• Journal of the Korean Institute of Telematics and Electronics C
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• v.35C no.11
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• pp.57-62
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• 1998

In this paper, tunable transconductor shows good linearity over a wide input voltage range are proposed. The proposed transconductor employ operating in the nonsaturation(ie., linear) region to improve circuit simplicity and tunability and 6.8V$\_$p-p/ wide input range. Also the circuit employ source-coupled differential pair to provide true differential input and can achieve both positive and negative transconductance values. The proposed circuits are implemented using a 1.2 $\mu\textrm{m}$ single poly double metal n-well CMOS technology. The THD characteristic of proposed circuit is less than 1% for a differential input voltage of up to 6V$\^$p-p/ when supply bias condition is V$\_$DD/=-V$\_$ss/=5V, I$\_$B/=20, 40${\mu}$A, and frequency of input signal is 1KHz.

• The Journal of Korean Institute of Communications and Information Sciences
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• v.27 no.10C
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• pp.987-992
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• 2002

In this paper, a new clock and data recovery circuit is proposed for the application of data communication systems requiring ㎓-range clock signals. The circuit is suitable for recovering NRZ data which is widely used for high speed data transmission in ㎓ ranges. The high frequency jitter is one of major performance-limiting factors in PLL, particularly when NRZ data patterns are used. A novel phase detector is able to suppress this noise, and stable clock generation is achieved. Futhermore, the phase detector has an adaptive delay cell removing the dead zone problem and has the optimal characteristics for fast locking. The proposed circuit has a convenience structure that can be easily extended to multi-channels. The circuit is designed based on CMOS 0.25㎛ fabrication process and verified by measurement result.

• Journal of the Korea Institute of Information and Communication Engineering
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• v.2 no.3
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• pp.439-446
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• 1998

This paper presents design of SD adder and PD adder on Multi-Valued Logic. For implementing of Multi-valued logic circuits we use Current-mode CMOS circuits and also use Voltage-mode CMOS circuits partially. The proposed arithmetic circuits was estimated by SPICE simulation. At the SD(Signed-Digit) number presentation applying Multi-Valued logic the carry propagation is always limited to one position to the left this number presentation allows fast parallel operation. The addition method that add M operands using PD( positive digit number) is effective not only for the realization of the high-speed compact arithmetic circuit, but also for the reduction of the interconnection in the VLSI processor. therefor, if we use PD number representation, the high speed processor can be implementation.

• Journal of the Korea Institute of Information and Communication Engineering
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• v.3 no.1
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• pp.235-244
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• 1999

This Paper proposes a new compaction algorithm for IDDQ testing in CMOS Circuits. A primary test pattern is generated by the primitive fault pattern which is able to detect GOS(gate-oxide short) and the bridging faults in an internal primitive gate. The new algorithm can reduce the number of the test vectors by decreasing the don't care(X) in the primary test pattern. The controllability of random number is used on processing of the backtrace together four ones of heuristics. The simulation results for the ISCAS-85 benchmark circuits show that the test vector reduction is more than 45% for the large circuits on the average compared to static compaction algorithms.

• The Transactions of the Korea Information Processing Society
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• v.5 no.11
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• pp.2980-2988
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• 1998

This paper describes the design of asynchronous adders based on carry selection and carry bypass techniques. The designs are faster than existing asynchronous adders which are based on ripple carry technique. It is caused by reducing the carry transfer time by using carry selection and carry bypass techniques. Also, the design uses tree structure to reduce the completion sensing time. The proposed adders are designed with CMOS domino logic and experimented with HSPICE simulator. Experimental results show that the proposed adders can be faster about 50% in average cases than previous ripple carry adders.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.39 no.10
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• pp.65-73
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• 2002

Two CMOS composite transistors with an improved operating region by reducing the threshold voltage are proposed in this paper. And also, as an application of the proposed composite transistors, the transconductor is designed. The proposed composite transistor I and II employ a P-type folded composite transistor and a composite diode in order to decrease the threshold voltage, respectively. The limitation of the operating region of these transistors by current source is described. All circuits are simulated by HSPICE using 0.25${\mu}{\textrm}{m}$ n-well process.

• Journal of Sensor Science and Technology
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• v.3 no.1
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• pp.46-53
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• 1994

In the following paper, the high frequency oscillation proximity sensor system, one of the sensor systems used in FA, is designed using CMOS. According to the proximity of metal objects, two differing amplitudes of sinusoidal waves are set, and by using rectifiers, dc voltages, which determine the constant current source circuit's output current levels, can be abstracted from these waves. To remove any disturbances in the dc voltage levels, a schmitt trigger is used. Some advantages of this CMOS high frequency oscillation proximity sensor are miniturization, light weight and low power disspation.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.47 no.11
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• pp.37-42
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• 2010

A novel hysteresis tunable monolithic comparator circuit based on a $0.35{\mu}m$ CMOS process is suggested, designed, fabricated, measured and analyzed in this paper. To tune the threshold voltage of the hysteresis in the comparator circuit, two external digital bits are used with supply voltage of 3.3V.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.40 no.12
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• pp.63-71
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• 2003

IDDQ testing is indispensable in improving Duality and reliability of CMOS VLSI circuits. But the major problem of IDDQ testing is slow testing speed due to time-consuming IDDQ current measurement. So one requirement is to reduce the number of target faults or to make the test sets compact in fault model. In this paper, we consider equivalent fault collapsing for transistor short faults, a fault model often used in IDDQ testing and propose an efficient algorithm for reducing the number of faults that need to be considered by equivalent fault collapsing. Experimental results for ISCAS benchmark circuits show the effectiveness of the proposed method.

• The Transactions of the Korean Institute of Power Electronics
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• v.6 no.1
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• pp.13-20
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• 2001

In this appear, we proposed the new current mirror has large output resistance and excellent current matching characteristics. If supply voltage were lowered under the conventional CMOS operational amplifier, the wing of out put power could be restricted. So, the paper suggests a new way of differential operational amplifier circuit to solve the problem. The paper proposes that a new current mirror increases output swing and has a stable operation. We compare and verify characteristics of the proposed current mirror with the cascoded current mirror and the regulated current mirror through simulation.