• Title/Summary/Keyword: Density of states

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Length- and parity-dependent electronic states in one-dimensional carbon atomic chains on C(111)

  • Kim, Hyun-Jung;Oh, Sang-Chul;Kim, Ki-Seok;Zhang, Zhenyu;Cho, Jun-Hyung
    • Proceedings of the Korean Vacuum Society Conference
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    • 2010.08a
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    • pp.56-56
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    • 2010
  • Using first-principles density-functional theory calculations, we find dramatically different electronic states in the C chains generated on the H-terminated C(111) surface, depending on their length and parity. The infinitely long chain has $\pi$ electrons completely delocalized over the chain, yielding an equal C-C bond length. As the chain length becomes finite, such delocalized $\pi$ electrons are transformed into localized ones. As a result, even-numbered chains exhibit a strong charge-lattice coupling, leading to a bond-alternated structure, while odd-numbered chains show a ferrimagnetic spin ordering with a solitonlike structure. These geometric and electronic features of infinitely and finitely long chains are analogous to those of the closed (benzene) and open (polyacetylene) chains of hydrocarbons, respectively.

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Structural and Electronic Properties of Vacancy Defects in GaS Single Tetralayer

  • Sim, Ye-Ji;Lee, Su-Jin
    • Proceeding of EDISON Challenge
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    • 2016.03a
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    • pp.308-312
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    • 2016
  • 2차원 화합물 반도체인 GaS single tetralayer에 존재하는 vacancy defect의 원자구조 및 전자구조 특성을 제일원리계산을 이용하여 연구하였다. 고립된 Ga과 S vacancy를 모델링하기 위해, GaS $4{\times}4$ supercell을 이용하였고 각 vacancy에 대해 symmetry-preserving 구조와 broken symmetry 구조들의 에너지를 계산하여 가장 안정한 결함 원자 구조를 결정하였다. Ga-rich, S-rich condition에서의 formation energy 계산을 통해 vacancy 구조의 생성 가능성을 예측하였다. 안정한 vacancy 구조들에 대해 projected density of states (PDOS)를 clean GaS의 PDOS와 비교 분석함으로써 vacancy에 의한 defect states들을 찾고, 결과적으로 나타나는 전자구조 특성의 변화를 규명하였다.

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Development for the Index of an Anesthesia Depth using the Power Spectrum Density Analysis (뇌파 스펙트럼 분석에 의한 마취 심도 지표 개발)

  • Ye, Soo-Young;Baik, Swang-Wan;Kim, Jae-Hyung;Park, Jun-Mo;Jeon, Gye-Rok
    • Journal of Biomedical Engineering Research
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    • v.30 no.4
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    • pp.327-332
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    • 2009
  • In this paper, new index was developed to estimate the depth of anesthesia during general anesthesia using EEG. Analysis of the power spectral density(PSD) of EEG was used to develop new parameters because EEG signal tends to have slow wave during anesthesia. Classifier for index creator was developed by using SEF, BDR and BTR parameters, which are calculated by power spectral density. EEG data were obtained from 7 patients (ASA I, II) during general anesthesia with Sevoflurane. The anesthetic depth evaluation indexes ranged from 0 to 100. The average were $86.05{\pm}10.1$, $36.98{\pm}20.2$, $15.33{\pm}13.6$, $50.87{\pm}16.5$ and $87.72{\pm}11.7$ for the states of pre-operation, induction of anesthesia, operation, awaked and post-operation, respectively. The results show that while the depth of anesthesia was evaluated, more accurate information can be provided for anesthetician.

Mechanisms of Na adsorption on graphene and graphene oxide: density functional theory approach

  • Moon, Hye Sook;Lee, Ji Hye;Kwon, Soonchul;Kim, Il Tae;Lee, Seung Geol
    • Carbon letters
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    • v.16 no.2
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    • pp.116-120
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    • 2015
  • We investigated the adsorption of Na on graphene and graphene oxide, which are used as anode materials in sodium ion batteries, using density functional theory. The adsorption energy for Na on graphene was -0.507 eV at the hollow sites, implying that adsorption was favorable. In the case of graphene oxide, Na atoms were separately adsorbed on the epoxide and hydroxyl functional groups. The adsorption of Na on graphene oxide-epoxide (adsorption energy of -1.024 eV) was found to be stronger than the adsorption of Na on pristine graphene. However, the adsorption of Na on graphene oxide-hydroxyl resulted in the generation of NaOH as a by-product. Using density of states (DOS) calculations, we found that the DOS of the Na-adsorbed graphene was shifted down more than that of the Na-adsorbed graphene oxide-epoxide. In addition, the intensity of the DOS around the Fermi level for the Na-adsorbed graphene was higher than that for the Na-adsorbed graphene oxide-epoxide.

Electronic State of ZnO Doped with Elements of IIIB family, Calculated by Density functional Theory (범밀도함수법을 이용하여 계산한 IIIB족 원소가 도핑된 ZnO의 전자상태)

  • Lee, Dong-Yoon;Lee, Won-Jae;Min, Bok-Ki;Kim, In-Sung;Song, Jae-Sung;Kim, Yang-Soo
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.18 no.7
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    • pp.589-593
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    • 2005
  • The electronic states of ZnO doped with Al, Ga and In, which belong to III family elements in periodic table, were calculated using the density functional theory. In this study, the calculation was performed by two Programs; the discrete variational Xa (DV-Xa) method, which is a sort of molecular orbital full potential method; Vienna Ab-initio Simulation Package (VASP), which is a sort of pseudo potential method. The fundamental mixed orbital structure in each energy level near the Fermi level was investigated with simple model using DV-Xa. The optimized crystal structures calculated by VASP were compared to the measured structures. The density of state and the energy levels of dopant elements were shown and discussed in association with properties.

Applicability of the Krško nuclear power plant core Monte Carlo model for the determination of the neutron source term

  • Goricanec, Tanja;Stancar, Ziga;Kotnik, Domen;Snoj, Luka;Kromar, Marjan
    • Nuclear Engineering and Technology
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    • v.53 no.11
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    • pp.3528-3542
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    • 2021
  • A detailed geometrical model of a Krško reactor core was developed using a Monte Carlo neutron transport code MCNP. The main goal of developing an MCNP core model is for it to be used in future research focused on ex-core calculations. A script called McCord was developed to generate MCNP input for an arbitrary fuel cycle configuration from the diffusion based core design package CORD-2, taking advantage of already available material and temperature data obtained in the nuclear core design process. The core model was used to calculate 3D power density profile inside the core. The applicability of the calculated power density distributions was tested by comparison to the CORD-2 calculations, which is regularly used for the nuclear core design calculation verification of the Krško core. For the hot zero power and hot full power states differences between MCNP and CORD-2 in the radial power density profile were <3%. When studying axial power density profiles the differences in axial offset were less than 2.3% for hot full power condition. To further confirm the applicability of the developed model, the measurements with in-core neutron detectors were compared to the calculations, where differences of 5% were observed.

Strength Characteristics in Drained Triaxial Tests on Granular Materials (사질토의 배수삼축압축시험에서의 강도특성)

  • 장병유;송창섭
    • Magazine of the Korean Society of Agricultural Engineers
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    • v.34 no.3
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    • pp.33-42
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    • 1992
  • The shear strength of cohesionless Soils results from particle-to-particle friction and structural resistance by interlocking. And, the shear strength of soils is subjected to vary depending on the internal states and external condtions. If the volume change occurring in the soils and stress-strain relationships under the internal and external changes can accrurately he described, it is possible to predict the behaviors of soils. To accomplish these objectives a series of drained triaxial compression tests and isotropic compression test was performed on the Banwol sand at different relative densities ranging from 20% to 80% and different confining pressures ranging from 0.4kgf/cm$^2$ to l2kgf/cm$^2$. The results and main conclusions of the study are summarized as follows; 1.When the relative density or the confining pressure is increased, the maximum deviator stress is increased. The ratio of the maximum deviator stress and the confining pressure is linearly proportional to the relative density. 2.It is observed that the dilatancy depends not only upon its relative density but also the confining stress, and that the maximum deviator stress is obtained after the diatancy occurs. 3.The volume of sands undergoes initial contraction prior to the dilatancy occurred by strain softening. The dilatancy rate eventually approaches the critical state or a constant volume. 4.At lower strains, Poisson's ratio approaches a certain minimum value regadless of the state of materials. At larger strains, however, the ratio is increased as the relative density is increased. 5.It is observed that the modulus of elasticity is linearly proportional to the relative density and the pressure. 6.When the relative density is increased, the friction angle of sands is linearly increased. 7.When the relative density is increased, the expansion index and the compression index are linearly decreased, and the ratio of the two is about 1/3.

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Effects of reversible metastable defect induced by illumination on Cu(In,Ga)Se2 solar cell with CBD-ZnS buffer layer

  • Lee, Woo-Jung;Yu, Hye-Jung;Cho, Dae-Hyung;Wi, Jae-Hyung;Han, Won-Seok;Yoo, Jisu;Yi, Yeonjin;Song, Jung-Hoon;Chung, Yong-Duck
    • Proceedings of the Korean Vacuum Society Conference
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    • 2016.02a
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    • pp.431-431
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    • 2016
  • Typical Cu(In,Ga)Se2 (CIGS)-based solar cells have a buffer layer between CIGS absorber layer and transparent ZnO front electrode, which plays an important role in improving the cell performance. Among various buffer materials, chemical bath deposition (CBD)-ZnS is being steadily studied to alternative to conventional CdS and the efficiency of CBD-ZnS/CIGS solar cell shows the comparable values with that of CdS/CIGS solar cell. The intriguing thing is that reversible changes occur after exposure to illumination due to the metastable defect states in completed ZnS/CIGS solar cell, which induces an improvement of solar cell performance. Thus, it implies that the understanding of metastable defects in CBD-ZnS/CIGS solar cell is important issue. In this study, we fabricate the ITO/i-ZnO/CBD-ZnS/CIGS/Mo/SLG solar cells by controlling the NH4OH mole concentration (from 2 M to 3.5 M) of CBD-ZnS buffer layer and observe their conversion efficiency with and without light soaking for 1 hr. From the results, NH4OH mole concentration and light exposure can significantly affect the CBD-ZnS/CIGS solar cell performance. In order to investigate that which layer can contain metastable defect states to influence on solar cell performance, impedance spectroscopy and capacitance profiling technique with exposure to illumination have been applied to CBD-ZnS/CIGS solar cell. These techniques give a very useful information on the density of states within the bandgap of CIGS, free carriers density, and light-induced metastable effects. Here, we present the rearranged charge distribution after exposure to illumination and suggest the origin of the metastable defect states in CBD-ZnS/CIGS solar cell.

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Comparative Investigation of Interfacial Characteristics between HfO2/Al2O3 and Al2O3/HfO2 Dielectrics on AlN/p-Ge Structure

  • Kim, Hogyoung;Yun, Hee Ju;Choi, Seok;Choi, Byung Joon
    • Korean Journal of Materials Research
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    • v.29 no.8
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    • pp.463-468
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    • 2019
  • The electrical and interfacial properties of $HfO_2/Al_2O_3$ and $Al_2O_3/HfO_2$ dielectrics on AlN/p-Ge interface prepared by thermal atomic layer deposition are investigated by capacitance-voltage(C-V) and current-voltage(I-V) measurements. In the C-V measurements, humps related to mid-gap states are observed when the ac frequency is below 100 kHz, revealing lower mid-gap states for the $HfO_2/Al_2O_3$ sample. Higher frequency dispersion in the inversion region is observed for the $Al_2O_3/HfO_2$ sample, indicating the presence of slow interface states A higher interface trap density calculated from the high-low frequency method is observed for the $Al_2O_3/HfO_2$ sample. The parallel conductance method, applied to the accumulation region, shows border traps at 0.3~0.32 eV for the $Al_2O_3/HfO_2$ sample, which are not observed for the $Al_2O_3/HfO_2$ sample. I-V measurements show a reduction of leakage current of about three orders of magnitude for the $HfO_2/Al_2O_3$ sample. Using the Fowler-Nordheim emission, the barrier height is calculated and found to be about 1.08 eV for the $HfO_2/Al_2O_3$ sample. Based on these results, it is suggested that $HfO_2/Al_2O_3$ is a better dielectric stack than $Al_2O_3/HfO_2$ on AlN/p-Ge interface.

Effect of negative oxygen ion bombardment on the gate bias stability of InGaZnO

  • Lee, Dong-Hyeok;Kim, Gyeong-Deok;Hong, Mun-Pyo
    • Proceedings of the Korean Vacuum Society Conference
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    • 2015.08a
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    • pp.160-160
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    • 2015
  • InGaZnO (IGZO) thin-film transistors (TFTs) are very promising due to their potential use in high performance display backplane [1]. However, the stability of IGZO TFTs under the various stresses has been issued for the practical IGZO applications [2]. Up to now, many researchers have studied to understand the sub-gap density of states (DOS) as the root cause of instability [3]. Nomura et al. reported that these deep defects are located in the surface layer of the IGZO channel [4]. Also, Kim et al. reported that the interfacial traps can be affected by different RF-power during RF magnetron sputtering process [5]. It is well known that these trap states can influence on the performances and stabilities of IGZO TFTs. Nevertheless, it has not been reported how these defect states are created during conventional RF magnetron sputtering. In general, during conventional RF magnetron sputtering process, negative oxygen ions (NOI) can be generated by electron attachment in oxygen atom near target surface and accelerated up to few hundreds eV by self-bias of RF magnetron sputter; the high energy bombardment of NOIs generates bulk defects in oxide thin films [6-10] and can change the defect states of IGZO thin film. In this study, we have confirmed that the NOIs accelerated by the self-bias were one of the dominant causes of instability in IGZO TFTs when the channel layer was deposited by conventional RF magnetron sputtering system. Finally, we will introduce our novel technology named as Magnetic Field Shielded Sputtering (MFSS) process [9-10] to eliminate the NOI bombardment effects and present how much to be improved the instability of IGZO TFTs by this new deposition method.

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