• Title/Summary/Keyword: Fast Switching Circuit

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Switched SRAM-Based Physical Unclonable Function with Multiple Challenge to Response Pairs (스위칭 회로를 이용한 다수의 입출력 쌍을 갖는 SRAM 기반 물리적 복제 불가능 보안회로)

  • Baek, Seungbum;Hong, Jong-Phil
    • Journal of the Korea Institute of Information and Communication Engineering
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    • v.24 no.8
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    • pp.1037-1043
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    • 2020
  • This paper presents a new Physical Unclonable Function (PUF) security chip based on a low-cost, small-area, and low-power semiconductor process for IoT devices. The proposed security circuit has multiple challenge-to-response pairs (CRP) by adding the switching circuit to the cross-coupled path between two inverters of the SRAM structure and applying the challenge input. As a result, the proposed structure has multiple CRPs while maintaining the advantages of fast operating speed and small area per bit of the conventional SRAM based PUF security chip. In order to verify the performance, the proposed switched SRAM based PUF security chip with a core area of 0.095㎟ was implemented in a 180nm CMOS process. The measurement results of the implemented PUF show 4096-bit number of CRPs, intra-chip Hamming Distance (HD) of 0, and inter-chip HD of 0.4052.

Design of a Fast 256Kb EEPROM for MCU (MCU용 Fast 256Kb EEPROM 설계)

  • Kim, Yong-Ho;Park, Heon;Park, Mu-Hun;Ha, Pan-Bong;Kim, Young-Hee
    • Journal of the Korea Institute of Information and Communication Engineering
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    • v.19 no.3
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    • pp.567-574
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    • 2015
  • In this paper, a 50ns 256-kb EEPROM IP for MCU (micro controller unit) ICs is designed. The speed of data sensing is increased in the read mode by using a proposed DB sensing circuit of differential amplifier type which uses the reference voltage, and the switching speed is also increased by reducing the total DB parasitic capacitance as a distributed DB structure is separated into eight. Also, the access time is reduced reducing a precharging time of BL in the read mode removing a 5V NMOS transistor in the conventional RD switch, and the reliability of output data can be secured by obtaining the differential voltage (${\Delta}V$) between the DB and the reference voltages as 0.2*VDD. The access time of the designed 256-kb EEPROM IP is 45.8ns and the layout size is $1571.625{\mu}m{\times}798.540{\mu}m$ based on MagnaChip's $0.18{\mu}m$ EEPROM process.

Multi-Secondary Transformer: A Modeling Technique for Simulation - II

  • Patel, A.;Singh, N.P.;Gupta, L.N.;Raval, B.;Oza, K.;Thakar, A.;Parmar, D.;Dhola, H.;Dave, R.;Gupta, V.;Gajjar, S.;Patel, P.J.;Baruah, U.K.
    • Journal of international Conference on Electrical Machines and Systems
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    • v.3 no.1
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    • pp.78-82
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    • 2014
  • Power Transformers with more than one secondary winding are not uncommon in industrial applications. But new classes of applications where very large number of independent secondaries are used are becoming popular in controlled converters for medium and high voltage applications. Cascade H-bridge medium voltage drives and Pulse Step Modulation (PSM) based high voltage power supplies are such applications. Regulated high voltage power supplies (Fig. 1) with 35-100 kV, 5-10 MW output range with very fast dynamics (${\mu}S$ order) uses such transformers. Such power supplies are widely used in fusion research. Here series connection of isolated voltage sources with conventional switching semiconductor devices is achieved by large number of separate transformers or by single unit of multi-secondary transformer. Naturally, a transformer having numbers of secondary windings (~40) on single core is the preferred solution due to space and cost considerations. For design and simulation analysis of such a power supply, the model of a multi-secondary transformer poses special problem to any circuit analysis software as many simulation softwares provide transformer models with limited number (3-6) of secondary windings. Multi-Secondary transformer models with 3 different schemes are available. A comparison of test results from a practical Multi-secondary transformer with a simulation model using magnetic component is found to describe the behavior closer to observed test results. Earlier models assumed magnetising inductance in a linear loss less core model although in actual it is saturable core made-up of CRGO steel laminations. This article discusses a more detailed representation of flux coupled magnetic model with saturable core properties to simulate actual transformers very close to its observed parameters in test and actual usage.