• Title/Summary/Keyword: Down-scaling

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Rainfall Quantile Estimation using Scaling IDF Curve and Frequency Analysis (스케일링 IDF곡선과 빈도해석을 이용한 확률강우량 추정)

  • Jung, Younghun;Kim, Sunghun;Kim, Hanbeen;Heo, Jun-Haeng
    • Proceedings of the Korea Water Resources Association Conference
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    • 2017.05a
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    • pp.436-436
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    • 2017
  • IDF(intensity-duration-frequency) 곡선은 재현기간을 고려하여 수공구조물 설계에 필요한 설계강우량을 산정하는데 사용되고 있다. 국내의 경우 IDF 곡선은 지점빈도해석으로부터 지속기간별로 산정되고 있으며 지속기간별 분포형 선택과 같은 많은 가정으로 인해 불확실성을 내포하고 있다. 본 연구에서는 이러한 극한 강우량의 스케일 특성을 통해 서로 다른 기간에 걸쳐 통계적으로 접근하고자 하였다. 이를 위해 지속기간 24시간의 강우자료로부터 연최대강우량을 추출하여 스케일 특성을 통해 지속기간 24시간 이하 또는 이상의 스케일링(scaling) IDF 곡선을 유도하였다. 본 연구를 위해 k-means 방법으로부터 지역을 구분하여 지역빈도해석을 실시하였고, 기상청 산하의 강우 지점을 미계측 지점으로 가정한 후 하향스케일링(down-scaling)과 상향스케일링(up-scaling)을 적용한 후 지속기간 24시간 이외의 확률강우량을 추정하였으며, 빈도해석 결과와의 비교를 통해 스케일링 IDF 곡선의 적용성을 판단하였다.

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New Voltage Programming LTPS-TFT Pixel Scaling Down VTH Variation for AMOLED Display

  • Nam, Woo-Jin;Lee, Jae-Hoon;Choi, Sung-Hwan;Jeon, Jae-Hong;Han, Min-Koo
    • 한국정보디스플레이학회:학술대회논문집
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    • 2006.08a
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    • pp.399-402
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    • 2006
  • A new voltage-scaled compensation pixel which employs 3 p-type poly-Si TFTs and 2 capacitors without additional control line has been proposed and verified. The proposed pixel does not employ the $V_{TH}$ memorizing and cancellation, but scales down the inevitable $V_{TH}$ variation of poly-Si TFT. Also the troublesome narrow input range of $V_{DATA}$ is increased and the $V_{DD}$ supply voltage drop is suppressed. In our experimental results, the OLED current error is successfully compensated by easily controlling the proposed voltage scaling effects.

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A novel approach for designing of variability aware low-power logic gates

  • Sharma, Vijay Kumar
    • ETRI Journal
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    • v.44 no.3
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    • pp.491-503
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    • 2022
  • Metal-oxide-semiconductor field-effect transistors (MOSFETs) are continuously scaling down in the nanoscale region to improve the functionality of integrated circuits. The scaling down of MOSFET devices causes short-channel effects in the nanoscale region. In nanoscale region, leakage current components are increasing, resulting in substantial power dissipation. Very large-scale integration designers are constantly exploring different effective methods of mitigating the power dissipation. In this study, a transistor-level input-controlled stacking (ICS) approach is proposed for minimizing significant power dissipation. A low-power ICS approach is extensively discussed to verify its importance in low-power applications. Circuit reliability is monitored for process and voltage and temperature variations. The ICS approach is designed and simulated using Cadence's tools and compared with existing low-power and high-speed techniques at a 22-nm technology node. The ICS approach decreases power dissipation by 84.95% at a cost of 5.89 times increase in propagation delay, and improves energy dissipation reliability by 82.54% compared with conventional circuit for a ring oscillator comprising 5-inverters.

FinFET for Terabit Era

  • Choi, Yang-Kyu
    • JSTS:Journal of Semiconductor Technology and Science
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    • v.4 no.1
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    • pp.1-11
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    • 2004
  • A FinFET, a novel double-gate device structure is capable of scaling well into the nanoelectronics regime. High-performance CMOS FinFETs , fully depleted silicon-on-insulator (FDSOI) devices have been demonstrated down to 15 nm gate length and are relatively simple to fabricate, which can be scaled to gate length below 10 nm. In this paper, some of the key elements of these technologies are described including sub-lithographic pattering technology, raised source/drain for low series resistance, gate work-function engineering for threshold voltage adjustment as well as metal gate technology, channel roughness on carrier mobility, crystal orientation effect, reliability issues, process variation effects, and device scaling limit.

The Study on Scaling Methodology for 0.1${\mu}{\textrm}{m}$ MOSFET′s (0.1${\mu}{\textrm}{m}$ MOSFET를 위한 스케일링 방법에 관한 연구)

  • 신희갑;류찬형;김환준;이철인;최현식;김태형;서용진;김창일;장의구
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 1996.05a
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    • pp.109-113
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    • 1996
  • In this work, a scaling methodology to scale down to or below 0.1$\mu\textrm{m}$ is presented, considering a current process technology. 0.12$\mu\textrm{m}$ nMOSFET's with both good performance and reliability is designed by this methodology

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Scale Effect on Combustion Characteristics of N2O/PE Hybrid Rocket (N2O/PE 하이브리드 로켓의 스케일 변화에 따른 연소특성 연구)

  • Han, Seongjoo;Moon, Keunhwan;Kim, Jinkon;Moon, Heejang
    • Proceedings of the Korean Society of Propulsion Engineers Conference
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    • 2017.05a
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    • pp.797-802
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    • 2017
  • This paper describes the scale effect of hybrid rocket motor which has blow-down oxidizer supply system. ResuIts show that the scale effect on regression rate is negligible using presently accessible scaling relation for $LN_2O$/PE propellant combination amid the absence of exactly proven scaling relation. It was also found that the characteristic velocity efficiency increases as motor scale increases. However, the characteristic velocity efficiency includes complicated parameters such as post-chamber configuration or geometry which can affect the entire flow field. It is therefore hard to conclude that the increase of efficiency is solely due to the enlargement of motor scale nor draw any conclusion on the scale effect which require a profound understanding of hybrid rocket scaling rules.

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Comparison of Rainfall Quantile using At-site Frequency Analysis and Scale Invariance Property (빈도해석과 스케일 성질을 이용한 확률강우량의 비교)

  • Jung, Young-Hun;Kim, Soo-Young;Kim, Tae-Soon;Heo, Jun-Haeng
    • Proceedings of the Korea Water Resources Association Conference
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    • 2008.05a
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    • pp.164-168
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    • 2008
  • 일반적으로 확률강우량은 관측지점에서 관측된 연최대 강우량자료를 바탕으로 빈도해석을 적용하여 산정한다. 그러나 국내에서는 매시각별로 관측된 자료가 대부분이기 때문에 단기간 혹은 장기간의 지속기간에 대한 확률강우량을 산정하는 것은 쉽지 않다. 따라서 본 연구에서는 매시각단위의 지속기간 강우자료를 바탕으로 다양한 지속기간에 대한 확률 강우량을 산정할 수 있는 스케일 성질을 적용하여 확률강우량을 산정하여 정확성을 판단하였다. 강우자료는 비교적 신뢰성이 높고 자료기간이 긴 기상청 지점 22개 자료를 사용하였으며, 2003년까지의 관측된 자료를 이용하여 확률강우량을 산정한 후 지점빈도해석 프로그램인 FARD2006과 비교하여 지점빈도해석의 결과 값을 참값으로 절대상대오차를 산정하여 비교하였다. 산정한 방법은 기준이 되는 확률강우량을 산정한 후 그보다 긴 지속기간에 대한 확률강우량을 산정하는 방법인 상향스케일링 (Up-scaling)과 그 보다 짧은 지속기간에 대한 확률강우량을 산정하는 방법인 하향스케일링(Down-scaling)의 두 가지 방법으로 확률강우량을 산정하였다. 두 방법 모두 1시간$\sim$24시간의 지속기간에 대한 확률강우량을 2년$\sim$500년의 재현기간에 대하여 확률강우량을 산정하였으며, 빈도해석으로 산정한 FARD2006의 결과값과 비교하여 절대상대오차를 산정하였다. 그 결과, 시간단위자료를 사용할 경우 대부분 절대상대오차가 10% 미만인 결과를 얻을 수 있었으며, 14개의 재현기간 중에서 8개 이상의 재현기간에 대해 적용이 가능한 것으로 나타났다. 지속기간 1시간 강우자료를 기준 지속기간으로 1시간 미만의 지속기간에 대한 확률강우량을 추정한 결과 10분을 제외하고는 대부분 절대상대오차가 10% 내외의 정확도를 가지는 것으로 나타났다. 따라서 스케일 성질을 이용하여 미계측 강우지속기간의 확률강우량을 추정할 수 있을 것으로 판단된다.

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Analysis of SNE Learner's Performance Using NASA Scaling

  • Naveen, A.;Babu, Sangita
    • Journal of the Korea Convergence Society
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    • v.5 no.3
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    • pp.45-51
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    • 2014
  • Computer science and computing technologies are applied into mathematical, science, medical, engineering and educational applications. The models are used to solve the issues in all the domains. Educational systems are used top down, bottom up, Gap Analysis model in the educational learning system. Educational learning process integrated with Lerner, content and the methodology. The Learners and content are same in the educational system or similar courses but the teaching methodologies are differing one with another. The determinations of teaching methodologies are based on the factors related to that particular model or subject. The learning model influencing determinations are made by the surveys, analysis and observation of data to maximize the learning outcome. This paper attempted to evaluate the SNE learners cognitive using NASA Scaling.

Random Telegraph Signals of the Scaling-down NOR Flash Cells

  • An, Ho-Joong;Lee, Gae-Hun;Kil, Gyu-Hyun;Song, Yun-Heup
    • Proceedings of the Korean Vacuum Society Conference
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    • 2010.02a
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    • pp.250-250
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    • 2010
  • The random telegraph signal (RTS) for the NOR flash cell scaling is investigated. An innovative method to suppress the RTS, based on the device engineering, is proposed. By optimizing the channel doping profile and using the high-k tunnel dielectric, it is confirmed from three-dimensional (3-D) simulation, that the $V_{th}$ amplitude, dueto RTS, is significantly suppressed, from approximately 0.5 to 0.07 V in the middle of the channel at 45 nm NOR Flash technology. From this result, it is expected that the proposed method to suppress the RTS amplitude is essential for further cell size scaling in Flash memory.

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Scaling Analysis of Thermal Hydraulics Phenomena in the Nuclear Reactor Vessel Downcomer during the Reflood Phase of LBLOCA (대형냉각재 상실사고 재관수 기간 동안, 차세대 원자로 강수부 내의 열수력 현상 모의를 위한 실험장치 척도해석)

  • Yun, B.J.;Song, C.H.;Kwon, T.S.;Euh, D.J.;Chu, I.C.;Yoon, Y.J.
    • Proceedings of the KSME Conference
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    • 2001.06d
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    • pp.821-827
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    • 2001
  • As one of the advanced design features of the Korea next generation reactor, direct vessel injection (DVI) system is being considered instead of conventional cold leg injection (CLl) system. It is known that the DVI system greatly enhances the reliability of the emergency core cooling (ECC) system. However, there is still a dispute on its performance in terms of water delivery to the reactor core during the reflood period of a large-break loss-of-coolant accident (LOCA). Thus, experimental validation is under progress. In this paper, a new scaling method, using time and velocity reduced linear scaling law, is suggested for the design of a scaled-down experimental facility to investigate the direct ECC bypass phenomena in PWR downcomer.

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