• Title/Summary/Keyword: Embedded memory

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Efficient Interface circuits of Embedded Memory for RISC-based DSP Microprocessor (RICS-based DSP의 효율적인 임베디드 메모리 인터페이스)

  • Kim, You-Jin;Cho, Kyoung-Rok;Kim, Sung-Sik;Cheong, Eui-Seok
    • Journal of the Korean Institute of Telematics and Electronics C
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    • v.36C no.9
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    • pp.1-12
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    • 1999
  • In this paper, we designed an embedded processor with 128Kbytes EPROM and 4Kbytes SRAM based on GMS30C2132 which RISC processor with DSP functions. And a new architecture of bus sharing to control the embedded memory and external memory unit i proposed aiming at one-cycle access between memories and CPU. For embedded 128Kbytes EPROM, we designed the new expansion interface for data size at data ordering with memory organization and the efficient interface for test. The embedded SRAM supports an extended stack area high speed DSP operation, instruction cache and variable data-length control which is accessed with 4K modulo addressing schemes. The proposed new architecture and circuits reduced the memory access cycle time from 40ns and improved operation speed 2-times for program benchmark test. The chip is occupied $108.68mm^2$ using $0.6{\mu}m$ CMOS technology.

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Self-adaptive testing to determine sample size for flash memory solutions

  • Byun, Chul-Hoon;Jeon, Chang-Kyun;Lee, Taek;In, Hoh Peter
    • KSII Transactions on Internet and Information Systems (TIIS)
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    • v.8 no.6
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    • pp.2139-2151
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    • 2014
  • Embedded system testing, especially long-term reliability testing, of flash memory solutions such as embedded multi-media card, secure digital card and solid-state drive involves strategic decision making related to test sample size to achieve high test coverage. The test sample size is the number of flash memory devices used in a test. Earlier, there were physical limitations on the testing period and the number of test devices that could be used. Hence, decisions regarding the sample size depended on the experience of human testers owing to the absence of well-defined standards. Moreover, a lack of understanding of the importance of the sample size resulted in field defects due to unexpected user scenarios. In worst cases, users finally detected these defects after several years. In this paper, we propose that a large number of potential field defects can be detected if an adequately large test sample size is used to target weak features during long-term reliability testing of flash memory solutions. In general, a larger test sample size yields better results. However, owing to the limited availability of physical resources, there is a limit on the test sample size that can be used. In this paper, we address this problem by proposing a self-adaptive reliability testing scheme to decide the sample size for effective long-term reliability testing.

WAP-LRU: Write Pattern Analysis Based Hybrid Disk Buffer Management in Flash Storage Systems (WAP-LRU : 플래시 스토리지 시스템에서 쓰기 패턴 분석 기반의 하이브리드 디스크 버퍼 관리 기법)

  • Kim, Kyung Min;Choi, Jun-Hyeong;Kwak, Jong Wook
    • IEMEK Journal of Embedded Systems and Applications
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    • v.13 no.3
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    • pp.151-160
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    • 2018
  • NAND flash memories have the advantages of fast access speed, high density and low power consumption, thus they have increasing demand in embedded system and mobile environment. Despite the low power and fast speed gains of NAND flash memory, DRAM disk buffers were used because of the performance load and limited durability of NAND flash cell. However, DRAM disk buffers are not suitable for limited energy environments due to their high static energy consumption. In this paper, we propose WAP-LRU (Write pattern Analysis based Placement by LRU) hybrid disk buffer management policy. Our policy designates the buffer location in the hybrid memory by analyzing write pattern of the workloads to check the continuity of the page operations. In our simulation, WAP-LRU increased the lifetime of NAND flash memory by reducing the number of garbage collections by 63.1% on average. In addition, energy consumption is reduced by an average of 53.4% compared to DRAM disk buffers.

Implementation of Light Weight Linux O.S on the Flash Memory (플래쉬 메모리 내에 상주 가능한 경량 리눅스 운영체제 구현)

  • Jang, Seung-Ju
    • Journal of the Korea Institute of Information and Communication Engineering
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    • v.11 no.12
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    • pp.2298-2305
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    • 2007
  • Many people is studying the embedded system. The embedded system becomes a small size device. The DOM memory is using in the mobile device and small site devices. This paper proposes light-weighted Linux O.S that is running onto the DOM memory. The embedded system with the DOM must have a light-weigthed O.S due to the memory space restriction. This paper designs light-weigthed Linux O.S for the DOM memory. The new designed LILO boot loader boots the new designed light-weigthed Linux O.S as a normal Linux O.S. This paper experiments comparing the designed new light-weigthed Linux O.S with a Linux PC.

Implementation of March Algorithm for Embedded Memory Test using IEEE 1149.1 (IEEE 1149.1을 이용한 March 알고리듬의 내장형 자체 테스트 구현)

  • Yang, Sun-Woong;Park, Jae-Heung;Chang, Hoon
    • Journal of KIISE:Computing Practices and Letters
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    • v.7 no.1
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    • pp.99-107
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    • 2001
  • In this paper, we implemented memory BIST circuit based on ION march algorithm, and the IEEE 1149.1 has been designed as main controlJer for embedded memory testing. The implemented memory BIST can be used for word-oriented memory since it adopts background data, this is avaliable for word-oriented memory. It is able to detect all stuck-at faults, transition faults, coupling faults, and address decoder faults in the word-oriented memory. Memory BIST and IEEE 1149.1 are described at RTL level in Verilog-HDL, and synthesized with the Synopsys. The synthesized circuits are fully velified using VerilogXL and memory cell generated by memory compiler.

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An Embedded Text Index System for Mass Flash Memory (대용량 플래시 메모리를 위한 임베디드 텍스트 인덱스 시스템)

  • Yun, Sang-Hun;Cho, Haeng-Rae
    • Journal of the Korea Society of Computer and Information
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    • v.14 no.6
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    • pp.1-10
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    • 2009
  • Flash memory has the advantages of nonvolatile, low power consumption, light weight, and high endurance. This enables the flash memory to be utilized as a storage of mobile computing device such as PMP(Portable Multimedia Player). Potable device with a mass flash memory can store various multimedia data such as video, audio, or image. Typical index systems for mobile computer are inefficient to search a form of text like lyric or title. In this paper, we propose a new text index system, named EMTEX(Embedded Text Index). EMTEX has the following salient features. First, it uses a compression algorithm for embedded system. Second, if a new insert or delete operation is executed on the base table. EMTEX updates the text index immediately. Third, EMTEX considers the characteristics of flash memory to design insert, delete, and rebuild operations on the text index. Finally, EMTEX is executed as an upper layer of DBMS. Therefore, it is independent of the underlying DBMS. We evaluate the performance of EMTEX. The Experiment results show that EMTEX can outperform th conventional index systems such as Oracle Text and FT3.

Reallocation Data Reusing Technique for BISR of Embedded Memory Using Flash Memory (플래시 메모리를 이용한 내장 메모리 자가 복구의 재배치 데이타 사용 기술)

  • Shim, Eun-Sung;Chang, Hoon
    • Journal of KIISE:Computer Systems and Theory
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    • v.34 no.8
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    • pp.377-384
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    • 2007
  • With the advance of VLSI technology, the capacity and density of memories is rapidly growing. In this paper, We proposed a reallocation algorithm for faulty memory part to efficient reallocation with row and column redundant memory. Reallocation information obtained from faulty memory by only every test. Time overhead problem occurs geting reallocation information as every test. To its avoid, one test resulted from reallocation information can save to flash memory. In this paper, reallocation information increases efficiency using flash memory.

Implementation of Kernel Module for Shared Memory in Dual Bus System (듀얼 버스 시스템에서의 공유 메모리 커널 모듈 구현)

  • Moon, Ji-Hoon;Oh, Jae-Chul
    • The Journal of the Korea institute of electronic communication sciences
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    • v.10 no.5
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    • pp.539-548
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    • 2015
  • In this paper, shared memory feature was developed in multi-core system with different OS for different processor-specific bus, while conducting an experiment on shared memory feature between the two processors based on embedded Linux system. For the purpose of developing shared memory in dual bus structure, memory controller was used, while managing shared memory segment through list data structure. For AMP multi-core test, Linux OS was installed in 2 processor cores. In addition, it verified the creation and use of shared memory by using kernel module implemented to test shared memory.

Effect of ASLR on Memory Duplicate Ratio in Cache-based Virtual Machine Live Migration

  • Piao, Guangyong;Oh, Youngsup;Sung, Baegjae;Park, Chanik
    • IEMEK Journal of Embedded Systems and Applications
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    • v.9 no.4
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    • pp.205-210
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    • 2014
  • Cache based live migration method utilizes a cache, which is accessible to both side (remote and local), to reduce the virtual machine migration time, by transferring only irredundant data. However, address space layout randomization (ASLR) is proved to reduce the memory duplicate ratio between targeted migration memory and the migration cache. In this pager, we analyzed the behavior of ASLR to find out how it changes the physical memory contents of virtual machines. We found that among six virtual memory regions, only the modification to stack influences the page-level memory duplicate ratio. Experiments showed that: (1) the ASLR does not shift the heap region in sub-page level; (2) the stack reduces the duplicate page size among VMs which performed input replay around 40MB, when ASLR was enabled; (3) the size of memory pages, which can be reconstructed from the fresh booted up state, also reduces by about 60MB by ASLR. With those observations, when applying cache-based migration method, we can omit the stack region. While for other five regions, even a coarse page-level redundancy data detecting method can figure out most of the duplicate memory contents.