• Title/Summary/Keyword: Electronic Scan

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Sine Scan Inhomogeneity Field Mapping using Multiple Echo (다중 Echo를 이용한 Single Scan Inhomogeneity Field Mapping)

  • Kim, C.Y.;Han, S.Y.;Jung, K.W.;Oh, C.H.;Yi, Y.;Ahn, C.B.
    • Proceedings of the KOSOMBE Conference
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    • v.1998 no.11
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    • pp.307-308
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    • 1998
  • In this paper, we describe a field measurement technique using multiple gradient echo method. For this purpose, 3 differential phase map is used between two images obtained in a single scan. The phase map is further processed to unfold phase folding (2n $\pi$). The inhomogeneity map is used to correct image distortion along readout gradient direction. Some experimental results obtained at 1.0 Tesla whole body MR system are shown with the proposed technique.

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Building 3D model using laser scan data

  • Choi, Sung-Hun;Kim, Dong-Seok;Lee, Heung-Jae;Lee, Kwae-Hi
    • Proceedings of the KSRS Conference
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    • 2002.10a
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    • pp.101-105
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    • 2002
  • In this paper we describe techniques for the automated creation of geometric correct 3-D models of the building using two 2-D laser scanners. One of the laser scanners is used for position estimation using a scan matching algorithm, while the other is used to build 3-D models of the facade of the buildings. Those models can be used for virtual reality, tele-presence, digital cinematography and urban planning applications. Results are shown for building models in our campus using real data acquired from two sensors.

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Development of Progressive Scan Gamera module using FPGA (FPGA를 이용한 프로그래시브 스캔 카메라 접속 모듈 개발)

  • Kim, Jeong-Hun;Jeon, Jae-Wook;Byun, Jong-Eun
    • Proceedings of the KIEE Conference
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    • 2000.07d
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    • pp.2865-2867
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    • 2000
  • In machine vision fields around FA, there have been demands for functions to capture high speed moving objects as blur-free images. By electronic shutters, progressive scan cameras can do it. This paper develops a module to connect a progressive scan camera, XC-55.

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Image Enhancement Techniques for UT - NDE for Sizing and Detection of Cracks in Narrow Target (초음파 비파괴 평가를 위한 협소 타깃의 크랙 사이징 및 검출을 위한 영상 증진기술)

  • Lee, Young-Seock;Nam, Myoung-Woo;Hong, Sunk-Wan
    • Journal of the Korea Academia-Industrial cooperation Society
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    • v.8 no.2
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    • pp.245-249
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    • 2007
  • In this paper describes image enhancement technique using deconvolution processing for ultrasonic nondestructive testing. When flaws are detected fur B-scan or C-scan, blurring effect which is caused by the moving intervals of transducer degrades the quality of images. In addition, acquisited images suffer form speckle noise which is caused by the ultrasonic components reflected from the grain boundary of material (1,2). The deconvolution technique can restore sharp peak value or clean image from blurring signal or image. This processing is applied to C-scan image obtained from known specimen. Experimental results show that the deconvolution processing contributes to get improved the quality of C-scan images.

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Analysis of the ES detection loss related to the circular scan of radars (레이더의 원형 스캔에 따른 ES 탐지손실 분석)

  • Ryoo, Young-Jin;Kim, Whan-Woo
    • Journal of the Institute of Electronics Engineers of Korea SP
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    • v.42 no.6
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    • pp.159-166
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    • 2005
  • The pulse amplitude of a search radar signal received by an ES system is not constant pulse by pulse because of the radar's scan characteristics. The variation of the pulse amplitude causes the ES detection loss in the ES system. Therefore, the ES detection range equation should consider the ES detection loss caused by the search radar's scan characteristics. In this paper, we theoretically analyze the ES detection loss for the circular scar and propose the model to evaluate it quantitatively. The experiment results for the real search radar signals demonstrate that the proposed model is suitable for the evaluation model of the ES detection loss related to the circular scan of radars.

Influence of Oxide Fabricated by Local Anodic Oxidation in Silicon (실리콘에 Local Anodic Oxidation으로 만든 산화물의 영향)

  • Jung, Seung-Woo;Byun, Dong-Wook;Shin, Myeong-Cheol;Schweitz, Michael A.;Koo, Sang-Mo
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.34 no.4
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    • pp.242-245
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    • 2021
  • In this work, we fabricated oxide on an n-type silicon substrate through local anodic oxidation (LAO) using atomic force microscopy (AFM). The resulting oxide thickness was measured and its correlation with load force, scan speed and applied voltage was analyzed. The surface oxide layer was stripped using a buffered oxide etch. Ohmic contacts were created by applying silver paste on the silicon substrate back face. LAO was performed at approximately 70% humidity. The oxide thickness increased with increasing the load force, the voltage, and reducing the scan speed. We confirmed that LAO/AFM can be used to create both lateral and, to some extent, vertical shapes and patterns, as previously shown in the literature.

Automation of laser scanning and registration of measured data using a 3-axis motorized stage (3축 전동테이블을 이용한 레이저 스캐너의 측정 및 레지스트레이션 자동화)

  • Son, Seok-Bae;Kim, Seung-Man;Lee, Kwan-Heng
    • Proceedings of the KSME Conference
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    • 2001.06c
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    • pp.134-139
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    • 2001
  • Laser scanners are widely used for reverse engineering and inspection of freeform parts in industry such as motors, electronic products, dies and molds. Due to the lack of measuring software and positioning device, the laser scanning processes have been erroneous and inconsistent. In order to automate measuring processes, an automated scan plan generation software and a proprietary hardware are developed. In this paper, an automated laser scanning system using a 3-axis motorized stage is proposed. In the scan planning step, scan directions, paths, and the number of scans are generated considering optical and mechanical parameters. In the scanning step, the generated scan plan is downloaded into the laser scanner and the motorized stage and the points on the surface are captured automatically. Finally, the point data set is analyzed to evaluate the performance of the system.

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A Novel Image Encryption Using Calligraphy Based Scan Method and Random Number

  • Sivakumar, T;Venkatesan, R
    • KSII Transactions on Internet and Information Systems (TIIS)
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    • v.9 no.6
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    • pp.2317-2337
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    • 2015
  • Cryptography provides an effective solution to secure the communication over public networks. The communication over public networks that includes electronic commerce, business and military services, necessitates the requirement of simple and robust encryption techniques. In this paper, a novel image encryption method which employs calligraphy based hybrid scan and random number is presented. The original image is scrambled by pixel position permutation with calligraphy based diagonal and novel calligraphy based scan patterns. The cipher image is obtained by XORing the scrambled image with random numbers. The suggested method resists statistical, differential, entropy, and noise attacks which have been demonstrated with a set of standard images.

An Efficient Test Compression Scheme based on LFSR Reseeding (효율적인 LFSR 리시딩 기반의 테스트 압축 기법)

  • Kim, Hong-Sik;Kim, Hyun-Jin;Ahn, Jin-Ho;Kang, Sung-Ho
    • Journal of the Institute of Electronics Engineers of Korea SD
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    • v.46 no.3
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    • pp.26-31
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    • 2009
  • A new LFSR based test compression scheme is proposed by reducing the maximum number of specified bits in the test cube set, smax, virtually. The performance of a conventional LFSR reseeding scheme highly depends on smax. In this paper, by using different clock frequencies between an LFSR and scan chains, and grouping the scan cells, we could reduce smax virtually. H the clock frequency which is slower than the clock frequency for the scan chain by n times is used for LFSR, successive n scan cells are filled with the same data; such that the number of specified bits can be reduced with an efficient grouping of scan cells. Since the efficiency of the proposed scheme depends on the grouping mechanism, a new graph-based scan cell grouping heuristic has been proposed. The simulation results on the largest ISCAS 89 benchmark circuit show that the proposed scheme requires less memory storage with significantly smaller area overhead compared to the previous test compression schemes.

Efficient Test Wrapper Design in SoC (SoC 내의 효율적인 Test Wrapper 설계)

  • Jung, Jun-Mo
    • Journal of the Korea Academia-Industrial cooperation Society
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    • v.10 no.6
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    • pp.1191-1195
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    • 2009
  • We present the efficient test wrapper design methodology considering the layout distance of scan chain. To test the scan chains in SoC, the scan chains must be assigned to external TAM(Test Access Mechanism) lines. The scan chains in IP were placed and routed without any timing violation at normal mode. However, in test mode, the scan chains have the additional layout distance after TAM line assignment, which can cause the timing violation of flip-flops in scan chains. This paper proposes a new test wrapper design considering layout distance of scan chains with timing violation free.