International Journal of Reliability and Applications

The Korean Reliability Society (한국신뢰성학회)
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Accelerated life test plan under modified ramp-stress loading with two stress factors

  • Srivastava, P.W. (University of Delhi) ;
  • Gupta, T. (University of Delhi)
  • Received : 2017.07.31
  • Accepted : 2017.12.27
  • Published : 2017.12.31
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Abstract

Accelerated life tests (ALTs) are frequently used in manufacturing industries to evaluate the reliability of products within a reasonable amount of time and cost. Test units are subjected to elevated stresses which yield quick failures. Most of the previous works on designing ALT plans are focused on tests that involve a single stress. Many times more than one stress factor influence the product's functioning. This paper deals with the design of optimum modified ramp-stress ALT plan for Burr type XII distribution with Type-I censoring under two stress factors, viz., voltage and switching rate each at two levels- low and high. It is assumed that usage time to failure is power law function of switching rate, and voltage increases linearly with time according to modified ramp-stress scheme. The cumulative exposure model is used to incorporate the effect of changing stresses. The optimum plan is devised using D-optimality criterion wherein the ${\log}_{10}$ of the determinant of Fisher information matrix is maximized. The method developed has been explained using a numerical example and sensitivity carried out.

Keywords

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