• Title/Summary/Keyword: Current memory

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New nonvolatile unit memory cell and proposal peripheral circuit using the polymer material (폴리머 재료를 이용한 새로운 비휘발성 단위 메모리 셀과 주변회로 제안)

  • Kim, Jung-Ha;Lee, Sang-Sun
    • Proceedings of the IEEK Conference
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    • 2005.11a
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    • pp.825-828
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    • 2005
  • In this paper, we propose a new nonvolatile unit memory cell and proposal peripheral circuit using the polymer material. Memory that relies on bistable behavior- having tow states associated with different resistances at the same applied voltage - has attracted much interest because of its nonvolatile properties. Such memory may also have other merits, including simplicity of structure and manufacturing, and the small size of memory cells. We have plotted the load line graphs for the use of a polymer memory character, hence we have designed in the band-gap reference shape of a write/erase drive, and then designed in the 2-stage differential amplifier shape of a sense amplifier in the consideration of a low current characteristic of a polymer memory cell. The simulation result shows that is has high gain about 80dB by sensing the very small current.

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Hardware Platforms for Flash Memory/NVRAM Software Development

  • Nam, Eyee-Hyun;Choi, Ki-Seok;Choi, Jin-Yong;Min, Hang-Jun;Min, Sang-Lyul
    • Journal of Computing Science and Engineering
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    • v.3 no.3
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    • pp.181-194
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    • 2009
  • Flash memory is increasingly being used in a wide range of storage applications because of its low power consumption, low access latency, small form factor, and high shock resistance. However, the current platforms for flash memory software development do not meet the ever-increasing requirements of flash memory applications. This paper presents three different hardware platforms for flash memory/NVRAM (non-volatile RAM) software development that overcome the limitations of the current platforms. The three platforms target different types of host system and provide various features that facilitate the development and verification of flash memory/NVRAM software. In this paper, we also demonstrate the usefulness of the three platforms by implementing three different types of storage system (one for each platform) based on them.

Design of Low Power Current Memory Circuit based on Voltage Scaling (Voltage Scaling 기반의 저전력 전류메모리 회로 설계)

  • Yeo, Sung-Dae;Kim, Jong-Un;Cho, Tae-Il;Cho, Seung-Il;Kim, Seong-Kweon
    • The Journal of the Korea institute of electronic communication sciences
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    • v.11 no.2
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    • pp.159-164
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    • 2016
  • A wireless communication system is required to be implemented with the low power circuits because it uses a battery having a limited energy. Therefore, the current mode circuit has been studied because it consumes constant power regardless of the frequency change. However, the clock-feedthrough problem is happened by leak of stored energy in memory operation. In this paper, we suggest the current memory circuit to minimize the clock-feedthrough problem and introduce a technique for ultra low power operation by inducing dynamic voltage scaling. The current memory circuit was designed with BSIM3 model of $0.35{\mu}m$ process and was operated in the near-threshold region. From the simulation result, the clock-feedthrough could be minimized when designing the memory MOS Width of $2{\mu}m$, the switch MOS Width of $0.3{\mu}m$ and dummy MOS Width of $13{\mu}m$ in 1MHz switching operation. The power consumption was calculated with $3.7{\mu}W$ at the supply voltage of 1.2 V, near-threshold voltage.

Memory-Efficient Hypercube Key Establishment Scheme for Micro-Sensor Networks

  • Lhee, Kyung-Suk
    • ETRI Journal
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    • v.30 no.3
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    • pp.483-485
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    • 2008
  • A micro-sensor network is comprised of a large number of small sensors with limited memory capacity. Current key-establishment schemes for symmetric encryption require too much memory for micro-sensor networks on a large scale. In this paper, we propose a memory-efficient hypercube key establishment scheme that only requires logarithmic memory overhead.

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Widely Tunable Adaptive Resolution-controlled Read-sensing Reference Current Generation for Reliable PRAM Data Read at Scaled Technologies

  • Park, Mu-hui;Kong, Bai-Sun
    • JSTS:Journal of Semiconductor Technology and Science
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    • v.17 no.3
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    • pp.363-369
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    • 2017
  • Phase-change random access memory (PRAM) has been emerged as a potential memory due to its excellent scalability, non-volatility, and random accessibility. But, as the cell current is reducing due to cell size scaling, the read-sensing window margin is also decreasing due to increased variation of cell performance distribution, resulting in a substantial loss of yield. To cope with this problem, a novel adaptive read-sensing reference current generation scheme is proposed, whose trimming range and resolution are adaptively controlled depending on process conditions. Performance evaluation in a 58-nm CMOS process indicated that the proposed read-sensing reference current scheme allowed the integral nonlinearity (INL) to be improved from 10.3 LSB to 2.14 LSB (79% reduction), and the differential nonlinearity (DNL) from 2.29 LSB to 0.94 LSB (59% reduction).

Electromagnetic and Thermal Analysis of Phase Change Memory Device with Heater Electrode (발열 전극에 따른 상변화 메모리 소자의 전자장 및 열 해석)

  • Jang, Nak-Won;Mah, Suk-Bum;Kim, Hong-Seung
    • Journal of Advanced Marine Engineering and Technology
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    • v.31 no.4
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    • pp.410-416
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    • 2007
  • PRAM (Phase change random access memory) is one of the most promising candidates for next generation non-volatile memories. However, the high reset current is one major obstacle to develop a high density PRAM. One way of the reset current reduction is to change the heater electrode material. In this paper, to reduce the reset current for phase transition, we have investigated the effect of heater electrode material parameters using finite element analysis. From the simulation. the reset current of PRAM cell is reduced from 2.0 mA to 0.72 mA as the electrical conductivity of heater is decreased from $1.0{\times}10^6\;(1/{\Omega}{\cdot}m$) to $1.0{\times}10^4\;(1/{\Omega}{\cdot}m$). As the thermal conductivity of heater is decreased, the reset current is slightly reduced. But the reset current of PRAM cell is not changed as the specific heat of heater is changed.

Operating Characteristics of Amorphous GeSe-based Resistive Random Access Memory at Metal-Insulator-Silicon Structure (금속-절연층-실리콘 구조에서의 비정질 GeSe 기반 Resistive Random Access Memory의 동작 특성)

  • Nam, Ki-Hyun;Kim, Jang-Han;Chung, Hong-Bay
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.29 no.7
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    • pp.400-403
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    • 2016
  • The resistive memory switching characteristics of resistive random access memory (ReRAM) using the amorphous GeSe thin film have been demonstrated at Al/Ti/GeSe/$n^+$ poly Si structure. This ReRAM indicated bipolar resistive memory switching characteristics. The generation and the recombination of chalcogen cations and anions were suitable to explain the bipolar switching operation. Space charge limited current (SCLC) model and Poole-Frenkel emission is applied to explain the formation of conductive filament in the amorphous GeSe thin film. The results showed characteristics of stable switching and excellent reliability. Through the annealing condition of $400^{\circ}C$, the possibility of low temperature process was established. Very low operation current level (set current: ~ ${\mu}A$, reset current: ~ nA) was showed the possibility of low power consumption. Particularly, $n^+$ poly Si based GeSe ReRAM could be applied directly to thin film transistor (TFT).

A study on the CFT error reduction of switched-current system (전류 스위칭 시스템의 CFT 오차 감소에 관한 연구)

  • 최경진;이해길;신홍규
    • The Journal of Korean Institute of Communications and Information Sciences
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    • v.21 no.5
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    • pp.1325-1331
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    • 1996
  • In this paper, a new current-memory circuit is proposed that reduces the clock feedthrough(CFT) error voltage causing total harmonic distortion(THD) increment in switched-current(SI) systems. Using PMOS transistor in CMOS complementary, the proposed one reduces output distortion current due to the CFT errorvoltage. A proposed current-memory is designed using a 1.2.mu.m CMOS process anda 1MHz sinusoidal signal having a 68.mu.A amplitude current is applied as input (sampling frequency:20MHz). It hasbeen shown from the simulation that the output distortion current effected by the CFT error voltage is reduced by approximately 10 times the error voltage of conventional one, THD is -57dB in case ofappling 1kHz frequency input signalwith 0.5 peak signal-to-bias current ratio.

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Micro Electrochemical Machining Characteristics and Shape Memory Effect in Ni-Ti SMA (Ni-Ti SMA의 미세 전해가공특성과 형상기억효과)

  • 김동환;박규열
    • Journal of the Korean Society for Precision Engineering
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    • v.20 no.1
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    • pp.43-49
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    • 2003
  • In this study, micro electrochemical machining method was introduced for accomplishment the fabrication technology of functional parts and smart structures using the Ni-Ti shape memory alloy. From the experimental result, the micro part which has very fine surface could be achieved by use of micro electrochemical process with point electrode method. Concretely, the optimal performance of micro electrochemical process in Ni-Ti SMA was obtained at the condition of approximately 100% of current efficiency and high frequency pulse current. That is, much finer surface integrity and shape memory effect can be obtained at the same condition mentioned above.

An Artificial Immune system using Memory Cell for the Inventory Routing Problem (기억 세포를 이용한 재고-차량 경로 문제의 인공면역시스템)

  • Yang, Byoung-Hak
    • Proceedings of the Korean Operations and Management Science Society Conference
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    • 2008.10a
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    • pp.236-246
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    • 2008
  • We consider the Inventory Routing problem(IRP) for the vending machine operating system. An artificial immune system(AIS) is introduced to solve the IRP. The IPR is an rolling wave planning. The previous solution of IRP is one of good initial solution of current IRP. We introduce an Artificial Immune system with memory cell (AISM) which store previous solution in memory cell and use an initial solution for current problem. Experiment results shows that AISM reduced calculations time in relatively less demand uncertainty.

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