• Journal of the Institute of Electronics Engineers of Korea SD
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• v.46 no.5
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• pp.15-24
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• 2009

This paper proposes an effective low power BIST architecture using the pattern mapping method for 100% fault coverage and the transition freezing method for making high correlative low power patterns. When frozen patterns are applied to a circuit, it begins to find a great number of faults at first. However, patterns have limitations of achieving 100% fault coverage due to random pattern resistant faults. In this paper, those faults are covered by the pattern mapping method using the patterns generated by an ATPG and the useless patterns among frozen patterns. Throughout the scheme, we have reduced an amount of applied patterns and test time compared with the transition freezing method, which leads to low power dissipation.

• The Transactions of the Korean Institute of Electrical Engineers D
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• v.54 no.6
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• pp.403-408
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• 2005

As the increasing integrity of VLSI, the BIST(Built-In Self Test) is used as an effective method to test chips. Generally the pseudo-random test pattern generation is used for BIST. But it requires too many test patterns when there exist random This paper proposes and presents a new efficient network architecture for Reflective Memory System (RMS). A time to copy shared-data among nodes effects critically on the entire performance of the RMS. In this paper, the recent researches about the RMS are investigated and compared. The device named Topology Conversion Switch(TCS) is introduced to realize the proposed network architecture. One of the RMS based industrial control networks, Ethernet based Real-time Control Network (ERCnet), is adopted to evaluate the performance of the proposed network architecture for RMS.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.39 no.3
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• pp.85-97
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• 2002

STUMPS has been widely used for built-in self-test of scan design with multiple scan chains. In the STUMPS architecture, there is very high correlation between the bit sequences in the adjacent scan chains. This correlation causes circuits lower the fault coverage. In order to solve this problem, an extra combinational circuit block(phase shifter) is placed between the LFSR and the inputs of STUMPS architecture despite the hardware overhead increase. This paper introduces an efficient test pattern generation technique and built-in self-test architecture for sequential circuits with multiple scan chains. The proposed test pattern generator is not used the input of LFSR and phase shifter, hence hardware overhead can be reduced and sufficiently high fault coverage is obtained. Only several XOR gates in each scan chain are required to modify the circuit for the scan BIST, so that the design is very simple.

• Proceedings of the KIEE Conference
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• 2007.07a
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• pp.1862-1863
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• 2007

Testing the analog/mixed-signal circuitry of a mixed-signal IC has become a difficult task. Offset error, gain error, Non-monotonic behavior, Differential Non-linearity(DNL) error, Integral Non-linearity(INL) error are important specifications used as test parameters for DAC. In this paper, we propose an efficient BIST structure for DAC testing. The proposed BIST adds the circuit which uses the capacitor and op-amp, and accomplishes a test.

• JSTS:Journal of Semiconductor Technology and Science
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• v.2 no.3
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• pp.226-232
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• 2002

This paper explains a technique to improve the fault coverage of oscillation-test [1-5] for linear analog circuits. The transient behavior of the virtual ground is monitored during oscillation to extract information of the circuit. The limitation of the oscillation-test is analyzed, and an efficient signature analysis technique is proposed to maximize the fault coverage. The experimental result proves that the parametric fault coverage can be significantly increased by the proposed technique.

• Journal of the Korean Institute of Telematics and Electronics
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• v.27 no.5
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• pp.699-708
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• 1990

This paper proposes two test procedures for detecting functional faults in semiconductor random access memories (RAM's) and a new testimg scheme to execute the proposed test procedures. The first test procedure detects stuck-at faults, coupling faults and decoder faults, and requires 19N operations, which is an improvement over conventional procedures. The second detects restricted patternsensitive faults and requires 69N operations. The proposed scheme uses Built-In Self Testing (BIST) techniques. The scheme can write into more memory cells than I/O pins can in a write cycle in test mode. By using the scheme, the number of write operations is reduced and then much testing time is saved.

• The Journal of Korean Institute of Communications and Information Sciences
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• v.25 no.12A
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• pp.1912-1923
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• 2000

본 논문에서는 내장된 자체 테스트(BIST: Built-In Self Test) 기법의 구현에 관해 기술한다. 내장된 자체 테스트 기법이 적용된 칩은 영상 처리 및 3차원 그래픽스용 부동 소수점 DSP 코어인 FLOVA이다. 내장된 로직 자체 테스트 기법은 FLOVA의 부동 소수점 연산 데이터 패스에 적용하였으며, 내장된 메모리 자체 테스트 기법은 FLOVA에 내장된 데이터 메모리와 프로그램 메모리에 적용하였다. 그리고, 기판 수준의 테스팅을 지원하기 위한 표준안인 경계 주사 기법(IEEE 1149.1)을 구현하였다. 특히, 내장된 자체 테스트 로직을 제어할 수 있도록 경계주사 기법을 확장하여 적용하였다.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.43 no.8 s.350
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• pp.27-34
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• 2006

During Built-In Self-Test(BIST), The set of patterns generated by a pseudo-random pattern generator may not provide sufficiently high fault coverage and many patterns were undetected fault. In order to reduce the test time, we can remove useless patterns or change from them to useful patterns. In this paper, we reseed modify the pseudo-random and use an additional bit flag to improve test length and achieve high fault coverage. the fat that a random tset set contains useless patterns, so we present a technique, including both reseeding and bit modifying to remove useless patterns or change from them to useful patterns, and when the patterns change, we choose number of different less bit, leading to very short test length. the technique we present is applicable for single-stuck-at faults. the seeds we use are deterministic so 100% faults coverage can be achieve.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.41 no.7
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• pp.63-70
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• 2004

This paper describes the link layer and physical layer of the Serial ATA which is the next generation for parallel ATA specification that defines data transfer between PC and peripheral storage devices. The link layer consists of CRC generation/error detection, 8b/10b decoding/encoding, primitive generation/detection block. For the physical layer, it includes CDR(Cock Data Recovery), transmission PLL, serializer/de-serializer. It also includes generation and receipt of OOB(Out-Of-Band) signal, impedance calibration, squelch circuit and comma detection/generation. Additionally, this chip includes TCB(Test Control Block) and BIST(Built-In Selt Test) block to ease debugging and verification. It is fabricated with 0.18${\mu}{\textrm}{m}$ standard CMOS cell library. All the function of the link layer operate properly. For the physical layer, all the blocks operate properly but the data transfer is limited to the 1.28Gbps. This is doe to the affection or parasitic elements and is verified with SPICE simulation.

• The Journal of Korean Institute of Communications and Information Sciences
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• v.26 no.5B
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• pp.685-691
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• 2001

본 논문은 4단계 파이프 라인과 VLIW (Very Long Instruction Word) 구조를 갖는 FLOVA라는 DSP 프로세서의 테스트용이 설계 기법을 다룬다. Full-scan design, BIST(Built-In-Self-Test), IEEE 1149.1의 기법들이 플립플롭과 floaing point unit, 내장된 메모리, I/O cell 등에 각각 적용되었다. 이러한 기법들은 테스트 용이도의 관점에서 FLOVA의 구조에 적절하게 적용되었다. 본 논문에서는 이와 같이 FLOVA에 적용된 테스트 용이 설계의 특징들을 중심으로 상세하게 기술한다.