• Journal of Sensor Science and Technology
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• v.2 no.1
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• pp.87-94
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• 1993

CdS and Se thin films were deposited on slide glass by EBE method respectively and surface morphology, crystal structure, electrical and optical properties were investigated by substrate temperature and annealing. The deposited CdS film was well fabricated with cubic structure at substrate temperature of $150^{\circ}C$. Se film was deposited with noncrystal structure until substrate temperature of $100^{\circ}C$, but Se film was grown with monoclinic structure at substrate temperature of $150^{\circ}C$. And so, after annealing at $150^{\circ}C$ for 15min, noncrystalline Se was proved to be hexagonal structure. Finally, the maximum output of Se/CdS heterojunction at 5000 lux was 4 $mW/cm^{2}$ and maximum spectral sensitivity was represented at 585nm.

• Applied Chemistry for Engineering
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• v.28 no.3
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• pp.290-293
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• 2017

In this study, the fundamental behavior of microdomains in block copolymer/nanoparticle composite thin films was examined. In this experiment, polystyrene-b-poly(2-vinylpyridine) block copolymer and CdSe nanoparticles having a noncentrosymmetric property were employed. Composite hybrid thin films were produced by a spin coating method, and changes in the internal structure of composite thin films were monitored mainly by transmission electron microscopy. In summary, nanoparticles resided inside the thin film relatively intact, however, the block copolymer microdomains rotated parallel to the electric field direction. This study will be very helpful for future research activities regarding behaviors of heterogeneous composite materials under external fields.

• Solar Energy
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• v.20 no.2
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• pp.55-65
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• 2000

Better electrical and optical properties of ITO thin films were demanded for the window layer of CdS/CdTe solar cells. To match that demand, an ion beam sputtering system was used for the deposition of ITO thin films. The substrate temperature and ion beam energy were controlled to deposit high quality ITO thin films in two cases of Ar ion sputtering and Ar+$O_2$ ion sputtering. The microstructure changed from domain structure in ITO deposited by Ar ions to grain structure in ITO deposited by Ar+$O_2$ ions. The lowest resistivity of ITO films was $1.5\times10^{-4}{\Omega}cm$ at $100^{\circ}C$ substrate temperature in case of Ar ions sputtering. Transmittance in the visible range was over 80% above $100^{\circ}C$ substrate temperature.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.16 no.10
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• pp.871-880
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• 2003

Single crystal CuAlSe$_2$ layers were grown on thoroughly etched semi-insulating GaAs(100) substrate at 410 C with hot wall epitaxy (HWE) system by evaporating CuAlSe$_2$ source at 680 C. The crystalline structure of the single crystal thin films was investigated by the photoluminescence(PL) and double crystal X -ray diffraction (DCXD). The carrier density and mobility of single crystal CuAlSe$_2$ thin films measured with Hall effect by van der Pauw method are 9.24${\times}$10$\^$16/ cm$\^$-3/ and 295 cm$^2$/V $.$ s at 293 K, respectively. The temperature dependence of the energy band gap of the CuAlSe$_2$ obtained from the absorption spectra was well described by the Varshni's relation, Eg(T) = 2.8382 eV - (8.86 ${\times}$ 10$\^$-4/ eV/K)T$^2$/(T + 155K). After the as-grown single crystal CuAlSe$_2$ thin films were annealed in Cu-, Se-, and Al-atmospheres, the origin of point defects of single crystal CuAlSe$_2$ thin films has been investigated by PL at 10 K. The native defects of V$\_$cd/, V$\_$se/, Cd$\_$int/, and Se$\_$int/ obtained by PL measurements were classified as donors or acceptors. And we concluded that the heat-treatment in the Cu-atmosphere converted single crystal CuAlSe$_2$ thin films to an optical n-type. Also, we confirmed that Al in CuAlSe$_2$/GaAs did not form the native defects because Al in single crystal CuAlSe$_2$ thin films existed in the form of stable bonds.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2004.07b
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• pp.857-860
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• 2004

Cubic CdS thin film with the strongest XRD peak (111) at diffraction angle $(\theta)$ of 26.5 was well made at substrate temperature of $150^{\circ}C$. At that time, lattice constant a of the thin film was $5.79{\AA}$, grain size of that was more over ${\mu}m$ and it's resistivity was over $10^3{\Omega}cm$. And the peak of diffraction intensityat miller index (111) of CdS:In thin film with dopant In of 1 atom% was shown higher about 20 % than undoped CdS thin film. Also, CdS:In thin film had in part hexagonal structure among cubic structure as secondary phase. Lattice constant of a and grain size of secondary phase of the film with dopant In of 1 atom% was $5.81{\AA}$ and around $1{\mu}m$ respectively The lowest resistivity of $5.1{\times}10^{-3}{\Omega}cm$ was appeared on dopant In of 1.5 atom%. Optical band gap of undoped CdS thin film was 2.43 eV and CdS:In thin film with dopant In of 0.5 atom% had the largest band gap 2.49 eV.

• Proceedings of the KIEE Conference
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• 2009.07a
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• pp.1266_1267
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• 2009

신재생 에너지 태양광을 활용하기 위한 태양광 발전에 있어서 기존의 고가의 실리콘 기판 대신 저가의 박막형 태양전지 연구가 활발히 진행 되고 있다. 본 연구에서는 박막형 태양전지에 있어서 태양광의 투과층으로 사용되는 CdS 박막의 열처리에 따른 특성을 연구하였다. 실험은 CdS박막을 Sputtering법으로 동일한 조건에서 제조하였고 이 박막을 $200^{\circ}C$, $300^{\circ}C$, $400^{\circ}C$, $500^{\circ}C$, $600^{\circ}C$까지 열처리 하였다. 열처리 전과 후 Ellipsometer를 이용한 박막의 두께 변화, 표면의 RMS Roughness와 Peak to Valley Roughness의 변화 그리고 결정 구조변화 등을 조사하였다. 박막의 두께는 열처리 전보다 처리 후 두께가 얇아졌으나 거칠기나 결정성은 열처리 온도에 따라 거칠어지고 결정성이 떨어졌다.

• Journal of The Korean Association For Science Education
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• v.19 no.3
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• pp.428-440
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• 1999

The colorful overhead projector films, named as Bio-cosmos II, including photographs, pictures, concept maps, and diagrams, were developed and manufactured as audio-visual teaching aids and teaching resources for students' biology learning in high school, and the CD-ROM and web sites for their application to the school were also constructed. The content of the films was organized based upon the analysis of seven different biology textbooks approved by the Ministry of Education. The films were designated based on various instructional strategies and manufactured using multimedia with various educational softwares. The CD-ROM was composed of the scenes as logo, initial main, chapters list, contents, and quit. Initial main scene indicated various chapters according to the texts of biology areas in General Science, Biology I, and II. Each chapters linked with the scenes for detailed concept maps, the downstream real subjects, and contents. The subject screens were composed of various types of summarized diagrams including lesson contents, figures, pictures, photographs, and their explanation, experimental procedures and results, tables for summarized contents, and additional animation with video captures, explanations, glossary, etc. Most files were manufactured in software Adobe Photoshop by scanning the pictures, figures and photographs, and then the explanation, modification, storing with PICT or PSD files, and transformation with JPG files, were processed in the aspect of high quality in terms of instructional strategies and graphic skills on gracefulness, clearness, colorfulness, brightness, and distinctness. A 14 films for biology areas in General Science, 80 for Biology I, and 142 for Biology II were manufactured and loaded to the CD-ROM and web site, and the files had been attempted to opened with an internet home-page of http://gic.kyungpook.ac.kr/biocosmos.

• Journal of Sensor Science and Technology
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• v.12 no.6
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• pp.282-288
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• 2003

We report the growth of HgCdTe by metal organic vapor phase epitaxy (MOVPE), using (211)B CdTe/Si substrates grown by molecular beam epitaxy (MBE). The surface morphology of these films is very smooth with hillock free. The etch pit densities (EPD) and full widths at half maximum (FWHM) of x-ray rocking curves exhibited that the crystalline quality of HgCdTe epilayer on MBE grown CdTe/Si was improved compare to HgCdTe on GaAs substrate. The Hall parameters of undoped HgCdTe layers on CdTe/Si showed n-type behavior with carrier concentration of $8{\times}10^{14}/cm^3$ at 77K. But HgCdTe on GaAs showed p-type conductivity due to in corporation of p-type impurities during GaAs substrate preparation. It is thought that these results are applicable for large area HgCdTe forcal plane arrays of $1024{\times}1024$ format and beyound.

• Transactions of the Korean hydrogen and new energy society
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• v.11 no.3
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• pp.119-125
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• 2000

To improve the photochemical energy conversion efficiency and the stability of CdS particulate film electrode which is used to produce hydrogen from the aqueous $H_2S$ solution photoelectrochemically, surface treatment of this film was carried out using $TiCl_4$ solution. CdS particles for preparation of the films were synthesized by precipitation reaction of $Cd({NO_3})_2{\cdot}9H_2O$ and $Na_2S{\cdot}4H_2O$. Then, the CdS sol was hydrothermally treated for 12hr in an autoclave with the variation of treatment temperature to control the crystalline phase of particles. CdS film electrode was thus prepared by annealing at $400^{\circ}C$ for 12hr of the wet-film cast at room temperature, and subsequently surface treated with $TiCl_4$ solution. The electrodes were characterized using XRD, SEM, and the photocurrent meter. The photocurrents of Cds film electrodes prepared with surface treatment were up to two times higher than the electrodes without surface treatment, indicating about $4.0mA/cm^2$. Hydrogen production rate in a continuous flow system using photoelectrochemical or photochemical cells prepared with surface treatment also increased in proportion to the increase of photocurrents.

• Journal of Sensor Science and Technology
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• v.4 no.1
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• pp.51-63
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• 1995

Polycrystalline $CdS_{1-x}Se_{x}$ thin films were grown on ceramic substrate using a chemical bath deposition method. They were annealed at various temperature and X-ray diffraction patterns were measured by X-ray diffractometer in order to study $CdS_{1-x}Se_{x}$ polycrystal structure using extrapolation method of X-ray diffraction patterns for the CdS, CdSe samples annealed in $N_{2}$ gas at $550^{\circ}C$ it was found hexagonal structure which had the lattice constant $a_{0}=4.1364{\AA}$, $c_{0}=6.7129{\AA}$ in CdS and $a_{0}=4.3021{\AA}$, $c_{0}=7.0142{\AA}$ in CdSe, respectively. Hall effect on these samples was measured by Van der Pauw method and then studied on carrier density and mobility depending on temperature. We measured also spectral response, sensitivity(${\gamma}$), maximum allowable power dissipation and response time on these samples.