• Journal of IKEEE
• /
• v.7 no.1 s.12
• /
• pp.9-15
• /
• 2003

An optimized finite-field multiplier is proposed for encryption and error correction devices. It is based on a modified Linear Feedback Shift Register (LFSR) which has lower power consumption and smaller area than prior LFSR-based finite-field multipliers. The proposed finite field multiplier for GF(2n) multiplies two n-bit polynomials using polynomial basis to produce $z(x)=a(x)^*b(x)$ mod p(x), where p(x) is a irreducible polynomial for the Galois Field. The LFSR based on a serial multiplication structure has less complex circuits than array structures and hybrid structures. It is efficient to use the LFSR structure for systems with limited area and power consumption. The prior finite-field multipliers need 3${\cdot}$m flip-flops for multiplication of m-bit polynomials. Consequently, they need 6${\cdot}$m latches because one flip-flop consists of two latches. The proposed finite-field multiplier requires only 4${\cdot}$m latches for m-bit multiplication, which results in 1/3 smaller area than the prior finite-field multipliers. As a result, it can be used effectively in encryption and error correction devices with low-power consumption and small area.

• Journal of the Institute of Electronics Engineers of Korea SD
• /
• v.42 no.2 s.332
• /
• pp.73-82
• /
• 2005

Test data volume and power consumption for scan vectors are two major problems in system-on-a-chip testing. Therefore, this paper proposes a new test data compression/decompression method for low power testing. The method is based on analyzing the factors that influence test parameters: compression ratio, power reduction and hardware overhead. To improve the compression ratio and the power reduction ratio, the proposed method is based on Modified Statistical Coding (MSC), Input Reduction (IR) scheme and the algorithms of reordering scan flip-flops and reordering test pattern sequence in a preprocessing step. Unlike previous approaches using the CSR architecture, the proposed method is to compress original test data, not $T_{diff}$, and decompress the compressed test data without the CSR architecture. Therefore, the proposed method leads to better compression ratio with lower hardware overhead and lower power consumption than previous works. An experimental comparison on ISCAS '89 benchmark circuits validates the proposed method.

• Journal of the Institute of Electronics Engineers of Korea SP
• /
• v.49 no.2
• /
• pp.28-34
• /
• 2012

Various feature extraction algorithms are widely applied to real-time image processing applications for extracting significant features from images. Feature extraction algorithms are mostly combined with image processing algorithms mostly for image tracking and recognition. Feature extraction function is used to supply feature information to the other image processing algorithms and it is mainly implemented in a preprocessing stage. Nowadays, image processing applications are faced with embedded system implementation for a real-time processing. In order to satisfy this requirement, it is necessary to reduce execution time so as to improve the performance. Reducing the time for executing a feature extraction function dose not only extend the execution time for the other image processing algorithms, but it also helps satisfy a real-time requirement. This paper explains FAST (Feature from Accelerated Segment Test algorithm) of E. Rosten and presents FPGA-based embedded hardware accelerator architecture. The proposed acceleration scheme can be implemented by using approximately 2,217 Flip Flops, 5,034 LUTs, 2,833 Slices, and 18 Block RAMs in the Xilinx Vertex IV FPGA. In the Modelsim - based simulation result, the proposed hardware accelerator takes 3.06 ms to extract 954 features from a image with $640{\times}480$ pixels and this result shows the cost effectiveness of the propose scheme.

• Journal of Electrical Engineering and Technology
• /
• v.13 no.6
• /
• pp.2479-2484
• /
• 2018

The filter bank multicarrier modulation (FBMC) technique is one of multicarrier modulation technique (MCM), which is mainly used to improve channel capacity of cognitive radio (CR) network and frequency spectrum access technique. The existing FBMC System contains serial to parallel converter, normal QAM modulation, Radix2 inverse FFT, parallel to serial converter and poly phase filter. It needs high area, delay and power consumption. To further reduce the area, delay and power of FBMC structure, a new clock gating technique is applied in the QAM modulation, radix2 multipath delay commutator (R2MDC) based inverse FFT and unified addition and subtraction (UAS) based FIR filter with parallel asynchronous self time adder (PASTA). The clock gating technique is mainly used to reduce the unwanted clock switching activity. The clock gating is nothing but clock signal of flip-flops is controlled by gate (i.e.) AND gate. Hence speed is high and power consumption is low. The comparison between existing QAM and proposed QAM with clock gating technique is carried out to analyze the results. Conversely, the proposed inverse R2MDC FFT with clock gating technique is compared with the existing radix2 inverse FFT. Also the comparison between existing poly phase filter and proposed UAS based FIR filter with PASTA adder is carried out to analyze the performance, area and power consumption individually. The proposed FBMC with clock gating technique offers low power and high speed than the existing FBMC structures.

• Journal of the Institute of Electronics Engineers of Korea SC
• /
• v.46 no.1
• /
• pp.68-75
• /
• 2009

In this paper, an efficient proposed CDR(Clock and Data Recovery Circuits) using 1/4-rate clock based on dual-interpolator is proposed. The CDR is aimed to overcome problems that using multi-phase clock to decrease the clock generator frequency causes side effects such as the increased power dissipation and hardware complexity, especially when the number of channels is high. To solve these problems, each recovery part generates needed additional clocks using only inverters, but not flip-flops while maintaining the number of clocks supplied from a clock generator the same as 1/2-rate clock method. Thus, the reduction of a clock generator frequency using 1/4-rate clocking helps relax the speed limitation and power dissipation when higher data rate transfer is demanded.

• Journal of the Institute of Electronics Engineers of Korea SC
• /
• v.49 no.3
• /
• pp.31-37
• /
• 2012

This paper presents an efficient hardware architecture to enable the high-speed Givens rotation-based QR decomposition. The proposed architecture achieves a highly parallel givens rotation process by maximizing the number of pivots selected for parallel zero-insertions. Sign-select lookahed (SSL)-CORDIC is also efficiently used for the high-speed givens rotation. The performance of QR decomposition hardware considerably increases compared to the conventional triangular systolic array (TSA) architecture. Moreover, the circuit area of QR decomposition hardware was reduced by decreasing the number of flip-flops for holding the pre-computed results during the decomposition process. The proposed QR decomposition hardware was implemented using TSMC $0.25{\mu}m$ technology. The experimental results show that the proposed architecture achieves up to 70 % speed-up over the TACR/TSA-based architecture for the $8{\times}8$ matrix decomposition.

• The Journal of Korean Institute of Electromagnetic Engineering and Science
• /
• v.26 no.1
• /
• pp.63-70
• /
• 2015

In this paper, a receiver has been developed in a $0.11-{\mu}m$ CMOS technology for 900 MHz RFID communication system applications. The receiver is composed of an envelope detector, a low-pass-filter, a comparator, D flip-flops, as well as an oscillator to provide the clock for digital blocks. The receiver is designed for low power consumption, which would be suitable for passive RFID tags. In this circuit, a digital data slicer was employed instead of the conventional analog data slicer in order to reduce the power consumption. The clock frequency is 1.68 MHz and the circuit operates with a power consumption as small as $5{\mu}W$. The chip size is $325{\mu}m{\times}290{\mu}m$ excluding the probing pads.

• The Journal of the Convergence on Culture Technology
• /
• v.6 no.2
• /
• pp.515-520
• /
• 2020

CMOS used in digital circuit design technology has reached the limit of integration due to quantum tunneling. Quantum-dot cellular automata (QCA), which can replace this, has many advantages such as low power consumption and fast switching speed, so many digital circuits of CMOS have been proposed based on QCA. Among them, the multiplexer is a basic circuit used in various circuits such as D-flip-flops and resistors, and has been studied a lot. However, the existing multiplexer has a disadvantage that space efficiency is not good. Therefore, in this paper, we propose a new multilayered multiplexer using cell interaction and D-latch using it. The multiplexer and D-latch proposed in this paper have improved area, cell count, and delay time, and have excellent connectivity and scalability when designing large circuits. All proposed structures are simulated using QCADesigner to verify operation.

• Journal of the Korean Institute of Telematics and Electronics C
• /
• v.35C no.9
• /
• pp.38-48
• /
• 1998

Generating test patterns for asynchronous sequential circuits remains to be a very difficult problem. There are few algorithms for this problem, and previous works cut feedback loops, and insert synchronous flip-flops in the feedback loops during ATPG. The conventional algorithms are similar to the algorithms for synchronous sequential circuits. This means that the conventional algorithms generate test patterns by modeling asynchronous sequential circuits as synchronous sequential circuits. So, test patterns generated by those algorithms nay not detect target faults when the test patterns are applied to the asynchronous sequential circuit under test. In this paper an algorithm is presented to generate test patterns for asynchronous sequential circuits. Test patterns generated by the algorithm can detect target faults for asynchronous sequential circuits with the minimal possibility of critical race problem and oscillation. And it is guaranteed that the test patterns generated by the algorithm will detect target faults.

• Journal of the Institute of Electronics Engineers of Korea SD
• /
• v.39 no.8
• /
• pp.74-83
• /
• 2002

In order to design a huge VLSI system, the scan testing methodology by employing scan flip-flops(cells) is a popular method to test those If chips. In this case, the connection order of scan cells are not important, and hence the order can be determined in the very final stage of physical design such as cell placement. Using this fact, we propose, in this paper, a scan cell reordering method which minimizes the length of wires for scan chain connections. Especially, our reordering method is newly proposed method in the case when the scan cells are grouped according to their clock domains. In fact, the proposed reordering method reduces the wire length about 13.6% more than that by previously proposed reordering method. Our method may also be applicable for reordering scan chains that have various constraints on the scan cell locations due to the chain grouping.