• Journal of the Korea Academia-Industrial cooperation Society
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• v.18 no.10
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• pp.63-68
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• 2017

Although automated metro subway systems have the advantage of operating a train without a train driver, it is difficult to detect an immediate fault condition and take countermeasures when an unusual situation occurs. Therefore, it is important to construct a maintenance information system (MIS) that detects the vehicle failure/status information in real time and maintains it efficiently in the depot of the railway's vehicles. This paper proposes a conceptual design method that realizes the interface between the train control system (TCS), the operation control center train control monitoring system (OCC-TCMS) console, and the MIS using wireless communication network in real-time. To transmit a large amount of information on 800,000 occurrences per day during operation, data was collected in a 56 byte data table using a data processing algorithm. This state information was classified into 4 hexadecimal codes and transmitted to the MIS by mapping the status and the fault information on the vehicle during the main line operation. Furthermore, the transmission and reception data were examined in real time between the TCS and MIS, and the implementation of the failure information screen was then displayed.

• Journal of Internet Computing and Services
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• v.15 no.5
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• pp.107-121
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• 2014

Distributed systems are collection of physically distributed computers linked by a network. General use of wired/wireless Internet enables users to make use of distributed service anytime and anywhere. The explosive growth of distributed services strongly requires functional verification of services as well as verification of non-functional elements such as service quality. In order to verify distributed services it is necessary to build a test environment for distributed systems. Because, however, distributed systems are composed of physically distributed nodes, efforts to construct a test environment are required more than those in a test environment for a monolithic system. In this paper we propose a test framework to verify functional and non-functional features of distributed systems. The suggested framework automatically generates test cases through the message sequence charts, and includes a test driver composed of the virtual nodes which can simulate the physically distributed nodes. The test result can be checked easily through the various graphs and the graphical user interface (GUI). The test framework can reduce testing efforts for a distributed system and can enhance the reliability of the system.

• Journal of the Institute of Electronics Engineers of Korea SC
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• v.47 no.1
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• pp.17-28
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• 2010

This paper presents a new automatic TFT-LCD image quality optimization system using DSP for the first time. Since conventional manual method depends on experiences of LCD module developers, it is highly labor-intensive and requires several correction steps providing large gamma correction error. The proposed system optimizes automatically gamma adjustment and power setting registers in mobile TFT-LCD driver IC to reduce gamma correction error, adjusting time, and flicker. It contains module-under-test (MUT, TFT-LCD module), PC installed with program, multimedia display tester for measuring luminance and flicker, and control board for interface between PC and TFT-LCD module. We have developed a new algorithm using 6-point programmable matching technique with reference gamma curve and applying automatic power setting sequence. Developed algorithm and program are generally applicable for most of the TFT-LCD modules. It is realized to calibrate gamma values of 1.8, 2.0, 2.2 and 3.0, and reduce flicker level. The control board is designed with DSP and FPGA, and it supports various interfaces such as RGB and CPU. Developed automatic image quality optimization system showed significantly reduced gamma adjusting time, reduced flicker, and much less average gamma error than conventional manual method. We believe that the proposed system is very useful to provide high-quality TFT-LCD and to improve developing process using optimized gamma-curve setting and automatic power setting.