• 대한전기학회:학술대회논문집
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• 대한전기학회 2006년도 제37회 하계학술대회 논문집 A
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• pp.466-467
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• 2006

Several synthetic testing methods have widely been used for the performance evaluation of ultra high-voltage circuit breaker. Among these synthetic method, in the paper, capacitance switching testing method which can meet the test requirements and increase the testing capacity has been proposed. This method is made up of two separated sources of short-circuit generator for current source and L-C resonance circuit for voltage source. By using this method, KERI will perform the performance evaluation of capacitive current switching performance for the 800kV GCB(Gas Circuit Breaker).

• 전기학회논문지
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• 제64권1호
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• pp.196-200
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• 2015

The switching noise in the power electronics of the power conversion equipment (Power Conditioning System) for large energy storage devices are generated. Since the burst-level transient noise from being generated in the power system at a higher power change process influences the control circuit of the low voltage driver circuit. Noise may cause the malfunction of the control device even if no dielectric breakdown leads to a control circuit. To overcome this, this paper proposes the installation of an additional nano-surge protection device on the power supply DC output circuit of the battery management unit.

• 대한전기학회:학술대회논문집
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• 대한전기학회 2006년도 제37회 하계학술대회 논문집 B
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• pp.695-696
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• 2006

The inrush current of transformer cause saturation effects of recovery voltage for short-circuit power testing. the inrush current depends on the residual flux of the transformer core. when inrush current occurs, it is contains a d.c. component and the high harmonic content of the current are of importance to relay protection of testing circuit. this paper describes of decrease method of inrush current for high power short-circuit testing transformer.

• 대한전기학회:학술대회논문집
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• 대한전기학회 2003년도 하계학술대회 논문집 A
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• pp.467-469
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• 2003

IEC(International Electrotechnical Commission) 62271-100 has been adopted for the design test of circuit breaker which is used as the main protecting device of power system. But, it is also necessary to separately receive the testing certificate in accordance with ANSI/IEEE standard for getting into the american market. Up to now, several domestic companies have completed the ANSI/IEEE testing in medium circuit breaker of distribution system, but they recently started the ANSI/IEEE testing in ultra high-voltage class of transmission and substation system. This paper introduces the testing techniques and its results for the making and breaking performance of 145kV, 40kA $SF_6$ gas circuit breaker which was firstly performed in KERI(Korea Electrotechnology Institute) by the ANSI/IEEE standard.

• 대한전기학회:학술대회논문집
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• 대한전기학회 2002년도 하계학술대회 논문집 A
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• pp.466-468
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• 2002

In order to newly define and specify the performance and the testing method of the high-voltage circuit breaker, IEC 62271-100 was published in May, 2001 and took place of IEC 60056 which had been used since 1987. This new standard intensifies the requirement and the test method of the circuit breaker and also domestic manufacturer makes progress the new product development. And, KERI also goes on the build-up project of short-circuit testing facilities for fulfilling the testing method requirements in new IEC 62271-100. This paper introduce the limiting method of short-circuit making current by controlling the time constant of dc component.

• Journal of Electrical Engineering and Technology
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• 제13권2호
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• pp.881-885
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• 2018

In order to develop a gas circuit breaker (GCB), the breaking performance of the short line fault (SLF) should be prioritized over that of the breaker terminal fault (BTF). In brief, it is necessary to evaluate the thermal characteristics of the insulating gas that is filled in a GCB. In the process of developing a GCB, many companies use the simplified synthetic testing facility (SSTF).In order to evaluate the SLF breaking performance of a GCB with a long minimum arcing time, a modifications to the conventional SSTF was proposed. In this study, we developed the SSTF with a modified transient recovery voltage circuit. The performance of the newly developed SSTF was verified by an $L_{90}$ breaking performance test on a rating combination of 170 kV, 50 kA, and 60 Hz.

• 대한전기학회:학술대회논문집
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• 대한전기학회 1999년도 하계학술대회 논문집 A
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• pp.409-411
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• 1999

This paper proposes the circuit of the simple synthetic testing facility using LC resonance circuit. EMTP has been used to analyze the circuit. The obtained results indicate that the simple synthetic testing facility using LC resonance circuit can be easily designed and used very usefully for the research and development for the switchgears.

• 한국정보통신학회:학술대회논문집
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• 한국해양정보통신학회 2011년도 추계학술대회
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• pp.882-885
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• 2011

This paper presents testing and self-calibration of RF circuits using MEMS switches to identify process-related defects and out of specification circuits. We have developed a novel multi-tone dither test technique where the test stimulus is generated by modulating the RF carrier signal with a multi-tone signal generated using an Arbitrary Waveform Generator (AWG) with additive white Gaussian noise. This test stimulus is provided as input to the RF circuit and peak-to-average ratio (PAR) is measured at the output. For a faulty circuit, a significant difference is observed in the value of PAR as compared to a fault-free circuit. Simulation is performed for various circuit conditions such as fault-free as well as fault-induced and their corresponding PARs are stored in the look-up table. This testing and self-calibration technique is exhaustive and efficient for present-day communication systems.

• 한국철도학회:학술대회논문집
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• 한국철도학회 1998년도 창립기념 춘계학술대회 논문집
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• pp.408-418
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• 1998

This paper presents the implementation of comparator which is self-testing with respect to the faults caused by any single physical defect likely to occur in NMOS and CMOS integrated circuit. The goal is to use it for the fault-tolerant system. First, a new fault model for PLA(Programmable Logic Array) is presented. This model reflects several physical defects in VLSI circuits. It focuses on the designs based on PLA because VLSI chips are far too complex to allow detailed analysis of all the possible physical defects that can occur and of the effects on the operation of the circuit. Second, this paper shows that these design, which has been implemented with 2 level AND-ORor NOR-NOR circuit, are optimal in term of size. And it also presents a formal proof that a comparator implemented using NOR-NOR PLA, based on these design, is sol f-testing with respect to most single faults in the presented fault model. Finally, it discusses the application of the self-testing comparator as a building block for the implementation of the fault-tolerant system.

• 대한전기학회:학술대회논문집
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• 대한전기학회 2007년도 제38회 하계학술대회
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• pp.77-78
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• 2007

국제규격에 따라 VCB(vacuum circuit breaker), ACB(air circuit breaker), 등과 같은 전력기기들의 기계적 동작 시험 시, 시험전후의 개폐시간, 개폐속도, 동작코일전류크기, 등과 같은 특성을 측정하고 이들의 변화정도를 평가하여 시험결과를 판단한다. 그러나 시험 중에는 이러한 동작특성들을 측정하지 않기 때문에, 시험 중에 실패하는 경우, 원인 규명에 많은 어려움이 따른다. 이러한 문제를 해결하기 위해, LS산전 PT&T(Power Testing & Technology Institutes)는 시험전후뿐만 아니라 전체시험횟수 동안 동작특성을 측정하고, 이들의 변화추이를 분석할 수 있는 시스템을 구축하고, 관련 소프트웨어를 개발하였다. 본 논문에서는 개발 내용과 결과를 소개하고자 한다.