• Title/Summary/Keyword: Dielectric capacitor

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A study on high-voltage measuring system using bushing-type capacitor (부싱형 커패시터를 이용한 고전압 계측시스템에 관한 연구)

  • Gang, Mun-Seong;Sim, Hyeong-Gwan;Yu, Chung-Hyeon
    • The Transactions of the Korean Institute of Electrical Engineers A
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    • v.48 no.5
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    • pp.502-507
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    • 1999
  • An improved, accurate and reliable high-voltage measuring system utilizing a bushing-type capacitor is proposed in this study. This system measures voltages and phase angles of three-phase 22.9 kV power distribution lines and provides enough current to charge a battery for a motor-driven load switch and to operate the measuring and communication circuits for the distribution automation. For reliability, epoxy resin was used as the dielectric material of the bushing-type capacitor since the dielectric strength of epoxy resin is very stable over the wide range of temperature. Capacitances were investigated and found to be stable over the wide range of temperature and applied voltage, and the results indicate that the proposed measurement system is very reliable.

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Defect Free Thin SiO2 Thermally Grown On Silicon For Mega Bit DRAM Capacitor (Mega Bit DRAM Capacitor를 위한 무결함 박막 SiO2)

  • Yeo, I.S.;Yoon, G.H.;Kim, B.S.;Choi, M.S.;Lee, K.R.
    • Proceedings of the KIEE Conference
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    • 1987.07a
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    • pp.436-438
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    • 1987
  • The thermal oxidation recipe has been optimized for very thin (12 nm) capacitor oxide for Mega bit DRAM. The time dependent dielectric breakdown characteristics show that the breakdown voltage and time to breakdown are very high and uniform, indication that our oxide is defect free and suitable for DRAM capacitor dielectric. To our knowledge this is the best oxide quality obtained up tp now around 10 nm.

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Verification of Controlled Closing Method for Unearthed Shunt Capacitor Banks by Simulation (비접지 분로 콘덴서 뱅크의 투입제어방식에 대한 시뮬레이션 검증)

  • 이우영;박경엽;정진교;김희진
    • The Transactions of the Korean Institute of Electrical Engineers B
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    • v.52 no.9
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    • pp.448-453
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    • 2003
  • In this paper the controlled closing algorithm of the circuit breaker for isolated capacitor banks is proposed. The characteristics of circuit breakers such as RDDS(rate of decrease of dielectric strength) and a mechanical operating tolerance should be also taken into account to locate contact touch instants around voltage zero. The analysis results on the voltages across circuit breaker terminals upon closing operation play an important roles to describe the suggested method. The simulations carried out in order to verify the performance of this method show that the closing instants obtained from the proposed method provide a good suppression effect on the closing transients for both single and back-to-back capacitor banks.

Screen printed $BaSrTiO_3$ composite for embedded capacitor apprication (Embedded capacitor 적용을 위한 screen printed $BaSrTiO_3$ 복합체)

  • Park, Yong-Jun;Koh, JUng-Hyuk
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2007.06a
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    • pp.311-312
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    • 2007
  • In this study, composite $BaSrTiO_3$ has been studied for high frequency device applications. Composite $Ba_{0.5}Sr_{0.5}TiO_3$ has high dielectric permittivity and low loss tangent at the relative frequency range from MHz to GHz. 10,30 and 50 wt% of epoxy doped $Ba_{0.5}Sr_{0.5}TiO_3$ powders were prepared with bisphenol A and F polymer employing ball milling process. Epoxy/($BaSrTiO_3$) composites thick films were screen printed on the Cu plated PCB substrates through screen printing methods. The specimens were designed for the embedded capacitor applications. Temperature dependent dielectric permittivity of Epoxy doped $BaSrTiO_3$ ceramics was measured.

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Development of a Cross Capacitor Electrode for Measurements of Liquids Dielectric Constants (액체의 유전상수 정밀측정용 크로스 커패시터 전극 개발)

  • ;;;YU. p. Semenov
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2000.07a
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    • pp.675-678
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    • 2000
  • Using the principle of the cross capacitor, a precise system for measuring the electric constants of liquids has been developed. The four electrodes of the cross capacitor were formed around fused-silica tube by plating a gold film. The effect of a non-uniform tube wall ok the measured permittivity was investigated As the individual characteristics of the tubes were determined to be constant, the pure dielectric constants extracted from any effect of the fused-silica material could be precisely derived with uncertainty of less than ${\pm}$ 0.02∼0.05 %.

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Dielectric Properties of LCP and $BaTiO_3-SrTiO_3$ Composites for Embedded Matching Capacitors (내장형 capacitor를 위한 LCP와 $BaTiO_3-SrTiO_3$ 복합재의 유전특성)

  • Kim, Jin-Cheol;Yoon, Sang-Jun;Yoon, Keum-Hee;Oh, Jun-Rok
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2008.06a
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    • pp.60-60
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    • 2008
  • We manufactured Liquid Crystal Polymer (LCP) and (1-x)$BaTiO_3-xSrTiO_3$(BST) ceramic composites and investigated dielectric properties to use as embedded capacitor in printed circuit boards and replace LTCC substrates. The dielectric properties of these composites are varied with volume fraction of BST and ratios of BT/ST. Dielectric constants are in the range of 3~28. In addition, we could get low TCC and High Q value that could not achieve in other ceramic-polymer composites. Especially, in composite with x=0.4 and 50vol% BST, the dieletric constant and Q-value are 27 and 300, respectively. And more TCC is -116~145ppm/$^{\circ}C$ in the temperature range of -55~$125^{\circ}C$. We think that this composites can be used high-Q substrate material like LTCC and embedded temperature compensation capacitor in printed circuit boards.

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Effect of Ti Adhesion Layer on the Electrical Properties of BMNO Capacitor Using Graphene Bottom Electrodes (그래핀 하부전극을 이용하여 BMNO 케페시터의 특성 향상을 위한 Ti Adhesion Layer의 효과)

  • Park, Byeong-Ju;Yoon, Soon-Gil
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.26 no.12
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    • pp.867-871
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    • 2013
  • The Ti adhesion layers were deposited onto the glass substrate for transparent capacitors using $Bi_2Mg_{2/3}Nb_{4/3}O_7$ (BMNO) dielectric thin films. Graphene was transferred onto the Ti/glass substrate after growing onto the Ni/$SiO_2$/Si using rapid-thermal pulse CVD (RTPCVD). The BMNO dielectric thin films were investigated for the microstructure, dielectric and leakage properties in the case of capacitors with and without Ti adhesion layers. Leakage current and dielectric properties were strongly dependent on the Ti adhesion layers grown for graphene bottom electrode.

Temperature Dependence of Dielectric Properties of BaTiO$_3$ doped with Nb$_2$O$_5$ and CoO (Nb$_2$O$_5$와 CoO의 복합첨가가 BaTiO$_3$ 유전특성의 온도안전성에 미치는 효과)

  • 최광휘;황진현;한영호
    • Journal of the Korean Ceramic Society
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    • v.35 no.8
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    • pp.864-870
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    • 1998
  • The effect of {{{{ {{Nb }_{2 }O }_{5 } }} and CoO addition on the temperature dependence of the {{{{ {BaTiO }_{3 } }}-based ceramic capa-citor has been studied. X7R with moderate temperature dependence has been developed by means of pre-cisely controlled {{{{ {{Nb }_{2 }O }_{5 } }}/CoO ratio. Dielectric constant(K) and dissipation factor(DF) were 3500 and 1.5% respectively. As the content of {{{{ {{Nb }_{2 }O }_{5 } }} was increased the curie temperature(Tc) was shifted to lower tem-perature and the dielectric constant at Tc was decreased. The proper addition of CoO with {{{{ {{Nb }_{2 }O }_{5 } }} improved the temperature dependence of dielectric properties of the {{{{ {BaTiO }_{3 } }}-based ceramic capacitor.

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