• Title/Summary/Keyword: Defect Density

Search Result 459, Processing Time 0.03 seconds

The Effect of Mold Density and Evacuation on Surface Defect in Lost Form Casting of High Chromium Cast Irons (고크롬 백주철재 소실모형 주조시 표면 결함 발생에 미치는 모형밀도 및 감압의 영향)

  • Lee, Kue-Hee;Yoo, Kook-Jong;Baek, Eung-Ryul;Choi, Hyun-Jin;Lee, Kyung-Whoan
    • Journal of Korea Foundry Society
    • /
    • v.22 no.6
    • /
    • pp.309-314
    • /
    • 2002
  • The effect of mold density and evacuation on surface defect of high chromium cast iron upon EPC process was investigated. Under evacuation of $0.1{\sim}0.3$ atm, surface defects were carbon defect, burn on and misrun. Carbon defect was augmented by increasing mold density from 0.011 g/$cm^3$ to 0.03 g/$cm^3$ under evacuation of $0.1{\sim}0.3$ atm, but carbon defect was decreased by increasing evacuation from 0.1 to 0.3 atm. Burn-on wasn't found under evacuation of 0.1 atm regardless of mold density, but burn-on was augmented by increasing evacuation from 0.2 to 0.3 atm and decreased by reducing mold density. Misrun was only found under 0.1 atm evacuation and 0.011 g/$cm^3$ mold density.

Defect Detection algorithm of TFT-LCD Polarizing Film using the Probability Density Function based on Cluster Characteristic (TFT-LCD 영상에서 결함 군집도 특성 기반의 확률밀도함수를 이용한 결함 검출 알고리즘)

  • Gu, Eunhye;Park, Kil-Houm
    • Journal of Korea Multimedia Society
    • /
    • v.19 no.3
    • /
    • pp.633-641
    • /
    • 2016
  • Automatic defect inspection system is composed of the step in the pre-processing, defect candidate detection, and classification. Polarizing films containing various defects should be minimized over-detection for classifying defect blobs. In this paper, we propose a defect detection algorithm using a skewness of histogram for minimizing over-detection. In order to detect up defects with similar to background pixel, we are used the characteristics of the local region. And the real defect pixels are distinguished from the noise using the probability density function. Experimental results demonstrated the minimized over-detection by utilizing the artificial images and real polarizing film images.

A study on Mass production stage Tank Battle Management System Environmental Stress Screening test method and application improvement based on Production process data (생산 공정 자료 기반 양산단계 전차 전장관리체계 환경 부하 선별 시험 방법 및 적용 개선에 관한 연구)

  • Kim, Jang-Eun;Shim, Bo-Hyun
    • Journal of Korean Society for Quality Management
    • /
    • v.43 no.3
    • /
    • pp.273-288
    • /
    • 2015
  • Purpose: In this study, we apply environmental stress screening (ESS) to battle management system (BMS) of a tank and use the ESS profile based on production process data, guided by MIL-HDBK-781/344/2164. Methods: To optimize ESS Profile of the BMS of a tank, we estimate ESS model parameters (e.g., defect density, screening strength) using primary production failure reporting and corrective action system (FRACAS) data of military supply contract firm. Results: First, we collect the Primary production FRACAS data of military supply contract firm. Second, we compute curve fitting approach to find patent defect density and latent defect density using FRACAS data. Third, we solve the equation of Defect Density(patent defect density + latent defect density)($D_{IN}$) and Screening Strength(SS) Using second step data. As a result of analysis according to the order, we calculate $D_{IN}$(Temperature stress case : 74.02, Vibration stress : 10.252) and : SS(Temperature stress case : 0.4632, Vibration stress : 0.4142) and confirm the Condition II-D based on MIL-HDBK-344. According to Condition II-D, it is necessary to modify existing ESS profile through decreasing the $D_{IN}$ and increasing the SS. Conclusion: Identification of defect causes through ESS approach reduce defect densities for production. It provides feedback to a lessons-learned data base to avoid similar problems on next generation tank BMS.

Analysis of Yield Model Using Defect Density Function of DOU(Defects of One Unit) (DOU 결점 밀도분포를 이용한 수율 모형 분석)

  • Choi, Sung-Woon
    • Proceedings of the Safety Management and Science Conference
    • /
    • 2010.11a
    • /
    • pp.551-557
    • /
    • 2010
  • The research proposes the hypergeometric, binomial and Poisson yield models for defective and defect. The paper also presents the hypothesis test, confidence interval and control charts for DPU(Defect Per Unit) and DPO(Defect Per Opportunity). Especially the study considers the analysis of compound Poisson yield models using various DOU density distributions.

  • PDF

Improving Device Efficiency for n-i-p Type Solar Cells with Various Optimized Active Layers

  • Iftiquar, Sk Md;Yi, Junsin
    • Transactions on Electrical and Electronic Materials
    • /
    • v.18 no.2
    • /
    • pp.70-73
    • /
    • 2017
  • We investigated n-i-p type single junction hydrogenated amorphous silicon oxide solar cells. These cells were without front surface texture or back reflector. Maximum power point efficiency of these cells showed that an optimized device structure is needed to get the best device output. This depends on the thickness and defect density ($N_d$) of the active layer. A typical 10% photovoltaic device conversion efficiency was obtained with a $N_d=8.86{\times}10^{15}cm^{-3}$ defect density and 630 nm active layer thickness. Our investigation suggests a correlation between defect density and active layer thickness to device efficiency. We found that amorphous silicon solar cell efficiency can be improved to well above 10%.

Influence of defective sites in Pt/C catalysts on the anode of direct methanol fuel cell and their role in CO poisoning: a first-principles study

  • Kwon, Soonchul;Lee, Seung Geol
    • Carbon letters
    • /
    • v.16 no.3
    • /
    • pp.198-202
    • /
    • 2015
  • Carbon-supported Pt catalyst systems containing defect adsorption sites on the anode of direct methanol fuel cells were investigated, to elucidate the mechanisms of H2 dissociation and carbon monoxide (CO) poisoning. Density functional theory calculations were carried out to determine the effect of defect sites located neighboring to or distant from the Pt catalyst on H2 and CO adsorption properties, based on electronic properties such as adsorption energy and electronic band gap. Interestingly, the presence of neighboring defect sites led to a reduction of H2 dissociation and CO poisoning due to atomic Pt filling the defect sites. At distant sites, H2 dissociation was active on Pt, but CO filled the defect sites to form carbon π-π bonds, thus enhancing the oxidation of the carbon surface. It should be noted that defect sites can cause CO poisoning, thereby deactivating the anode gradually.

Effects of electronic energy deposition on pre-existing defects in 6H-SiC

  • Liao, Wenlong;He, Huan;Li, Yang;Liu, Wenbo;Zang, Hang;Wei, Jianan;He, Chaohui
    • Nuclear Engineering and Technology
    • /
    • v.53 no.7
    • /
    • pp.2357-2363
    • /
    • 2021
  • Silicon carbide is widely used in radiation environments due to its excellent properties. However, when exposed to the strong radiation environment constantly, plenty of defects are generated, thus causing the material performance downgrades or failures. In this paper, the two-temperature model (2T-MD) is used to explore the defect recovery process by applying the electronic energy loss (Se) on the pre-damaged system. The effects of defect concentration and the applied electronic energy loss on the defect recovery process are investigated, respectively. The results demonstrate that almost no defect recovery takes place until the defect density in the damage region or the local defect density is large enough, and the probability of defect recovery increases with the defect concentration. Additionally, the results indicate that the defect recovery induced by swift heavy ions is mainly connected with the homogeneous recombination of the carbon defects, while the probability of heterogeneous recombination is mainly dependent on the silicon defects.

Effect of Heat Input Rate on the Weld Defect Formation during High Frequency Electric Resistance Welding (고주파 전기 저항 용접부의 용접 결함 발생 빈도에 미치는 용접 입열 속도의 영향)

  • 조윤희;김충명;김용석
    • Proceedings of the KWS Conference
    • /
    • 2000.10a
    • /
    • pp.201-203
    • /
    • 2000
  • In this study, effect of welding parameters on the defect density in the weldments produced by high frequency electric resistance welding process. The defect density measured by X-ray radiography showed a W-type curve as a function of heat input rate. The mechanisms of the such behavior were discussed based on the chemical compositions of the oxides formed at the weldments.

  • PDF

An Analysis of the Software defect density based on components size (소프트웨어 컴포넌트 규모에 의한 소프트웨어 결함 밀도의 평가)

  • 이재기;남상식;김창봉
    • Journal of the Institute of Electronics Engineers of Korea TC
    • /
    • v.41 no.8
    • /
    • pp.69-78
    • /
    • 2004
  • In this paper, we estimated the exact software defect density to build up a suitable model that is closely related to the size of module in the probability model proposed by MD (Malaiya and Denton). To put it concretely, we predict that the software defect density using some practical data sets that are the outcomes from the system test performed our three projects for the types of distribution (exponential and geometric), per a unit of module, and the size of source line that have been recommended by KLOC(kilo-line-of-code). Then, we make comparison between our proposed defect density model and those examined real data.