• 제목/요약/키워드: Electron source

검색결과 1,015건 처리시간 0.033초

Photoneutron yield for an electron beam on tantalum and erbium deuteride

  • Andrew K. Gillespie;Cuikun Lin;R.V. Duncan
    • Nuclear Engineering and Technology
    • /
    • 제56권8호
    • /
    • pp.3084-3089
    • /
    • 2024
  • An electron beam may be used to generate bremsstrahlung photons that go on to create photoneutrons within metals. This serves as a low-energy neutron source for irradiation experiments. In this article, we present simulation results for optimizing photoneutron yield for a 10-MeV electron beam on tantalum foil and erbium deuteride (ErD3). The thickness of the metal layers was varied. A tantalum foil thickness of 1.5 mm resulted in the most photons reaching the second metal layer. When a second metal layer of ErD3 was included, the photoneutron yield increased with the thickness of the secondary layer. When the electron beam was directly incident upon a layer of ErD3, the photoneutron yield did not differ significantly from the yield when a layer of tantalum was included. The directional photoneutron yield reached a maximum level when the thickness of the ErD3 layer was around 12 cm. About 1 neutron was generated per 104 source electrons. When using a 2-mA beam current, it is possible to generate up to 1012 neutrons per second, making this combination a relatively-inexpensive neutron generator.

Cl-based 유도결합 플라즈마의 전자에너지 분포함수 (Electron energy distribution functions in an inductively coupled a-based plasma)

  • 김관하;김창일;김동표;강영록
    • 한국전기전자재료학회:학술대회논문집
    • /
    • 한국전기전자재료학회 2005년도 하계학술대회 논문집 Vol.6
    • /
    • pp.91-91
    • /
    • 2005
  • Electron energy distribution functions and plasma parameters such as electron temperature ($T_e$) and electron density ($n_e$) in low-pressure Cl-based plasmas have been measured. As the $Cl_2/A4$ gas mixing ratio, the $BCl_3$ gas addition and the process pressure increases, the electron energy probability and the electron temperature decreases. In case of source power increases, electron energy probability increases, whereas the electron temperature was not related.

  • PDF

Enhanced Inductively Coupled Plasma의 자화 주파수 의존 특성 (Magnetized Frequency characteristics of Enhanced Inductively Coupled Plasma)

  • 라상호;박세근;오범환
    • 대한전자공학회:학술대회논문집
    • /
    • 대한전자공학회 2000년도 하계종합학술대회 논문집(2)
    • /
    • pp.302-305
    • /
    • 2000
  • It is important to control the electron energy distribution to have high quality plasma process. A conventional inductively coupled plasma(ICP) source with 13.56MHz power is not adequate for low damage sub-half micron patterning process due to higher electron temperature. Only the pulsed plasma technique seems to provide low electron temperature, and thus low process damage. Recently, a novel method proposed by us, named as ‘Enhanced-ICP’, which uses periodic weak axial magnetic field added to a normal ICP source, has shown great improvement in etch characteristics. changes of plasma characteristics according to the frequency of time-varying axial magnetic field have been observed by probe-time-averaged Langmuir probe.

  • PDF

Heat Source Modeling and Study on the Effect of Thickness on Residual Stress Distribution in Electron Beam Welding

  • Rajabi, Leila;Ghoreishi, Majid
    • Journal of Welding and Joining
    • /
    • 제35권1호
    • /
    • pp.49-54
    • /
    • 2017
  • In this study, the volumetric heat source in electron beam welding (EBW) is modeled through finite element method taking advantage of ABAQUS software package. Since this welding method is being applied in plates with different thicknesses and also considering that residual stresses reduce the strength of these weldments, the effect of thickness in the distribution and magnitude of residual stresses after welding is studied. Regarding the vast application of Inconel 706 super-alloy in aerospace industries, this material was selected in the current research. In order to validate the finite element model, the obtained results were compared to those of other researchers in this area, and good agreement was observed. The simulation results revealed that increase in the plate thickness leads to increase in the residual stresses. In addition heat treatment in the base metal (before welding) increases the residual stresses significantly.

Etching Characteristics of Fine Ta Patterns with Electron Cyclotron Resonance Chlorine Plasma

  • Kim, Sang-Hoon;Woo, Sang-Gyun;Ahn, Jin-Ho
    • 한국마이크로전자및패키징학회:학술대회논문집
    • /
    • 한국마이크로전자및패키징학회 2000년도 Proceedings of 5th International Joint Symposium on Microeletronics and Packaging
    • /
    • pp.97-102
    • /
    • 2000
  • We have studied etching characteristic of Ta film using Electron Cyclotron Resonance (ECR) etcher system. Microwave source power. RF bias power. and working pressure were varied to investigate the etch Profile. And we have used two step etching method to acquire the goWe have studied etching characteristic of Ta film using Electron Cyclotron Resonance (ECR) etcher system. Microwave source power. RF bias power. and working pressure were varied to investigate the etch Profile. And we have used two step etching method to acquire the good etch profile preventing the microloading effect.od etch profile preventing the microloading effect.

  • PDF

정전기 보호를 위한 이중 극성소스를 갖는 EDNMOS 소자의 특성 (Characteristics of Extended Drain N-type MOSFET with Double Polarity Source for Electrostatic Discharge Protection)

  • 서용진;김길호;박성우;이성일;한상준;한성민;이영균;이우선
    • 대한전기학회:학술대회논문집
    • /
    • 대한전기학회 2006년도 추계학술대회 논문집 전기물성,응용부문
    • /
    • pp.97-98
    • /
    • 2006
  • High current behaviors of extended drain n-type metal-oxide-semiconductor field effects transistor (EDNMOS) with double polarity source (DPS) for electrostatic discharge (ESD) protection are analyzed. Simulation based contour analyses reveal that combination of bipolar junction transistor operation and deep electron channeling induced by high electron injection gives rise to the second on-state. Therefore, the deep electron channel formation needs to be prevented in order to realize stable and robust ESD protection performance. Based on our analyses, general methodology to avoid the double snapback and to realize stable ESD protection is to be discussed.

  • PDF

마이크로 칩의 정전기 방지를 위한 DPS-GG-EDNMOS 소자의 특성 (Characteristics of Double Polarity Source-Grounded Gate-Extended Drain NMOS Device for Electro-Static Discharge Protection of High Voltage Operating Microchip)

  • 서용진;김길호;이우선
    • 한국전기전자재료학회:학술대회논문집
    • /
    • 한국전기전자재료학회 2006년도 하계학술대회 논문집 Vol.7
    • /
    • pp.97-98
    • /
    • 2006
  • High current behaviors of the grounded gate extended drain N-type metal-oxide-semiconductor field effects transistor (GG_EDNMOS) electro-static discharge (ESD) protection devices are analyzed. Simulation based contour analyses reveal that combination of BJT operation and deep electron channeling induced by high electron injection gives rise to the 2-nd on-state. Thus, the deep electron channel formation needs to be prevented in order to realize stable and robust ESD protection performance. Based on our analyses, general methodology to avoid the double snapback and to realize stable ESD protection is to be discussed.

  • PDF

열전자형 주사전자현미경 결상특성의 수치해석 (Numerical Analysis for the Image Evaluation of a Thermionic SEM)

  • 정현우;박만진;김동환;장동영;박근
    • 한국공작기계학회논문집
    • /
    • 제16권6호
    • /
    • pp.153-158
    • /
    • 2007
  • The present study covers numerical analysis of a thermionic scanning electron microscope(SEM) column. The SEM column contains an electron optical system in which electrons are emitted and moved to form a focused beam, and this generates secondary electrons from the specimen surfaces, eventually making an image. The electron optical system mainly consists of a thermionic electron gun as the beam source, the lens system, the electron control unit, and the vacuum unit. For a systematic design of the electron optical system, the beam trajectories are investigated through numerical analyses by tracing the ray path of the electron beams, and the quality of resulting image is evaluated from the analysis results.

SEM 단면 시료 제작을 위한 플라즈마 이온원의 구조 (Structure of a Plasma Ion Source for a Cross-Section SEM Sample)

  • 원종한;장동영;박만진
    • 한국생산제조학회지
    • /
    • 제24권4호
    • /
    • pp.400-406
    • /
    • 2015
  • This study researched the structure of the source of an ion milling machine used to fabricate a scanning electron microscope (SEM) sample. An ion source is used to mill out samples of over 1 mm dimension using a broad ion beam to generate plasma between the anode and cathode using a permanent magnet. To mill the sample in the vacuum chamber, the ion source should be greater than 6 kV for a positive ion current over $200{\mu}A$. To discover the optimum operating conditions for the ion miller, the diameter of the extractor, anode shape, and strength of the permanent magnet were varied in the experiments. A silicon wafer was used as the sample. The sputter yield was measured on the milled surface, which was analyzed using the SEM. The wafer was milled by injecting 1 sccm of argon gas into the 0.5 mTorr vacuum chamber.

Simulation Study of Optimizing Multicusp Magnetic Line Configurations for a Negative Hydrogen Ion Source

  • 김재홍;홍성광;김종원
    • 한국진공학회:학술대회논문집
    • /
    • 한국진공학회 2014년도 제46회 동계 정기학술대회 초록집
    • /
    • pp.250.1-250.1
    • /
    • 2014
  • A multicusp ion source has been used widely in negative hydrogen cyclotrons mainly for radioisotope productions. The ion source is designed to have cusp geometries of magnetic field inside plasma chamber, where ions are confining and their mean lifetimes increase. The magnetic confinement produced a number of permanent magnetic poles helps to increase beam currents and reduce the emittance. Therefore optimizing the number of magnets confining more ions and increasing their mean lifetime in plasma has to be investigated in order to improve the performance of the ion source. In this work a numerical simulation of the magnetic flux density from a number of permanent magnets is carried to optimize the cusp geometries producing the highest plasma density, which is clearly indicated along the full-line cusp geometry. The effect of magnetic fields and a number of poles on the plasma structure are investigated by a computing tool. The electron confinement effect becomes stronger and the density increases with increasing the number of poles. On the contrary, the escape of electrons from the loss cone becomes more frequent as the pole number increases [1]. To understand above observation the electron and ion's trajectories along with different cusp geometries are simulated. The simulation has been shown that the optimized numbers of magnets can improve the ion density and uniformity.

  • PDF