• 제목/요약/키워드: Film Bulk Acoustic Resonator

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표면 마이크로머시닝을 이용한 압전 박막 공진기 제작 (Film Bulk Acoustic Wave Resonator using surface micromachining)

  • 김인태;박은권;이시형;이수현;이윤희
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2002년도 하계학술대회 논문집
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    • pp.156-159
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    • 2002
  • Film Bulk Acoustic wave Resonator (FBAR) using thin piezoelectric films can be fabricated as monolithic integrated devices with compatibility to semiconductor process, leading to small size, low cost and high Q RF circuit elements with wide applications in communications area. This paper presents a MMIC compatible Suspended FBAR using surface micromachining. It is possible to make Si$_3$N$_4$/SiO$_2$/Si$_3$N$_4$membrane by using surface micromachining and its good effect is to remove the substrate silicon loss. FBAR was made on 2$\mu\textrm{m}$ multi-layered membrane using CVD process. According to our result, Fabricated film bulk acoustic wave resonator has two adventages. First, in the respect of device Process, our Process of the resonator using surface micromachining is very simple better than that of resonator using bull micromachining. Second, because of using the multiple layer, thermal expansion coefficient is compensated, so, the stress of thin film is reduced.

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바이오센서 개발을 위한 음향 브래그 반사층을 가지는 체적탄성파 공진기의 공진특성 분석 (Analysis of Resonance Characteristics of Bulk Acoustic Resonator with Acoustic Bragg Reflector for Biosensor Development)

  • 김희영;김기복;하태훈;김용일;이진민;김만수
    • Journal of Biosystems Engineering
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    • 제34권4호
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    • pp.260-268
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    • 2009
  • As a basic study to develop a high sensitive biosensor using film bulk acoustic resonator, the mathematical model for analyzing the resonance characteristics of bulk acoustic resonator with acoustic Bragg reflectors was investigated. The simulation results due to the number of acoustic Bragg reflectors with low and high acoustic impedance materials were compared with the experimental results for 1, 2.25 and 5 MHz of PZT based bulk acoustic resonators with various acoustic Bragg reflectors. At the fabricated bulk acoustic resonator with an odd number of acoustic Bragg reflectors, low and high acoustic impedance materials in sequence under the bottom electrode showed better resonance characteristics than even number of acoustic Bragg reflectors. The changes of resonance frequencies due to the increase of number of acoustic Bragg reflectors by simulation and experiment, respectively showed approximately similar tendency but some differences in input impedance between the experiment and simulation were found. The derived mathematical model for describing the resonance characteristics of the bulk acoustic resonator with acoustic Bragg reflector will be available for analyzing the design parameters for development of biosensor using bulk acoustic resonator.

압전박막을 이용한 air-gap type FBAR 필터설계 (Thin Film Bulk Acoustic Resonators(FBAR) filters design Air-gap type using piezoelectric thin film)

  • 정중연;김용천;김상종;김경환;윤석진;최형욱
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2003년도 하계학술대회 논문집 Vol.4 No.2
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    • pp.838-841
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    • 2003
  • The aim of the study is to scrutinize the relationship between the area of resonance and insertion loss by analyzing the characteristics of 2-port resonator. This was done through designing an air-gap type Film Bulk Acoustic Resonator (FBAR) by using CAD model for the application of bandpass filter of high-frequency band with piezoelectric thin film. Moreover, through the design of ladder-type BPF, we were able to observe changes in bandwidth, resonation, out-of-band rejection depending on the number and area of resonator.

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Thin Film Bulk Acoustic Resonators for RF Applications

  • Linh, Mai;Lee, Jae-Young;Yoon, Gi-Wan
    • Journal of information and communication convergence engineering
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    • 제4권3호
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    • pp.111-113
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    • 2006
  • A new thin film deposition technique of piezoelectric ZnO film and its successful application for film bulk: acoustic resonator (FBAR) devices are presented. The two-step deposition used seems to be able to deposit ZnO film with a highly preferred orientation. The FBAR devices with the ZnO films show an excellent return loss of $35{\sim}50$ dB at $1.5{\sim}2$ GHz.

유한 요소법(FEM)을 이용한 압전 박막 공진기(FBAR)의 공진 모드 해석 (Finite Element Method Analysis of Film Bulk Acoustic Resonator)

  • 송영민;정재호;이용현;이정희;최현철
    • 한국전자파학회:학술대회논문집
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    • 한국전자파학회 2000년도 종합학술발표회 논문집 Vol.10 No.1
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    • pp.95-98
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    • 2000
  • Film bulk acoustic resonator used in microwave region can be analyzed by one-dimension Mason's model and one-dimensional numerical method, but it had several constraints to analyze effects of area variation, electrode-area variation, electrode-shape variation and spurious characteristics. To overcome these constraints film bulk acoustic resonator must be analysed by three dimensional numerical method. So, in this paper three dimensional finite element method was used to analyze several moles of resonance and was compared with the one dimension Mason's model analysis and analytic solution.

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Comparison of Resonance Characteristics in FBAR Devices by Thermal Treatments

  • Mai Linh;Song Hae-il;Yoon Giwan
    • Journal of information and communication convergence engineering
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    • 제3권3호
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    • pp.137-141
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    • 2005
  • The paper presents some methods to improve characteristics of film bulk acoustic resonator (FBAR) devices. The FBAR devices were fabricated on Bragg reflectors. Thermal treatments were done by sintering and/or annealing processes. The measurement showed a considerable improvement of return loss $(S_{11})$ and quality factor $(Q_{s/p}).$ These thermal treatment techniques seem very promising for enhancing FBAR resonance performance.

ZnO 압전박막을 이용한 FBAR의 주파수 응답특성 (Frequency Characteristics of a FBAR using ZnO Thin Film)

  • 도승우;장철영;최현철;이용현
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2003년도 제5회 영호남 학술대회 논문집
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    • pp.94-97
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    • 2003
  • This study uses ZnO thin film as a piezoelectric material and Pt as bottom electrode for FBAR (film bulk acoustic resonator) device. ZnO thin film and Pt were deposited by RF-magnetron sputtering method. ZnO thin film and Pt were oriented to c-axis. Top electrode Al was deposited by thermal evaporation. The membrane was formed of bulk micromachining. The FBAR was evaluated by XRD, SEM and electrical characterization. The resonant frequency was measured by HP 8753C Network Analyzer. A fabricated FBAR device exhibited a resonant frequency of 700 MHz ~ 1.5 GHz. When bottom electrode and top electrode thickness were fixed, the resonant frequency was increased as decreasing ZnO thin film thickness.

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유전자 알고리즘을 이용한 압전 박막 음향 공진기에서의 물질 상수 추출 기법 (Method of Material Constants Extraction in Thin-Film Bulk Acoustic Resonator(FBAR) using Genetic Algorithm)

  • 이정흠;정재용;김형동
    • 한국전자파학회논문지
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    • 제14권4호
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    • pp.323-329
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    • 2003
  • 본 논문에서는 유전자 알고리즘을 이용한 FBAR(Thin-Film Bulk Acoustic Resonator)에서의 물질 상수 추출 기법을 제안하였다. 제안된 기법은 유전자 알고리즘을 적용하여 FBAR의 입력 임피던스로부터 물질 상수를 추출하는 방법이다. 유전자 알고리즘의 적합도 함수를 결정하기 위해 물질 상수 변화가 FBAR의 임피던스 특성에 미치는 영향을 알아본 후, FBAR의 입력 임피던스로부터 구해지는 직렬/병렬 공진 주파수와 FBAR 대역폭으로 적합도를 평가하였다. 유전자 알고리즘의 흐름도와 제안된 물질 상수 추출 과정에 대해 설명하였고, 본 기법의 타당성을 검증하기 위해 물질 상수 추출 결과를 제시하였다.

다양한 공진기 형태에 따른 압전박막필터 설계 및 특성 (Characteristics of film bulk acoustic resonators(FBAR) filters design with varying configuration of resonator)

  • 정중연;김용천;권상직;김경환;윤석진;최형욱
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2003년도 추계학술대회 논문집 Vol.16
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    • pp.275-278
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    • 2003
  • The aim of the study is to scrutinize the relationship between the area of resonance and center frequency with varying thickness by analyzing the characteristics of 2-port resonator. This was done through ideal design using Leach model equivalent model modified Mason model equivalent circuit for the application of bandpass filter high-frequency band with resonator Moreover, through the design of ladder-type BPF, we were able to observe changes in bandwidth, resonation, out-of-band rejection depending on the number and area of resonator.

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FBAR 응용을 위한 ZnO 압전 박막의 증착 특성에 관한 연구 (A Study on the Deposition Characteristics of ZnO Piezoelectric Thin film Bulk Acoustic Resonator)

  • 최승혁;김종성
    • 한국전기전자재료학회논문지
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    • 제16권8호
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    • pp.716-722
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    • 2003
  • ZnO thin films were deposited on Al and Pt electrodes by an RF reactive sputtering system for the fabrication of FBAR (film bulk acoustic wave resonator), and the effect of thermal treatment temperature on their c-axis preferred orientation was investigated. SEM experiments show that columnar structure of ZnO thin films were grown with c-axis normal to electrode material, and XRD experiments show that both ZnO films were grown with (002) plane preferred orientation, but larger diffraction peak was observed with Pt electrode. The peak intensity increased with higher thermal treatment temperature, but c-axis preferred orientation was diminished. The surface roughness of Al thin film was higher than that of Pt, and these affect the surface roughness of ZnO film deposited on the electrode. Though the preferred orientation with respect to Pt(111) plane was improved with higher thermal treatment temperature, this could not improve the c-axis orientation of ZnO film.