• ETRI Journal
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• v.29 no.5
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• pp.596-606
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• 2007

It is well known that an OFDM receiver is vulnerable to synchronization errors. Despite fine estimations used in the initial acquisition, there are still residual synchronization errors. Though these errors are very small, they severely degrade the bit error rate (BER) performance. In this paper, we propose a residual error elimination scheme for the digital OFDM baseband receiver aiming to improve the overall BER performance. Three improvements on existing schemes are made: a pilot-aided recursive algorithm for joint estimation of the residual carrier frequency and sampling time offsets; a delay-based timing error correction technique, which smoothly adjusts the incoming data stream without resampling disturbance; and a decision-directed channel gain update algorithm based on recursive least-squares criterion, which offers faster convergence and smaller error than the least-mean-squares algorithms. Simulation results show that the proposed scheme works well in the multipath channel, and its performance is close to that of an OFDM system with perfect synchronization parameters.

• ETRI Journal
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• v.38 no.3
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• pp.417-424
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• 2016

In this paper, an accurate characterization of a fabricated X-band transmit/receive module is described with the process of generating control data to correct amplitude and phase deviations in an active electronically scanned array antenna unit. In the characterization, quantization errors (from both a digitally controlled attenuator and a phase shifter) are considered using not theoretical values (due to discrete sets of amplitude and phase states) but measured values (of which implementation errors are a part). By using the presented procedure for the characterization, each initial control bit of both the attenuator and the phase shifter is closest to the required value for each array element position. In addition, each compensated control bit for the parasitic cross effect between amplitude and phase control is decided using the same procedure. Reduction of the peak sidelobe level of an array antenna is presented as an example to validate the proposed procedure.

• The Journal of the Institute of Internet, Broadcasting and Communication
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• v.14 no.1
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• pp.15-21
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• 2014

Due to the development of manufacturing technology scaling, more transistors can be placed on a cache memories of a processor. However, processors become more vulnerable to the soft errors because of highly integrated transistors, the reliability of cache memory must consider seriously at the design level. Various researches are proposed to overcome the vulnerability of soft error, but researches of tag bit are proposed very rarely. In this paper, we revaluate the reliability improvement technique for tag bit, and analyse the protection rate of write-back operation, which is a typical case of not satisfying temporal locality. We also propose the methodology to improve the protection rate of write-back operation. The experiments of the proposed scheme shows up to 76.8% protection rate without performance degradations.

• JSTS:Journal of Semiconductor Technology and Science
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• v.16 no.4
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• pp.511-519
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• 2016

This paper proposes a CMOS 6-bit phase shifter with low RMS phase and amplitude errors for an X-band phased array antenna. The phase shifter combines a switched-path topology for coarse phase states and a switch-filter topology for fine phase states. The coarse phase shifter is composed of phase shifting elements, single-pole double-throw (SPDT), and double-pole double-throw (DPDT) switches. The fine phase shifter uses a switched LC filter. The phase coverage is $354.35^{\circ}$ with an LSB of $5.625^{\circ}$. The RMS phase error is < $6^{\circ}$ and the RMS amplitude error is < 0.45 dB at 8-12 GHz. The measured insertion loss is < 15 dB, and the return losses for input and output are > 13 dB at 8-12 GHz. The input P1dB of the phase shifter achieves > 11 dBm at 8-12 GHz. The current consumption is zero with a 1.2-V supply voltage. The chip size is $1.46{\times}0.83mm^2$, including pads.

• Journal of the Institute of Electronics Engineers of Korea TC
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• v.49 no.4
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• pp.34-40
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• 2012

In wireless communication system, fading is an unavoidable problem. Hence, errors in form of BER are introduced with the transmitted signal. It is necessary to recognize the behavior of these errors in different fading channels. To obtain the mathematical solution for the average bit error rate(BER) of coherent MPSK, some techniques are presented. In this paper, the impact of diversity is also analyzed over slow and flat Rician fading channel. In here, the value of modulation index, M is varied and the effects of its variation are also depicted. So, these performance curves with different diversity values and fading parameter are useful to design and evaluate the radio channel for faithful communication system.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.31 no.1
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• pp.1-5
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• 2018

This study analyzed the change of electrical characteristics of a photocoupler when a narrow-band electromagnetic wave was combined with the photocoupler. A magnetron (3 kW, 2.45 GHz) was used as the narrow-band electromagnetic source. The EUT was Photocoupler (6N139) and the input signal was divided into two types: a square pulse and the second signal is 0 V. The malfunction of the photocoupler was confirmed by monitoring the variation in the output voltage of the photocoupler. As a result of the experiment, changes in the malfunctioning was observed as the electric field was increased. There are three types of malfunction modes: delay, output voltage off, and fluctuation. Bit errors were analyzed to verify the electrical characteristics of the photocoupler by narrow-band electromagnetic waves. The result of this study can be used as basic data for the effect analysis of photocoupler protection and impact analysis of high-power electromagnetic waves.

• The Journal of the Institute of Internet, Broadcasting and Communication
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• v.23 no.1
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• pp.37-43
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• 2023

Compressed still image or video bitstreams require protection from channel errors in a wireless channel. Embedded Zerotree Coding(EZW), SPIHT could have provided unprecedented high performance in image compression with low complexity. If bit error is generated by dint of wireless channel transmission problem, the loss of synchronization on between encoder and decoder causes serious performance degradation. But wavelet zerotree coding algorithms are producing variable-length codewords, extremely sensitive to bit errors. The idea is to partition the lifting coefficients. A many partition of lifting transform coefficients distributes channel error from wireless channel to each partition. Therefore synchronization problem that caused quality deterioration in still image and video stream was improved.

• IEMEK Journal of Embedded Systems and Applications
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• v.18 no.1
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• pp.31-40
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• 2023

Recent advances in flash technologies, such as 3D processing and multileveling schemes, have successfully increased the flash capacity. Unfortunately, these technology advances significantly degrade flash's reliability due to a smaller cell geometry and a finer-grained cell state control. In this paper, we propose an asymmetric BER-aware reliability optimization technique (aBARO), new flash optimization that improves the flash reliability. To this end, we first reveal that bit errors of 3D NAND flash memory are highly skewed among flash cell states. The proposed aBARO exploits the unique per-state error model in flash cell states by selecting the most error-prone flash states and by forming narrow threshold voltage distributions (for the selected states only). Furthermore, aBARO is applied only when the program time (tPROG) gets shorter when a flash cell becomes aging, thereby keeping the program latency of storage systems unchanged. Our experimental results with real 3D MLC and TLC flash devices show that aBARO can effectively improve flash reliability by mitigating a significant number of bit errors. In addition, aBARO can also reduce the read latency by 40%, on average, by suppressing the read retries.

• Journal of the Institute of Electronics and Information Engineers
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• v.49 no.11
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• pp.3-8
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• 2012

Two-dimensional product code has been studied for correcting burst errors on the storage systems. An RS-LDPC product code consists of an RS code in horizontal direction and an LDPC code in vertical direction. First, we detect the position of burst errors by using RS code, then LDPC code corrects the errors by using the burst error positions. In storage system, long burst errors are occurred by various reason. So, we need a strong code for correcting the long burst errors. RS-LDPC product code is good for long burst errors. However, as the storage density grows the length of the burst errors will be longer. Thus, we propose an LDPC-LDPC product code, it is strong for correcting the very long burst errors. Also, the proposed LDPC-LDPC product code performs better than RS-LDPC product code when the random errors are occurred, because a row direction LDPC code performs better than row direction RS code.

• Progress in Superconductivity and Cryogenics
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• v.7 no.1
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• pp.21-24
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• 2005

The problem of fluctuation-induced digital errors in a rapid single flux quantum (RSFQ) circuit has been very important issue. So in this experiment, we calculated error rate of RSFQ switch in superconductiyity ALU, The RSFQ switch should have a very low error rate in the optimal bias. We prepared two circuits Placed in parallel. One was a 10 Josephson transmission lines (JTLs) connected in series, and the other was the same circuit but with an RSFQ switch placed in the middle of the 10 JTLs. We used a splitter to feed the same input signal to the both circuits. The outputs of the two circuits were compared with an RSFQ XOR to measure the error rate of the RSFQ switch. By using a computerized bit error rate test setup, we measured the bit error rate of 2.18$\times$$10^{12}$ when the bias to the RSFQ switch was 0.398mh that was quite off from the optimum bias of 0.6mA.