• Journal of electromagnetic engineering and science
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• v.11 no.2
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• pp.105-112
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• 2011

In phase-locked frequency synthesizers, a fast-lock technique is frequently employed to overcome the trade-off between a lock-time and a spurious response. The function of fast-lock in a conventional PLL (Phased Lock Loop) IC (Integrated Circuit) is limited by a factor of 16, which is usually implemented by a scaling of charge pumper, and consequently a lock time improvement of a factor of 4 is possible using the conventional PLL IC. In this paper, we propose a novel external active fast-lock loop filter. The proposed loop filter provides, conceptually, an unlimited scaling of charge pumper current, and can overcome conventional trade-off between lock-time and spur suppression. To demonstrate the validity of our proposed loop-filter, we fabricated an X-band frequency synthesizer using the proposed loop filter. The loop filter in the synthesizer is designed to have a loop bandwidth of 100 kHz in the fast-lock mode and a loop bandwidth of 5 kHz in the normal mode, which corresponds to a charge pumper current change ratio of 400. The X-band synthesizer shows successful performance of a lock-time of below 10 ${\mu}sec$ and reference spur suppression below -64 dBc.

• Proceedings of the IEEK Conference
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• 2003.07b
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• pp.963-966
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• 2003

This paper proposes a new locking algorithm of the delay locked loop (DLL) which reduces the lock-acquisition time and eliminates false locking problem to enlarge the operating frequency range. The proposed DLL uses the modified phase frequency detector (MPFD) and the modified charge pump (MCP) to avoid the false locking problem. Adopting a new lock detector that measures delay between elects helps the fast lock-acquisition time greatly. The idea has been confirmed by HSPICE simulations in a 0.35-${\mu}{\textrm}{m}$ CMOS process.

• Journal of the Institute of Electronics and Information Engineers
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• v.51 no.2
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• pp.46-52
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• 2014

This paper presents a multiple gain controlled digital phase and frequency detector with a fast lock-time. Lock-time of the digital PLL can be significantly reduced by applying proposed adaptive gain control technique. A loop gain of the proposed digital PLL is controlled by three conditions that are very large phase difference between reference and feedback signal, small phase difference and before lock-state, and after lock-state. The simulation result shows that lock-time of the proposed multiple gain controlled digital PLL is 100 times faster than that of the conventional structure with unit gain mode.

• Proceedings of the IEEK Conference
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• 2000.11b
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• pp.79-82
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• 2000

This paper describes a delay locked loop with selective starting point for use in a high-frequency systems. SSRDLL (selective starting point RDLL) has been simulated in a 0.25$\mu\textrm{m}$ standard n-well CMOS process parameter to realize a fast lock-on time. This DLL is shown to be insensitive to variations in PVTL. The simulated lock time of the proposed SSRDLL is within 4 clock cycles at 333㎒ clock input.

• Proceedings of the IEEK Conference
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• 2003.07b
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• pp.1201-1204
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• 2003

This paper described a replica-delay adaptive lock-acquisition scheme for high-speed DLLs. The proposed scheme provides the fast and correct locking cycle that is variable according to the magnitude of the arbitrary replica delay (fixed delay). The scheme guarantees the wide operation range and the fast lock-aquisition time. It has been confirmed by HSPICE simulations in a 0.35${\mu}{\textrm}{m}$ CMOS process.

• Journal of information and communication convergence engineering
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• v.10 no.2
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• pp.187-193
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• 2012

A 1 GHz CMOS fast-lock phase-locked loop (PLL) is proposed to support the quick wake-up time of mobile consumer electronic devices. The proposed fast-lock PLL consists of a conventional charge-pump PLL, a frequency-to-digital converter (FDC) to measure the frequency of the input reference clock, and a digital-to-analog converter (DAC) to generate the initial control voltage of a voltage-controlled oscillator (VCO). The initial control voltage of the VCO is driven toward a reference voltage that is determined by the frequency of the input reference clock in the initial mode. For the speedy measurement of the frequency of the reference clock, an FDC with a parallel architecture is proposed, and its architecture is similar to that of a flash analog-to-digital converter. In addition, the frequency-to-voltage converter used in the FDC is designed simply by utilizing current integrators. The circuits for the proposed fast-lock scheme are disabled in the normal operation mode except in the initial mode to reduce the power consumption. The proposed PLL was fabricated by using a 0.18-${\mu}m$ 1-poly 6-metal complementary metal-oxide semiconductor (CMOS) process with a 1.8 V supply. This PLL multiplies the frequency of the reference clock by 10 and generates the four-phase clock. The simulation results show a reduction of up to 40% in the worstcase PLL lock time over the device operating conditions. The root-mean-square (rms) jitter of the proposed PLL was measured as 2.94 ps at 1 GHz. The area and power consumption of the implemented PLL are $400{\times}450{\mu}m^2$ and 6 mW, respectively.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.24 no.2
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• pp.141-146
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• 2011

When the current of the superconducting element exceeds its critical current by the fault occurrence, the quench of the high-$T_C$ superconducting fault current limiter (HTSC) comprising the flux-lock type superconducting fault current limiter (SFCL) occurs. Simultaneously, the magnetic flux in the iron core induces the voltage in each coil, which contributes to limit the fault current. In this paper, the fault current limiting characteristics of the flux-lock type SFCL as well as the load voltage sag suppressing characteristics according to the flux-lock type SFCL's winding direction were investigated. To confirm the fault current limiting and the voltage sag suppressing characteristics of the this SFCL, the short-circuit tests for the simulated power system with the flux-lock type SFCL were carried out. The flux-lock type SFCL designed with the additive polarity winding was shown to perform more effective fault current limiting and load voltage sag suppressing operations through the fast quench occurrence right after the fault occurs and the fast recovery operation after the fault removes than the flux-lock type SFCL designed with the subtractive polarity winding.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.45 no.5
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• pp.65-70
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• 2008

A novel fast locking dual-loop integer-N phase locked loop(PLL) with adaptive bandwidth scheme is presented. When the PLL is out-of-lock, bandwidth becomes much wider than 1/10 of channel spacing with the wide bandwidth loop. When the PLL is near in-lock, bandwidth becomes narrower than 1/10 of channel spacing with the narrow bandwidth loop. The proposed PLL is designed based on a $0.35{\mu}m$ CMOS process with a 3.3V supply voltage. Simulation results show the fast look time of $50{\mu}s$ for an 80MHz frequency jump in a 200KHz channel spacing PLL with almost 14 times wider bandwidth than the channel spacing.

• Journal of the Korea Institute of Information and Communication Engineering
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• v.9 no.3
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• pp.582-586
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• 2005

This paper presents a new structure of Phase Locked Loop(PLL) which changes its loop bandwidth according to the locking status. The proposed PLL consists of a conventional PLL and, Locking Status Indicator(LSI). The LSI decides the operating bandwidth of loop filler. When the PLL becomes out of lock, the PLL increases the loop bandwidth and achieves fast locking. When the PLL becomes in-lock, this PLL decreases the loop bandwidth and minimizes phase noise output. The PLL can achieve fast locking and low phase noise output at the same time. Proposed PLL's locking time is less than $40{\mu}s$ and spur is 76.1dBc. It is simulated by HSPICE in a Hynix CMOS $0.35{\mu}m$ Process.

• JSTS:Journal of Semiconductor Technology and Science
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• v.17 no.4
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• pp.534-542
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• 2017

This paper presents a fast locking technique for a fractional-N PLL frequency synthesizer. The technique directly measures $K_{VCO}$ on a chip, computes the VCO's target tuning voltage for a given target frequency, and directly sets the loop filter voltage to the target voltage before the PLL begins the normal closed-loop locking process. The closed-loop lock time is significantly minimized because the initial frequency of the VCO are put very close to the desired final target value. The proposed technique is realized and designed for a 4.3-5.3 GHz fractional-N synthesizer in 65 nm CMOS and successfully verified through extensive simulations. The lock time is less than $12.8{\mu}s$ over the entire tuning range. Simulation verifications demonstrate that the proposed method is very effective in reducing the synthesizer lock time.