• 제목/요약/키워드: Full width half maximum

검색결과 424건 처리시간 0.032초

피로과정에서 S45C강의 반가폭과 잔류응력의 변화양상 (The Change of Full Width Half Maximum and Residual Stress during Fatigue Process in S45C Steel)

  • 부명환;박영철;김병수;이종문
    • 비파괴검사학회지
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    • 제22권5호
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    • pp.539-544
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    • 2002
  • 기계구조물의 피로과정에 대한 손상정도를 평가하기 위하여 X선 회절을 이용하여 반가폭 및 하중방향과 수직방향에서의 2축에 대한 잔류응력의 변화를 측정하였다. 반가폭은 피로과정의 초기에는 큰 변화를 보이지만 피로수명 비의 약 $10{\sim}20%$ 이후에는 큰 변화를 보이지 않았다. 2축 방향에 대한 잔류응력은 피로수명비의 40% 전후에서 길이방향의 경우는 감소와 증가를, 폭방향의 경우는 증가와 감소를 하였으며, 응력진폭이 클수록 잔류응력의 절대 값은 커지는 증가하는 경향을 나타내었다.

열화상 기술에 의한 M.C 나일론의 내부 결함에 대한 평가 (The Estimation of Defect of Mono Cast Nylon by Infrared Thermography)

  • 한정섭
    • 한국해양공학회지
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    • 제23권2호
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    • pp.81-86
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    • 2009
  • Infrared thermography was used to determine the location, size, and depth of defects under the surface of M.C nylon. Defects were created in a specimen by back-drilling circular holes. These defects were located at the maximum temperature difference that occurred. The sizes of the defects could be calculated by means of the full width at half of the maximum temperature difference. The depth of a defect could be calculated by the peak time and the maximum temperature difference. The maximum temperature difference between a defect and normal part was decreased with the depth of the defect. And the peak time also slowly appeared with the depth of the defect.

광반도체용 사파이어웨이퍼 기계연마특성 연구 (A Study on the Micro-lapping process of Sapphire Wafers for optoelectronic devices)

  • 황성원;신귀수;김근주;서남섭
    • 한국정밀공학회지
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    • 제21권2호
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    • pp.218-223
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    • 2004
  • The sapphire wafers for blue light emitting devices were manufactured by the implementation of the surface machining technology based on micro-tribology. This process has been performed by Micro-lapping process. The sapphire crystalline wafers were characterized by double crystal X-ray diffraction. The sample quality of crystalline sapphire wafer at surface has a full width at half maximum of 250 arcsec. This value at the surface sapphire wafer surfaces indicated 0.12${mu}m$ sizes. Surfaces of sapphire wafers were mechanically affected by residual stress and surface default. As a result, the value of surface roughness of sapphire wafers measured by AFM(Atom Force Microscope) was 2.1nm.

고감도 단금속 및 쌍금속 표면 플라즈몬 공명 센서 설계를 위한 수치해석 연구 (Numerical Investigation on Surface Plasmon Resonance Sensor Design with High Sensitivity Using Single and Bimetallic Film Structures)

  • 권혁록;이성혁
    • 전기학회논문지
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    • 제58권4호
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    • pp.795-800
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    • 2009
  • Surface plasmon resonance (SPR) has been widely used for biological and chemical sensing applications. The present study investigates numerically the optical characteristics for the single Au film and bimetallic Ag/Au film SPR configurations by using the multiple beam interference matrix (MBIM) method. We use the prism coupling method, especially Kretschmann configuration for excitation of surface plasmon wave (SPW). The estimated results of reflectance, phase shift and magnetic field intensity enhancement factor are provided for finding out the optimum configuration with high sensitivity for SPR measurement. As a result, the optimum thicknesses are found to be 52 nm for a single Au film and 5 nm to 36 nm for bimetallic Ag-Au film. From the comparison of full width half maximum (FWHM) values for reflectance, phase shift, and enhancement of magnetic field intensity, it is concluded that the highest sensitivity can be obtained when using the phase shift for SPR sensor.

광반도체용 사파이어웨이퍼 기계연마특성 연구 (A Study on the Micro-lapping process of Sapphire Wafers for optoelectronic devices)

  • 황성원;김근주;서남섭
    • 한국정밀공학회:학술대회논문집
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    • 한국정밀공학회 2003년도 춘계학술대회 논문집
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    • pp.82-85
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    • 2003
  • The sapphire wafers for blue light emitting devices were manufactured by the implementation of the surface machining technology based on micro-tribology. This process has been performed by Micro-lapping process. The sapphire crystalline wafers were characterized by DCXD(Double Crystal X-ray Diffraction). The sample quality of crystalline sapphire wafer at surface has a FWHM(Full Width at Half Maximum) of 250 arcsec. This value at the sapphire wafer surfaces indicated 0.12${\mu}{\textrm}{m}$ sizes. Surfaces of sapphire wafers were mechanically affected by residual stress and surface default. Also Surfaces roughness of sapphire wafers were measured 2.1 by AFM(Atom Force Microscope).

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열처리에 따른 AlN 단결정의 결정성에 관한 연구 (A study on the crystallinity of AlN single crystals by heat treatment)

  • 강승민
    • 한국결정성장학회지
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    • 제27권3호
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    • pp.105-109
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    • 2017
  • 고주파 유도 가열 장치를 이용하여 승화법으로 성장된 AlN 단결정을 질소 분위기 하에서 $1200^{\circ}C$$1500^{\circ}C$에서 열처리하였다. 열처리 후 단결정 시편들의 표면을 광학현미경으로 관찰하였으며, DCXRD(Double crystal X-ray Diffractometry)를 이용하여 FWHM(Full width of half maximum) 값을 측정하여 결정성의 변화를 평가하였다.

Dual Fabry-Perot Interferometer to Improve the Color Purity of Displays

  • Keun Soo Shin;Jun Yong Kim;Yun Seon Do
    • Current Optics and Photonics
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    • 제7권2호
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    • pp.191-199
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    • 2023
  • We propose a dual Fabry-Perot interferometer (DFPI) structure that combines two Fabry-Perot interferometers. The structure is designed to have spectral peaks in the red, green, and blue regions simultaneously, to be applicable to R, G, and B subpixels without any patterning process. The optimized structure has been fabricated on a glass substrate using a thermal evaporation technique. When the DFPI structure was attached to the quantum-dot color-conversion layer, the full width at half maximum values of the green and red spectra decreased by 47.29% and 51.07% respectively. According to CIE 1931 color space, the DFPI showed a 37.66% wider color gamut than the standard RGB color coordinate. Thus it was experimentally proven that the proposed DFPI structure improved color purity. This DFPI structure will be useful in realizing a display with high color purity.

Simulations of Two-Dimensional Electronic Correlation Spectra

  • 김학진;전성준
    • Bulletin of the Korean Chemical Society
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    • 제22권8호
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    • pp.807-815
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    • 2001
  • Two-dimensional (2D) correlation method, which generates the synchronous and the asynchronous 2D spectrum by complex cross correlation of the Fourier transformed spectra, is an analysis method for the changes of the sample spectrum induced by vari ous perturbations. In the present work, the 2D electronic correlation spectra have been simulated for the cases where the sample spectrum composed of two gaussian bands changes linearly. When only the band amplitudes of the sample spectrum change, the synchronous spectrum shows strong peaks at the band centers of the sample spectrum, but the asynchronous spectrum does not make peaks. When the sample spectrum shifts without changing intensity and width, the synchronous spectrum shows peaks around the initial and final positions of the band maximum and the asynchronous spectrum shows long peaks spanning the shifting range. The band width change produces the complex 2D correlation spectra. When the sample spectrum shifts with band broadening, the width change by 50% of full width at half maximum (FWHM) does not give so large an effect on the correlation spectrum as the spectral shift by one half of FWHM of the sample spectrum.

테라헤르츠 중첩 신호의 FWHM 분석을 통한 유리섬유 복합재료 내부 미세 박리 검출 기술 (Detection of Fine Delamination in Glass Fiber Reinforced Polymer Analyzing Full Width Half Maximum of Superimposed Terahertz Signal)

  • 김헌수;박동운;김상일;김학성
    • Composites Research
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    • 제34권3호
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    • pp.143-147
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    • 2021
  • 유리섬유 복합재료(GFRP) 내부 미세 박리에서 나타나는 테라헤르츠(THz) 중첩 신호의 FWHM 분석을 통한 미세 박리 검출 기술을 연구하였다. 테라헤르츠 시간영역 분광(THz-TDS) 시스템의 반사모드를 통해 유리섬유 복합재료 내부의 미세 박리 크기 별 THz 신호를 측정하였고, 미세 박리 위치에서 반사되어 검출되는 THz 중첩 신호의 Full Width Half Maximum (FWHM) 값을 추출하였다. 이후, 유리섬유 복합재료의 복소굴절률을 측정하여 미세 박리 크기에 따른 미세 박리 위치에서의 THz 중첩 신호 및 FWHM 값을 계산하여 비교하였다. 이론적으로 계산된 THz 중첩 신호로부터 미세 박리 크기와 중첩 신호에서의 FWHM 값의 상관관계를 도출하였으며, 미세 박리 위치에서의 THz 신호로부터 추출된 FWHM의 분석을 통해 미세 박리 크기를 예측할 수 있었다.

높은 정렬 안정성을 갖는 레이저 공진기 구성에 관한 연구 (A Study on configuration of a laser resonator with high alignment stability)

  • 차혁진
    • 한국광학회지
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    • 제11권4호
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    • pp.279-288
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    • 2000
  • 다양한 종류의 펄스형 Nd:YAG 레이저 공진기를 구성하여 출력경의 각도변화에 따른 레이저 출력에너지의 변화를 최대 출력에너지가 반으로 줄어드는 점의 각도변위인 반치폭 (FWHM)을 측정하여 비교하였다. 출력경의 기울어짐에 대하여 높은 반치폭을 갖고 반사경의 각도변화에 대해서도 덜 민감하게 반응하는 안정적인 펄스형 고체 레이저의 새로운 공지기를 구성하였다. ABCD 광선 전파 행렬식을 이용하여 이러한 공지기의 전파행렬식이 단위행렬이 됨을 해석함으로서 높은 정렬 안정성을 가지고 있음을 증명하였다.

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