• 제목/요약/키워드: Circuit testing

검색결과 419건 처리시간 0.051초

Applying Parallel Processing Technique in Parallel Circuit Testing Application for improve Circuit Test Ability in Circuit manufacturing

  • Prabhavat, Sittiporn;Nilagupta, Pradondet
    • 제어로봇시스템학회:학술대회논문집
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    • 제어로봇시스템학회 2005년도 ICCAS
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    • pp.792-793
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    • 2005
  • Circuit testing process is very important in IC Manufacturing there are two ways in research for circuit testing improvement. These are ATPG Tool Design and Test simulation application. We are interested in how to use parallel technique such as one-side communication, parallel IO and dynamic Process with data partition for circuit testing improvement and we use one-side communication technique in this paper. The parallel ATPG Tool can reduce the test pattern sets of the circuit that is designed in laboratory for make sure that the fault is not occur. After that, we use result for parallel circuit test simulation to find fault between designed circuit and tested circuit. From the experiment, We use less execution time than non-parallel Process. And we can set more parameter for less test size. Previous experiment we can't do it because some parameter will affect much waste time. But in the research, if we use the best ATPG Tool can optimize to least test sets and parallel circuit testing application will not work. Because there are too little test set for circuit testing application. In this paper we use a standard sequential circuit of ISCAS89.

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합성단락시험용 재점호장치 (Reignition system for synthetic short-circuit test)

  • 박승처;김맹현;강영식;신영준;고희석
    • 대한전기학회:학술대회논문집
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    • 대한전기학회 2000년도 하계학술대회 논문집 C
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    • pp.1856-1858
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    • 2000
  • This paper describes the principles of reignition system which has newly been developed and used as KERI's high power testing facilities. Synthetic short-circuit testing method is generally adopted to perform the short-circuit test of the ultra high-voltage circuit breakers, which consists of two separated sources such as the current source from short-circuit generator and the voltage source from charged energy in capacitor. And, in case of synthetic short-circuit test, it will be necessary to use the reignition system in order to extending the arcing time of the circuit breaker and provide the arc energy equivalent to the direct testing method.

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IEC60947-2에 따른 누전차단기의 순시단락시험 과도현상에 대한 연구 (The Transient Analysis of Instant Short-Circuit Test Equipment For Earth Leakage Circuit Breaker)

  • 류행수;김명석;한규환
    • 대한전기학회:학술대회논문집
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    • 대한전기학회 2003년도 하계학술대회 논문집 A
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    • pp.357-359
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    • 2003
  • This paper is for the transient analysis of instant short-circuit test equipment according to the test of tripping limits and characteristics under IEC 60947-2. The in-rush current is harmful to almost equipments and the exact testing is not made because of it. LGIS has a instant short-circuit test equipment, but it is not suitable for carrying out instant short-circuit test on ELB(Earth Leakage Circuit breaker) by reason of that. Now, I am going to show a solution for that problem. After applying this method, manufacturer is going to acquire the exact testing result according to the IEC standard. Moreover, Testing laboratory will be trusted by clients.

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362kV, 63kA 초고압차단기 투입차단시험 (Short-circuit making and breaking test for 362kV, 63kA circuit breaker)

  • 박승재;서윤택;윤학동;김맹현;고희석
    • 대한전기학회:학술대회논문집
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    • 대한전기학회 2004년도 하계학술대회 논문집 A
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    • pp.554-556
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    • 2004
  • Testing capacity of KERI synthetic short-circuit testing facilities has been upgraded to fulfill the requirements up to 550kV 63kA, 1-break circuit breaker ratings. Specially the current capacity was increased 50kA to 63kA and the full type test of 362kV 63kA circuit breaker(1-break) was firstly completed in domestic. UP to now, domestic manufacturers have depended on the foreign testing laboratory for performance verification of newly designed products. This paper introduces the summary of the increased short-circuit testing facilities, the testing techniques and its results for the making and breaking performance of 362kV, 63kA circuit breaker which was Performed according to IEEE C37.06(1999) used in North America.

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초고압전력용차단기에 대한 다목적합성실험회의에 관한 연구 (A Study on the Multipurpose Three Phase Synthetic Testing Circuit for A.C. E.H.V. Circuit Breakers)

  • 변성봉;정재길;윤병도;류형기
    • 대한전기학회논문지
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    • 제39권12호
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    • pp.1296-1305
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    • 1990
  • Common enclosure type SF6 circuit breakers have been developed in many countries for their compact design and economical merits, but their performance testing method is one of the difficult problems because of the limitation of testing capacity. This paper studies a three phase synthetic testing circuit which consists of 4-unit circuits based on the current injection method. This new synthetic testing circuit can be used in both ways of three phase testing up to 242kV rating and single phase testing up to 800kV rating.

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배전용 변압기 단락강도 시험설비 개발 (Development of Short-circuit Testing Facility for Distribution Transformers)

  • 박지훈;민윤홍;강영학;유호근;안규선;함길호;오창주
    • 대한전기학회:학술대회논문집
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    • 대한전기학회 2002년도 춘계학술대회 논문집 전기기기 및 에너지변환시스템부문
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    • pp.64-67
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    • 2002
  • To increase the short-circuit testing capacity of distribution transformers, testing facility has been installed for KEPCO in Vi-wang. The power supply of testing facility is directly supplied from the network substation located closely. Testing can be performed up to 300 kVA for single-phase transformers, 500 kVA for three-phase transformers. Operating with this facility, the distribution company is able to maintain the reliable supply of electricity. Also the critical quality of transformers from manufacturers can be verified by short-circuit testing. This paper describes the design concept and specification of newly developed equipment and the procedure of short-circuit test.

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간이합성시험설비를 이용한 가스차단기 개발에 관한 연구 (A Study on A Gas Circuit Breaker Development Using Simplified Synthetic Testing Facility)

  • 정진교;김규탁
    • 대한전기학회:학술대회논문집
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    • 대한전기학회 2007년도 제38회 하계학술대회
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    • pp.902-904
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    • 2007
  • A $SF_6$ gas circuit breakers are widely used for short circuit current interruption in EHV or UHV power system. During a $SF_6$ gas circuit breaker development, Simplified synthetic testing facility is used. This paper shows how simplified synthetic testing facility is used for a SF6 gas circuit breaker development.

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단락시험에서의 과도회복전압발생회로에 관한 연구 (A study on TRV generating circuit in short-circuit tests)

  • 김맹현;서윤택;윤학동;강영식;고희석
    • 대한전기학회:학술대회논문집
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    • 대한전기학회 2000년도 하계학술대회 논문집 A
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    • pp.134-136
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    • 2000
  • This paper deals with the analysis on the TRV generating circuit and the TRV waveform occurred from the short-circuit tests using only the short-circuit generator. And the results of analysis on the proposed TRV generating circuit and TRV measured are described.

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800kV, 50kA 차단기의 전절연 검증을 위한 시험방법 검토 (Review about test method for the full-insulation verification of circuit breaker rated on 800kV, 50kA)

  • 박승재;서윤택;윤학동;김용식;김맹현;고희석
    • 대한전기학회:학술대회논문집
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    • 대한전기학회 2005년도 제36회 하계학술대회 논문집 A
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    • pp.569-571
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    • 2005
  • In case of dead-tank circuit breaker with the earthed enclosure, the dielectric performance for phase to ground should be verified under the hot-gas condition produced by the current interruption. This test condition is required in breaking test duties with the rated short-circuit current and rated voltage. And, KERI has completed the reinforcement of the synthetic testing facilities and these facilities have the testing capacity which enables the full-pole testing for 800kV circuit breaker by adopting the series voltage injection method. So, this paper introduced the test circuit and procedures about the full-pole and the multi-part testing method which was devised to estimate the full -insulation of phase-to-ground for the multi-pole and dead-tank circuit breaker.

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간이 합성시험설비의 구성 및 회로특성 (Construction and Circuital Characteristics of Simple Synthetic Test Facility)

  • 이정희;박경엽;장기찬;신영준
    • 대한전기학회:학술대회논문집
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    • 대한전기학회 1995년도 하계학술대회 논문집 A
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    • pp.168-170
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    • 1995
  • This paper proposes the circuit of the simple synthetic testing facility using LC resonance circuit. The analyzed results of the circuit which can be useful for the design stage of the testing facility are also shown. EMTP has been used to analyze the circuit. Two cases of short-circuit test results obtained from the simple synthetic testing facility in KERI are shown with the waveforms of current and voltage. The results also indicate that the simple synthetic testing facility using LC resonance circuit can be easily designed and used very usefully for the research and development for the switchgears.

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