• The Journal of Korean Institute of Communications and Information Sciences
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• v.40 no.4
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• pp.613-618
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• 2015

This paper proposed a low power CMOS Flash-SAR A/D converter which consists of a Flash A/D converter for 2 most significant bits and a SAR A/D converter with capacitor D/A converter for 8 least significant bits. Employment of a Flash A/D converter allows the proposed circuit to enhance the conversion speed. The SAR A/D converter with capacitor D/A converter provides a low power dissipation. The proposed A/D converter consumes $136{\mu}W$ with a power supply of 1V under a $0.18{\mu}m$ CMOS process and achieves 9.16 effective number of bits for sampling frequency up to 2MHz. Therefore it results in 120fJ/step of Figure of Merit (FoM).

• Journal of IKEEE
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• v.25 no.4
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• pp.770-773
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• 2021

In this paper, the retention characteristics of 3D NAND flash memory applied with tapering and ferroelectric (HfO₂) structure were analyzed after programming operation. Electrons trapped in nitride are affected by lateral charge migration over time. It was confirmed that more lateral charge migration occurred in the channel thickened by tapering of the trapped electrons. In addition, the Oxide-Nitride-Ferroelectric (ONF) structure has better lateral charge migration due to polarization, so the change in threshold voltage (V_th) is reduced compared to the Oxide-Nitride-Oxide (ONO) structure.

• Journal of the Korea Society of Computer and Information
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• v.26 no.11
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• pp.1-9
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• 2021

3D-NAND flash memory provides high capacity per unit area by stacking 2D-NAND cells having a planar structure. However, due to the nature of the lamination process, there is a problem that the frequency of error occurrence may vary depending on each layer or physical cell location. This phenomenon becomes more pronounced as the number of write/erase(P/E) operations of the flash memory increases. Most flash-based storage devices such as SSDs use ECC for error correction. Since this method provides a fixed strength of data protection for all flash memory pages, it has limitations in 3D NAND flash memory, where the error rate varies depending on the physical location. Therefore, in this paper, pages and layers with different error rates are classified into clusters through the K-means machine learning algorithm, and differentiated data protection strength is applied to each cluster. We classify pages and layers based on the number of errors measured after endurance test, where the error rate varies significantly for each page and layer, and add parity data to stripes for areas vulnerable to errors to provides differentiate data protection strength. We show the possibility that this differentiated data protection policy can contribute to the improvement of reliability and lifespan of 3D NAND flash memory compared to the protection techniques using RAID-like or ECC alone.

• Proceedings of the Korean Vacuum Society Conference
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• 2014.02a
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• pp.236.2-236.2
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• 2014

세계 반도체 시장은 컴퓨터 기능이 더해진 모바일 기기의 수요가 증가함에 따라 메모리반도체의 시장규모가 최근 빠른 속도로 증가했다. 특히 모바일 기기에서 저장장치 역할을 하는 비휘발성 반도체인 NAND Flash Memory는 스마트폰 및 태블릿PC 등 휴대용 기기의 수요 증가, SSD (Solid State Drive)를 탑재한 PC의 수요 확대, 서버용 SSD시장의 활성화 등으로 연평균 18.9%의 성장을 보이고 있다. 이러한 경제적인 배경 속에서 NAND Flash 미세공정 기술의 마지막 단계로 여겨지는 1Xnm 공정이 개발되었다. 그러나 1Xnm Flash Memory의 생산은 새로운 제조설비 구축과 차세대 공정 기술의 적용으로 제조비용이 상승하는 단점이 있다. 이에 따라 제조공정기술을 미세화하지 않고 기존의 수평적 셀구조에서 수직적 셀구조로 설계 구조를 다양화하는 기술이 대두되고 있는데 이 중 Flash Memory의 대용량화와 수명 향상을 동시에 추구할 수 있는 3D NAND 기술이 주목을 받게 되면서 공정기술의 변화도 함께 대두되고 있다. 3D NAND 기술은 기존라인에서 전환하는데 드는 비용이 크지 않으며, 노광장비의 중요도가 축소되는 반면, 증착(Chemical Vapor Deposition) 및 식각공정(Etching)의 기술적 난이도와 스텝수가 증가한다. 이 중 V-NAND 3D 기술에서 사용하는 박막증착 공정의 경우 산화막과 질화막을 번갈아 증착하여 30layer 이상을 하나의 챔버 내에서 연속으로 증착한다. 다층막 증착 공정이 비정상적으로 진행되었을 경우, V-NAND Flash Memory를 제조하기 위한 후속공정에 영향을 미쳐 웨이퍼를 폐기해야 하는 손실을 초래할 수 있다. 본 연구에서는 V-NAND 다층막 증착공정 중에 다층막의 두께를 가상 계측하는 알고리즘을 개발하고자 하였다. 증착공정이 진행될수록 박막의 두께는 증가하여 커패시터 관점에서 변화가 생겨 RF 신호의 진폭과 위상의 변화가 생긴다는 점을 착안하여 증착 공정 중 PECVD 장비 RF matcher와 heater에서 RF 신호의 진폭과 위상을 실시간으로 측정하여 데이터를 수집하고, 박막의 두께와의 상관성을 분석하였다. 이 연구 결과를 토대로 V-NAND Flash memory 제조 품질향상 및 웨이퍼 손실 최소화를 실현하여 제조 시스템을 효율적으로 운영할 수 있는 효과를 기대할 수 있다.

• Journal of IKEEE
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• v.25 no.4
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• pp.774-777
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• 2021

In this paper, we analyzed the gate controllability of 3D NAND Flash Memory with Charge Trap Flash using Ferroelectric (CTF-F) structure. HfO₂, a ferroelectric material, has a high-k characteristic besides polarization. Due to these characteristics, gate controllability is increased in CTF-F structure and on/off current characteristics are improved in Bit Line(BL). As a result of the simulation, in the CTF-F structure, the channel length of String Select Line(SSL) and Ground Select Line(GSL) was 100 nm, which was reduced by 33% compared to the conventional CTF structure, but almost the same off-current characteristics were confirmed. In addition, it was confirmed that the inversion layer was formed stronger in the channel during the program operation, and the current through the BL was increased by about 2 times.

• Proceedings of the KIEE Conference
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• 2004.11c
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• pp.626-628
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• 2004

This paper describes an 8-bit CMOS folding A/D converter for set-top box. Modular low-power, high-speed CMOS A/D converter for embedded systems aims at design techniques for low-power, high-speed A/D converter processed by the standard CMOS technology. The time-interleaved A/D converter or flash A/D converter are not suitable for the low-power applications. The two-step or multi-step flash A/D converters need a high-speed SHA, which represents a tough task in high-speed analog circuit design. On the other hand, the folding A/D converter is suitable for the low-power, high-speed applications(Embedded system). The simulation results illustrate a conversion rate of 40MSamples/s and a Power dissipation of 80mW(only analog block) at 2.5V supply voltage.

• Journal of Korea Game Society
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• v.9 no.1
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• pp.85-91
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• 2009

In the recent development of 3D game, the importance of the game interface as well as the amusement and performance of the game is highlighted. Considering the fact that the flash can easily express the various multimedia contents will provide new possibilities and improve the presentation of game interfaces, the system using the flash in 3D PC game interface was designed and tested in this paper.

• The KIPS Transactions:PartD
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• v.14D no.7
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• pp.719-726
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• 2007

Recently, NAND flash memory has been used for a storage device in various mobile computing devices such as MP3 players, mobile phones and laptops because of its shock-resistant, low-power consumption, and none-volatile properties. However, due to the very distinct characteristics of flash memory, disk based systems and applications may result in severe performance degradation when directly adopting them on flash memory storage systems. Especially, when a B-tree is constructed, intensive overwrite operations may be caused by record inserting, deleting, and its reorganizing, This could result in severe performance degradation on NAND flash memory. In this paper, we propose an efficient buffer management scheme, called IBSF, which eliminates redundant index units in the index buffer and then delays the time that the index buffer is filled up. Consequently, IBSF significantly reduces the number of write operations to a flash memory when constructing a B-tree. We also show that IBSF yields a better performance on a flash memory by comparing it to the related technique called BFTL through various experiments.

• The KIPS Transactions:PartD
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• v.13D no.3 s.106
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• pp.377-382
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• 2006

Advantageous features of flash memory are stimulating its exploitation in mobile and ubiquitous related devices. The hardware characteristics of flash memory however place restrictions upon this current trend. In this paper, a cleaning policy for flash memory is proposed in order to decrease the necessary penally for recycling of memory minimizing the degradation of performance at the same time. The proposed cleaning algorithm is based on partitioning of candidate memory regions, to be reclaimed as free, into a number of groups. In addition, in order to improve the balanced utilization of the entire flash memory space in terms of 'wearing-out', a free segment selection algorithm is discussed. The impact of the proposed algorithms is evaluated through a number of experiments. Moreover, the composition of the optimal configuration featuring the proposed methods is tested through experiments.

• Journal of the Korean Society of Safety
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• v.30 no.4
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• pp.86-91
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• 2015

The flash point is used to categorize inflammable liquids according to their relative flammability. Such a categorization is important for the safe handling, storage, and transportation of inflammable liquids. The flash point temperature of two binary liquid mixtures(n-octane+n-decane and n-octane+n-dodecane) has been measured for the entire concentration range using Seta-flash closed cup tester based on the ASTM D3278 method. The closed cup flash point temperature was estimated using the UNIFAC(Universal Functional Activity Coefficient) group contribution model. The experimentally derived flash point was also compared with the predicted flash point from the UNIFAC model. The UNIFAC model is able to estimate the flash point fairly well for n-octane+n-decane mixture and n-octane+n-dodecane mixture.