• Proceedings of the IEEK Conference
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• 2001.06b
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• pp.157-160
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• 2001

소자 내부의 전위와 전자 및 정공 의사 페르미 준위에 따른 반송자의 정확한 농도를 얻기 위해 Fermi-Dirac통계를 구현하는 방법을 제시하였다. 또한 Fermi-Dirac통계를 고려하여 반도체 방정식을 이산화하는 방법을 제안한다. 제안된 방법을 검증하기 위해 전력 바이폴라 접합 트랜지스터를 제작하였으며 모의 실험 결과 컬렉터-에미터 전압 대 컬렉터 전류는 현재 업계에서 상용화된 소자의 실측치와 비교하여 최대 15%이내의 상대오차를 보였다.

• Journal of the Korean Institute of Telematics and Electronics
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• v.26 no.1
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• pp.38-47
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• 1989

Calculated results for subband structures of electrons in GaInAs/InP hegerojunctions are presented, and their sensitivity to two parameters background impurity concentrations in the GaInAs, heterojunction barrier height-is examined. Energy levels, Fermi level and population of the ground energy level are increased with background impurity concentrations. The difference of the ground and first-excited energy levels is also increased with the increase of barrier height. However, the difference of the energy levels is almost invariable with barier height. But, population of the ground energy level decreases, but that of the first-excited energy level shows a slight increase.

• Journal of Korean Ophthalmic Optics Society
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• v.1 no.2
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• pp.63-69
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• 1996

D.c conductivity and optical transmittance of amorphous ($As_2Se_3$)Ag, (x =0, 2, 5, 10mol%) thin films were measured in order to find effects of Ag additives on electrical and optical properties of the films. The d.c. activation energy and the optical gap decreased with increasing Ag contents the Urbach tail was approximately unchangeable for variation of Ag contents. For Ag contents of 5mol% and less, the rate of decrease of the d.c activation energy was more rapidly than that of the optical gap with increasing Ag contents. For Ag contents more than 5mol%, the rate of decrease of the d.c activation energy and the optical gap were nearly the same each other with decreasing Ag contents. So it was appeared that the Fermi level of the films comes close to the mobility edge for Ag contents of 5mol% and less, and the mobility edge comes close the Fermi level for Ag contents more than 5mol%.

• Electrical & Electronic Materials
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• v.8 no.4
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• pp.418-425
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• 1995

The surface of GaAs was treated by using the 0.1M solution of N $a_{2}$S.9 $H_{2}$O. The passivation of the surface in this sample was investigated by the photoreflectance(PR) experiment. The surface electric field( $E_{s}$) and built-in voltage( $V_{bi}$ ) discussed from Franz-Keldysh oscillation of PR signals. The density of surface states and Fermi level of GaAs treated with N $a_{2}$S.9 $H_{2}$O for 40min were determined 1.61*10$^{12}$ c $m^{-2}$ and 0.73eV. These values were about 15 and 10% smaller than those in untreated sample.e.

• Proceedings of the Korean Vacuum Society Conference
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• 1996.06a
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• pp.54-55
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• 1996

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.39 no.2
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• pp.14-26
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• 2002

A new model for degenerate semiconductor quantum well devices was developed. In this model, the multi-subband Boltzmann transport equation was formulated by applying the Pauli exclusion principle and coupled to the Schrodinger and Poisson equations. For the solution of the resulted nonlinear system, the finite difference method and the Newton-Raphson method was used and carrier energy distribution function was obtained for each subband. The model was applied to a Si MOSFET inversion layer. The results of the simulation showed the changes of the distribution function from Boltzmann like to Fermi-Dirac like depending on the electron density in the quantum well, which presents the appropriateness of this modeling, the effectiveness of the solution method, and the importance of the Pauli -exclusion principle according to the reduced size of semiconductor devices.

• Nuclear Engineering and Technology
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• v.1 no.2
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• pp.91-101
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• 1969

Resistivity changes of n-type float-zone silicon crystals with 6.4$\times$10$^{14}$ to 1.25$\times$10$^{17}$ phosphorus atoms/㎤ due to irradiation by (1) 1 MeV electrons, (2) two types of research reactors, and (3) $Co^{60}$ ${\gamma}$-ray sources were investigated. The results were analyzed on the basis of a simple exponential formula derived by Buehler. While the formula gave a fair fit in the low fluence range in most cases, the deviation was quite appreciable in the case of 1 MeV electron irradiation, and a linear change gave better fit in some cases. The large change in the carrier removal rate in electron-irradiated samples in the high fluence range was analyzed in detail in terms of the Fermi level cross-over of the defect levels. Based on the damage constants evaluated from the initial portion of data where the formula was applicable, the relative effectiveness of various radiation sources in causing the resistivity change in n-type silicon was compared. The TRIGA Mark II reactor neutrons, for example, were found to be about 40 times more effective than 1 MeV electrons. The dependence of the damage constant on the initial carrier concentration was also examined. The physical basis of the exponential law and the effect of the Fermi level cross-over of the defect levels on the resistivity change in the high fluence ranges are discussed.

• Electrical & Electronic Materials
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• v.7 no.6
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• pp.490-495
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• 1994

We investigated photoreflectance of semi-insulating GaAs with respect to modulation sources, that is, modulation beam intensity, modulation frequency, temperature, and thickness of sample. PR spectra by each modulation source turned out to be signals of low electric field third differential, and band gap values of sample were fitted by least square root method for Aspnes' theoretical equation.

• Journal of the Korean Magnetics Society
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• v.20 no.5
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• pp.173-177
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• 2010

The electronic structure of charge-density-wave (CDW) system $CeTe_2$ has been investigated by using angle-resolved photoemission spectroscopy (ARPES). The clearly dispersive band structures are observed in the measured ARPES spectra, indicating the good quality of the single-crystalline sample employed in this study. The four-fold symmetric patterns are observed in the constant energy (CE) mappings, indicating the $2{\times}2$ lattice deformation in the Te(1) sheets. The observed CE images are similar to those of $LaTe_2$, suggesting that Ce 4f states have the minor contribution to the CDW formation in $CeTe_2$. This study reveals that the carriers near the Fermi level should have mainly the Te(1) 5p and Ce 5d character, that the Te(1) 5p bands contribute to the CDW formation, and that the Ce 5d bands cross the Fermi level even in the CDW state.

• Proceedings of the Materials Research Society of Korea Conference
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• 2003.03a
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• pp.178-178
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• 2003

II-Ⅵ족 반도체 중에서 넓은 밴드갭을 가지는 ZnO에 Mn 이온을 doping할 경우 Tc가 상온보다 높을 것이라는 이론적 계산이 2000년 Science에 발표되었다. 이후 ZnO에 전이금속 이온을 doping하여 상온에서도 강자성을 나타내는 자성 반도체 (DMS)를 만들기 위한 연구가 활발히 진행되고 있다. Co-doped ZnO 박막은 PLD로 증착하였을 경우 Tc가 상온보다 높으나 재현성이 낮은 것으로 알려져 있었다. 그러나 최근 sol-gel 방법을 이용하여 Co-doped ZnO 박막을 제조하면 강자기 특성의 재현성을 높일 수 있다는 결과가 보고되었다. 이에 본 연구에서는 sol-gel 방법을 사용하여 여러 조성의 Co-doped ZnO 박막을 합성한 후 이들의 자성 특성을 검토하였다. 이러한 결과를 바탕으로 Co-doped ZnO 박막에서 강자성 발현의 근원을 규명하고자 (ⅰ) 조성에 따른 Co-doped ZnO의 Raman peak과 EXAFS peak의 변화를 측정하여 구조적 특성과 ZnO 내에서의 Co 이온의 상태를 분석하였으며, (ⅱ) Hall 효과 실험으로 carrier density를 측정함으로써 Fermi 준위에서의 파수 벡터의 크기를 산출하고자 하였다.