• Title/Summary/Keyword: Electronic conduction

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Anomalous Subthreshold Characteristics for Charge Trapping NVSM at memory states. (기억상태에 있는 전하트랩형 비휘발성 반도체 기억소자의 하위문턱이상전류특성)

  • 김병철;김주연;서광열;이상배
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 1998.11a
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    • pp.13-16
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    • 1998
  • An anomalous current characteristics which show the superposition of a low current level and high current level at the subthreshold region when SONOSFETs are in memory states were investigated. We have assumed this phenomena were resulted from the effect of parasitic transistors by LOCOS isolation and were modeled to a parallel equivalent circuit of one memory transistor and two parasitic transistors. Theoretical curves are well fitted in measured log I$_{D}$-V$_{G}$ curves independent of channel width of memory devices. The difference between low current level and high current level is apparently decreased with decrease of channel width of devices because parasitic devices dominantly contribute to the current conduction with decrease of channel width of memory devices. As a result, we concluded that the LOCOS isolation has to selectively adopt in the design of process for charge-trap type NVSM.VSM.

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(Oscillation Characteristics in the Intergranular Layer of ZnO Varistor Fabricated 3-Composition Seed Grain Method) (3-성분 종입자법으로 제조한 ZnO 바리스터의 입계모델에서 발진특성)

  • 장경욱;김상진;이준웅
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 1995.11a
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    • pp.248-252
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    • 1995
  • In this paper, the samples are made by the new three-composition seed grain method, in order to obtain the low voltage varistor distributed randomly large seed grain in its bulk. The oscillation phenomena of carriers appeared from current-voltage characteristics under knee voltage is shown by the transient flow of non trapped carriers group in the trap level of intergranular layer, surface state and/or depletion layer. Current oscillation phenomena is hardly shown in the high electric field. The injected carriers from both electrodes are directly flowed from the conduction band of forward biased grain through the intergranular layer into the reverse biased grain, because the trap level in the electric field above the knee voltage is mostly filled.

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Analysis of Threshold Voltage and Conduction Path for Ratio of Channel Length and Thickness of Asymmetric Double Gate MOSFET (비대칭 이중게이트 MOSFET의 채널길이와 두께 비에 따른 문턱전압 및 전도중심 분석)

  • Jung, Hakkee;Jeong, Dongsu
    • Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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    • 2015.05a
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    • pp.829-831
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    • 2015
  • 본 연구에서는 비대칭 이중게이트 MOSFET의 채널길이와 채널두께의 비에 따른 문턱전압 및 전도중심의 변화를 분석하고자한다. 비대칭 이중게이트 MOSFET는 상하단 게이트 전압에 의하여 전류흐름을 제어할 수 있어 단채널효과를 감소시킬 수 있다는 장점이 있다. 그러나 채널길이가 감소하면 필연적으로 발생하는 문턱전압의 급격한 변화는 소자 특성에 커다란 영향을 미치고 있다. 특히 상하단의 게이트 전압, 상하단의 게이트 산화막 두께 그리고 도핑분포변화에 따라 발생하는 전도중심의 변화는 문턱전압을 결정하는 중요 요소가 된다. 해석학적으로 문턱전압 및 전도중심을 분석하기 위하여 해석학적 전위분포를 포아송방정식을 통하여 유도하였다. 다양한 채널길이 및 채널두께에 대하여 전도중심과 문턱전압을 계산한 결과, 채널길이와 채널두께의 비 등 구조적 파라미터뿐만이 아니라 도핑분포 및 게이트 전압 등에 따라 전도중심과 문턱전압은 크게 변화한다는 것을 알 수 있었다.

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Properties of Thermally Stimulated Current in ZnO (ZnO 세라믹의 열화와 열자격전류에 관한 연구)

  • Lee, S.I.;Park, I.K.;Jang, K.U.
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2004.07b
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    • pp.1211-1213
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    • 2004
  • In this paper, in other the study shift a degradation and electrical properties on ZnO based grain beurdry layer, we mearured thermally stmulated current. Also the TSC was investigated for understanding of GBL's interfacial carrier shift on bias voltage, bias time, bias temperature. as a result, the two peahs of $p_1$, $p_2$ was observed by conduction of the trapped carrier of border between the oxidation layer and the grains $P_3$ and $P_4$ Peaks observed to the ionization excition excitation in the grain.

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Transparent MWCNT Thin Films Fabricated by using the Spray Method (스프레이법으로 제작된 투명 MWCNT 박막)

  • Jang, Kyung-Uk
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.23 no.4
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    • pp.338-342
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    • 2010
  • Carbon nanotubes (CNTs) have excellent electrical, chemical stability, mechanical and thermal properties. The MWCNT films were investigated as a transparent electrode for the solar cell, OLED, and field-emission display. MWCNT films were fabricated by air spray method, whose process is quite low-costed, using the multi-walled CNTs solution on glass substrates. Moreover, the most stable film was fabricated when the spraying time was 60 sec. The film that was sprayed with the MWCNT dispersion for 60 sec, has 300nm thick. And its electric resistivity, transmittance rate, mobility and carrier concentration are $6{\times}10^{-2}{\Omega}{\cdot}cm$, 50% at ${\lambda}=550mm$, $4.3{\times}10^{-2}cm^2/V{\cdot}s$ and $2.1{\times}10^{21}cm^{-3}$, respectively. Also, absorption energy of MWCNT films show from 3.9 eV to 4.6 eV. Furthermore, we can use MWCNT films fabricated by the spray method for the transparent electrode.

A study on the Electric Characteristics of Polyimide Ultra Thin through LB-Method (Langumir-Blodgett법으로 제작된 polyimide 超薄膜(초박막)의 전기적특성(電氣的特性))

  • Park, Sang-Hyun;Yun, Sung-Do;Cheong, Hak-Su;Kook, Sang-Hoon
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 1992.11a
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    • pp.63-66
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    • 1992
  • Using an aromatic system, we made a ultra thin insulator through LB-method. We measured and wrote down afternating currant characteristics of ultraviolet rays extincting-spectrum and I.R extincting-spectrum. We surveyed the thickness of a film through X-ray diffracting method and certified about $4{\AA}$ by the layer. Measuring the characteristics of direct current voltage and electric current with this sample, we produced its conductivity and discovered that this sample had a god insulating performance. Addition to this, we measured the characteristics of voltage and electric current, and the temperature dependency of conductivity in a high voltage system and with these results tried to interpret a mechanism of conduction.

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A Study on Electrical Characteristics Improvement on Field Stop IGBT Using Trench Gate Structure (Trench Gate를 이용한 Field Stop IGBT의 전기적 특성 분석에 관한 연구)

  • Nam, Tae-Jin;Jung, Eun-Sik;Chung, Hun-Suk;Kang, Ey-Goo
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.25 no.4
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    • pp.266-269
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    • 2012
  • The most recently IGBT (insulated gate bipolar mode transistor) devices are in the most current conduction capable devices and designed to the big switching power device. Use this number of the devices are need to high voltage and low on-state voltage drop. And then in this paper design of field stop IGBT is insert N buffer layer structure in NPT planar IGBT and optimization design of field stop IGBT and trench field stop IGBT, both devices have a comparative analysis and reflection of the electrical characteristics. As a simulation result, trench field stop IGBT is electrical characteristics better than field stop IGBT.

A Study on Optimal Design and Electrical Characteristics of 600 V Planar Field Stop IGBT (600 V급 Planar Field Stop IGBT 최적 설계 및 전기적 특성 분석에 관한 연구)

  • Nam, Tae-Jin;Jung, Eun-Sik;Kang, Ey-Goo
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.25 no.4
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    • pp.261-265
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    • 2012
  • IGBT(insulated gate bipolar transistor) is outstanding device for current conduction capabilities. IGBT design to control the large power switching device for power supply, converter, solar converter, electric home appliances, etc. like this IGBT device can be used in many places so to increase the efficiency of the various structures are coming. in this paper optimization design of planar type IGBT and planar field stop IGBT, and both devices have a comparative analysis and reflection of the electrical characteristics.

2DEG Calculation in InP HEMT (InP HEMT의 2DEG계산)

  • Hwang, K.C.;Ahn, H.K.;Han, D.Y.
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2003.07a
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    • pp.316-318
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    • 2003
  • 양자우물 구조를 사용한 HEMT(High Electron Mobility Transistor)는 고속 스위칭 소자와 초고주파 통신용 소자 및 센서에에 우수한 동작특성을 갖고 있다. 본 논문에서는 AlInAs/InP HEMT의 heterostructure를 파동방정식과 Poisson 방정식을 self-consistent 한 방법으로 해석하였다. 파동방정식으로 junction의 전자농도를 계산하고, Poisson 방정식을 해석하여 potential profile에 의한 전자 농도가 heterostructure에서 self-consistent가 되도록 연산하였다. 끝으로 AlInAs/InP 구조에서 positively ionized donor, valance band에서의 hole, conduction band의 free electron과 구조내의 2DEG를 AlGaAs/GaAs 및 AlGaAs/InGaAs/GaAs와 비교하였다.

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Leakage Current Low-Temperature Processed Poly-Si TFT′s (저온제작 Poly-Si TFT′s의 누설전류)

  • 진교원;이진민;김동진;김영호
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 1996.05a
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    • pp.90-93
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    • 1996
  • The conduction mechanisms of the off-current in low temperature ($\leq$600$^{\circ}C$) processed polycrystalline silicon thin film transistors (LTP poly-Si TFT's) has been systematically studied. Especially, the temperature and bias dependence of the off-current between unpassivated and passivated poly-Si TFT's was investigated and compared. The off-current of unpassivated poly-Si TFT's is due to a resistive current at low gate and drain voltage, thermal emission current at high gate, low drain voltage, and field enhanced thermal emission current in the depletion region near the drain at high gate and drain voltage. After hydrogenation, it was observed that the off-currents were remarkably reduced by plasma-hydrogenation. It was also observed that the off-currents of the passivated poly-Si TFT's are more critically dependent on temperature rather than electric field.

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