• Title/Summary/Keyword: Electron Beam Evaporation Source

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Evaporation Characteristics of Materials from an Electron Beam Evaporation Source (전자빔 증발원을 이용한 물질의 증발 특성)

  • Jeong, J.I.;Yang, J.H.;Park, H.S.;Jung, J.H.;Song, M.A.
    • Journal of the Korean institute of surface engineering
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    • v.44 no.4
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    • pp.155-164
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    • 2011
  • Electron beam evaporation source is widely used to prepare thin films by physical vapor deposition because it is very effective to vaporize materials and there is virtually no limit to vaporize materials including metals and compounds such as oxide. In this study, evaporation characteristics of various metals and compounds from an electron beam evaporation source have been studied. The 180 degree deflection type electron beam evaporation source which has 6-hearth crucibles and is capable of inputting power up to 10 kW was employed for evaporation experiment. 36 materials including metals, oxides and fluorides have been tested and described in terms of optimum crucible liner, evaporation state, stability, and so on. Various crucible liners have been tried to find out the most effective way to vaporize materials. Two types of crucible liners have been employed in this experiment. One is contact type liner, and the other is non-contact type one. It has been tried to give the objective information and the most effective evaporation method on the evaporation of materials from the electron beam evaporation source. It is concluded that the electron beam evaporation source can be used to prepare good quality films by choosing the appropriate crucible liner.

Influence of Deposition Method on Refractive Index of SiO2 and TiO2 Thin Films for Anti-reflective Multilayers

  • Song, Myung-Keun;Yang, Woo-Seok;Kwon, Soon-Woo;Song, Yo-Seung;Cho, Nam-Ihn;Lee, Deuk-Yong
    • Journal of the Korean Ceramic Society
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    • v.45 no.9
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    • pp.524-530
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    • 2008
  • Anti-Reflective (AR) thin film coatings of $SiO_2$ (n= 1.48) and $TiO_2$ (n=2.17) were deposited by ion-beam assisted deposition (IBAD) with End-Hall ion source and conventional electron beam (e-beam) evaporation to investigate the effect of deposition method on the refractive indicies (n) of the fIlms. Green-light generation using a GaAs laser diode was achieved via excitation of the second harmonic. The latter resulted from the transmission of the fundamental guided-mode wave of 1064 nm through periodically poled $LiNbO_3$. Large differences in the refractive indicies of each of the layers in the multilayer coating may improve AR performance. IBAD of $SiO_2$ reduced its refractive index from 1.45 to 1.34 at 1064 nm. Conversely, e-beam evaporation of $TiO_2$ increased its refractive index from 1.80 to 2.11. In addition, no fluctuations in absorption at the wavelength of 1064 nm were found. The results suggest that films prepared by different deposition methods can increase the effectiveness of multilayer AR coatings.

Study on the deposition rate and vapor distribution of Al films prepared by vacuum evaporation and arc-induced ion plating (증착방법에 따른 Al 피막의 증착율 및 증기분포에 관한 연구)

  • 정재인;정우철;손영호;이득진;박성렬
    • Journal of the Korean Vacuum Society
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    • v.9 no.3
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    • pp.207-215
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    • 2000
  • Al films on cold-rolled steel sheet have been prepared by vacuum evaporation and arc-induced ion plating, respectively, and the evaporation rate and vapor distribution (thickness distribution over the substrate) have been investigated according to deposition conditions. The arc-induced ion plating (AIIP) method have been employed, which makes use of arc-like discharge current induced by ionization electrode located near the evaporation source. The AIIP takes advantage of high ionization rate compared with conventional ion plating, and can be carried out at low pressure of less than $10^{-4}$ torr. Very high evaporation rate of more than 2.0 mu\textrm{m}$/min could be achieved for Al evaporation using alumina liner by electron beam evaporation. The geometry factor n for the $cos^{n/\phi}$ vapor distribution, which affects the thickness distribution of films at the substrate turned out to be around 1 for vacuum evaporation, while it features around 2 or higher for ion plating. For the ion plated films, it has been found that the ionization condition and substrate bias are the main parameters to affect the thickness distribution of the films.

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A STUDY ON THE RELATIONSHIP BETWEEN PLASMA CHARACTERISTICS AND FILM PROPERTIES FOR MgO BY PULSED DC MAGNETRON SPUTTERING

  • Nam, Kyung H.;Chung, Yun M.;Han, Jeon G.
    • Proceedings of the Korean Institute of Surface Engineering Conference
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    • 2001.11a
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    • pp.35-35
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    • 2001
  • agnesium Oxide (MgO) with a NaCI structure is well known to exhibit high secondary electron emission, excellent high temperature chemical stability, high thermal conductance and electrical insulating properties. For these reason MgO films have been widely used for a buffer layer of high $T_c$ superconducting and a protective layer for AC-plasma display panels to improve discharge characteristics and panel lifetime. Up to now MgO films have been synthesized by lE-beam evaporation, Molecular Beam Epitaxy (MBE) and Metalorganic Chemical Vapor Deposition (MOCVD), however there have been some limitations such as low film density and micro-cracks in films. Therefore magnetron sputtering process were emerged as predominant method to synthesis high density MgO films. In previous works, we designed and manufactured unbalanced magnetron source with high power density for the deposition of high quality MgO films. The magnetron discharges were sustained at the pressure of O.lmtorr with power density of $110W/\textrm{cm}^2$ and the maximum deposition rate was measured at $2.8\mu\textrm{m}/min$ for Cu films. In this study, the syntheses of MgO films were carried out by unbalanced magnetron sputtering with various $O_2$ partial pressure and specially target power densities, duty cycles and frequency using pulsed DC power supply. And also we investigated the plasma states with various $O_2$ partial pressure and pulsed DC conditions by Optical Emission Spectroscopy (OES). In order to confirm the relationships between plasma states and film properties such as microstructure and secondary electron emission coefficient were analyzed by X-Ray Diffraction(XRD), Transmission Electron Microscopy(TEM) and ${\gamma}-Focused$ Ion Beam (${\gamma}-FIB$).

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XPS Characterization and Morphology of MgO Thin Films grown on Single-Crystalline Diamond (100)

  • Lee, S.M.;Ito, T.;Murakami, H.
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2003.07a
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    • pp.19-27
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    • 2003
  • Morphology and composition of MgO films grown on single-crystalline diamond (100) have been studied. MgO thin films were deposited in the substrate temperature range from room temperature (RT) to 723K by means of electron beam evaporation using MgO powder source. Atomic force microscopy images indicated that the film grown at RT without $O_2$ supply was relatively uniform and flat whereas that deposited in oxygen ambient yielded higher growth rates and rough surface morphologies. X-ray photoelectron spectroscopy analyses demonstrate that the MgO film deposited at RT without $O_2$ has the closest composition to the stoichiometric MgO, and that a thin contaminant layer composed mainly of magnesium peroxide (before etching) or hydroxide (after etching) was unintentionally formed on the film surface, respectively. These results will be discussed in relation to the interaction among the evaporated species and intentionally supplied oxygen molecules at the growth front as well as the interfacial energy between diamond and MgO.

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Evaporation characteristics of some materials by resistive and electron beam heating source (저항가열 및 전자빔 증발원을 이용한 물질의 증발 특성)

  • Jeong, Jae-In;Yang, Ji-Hun
    • Proceedings of the Korean Institute of Surface Engineering Conference
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    • 2014.11a
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    • pp.25-25
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    • 2014
  • 박막의 제조는 많은 연구의 기초가 되는 시편을 만드는 과정으로, 현대의 과학기술 연구개발에서 매우 중요한 공정의 하나이다. 그러나 박막의 제조는 제조하는 사람의 숙련도나 장치에 의존하는 경우가 많고 경우에 따라서는 원하는 특성의 박막을 제조하기 어려운 경우도 많다. 그러다보니 경험이 없는 연구자의 경우는 때때로 까다로움과 번거로움을 느끼게 되며, 안정된 공정을 찾기까지 많은 시간을 소비 하게 된다. 특히 부적절한 증발방법의 선정에 따른 실험 결과는 경제적인 손실을 초래할 뿐만 아니라 실험하는 사람을 좌절시키는 가장 큰 요인이 되어왔다. 본 논문에서는 박막 제조에 널리 이용되는 저항가열 및 전자빔 증발원을 이용하여 다양한 물질에 대한 증발특성을 조사하고 그 결과를 발표하고자 한다.

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Effect of $Al_2O_3$ capping layer on properties of MgO protection layer for plasma display panel

  • Eun, Jae-Hwan;Lee, Jung-Heon;Kim, Soo-Gil;Kim, Hyeong-Joon
    • 한국정보디스플레이학회:학술대회논문집
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    • 2002.08a
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    • pp.628-631
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    • 2002
  • $Al_2O_3$ capping layer and MgO protective layer were deposited by electron beam evaporation method using single crystal source. Thickness of the capping layer, $Al_2O_3$, was varied from 5 nm to 10 nm. Surface morphology was observed by SEM and AFM before and after hydration. And microstructure of deposited $Al_2O_3$ layer and chemical shift of electron binding energy were also observed by high resolution TEM and XPS, respectively, after hydration. From these results, it was found that Mg atoms diffused into $Al_2O_3$ layer, reacted with moisture and formed $Mg(OH)_2$ during hydration. As thickness of $Al_2O_3$ increased, extent of hydration increased. $Al_2O_3$ capped MgO thin films and uncapped MgO thin films were deposited on AC-PDP test panel to characterize discharge properties. Although $Al_2O_3$ has poor discharge properties rather than MgO, because of many hydrated species on the surface of MgO, similar discharge properties were observed.

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저항가열 및 전자빔 증발원을 이용한 물질의 증발 특성

  • Jeong, Jae-In;Yang, Ji-Hun;Park, Hye-Seon;Jeong, Jae-Hun;Song, Min-A
    • Proceedings of the Korean Vacuum Society Conference
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    • 2011.08a
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    • pp.130-131
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    • 2011
  • 박막의 제조는 많은 연구의 가장 기초가 되는 시편을 만드는 과정으로 현대의 과학기술에서 매우 중요한 공정 중의 하나이다. 그러나 이러한 박막의 제조는 제조하는 사람의 숙련도나 장치에 의존하며 경우에 따라서는 원하는 특성의 박막을 제조하는 것이 매우 어려운 작업이 되기도 한다. 따라서 경험이 없는 연구자의 경우는 때때로 까다로움과 번거로움을 느끼게 되며, 안정된 공정을 찾기까지 많은 시간을 소비 하게 된다. 특히 부적절한 증발방법의 선정에 따른 실험 결과는 경제적인 손실을 초래할 뿐만 아니라 실험하는 사람을 좌절시키는 가장 큰 요인이 되어왔다. 진공증착에 의한 박막의 제조는 증발법과 스퍼터링, 이온플레이팅 등의 방법이 있으며 이중 증발을 이용한 박막의 제조에는 저항가열 증발, 전자빔 가열 증발, 유도가열 증발 등의 방법으로 구분하고 있다. 저항가열 증발원은 가격이 저렴하다는 장점은 있으나 증발원이 손쉽게 파손되거나 증발량이 일정하지 않아 박막의 정밀 제어가 어려울 뿐만 아니라 때에 따라서는 1 ${\mu}m$ 이상의 후막 형성에도 어려움이 있는 등 많은 제약이 있다. 따라서 적절한 증발원의 선정이 실험의 효율성을 좌우하는 경우가 많다. 적절한 증발원의 선정과 효율적인 실험을 위해 증발원 제조회사에서는 증발원의 선정과 증발 조건과 관련된 자료를 카탈로그 형태로 발행하고 있다. 그러나 그러한 자료만으로는 객관적인 정보를 얻기에 충분하지 못한 경우가 많으며, 어떤 경우에는 저자 등의 경험과 일치하지 않는 정보도 포함하고 있었다. 전자빔 증발원은 냉각이 되는 Crucible에 물질을 담고 고전압의 전자빔으로 물질을 가열시켜 증발시키는 증발원으로 1960년대 이후 박막 제조 실험에 이용되기 시작하였다. 전자빔은 고순도의 피막 제조가 가능하고 증발물질의 교체가 쉬우며 고속 증발이 가능함은 물론 다층막의 제조가 용이하고 증발물질의 제조비용이 저렴하다는 장점이 있다. 이러한 장점 때문에 1970년대 이후에는 전자빔을 이용한 박막제조가 폭 넓게 이루어졌고 이때를 즈음하여 전자빔을 이용한 물질의 증발 특성이 논문으로 발표되기도 하였다. 본 연구에서는 증발에 관한 저자들의 경험을 바탕으로 저항가열과 전자빔을 이용하여 증발실험을 진행한 물질계를 중심으로 각 물질의 증발특성과 가장 효율적인 Liner 등에 대해 기술하였다. 특히, 각종 물질의 증발 특성을 체계화함은 물론 효율적인 증발 방법을 객관적인 Data와 함께 제공하여 효과적인 박막 제조 실험에 도움이 되고자 하였다.

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The structure and the surface composition of semiconductor CdZnTe films by EBE (EBE로 증착된 반도체 CdZnTe 박막의 결정구조와 표면조성)

  • 박국상;김선옥;이기암
    • Journal of the Korean Crystal Growth and Crystal Technology
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    • v.5 no.1
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    • pp.25-36
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    • 1995
  • We have investigated the structure and the conductivity of the $Cd_{1-y}Zn_{y}$ Te films evaporated on the glass substrates (Corning 7059) by Electron Beam Evaporator (EBE) in pressure of approximately $1 {\times} 10^{-6}$ torr.The structure temperatures were held at both room temperature and $300^{\circ}C$, and the samples have annealed for an hour at $300^{\circ}C$ The survace com-position of the as-prepared films were slightly different from those of CdZn Te source material.Cd losses on the CdZnTe surface was measured about 4% of atomic ratio at room temperature substrate, whereas Zn atomic ratio was nearly constant, relatively. The strure is observed to be polycrystalline whose phase is mainly cubic phase. Thermal expansion coefficient was $6.30 {\times} 10^{-5}/^{\circ}C$ which was calculated from the variation of lattice parameter by X-ray powder pat-terns measured at $400^{\circ}C$.Diffraction peaks were slightly increased by annealing for an hour at $300^{\circ}C $, but they werey highly affected by substrate temperature during evaporation.

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Organic Thin Film Transistors for Liquid Crystal Display Fabricated with Poly 3-Hexylthiophene Active Channel Layer and NiOx Electrodes

  • Oh, Yong-Cheul
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.19 no.12
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    • pp.1140-1143
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    • 2006
  • We report on the fabrication of P3HT-based thin-film transistors (TFTs) for liquid crystal display that consist of $NiO_x$, poly-vinyl phenol (PVP), and Ni for the source-drain (S/D) electrodes, gate dielectric layer, and gate electrode, respectively The $NiO_x$ S/D electrodes of which the work function is well matched to that of P3HT are deposited on a P3HT channel by electron-beam evaporation of NiO powder. The maximum saturation current of our P3HT-based TFT is about $15{\mu}A$ at a gate bias of -30 V showing a high field effect mobility of $0.079cm^2/Vs$ in the dark, and the on/off current ratio of our TFT is about $10^5$. It is concluded that jointly adopting $NiO_x$ for the S/D electrodes and PVP for gate dielectric realizes a high-quality P3HT-based TFT.