• Title/Summary/Keyword: Density 전파

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Dissemination of Bacillus Subtilis by using Bee-vectoring Technology in Cherry Tomato Greenhouses (방울토마토 시설재배에서 비벡터링(bee-vectoring) 기술을 이용한 Bacillus Subtilis 포장내 전파)

  • Park, Hong-Hyun;Kim, Jeong Jun;Kim, Kwang-Ho;Lee, Sang-Guei
    • Korean journal of applied entomology
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    • v.52 no.4
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    • pp.357-364
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    • 2013
  • Bee-vectoring is a new crop protection technology used for suppressing insect pests and diseases in crops by disseminating microbial agents into plants during bee pollination activities. In this study, we conducted bee-vectoring trials in cherry tomato greenhouses by using the bumble bee (Bombus terrestris), a microbial agent (Bacillus subtilis) and a new dispenser, and we measured the delivered quantity of microbial agent. Bacterial colony forming units (CFUs) in bees exiting a dispenser ranged from $9.0{\times}10^5$ to $1.9{\times}10^6$ per bee. At greenhouse trials in the National Academy of Agricultural Science (NAAS) trials, 3,300 - 8,500 CFUs per flower were counted and 80 - 100% of the flower samples contained detectable concentrations. There was no significant difference in CFU density between microbial replacement intervals (once a week vs twice a week) in the NAAS trials. In a commercial greenhouse trial, 1,800 - 2,400 CFUs per flower were found, and 83 - 93% of the flower samples contained detectable concentrations. CFUs detected in bee-vectored flowers increased by approximately 75 times before bee-vectoring. The mortality of bumble bees in the NAAS trials was, on average, 22% and little negative effects were observed on the bumble bee colonies. The yield difference for cherry tomatoes in the NAAS trials was not significant between treatments. When we select additional microbial agents that can be disseminated using this technology and create a detailed plan based on insect pests and disease incidence, we can apply this technology in greenhouses for growing tomatoes and strawberries in the near future.

A study on the effect of Ni-rich phase on the stress-rupture properties of Ni microalloyed W (W 활성소결체의 Ni-rich 상의 양이 응력 파단 성질에 미치는 영향에 관한 연구)

  • Park, Dae-Gyu;Kim, Su-Seong;Lee, Kyung-Sub
    • Korean Journal of Materials Research
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    • v.2 no.4
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    • pp.270-278
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    • 1992
  • The effect of Ni-rich phase on the stress-rupture properties of Ni mlcroalloyed W were studied using direct load creep tester at 100$0^{\circ}C$, 110$0^{\circ}C$, and 120$0^{\circ}C$ in $H_2.$ The stress rupture strength of 100hrs. of W-0.4wt% Ni was 43% higher at 100$0^{\circ}C$ and 35% higher at 110 $0^{\circ}C$than that of W-0.2wt% Ni due to the larger initial grain size, the higher relative density and the higher grain growth during test. That of W-0.8wt% Ni was 90% higher at 100$0^{\circ}C$ and 60% higher at 110$0^{\circ}C$ than that of W-0.2wt% Ni. The activation energy of W-0.4wt% Ni for creep was 81.3 Kcal/mole. It was considered that creep deformation was controlled by the diffusion of W in the Ni rich phase between the grains and the deformation of grains. All of the specimens showed intergranular fracture by grain boundary cavitation and growth of cavity throughout the entire spcimen cross-section.

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An Improved Vehicle Tracking Scheme Combining Range-based and Range-free Localization in Intersection Environment (교차로 환경에서 Range-based와 Range-free 위치측정기법을 혼합한 개선된 차량위치추적기법)

  • Park, Jae-Bok;Koh, Kwang-Shin;Cho, Gi-Hwan
    • Journal of the Institute of Electronics Engineers of Korea CI
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    • v.48 no.2
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    • pp.106-116
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    • 2011
  • USN(Ubiquitous Sensor Network) environment permits us to access whatever information we want, whenever we want. The technologies to provide a basement to these environments premise an accurate location establishment. Especially, ITS(Intelligent Transportation Systems) is easily constructed by applying USN technology. Localization can be categorized as either Range-based or Range-free. Range-based is known to be not suitable for the localization based on sensor network, because of the irregularity of radio propagation and the additional device requirement. The other side, Range-free is much appropriated for the resource constrained sensor network because it can actively locate by means of the communication radio. But, generally the location accuracy of Range-free is low. Especially, it is very low in a low-density environment. So, these two methods have both merits and demerits. Therefore, it requires a new method to be able to improve tracking accuracy by combining the two methods. This paper proposes the tracking scheme based on range-hybrid, which can markedly enhance tracking accuracy by effectively using the information of surrounding nodes and the RSSI(Received Signal Strength Indication) that does not require additional hardware. Additionally, we present a method, which can improve the accuracy of vehicle tracking by adopting the prediction mechanism. Simulation results show that our method outperforms other methods in the transportation simulation environment.

Sintered properties of silicon carbide prepared by using the alumina and yttria-coated SiC powder (알루미나 및 이트리아로 코팅된 분말을 사용하여 제조한 탄화규소의 소결물성)

  • Um, Ki-Young;Kim, Hwan;Kang, Hyun-Hee;Lee, Jong-Kook
    • Journal of the Korean Crystal Growth and Crystal Technology
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    • v.8 no.4
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    • pp.645-650
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    • 1998
  • Alumina- and yttria-coated SiC powder was prepared by the surface-induced precipitation method, and sintered properties of silicon carbide prepared from this powder were investigated. After a well dispersion of SiC powders in the aqueous solution of $Al_2(SO_4)_3$ and $Y_2(SO_4)_3$, the mixed precursors of aluminum hydroxide, aluminum carbonate, yttrium hydroxide, and yttrium carbonate were precipitated on the surfaces of SiC particles through the hydrolysis reaction of urea. SiC specimens with alumina and yttria exhibit, 97.8% of theoretical density after the sintering at $1900^{\circ}C$ for 2 hrs. During annealing at $2000^{\circ}C$, $\beta$longrightarrow$\alpha$ phase transformation of SiC had taken place and resulted with a rodlike microstructure. Toughness of sintered SiC was enhanced by crack deflection around the rodlike grains. In case of annealing less than that of 3 hr, the fracture toughness of SiC was slightly improved with increasing the amount of sintering aid. However, annealed specimens for a long time showed constant fracture toughness even though the amount of sintering aid increased. It is resulted that the main factor for toughening in annealed SiC for a long time is the pullout effect of rodlike grains during the propagation of cracks, and the amount of sintering aids is less effective on the fracture toughness of SiC.

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New VLSI Architecture of Parallel Multiplier-Accumulator Based on Radix-2 Modified Booth Algorithm (Radix-2 MBA 기반 병렬 MAC의 VLSI 구조)

  • Seo, Young-Ho;Kim, Dong-Wook
    • Journal of the Institute of Electronics Engineers of Korea SD
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    • v.45 no.4
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    • pp.94-104
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    • 2008
  • In this paper, we propose a new architecture of multiplier-and-accumulator (MAC) for high speed multiplication and accumulation arithmetic. By combining multiplication with accumulation and devising a hybrid type of carry save adder (CSA), the performance was improved. Since the accumulator which has the largest delay in MAC was removed and its function was included into CSA, the overall performance becomes to be elevated. The proposed CSA tree uses 1's complement-based radix-2 modified booth algorithm (MBA) and has the modified array for the sign extension in order to increase the bit density of operands. The CSA propagates the carries by the least significant bits of the partial products and generates the least significant bits in advance for decreasing the number of the input bits of the final adder. Also, the proposed MAC accumulates the intermediate results in the type of sum and carry bits not the output of the final adder for improving the performance by optimizing the efficiency of pipeline scheme. The proposed architecture was synthesized with $250{\mu}m,\;180{\mu}m,\;130{\mu}m$ and 90nm standard CMOS library after designing it. We analyzed the results such as hardware resource, delay, and pipeline which are based on the theoretical and experimental estimation. We used Sakurai's alpha power low for the delay modeling. The proposed MAC has the superior properties to the standard design in many ways and its performance is twice as much than the previous research in the similar clock frequency.

Characteristics on sea level variations in the South Indian Ocean (남인도양의 해수면 변화 특성)

  • 윤홍주
    • Journal of the Korea Institute of Information and Communication Engineering
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    • v.5 no.6
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    • pp.1094-1103
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    • 2001
  • According to standard procedures as defined in the users handbook for sea level data processes, I was compared to Topex/Poseidon sea level data from the first 350days of mission and Tide Gauge sea level data from the Amsterdam- Crozet- Kerguelen region in the South Indian Ocean. The comparison improves significantly when many factors for the corrections were removed, then only the aliased oceanic tidal energy is removed by oceanic tide model(11) in this period. Making the corrections and smoothing the sea level data ()ver 60km along-track segments and the Tide Gauge sea level data for the time series results in the digital correlation and RMS difference between the two data of c=-0.12 and rms= 11.4cm, c=0.55 and rms=5.38cm, c=0.83 and rms=2.83cm, and c=0.24 and rms=6.72 for the Amsterdam, Crozet and Kerguelenplateau, and Kerguelen coast, respectively. It was also found that the Kerguelen plateau has a comparisons due to propagating signals(the baroclinic Rossby wave with velocity of -3.9 ~-4.2cm/sec, period of 167days and amplitude of 10cm) that introduce temporal lags(${\gamma}$: 10~30days) between the altimeter and tide gauge time series. The conclusion is that on timescales longer than about 10days the RMS sea level errors are less than or of the order of several centimeters and are mainly due to the effects of currents rather than the effects of stories(water temperature, density) and winds.

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Analysis on optical pulse propagation in atomic medium for amplification without inversion (밀도 반전 없는 증폭 매질에서 광펄스 군속도의 제어 과정 분석)

  • Kim, Haeng-Hwa;Kim, Kyung-Dae;Lee, Rim;An, Moon-Hee;Kim, Joong-Bok
    • Korean Journal of Optics and Photonics
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    • v.14 no.5
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    • pp.483-490
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    • 2003
  • We have analyzed theoretically optical pulse propagation in a coherent atomic medium for amplification without inversion (AWI), which is achieved by adding incoherent optical pumping to a typical EIT system. In order to explain experimental results [Kim et al., J. Phys. B, 36, 2671(2003)] to control the group velocity of the optical pulse by changing pumping power, we established a 5-level atomic system and applied density matrix equations. This AWI model system is different from previous AWI systems from the viewpoint of using two levels for incoherent optical pumping isolated optically from the EIT (electromagentically induced transparency) system so that more atoms can participate in pulse speed control. We have found that population transfer by collisions between ground states plays a decisive role for efficient AWI, and more atoms are effective for slowing the pulse. Our numerical results are in good agreement qualitatively with experimental results.

Evaluation of Adhesive Strength for Nano-Structured Thin Film by Scanning Acoustic Microscope (초음파 현미경을 이용한 나노 박막의 접합 강도 평가)

  • Park, Tae-Sung;Kwak, Dong-Ryul;Park, Ik-Keun;Miyasaka, Chiaki
    • Journal of the Korean Society for Nondestructive Testing
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    • v.32 no.4
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    • pp.393-400
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    • 2012
  • In recent years, nano-structured thin film systems are often applied in industries such as MEMS/NEMS device, optical coating, semiconductor or like this. Thin films are used for many and varied purpose to provide resistance to abrasion, erosion, corrosion, or high temperature oxidation and also to provide special magnetic or dielectric properties. Quite a number of articles to evaluate the characterization of thin film structure such as film density, film grain size, film elastic properties, and film/substrate interface condition were reported. Among them, the evaluation of film adhesive to substrate has been of great interest. In this study, we fabricated the polymeric thin film system with different adhesive conditions to evaluate the adhesive condition of the thin film. The nano-structured thin film system was fabricated by spin coating method. And then V(z) curve technique was applied to evaluate adhesive condition of the interface by measuring the surface acoustic wave(SAW) velocity by scanning acoustic microscope(SAM). Furthermore, a nano-scratch technique was applied to the systems to obtain correlations between the velocity of the SAW propagating within the system including the interface and the shear adhesive force. The results show a good correlation between the SAW velocities measured by acoustic spectroscope and the critical load measured by the nano-scratch test. Consequently, V(z) curve method showed potentials for characterizing the adhesive conditions at the interface by acoustic microscope.

Analysis of Electromagnetic Scattering by a Perfectly Conducting Strip Grating on Dielectric Multilayers (다층 유전체 위의 조기적인 도체 스트립 구조에 의한 전자파산란 해석)

  • 윤의중;양승인
    • The Journal of Korean Institute of Electromagnetic Engineering and Science
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    • v.8 no.2
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    • pp.161-172
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    • 1997
  • In this paper, electromagnetic scattering by a perfectly conducting strip grating on dielectric multilayers is analyzed for the normalized reflected and transmitted power by applying the Fourier-Galeakin moment method. The induced current density is expanded in a series of multiplication of chebyshev polynomials of the first kind and functions with appropriate edge boundary condition, the continuous condition of electromagnetic field is applied in the boundary planes. The confirm the validity of the proposed method, the nor- malized reflected and transmitted power obtained by varying the relative permittivity and thickness of each dielectric layers are evaluated and compared with those of the existing numerical method and a paper, and then the numerical results in this paper are in good agreement with those of the existing numerical method and the paper. The sharp variation position in the geometrically normalized reflected and transmitted power can be moved by the incident angle, grating period, and the relative permittivity and thickness of the dielectric multilayers, these sharp variation points which are called the Wood's anomaly of the Geome- trically normalized reflected power are observed as a main factor when the reflected powers of the higher order mode are transitted between propagating and evanescent modes, and the local minimum positions are slightly moved to the left hand direction in which grating period is getting small according to the increase of the relative permittivity of dielectric layers.

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Analysis of Electromagnetic Scattering by a Resistive Strip Grating with Tapered Resistivity on Dielectric Multilayers (다층 유전체위의 변하는 저항율을 가진 저항띠 격자구조에 의한 전자파 산란 해석)

  • Uei-Joong Yoon
    • The Journal of Korean Institute of Electromagnetic Engineering and Science
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    • v.8 no.5
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    • pp.495-503
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    • 1997
  • In this paper, the E-polarized electromagnetic scattering problems by a resistive strip grating with tapered resistivity on 3 dielectric layers are analyzed to find out the effects for the tapered resistivity of resistive strip and the relative permittivity and thickness of 3 die- lectric layers by applying the Fourier-Galerkin moment methods. The induced surface current density is expanded in a series of Jacobi-polynomial ${P^{(\chi,\beta)}}_p$(.) of the order $\alpha$= 0 and $\beta$=1 as a kind of orthogonal polyomians, and the tapered resistivity assumes to vary linearly from 0 at one edge to finite resistivity at the other edge. The normalized reflected and transmitted powers are obtained by varying the tapered resistivity and the relative permittivity and thickness of dielectric layers. The sharp variation points are observed when the higher order modes are transferred between propagating and evanescent modes, and in general the local minimum positions occur at less grating period for the more relative permittivity of dielectric layers. It should be noted that the patterns of the normalized reflected and transmitted powers for the tapered resistivity are very much different from those of the uniform resistivity and perfectly conducting cases. The proposed method of this paper cna solve the scattering problems for the tapered resistive, uniform resistive, and PEC strip cases.

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