• Proceedings of the Optical Society of Korea Conference
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• 2003.02a
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• pp.228-229
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• 2003

The quasi-phase matching (QPM) technique has dramatically changed the guidelines in developing nonlinear optical materials, which doesn't require birefringence and off-diagonal components for efficient wavelength conversion. Minimum requirement for QPM is the modulation of nonlinearity and ferroelectric materials with low coercive field has become fascinating in periodical poling. Stoichiometric lithium tantalate (SLT) has attractive advantages of low coercive field (∼l .5 KV/mm), high nonlinearity, high optical damage resistance and low thermo-optic coefficients, leading to a large aperture QPM devices for high power operation. (omitted)

• Proceedings of the Korean Society Of Semiconductor Equipment Technology
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• 2006.05a
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• pp.194-197
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• 2006

Lead-free bismuth-layered perovskite ferroelectric europium-substituted $Bi_{4}Ti_{3}O_{12}(BTO)$ thin films have been successfully deposited on Pt/Ti/$SiO_2$/Si substrate by a sol-gel spin-coating process. $Bi(TMHD)_3,\;Eu(THMD)_3,\;Ti(OiPr)_4$ were used as the precursors, which were dissolved in 2-methoxyethanol. The thin films were annealed at various temperatures from $600^{\circ}\;to\;720^{\circ}C$ in oxygen ambient for 1 hr, which was followed by post-annealed for 1 hr after depositing a Pt electrode to enhance the electrical properties. X-ray diffraction (XRD) and scanning electron microscopy (SEM) were used to analyze the crystallinity and surface morphology of layered perovskite phase, respectively. The remanent polarization value of the BET thin films annealed at $720^{\circ}C\;was\;25.95{\mu}C/cm^2$ at an applied voltage of 5 V.

• Journal of the Korean Vacuum Society
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• v.8 no.2
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• pp.111-115
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• 1999

The structural characteristics of an epitaxial $BaTiO_3$ film on MgO(001) grown by sputtering were studied as a function of temperature using in-situ, real time synchrotron x-ray scattering experiments. We found that the as-grown film was single c-domain but strained at room temperature and tetragonally distorted with the c-axis normal to the film surface. Interestingly, its lattice parameters were found to be expanded in both the in-plane and the out-of -plane directions, i.e. biaxially, comparing with those of a bulk $BaTiO_3$ . More importantly, as it was heated up to $600^{\circ}C$, the tetragonal structure was kept up through without and any phase transition, which is usually observed in other epitaxial ferroelectric thin films.

• The Korean Journal of Ceramics
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• v.1 no.4
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• pp.197-203
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• 1995

Nearly fully dense PZT samples both with tetragonal and with morphotropic phase boundary compositions were prepared by the conventional powder processing and sintering. A micro-indentation technique was used to evaluate the dependence of fracture toughness on remanent polarization, crack length and the direction of crack propagation. The result shows that the toughness increases with the remanent polarization along the poling direction and decreases in the transverse direction. The dependence of toughness on the remanent polarization is neither symmetric nor linear but rather shown to be saturated quickly with the increase in remanent polariztion. R-curve behaviors are observed in both poled and unpoled samples. Sequential SEM and XRD studies on annealed, poled, ground, fractured and etched samples show that domain switching is evident as a viable toughening mechanism but might depend upon the rate of crack propagation. Grain bridging is also observed as one of the active toughening mechanisms.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 1999.05a
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• pp.109-112
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• 1999

The PZT(10/90)/(90/17) heterolayered thin films were fabricated by the spin-coaling on the Pt/Ti/SiO$_2$/Si substrate using the PZT(10/90) and PZT(70/10) metal alkoxide solutions. The effect of heterolayered thin films on the ferroelectrics and electrical properties have been investigated. The lower PZT layers provided the nucleation site for the formation of a perovskite phase of the upper PZT films. Dielectric constant increased with increasing the number of coatings, and it was about 569.9 at PZT-6 heterolayered films.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2000.11a
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• pp.33-35
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• 2000

Na-K-Nb system showed a number of ferroelectric phases in bulk ceramic. [001]-axis oriented single-phase Na$_{0.5}$K$_{0.5}$NbO$_3$ (NKN) thin film have been grown on LaA1O$_3$ substrates using KrF excimer laser. X-ray diffraction $\theta$-2$\theta$ scan, rocking curves, and $\phi$ scan data evidence highly c-axis oriented along the [001] direction.ion.

• Proceedings of the KIEE Conference
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• 2006.07c
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• pp.1394-1395
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• 2006

$(Na_{0.5}LaK_{0.5})NbO_3$ (NKN) thin films were fabricated by the alkoxide-based MOD method. NKN stock solutions were made spin-coated onto the Pt/Ti/$SiO_2$/Si substrate. The structural properties of the NKN thin films examined by x-ray diffraction. The perovskite phase was obtained as a function of the annealing temperature from $550^{\circ}C$ to $700^{\circ}C$ for 1h. The crystallinity and grain size of the NKN thin films increased with increasing annealing temperature. The dielectric constants and loss of the NKN thin films annealed at $650^{\circ}C$ ($t_{eq}$=2.35 nm) showed 323 and 0.025.

• Proceedings of the KIEE Conference
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• 2006.07c
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• pp.1705-1706
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• 2006

Ferroelectric PZT (70/30) thick films were fabricated by the screen printing method. And the PZT (30/70) precusor solution were infiltrated by the spin-coating method on the PZT thick films to obtain a densification. All PZT thick films were sintered at $1050^{\circ}C$ for 10 min. Structural properties, such as crystalline structure, microstructures and compositional ratio, of PZT thick films were investigated with the variation of the number of sol coatings using XRD, SEM and EDS, respectively. All PZT thick films exhibited a perovskite polycrystalline structure without a pyrochloer phase. The thickness of PZT thick films, 4-times screen-printed, was approximately $60{\mu}m$. And the densification of the PZT thick films increased with increasing the number of sol coatings.

• Journal of the Korean Society of Safety
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• v.19 no.1
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• pp.72-76
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• 2004

The $Sr_{0.7}Bi_{2.6}Ta_2O_9$(SBT)thin films are deposited on pt-coated electrode(Pt/$TiO_2/SiO_2/Si$) using a RF magnetron sputtering method. The electrical properties of SBT capacitors with annealing conditions were studied. In the XRD pattern, the SBT thin films in all annealing temperatures had (105) orientation. In the SEM images, Bi-layered perovskite phase was crystallized at $750^{\circ}C$,/TEX> and grains largely grew in oxygen annealing atmosphere. The maximum renanent polarization and the coercive electric field with annealing conditions are 12.40C/$cm^2$ and 30kV/cm, respectively. The dielectric constant and leakage current density with Pt electrode is 340 and 2.13${\times}10^{-10}A/cm^2$, respectively.

• Journal of Magnetics
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• v.16 no.1
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• pp.19-22
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• 2011

[ $BiFeO_3$ ]is a multiferroic material that attracts attentions of many research groups due to its potential as being ferroelectric and ferromagnetic above room temperature. We have prepared both undoped- and Mn-doped $BiFeO_3$ by sol-gel auto-ignition method. Doping of Mn has resulted in decreasing grain size from 60 to 32 nm. X-ray diffraction data show that the samples are pure and single-phase. Infrared measurements on $BiFeO_3$ and Mn-doped $BiFeO_3$ revealed intrinsic stretching vibrations of tetrahedral sites of $Fe^{3+}$-O and of octahedral $Bi^{3+}$-O as well. On the other hand, as the Mn concentration increases, the magnetic moment of $BiFeO_3$ increases. It gives some suggestions in manipulating structural and magnetic properties of $BiFeO_3$ by doping Mn.