceedings of the IEEK Conference
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• 2003.07b
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• pp.1105-1108
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• 2003

In this paper, we have fabricated the hydrogenated n-channel polysilicon thin film transistor (TFT) with LDD structure and have analyzed the hot carrier degradation characteristics by electrical stress. We have compared the threshold voltage (Vth), sub-threshold slope (S), and trans-conductance (Gm) for devices with LDD (Lightly Doped Drain) structure and non-LDD at same active sizes. We have analyzed the hot carrier effects by the hydrogenation in devices. As a analyzed results, the threshold voltage, sub-threshold slope for n-channel poly-si TFT were increased, trans-conductance was decreased. The effects of hydrogenation in n-channel poly-si TFT with LDD structure were shown the lower variations of characteristics than devices of the non-LDD structure with nomal process.