• International Journal of Reliability and Applications
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• 제18권2호
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• pp.21-44
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• 2017

Accelerated life tests (ALTs) are frequently used in manufacturing industries to evaluate the reliability of products within a reasonable amount of time and cost. Test units are subjected to elevated stresses which yield quick failures. Most of the previous works on designing ALT plans are focused on tests that involve a single stress. Many times more than one stress factor influence the product's functioning. This paper deals with the design of optimum modified ramp-stress ALT plan for Burr type XII distribution with Type-I censoring under two stress factors, viz., voltage and switching rate each at two levels- low and high. It is assumed that usage time to failure is power law function of switching rate, and voltage increases linearly with time according to modified ramp-stress scheme. The cumulative exposure model is used to incorporate the effect of changing stresses. The optimum plan is devised using D-optimality criterion wherein the ${\log}_{10}$ of the determinant of Fisher information matrix is maximized. The method developed has been explained using a numerical example and sensitivity carried out.

• 한국군사과학기술학회지
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• 제21권5호
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• pp.697-703
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• 2018

In this paper, we analyzed the operation of the ignition circuit for electronic arm and fire device(EAFD), and investigated the sensitive elements of the circuit system. For reliability analysis, the EAFD ignition circuit was modeled using the PSpice simulation tool, and the output results of the circuit were examined by changing the tolerance of each circuit element. Monte Carlo simulation was used by maintaining the values of the observed sensitive elements at ${\pm}10%$ of the original values and adjusting the values of the other components according to a random distribution. The histogram results of the output peak currents and pulse widths were represented by Weibull and Burr type XII function fittings in three cases(element values are +10 %, 0 %, -10 % of original). For the output peak currents, mean values were 1.0028, 1.0034, and 1.0050, where the variance values were calculated as 0.0398, 0.0396, and 0.0290 using the Weibull function fitting, respectively. For pulse widths, the mean values of 0.9475, 0.9907, and 1.0293 with the variance values of 0.0260, 0.0251, and 0.0238 were obtained using the Burr Type XII function fittings.

• International Journal of Reliability and Applications
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• 제13권1호
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• pp.19-35
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• 2012

This paper presents an optimum design of step-stress partially accelerated life test (PALT) plan which allows the test condition to be changed from use to accelerated condition on the occurrence of fixed number of failures. Various life distribution models such as exponential, Weibull, log-logistic, Burr type-Xii, etc have been used in the literature to analyze the PALT data. The need of different life distribution models is necessitated as in the presence of a limited source of data as typically occurs with modern devices having high reliability, the use of correct life distribution model helps in preventing the choice of unnecessary and expensive planned replacements. Truncated distributions arise when sample selection is not possible in some sub-region of sample space. In this paper it is assumed that the lifetimes of the items follow Truncated Logistic distribution truncated at point zero since time to failure of an item cannot be negative. Optimum step-stress PALT plan that finds the optimal proportion of units failed at normal use condition is determined by using the D-optimality criterion. The method developed has been explained using a numerical example. Sensitivity analysis and comparative study have also been carried out.